JP2002244612A - Driving device for capacitive light emitting element - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a driving device of a capacitive light emitting element capable of resolving a problem giving damage to the light emitting element such as to incur the degradation or luminance reduction or generation of leakage current of the light emitting element. SOLUTION: This driving device is constituted so as to make respective EL (electroluminescent) elements emit light selectively by connecting the organic EL elements E11 to Enm at respective intersections of anode drive lines and cathode scanning lines, by connecting constant current sources I1 to In to desired drive lines while scanning the cathode scanning lines in prescribed cycles. Then, in a power source circuit 5 which applies a reverse bias (VM) to scanning lines being in non-scanning states in order to impress the reverse bias (VM) on the respective light emitting elements connected to pertinent scanning lines, an inrush current limiting means 6 for suppressing the peak of charging currents to be charged into parasitic capacities of respective light emitting elements from the power source circuit 5 right after the reverse bias is impressed is interposed.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention
(Electroluminescence) The present invention relates to a technique for driving a capacitive light emitting element such as an element to emit light, and in particular, to reduce damage to the light emitting element or the like due to a peak current by suppressing a peak of a current charged in a parasitic capacitance of the capacitive light emitting element. The present invention relates to a driving device for a capacitive light emitting element which can be used.

[0002]

2. Description of the Related Art An organic EL display has been attracting attention as a display that can replace a liquid crystal display with low power consumption, high display quality, and be thin. This is due to the fact that the use of an organic compound that can be expected to have good light-emitting properties in the light-emitting layer of an EL element used in an EL display has promoted high efficiency and long life that can be practically used. is there.

An organic EL device can be electrically represented by an equivalent circuit as shown in FIG. That is, the organic EL
The element can be replaced with a configuration including a parasitic capacitance component C and a diode component E coupled in parallel with the capacitance component, and the organic EL element is considered to be a capacitive light emitting element. When a light emission drive voltage is applied to the organic EL element, first, a charge corresponding to the electric capacity of the element flows into an electrode as a displacement current and is accumulated. Subsequently, when the voltage exceeds a certain voltage (light emission threshold = Vth) unique to the element, a current starts to flow from the electrode (the anode side of the diode component E) to the organic layer constituting the light emitting layer, and light is emitted with an intensity proportional to this current. Then you can think.

FIG. 6 shows the static light emission characteristics of such an organic EL device. According to this, as shown in FIG. 6A, when the driving voltage (V) is equal to or higher than the light emission threshold voltage (Vth), the current (I) rapidly flows to emit light. In other words, if the applied drive voltage is equal to or lower than the light emission threshold voltage, almost no drive current flows into the EL element after the charge of the parasitic capacitance, and the EL element does not emit light. Then, in the light emission enabling region where the drive voltage (V) is equal to or higher than the light emission threshold voltage, as shown in FIG.
Has a characteristic of emitting light with a luminance (L) substantially proportional to the luminance. Therefore, as shown in FIG. 6 (c), the luminance characteristics of the EL element in a light emitting area where the threshold voltage is higher than the threshold voltage, the light emitting luminance (L) increases as the voltage (V) applied thereto increases. It has the property of increasing.

As a method of driving a display panel constituted by arranging a plurality of organic EL elements, a simple matrix driving method is applicable. FIG. 7 shows an example of a simple matrix display panel and its driving device. There are two methods of driving the organic EL element in this simple matrix driving method, ie, a cathode line scanning / anode line driving and an anode line scanning / a cathode line driving. FIG. 7 shows the former form of the cathode line scanning / anode line driving. Is shown.
That is, n anode lines A1 to An are arranged in the vertical direction, and m cathode lines B1 to Bm are arranged in the horizontal direction, and the organic EL elements E11 to Enm are arranged at the intersections (n × m places in total). The display panel 1 is arranged.

Then, each of the elements E11 to Enm constituting the pixel
Are arranged in a lattice pattern, and the anode lines A1 to A
One end (the anode terminal of the diode component E of the above-described equivalent circuit) corresponds to the anode line, and the other end (the cathode of the diode component E of the above-described equivalent circuit) corresponds to the intersection between the n and the cathode lines B1 to Bm along the horizontal direction. Terminal) is connected to the cathode line. The anode line is connected to the anode line drive circuit 2 and the cathode line is connected to and driven by the cathode line scanning circuit 3.

The cathode line scanning circuit 3 is provided with scanning switches SY1 to SYm as switching means corresponding to the respective cathode scanning lines B1 to Bm, and a reverse bias voltage VM (for example, 10 V) from the power supply circuit 5 and a reference voltage. One of the ground potentials (0 V) as a potential point acts to connect to the corresponding cathode scanning line. The anode line drive circuit 2 supplies a drive current to each E through each anode line.
Driving sources I1 to In supplied to the L element and drive switches SX1 to SXn are provided. When the drive switches are turned on, currents from the driving sources I1 to In become:
It acts so as to be supplied to each EL element arranged corresponding to the cathode scanning line.

Thus, by connecting the drive source to a desired anode drive line while setting the cathode scan line to the ground potential at a predetermined cycle, each of the light emitting elements acts to emit light selectively. Note that a voltage source such as a constant voltage circuit can be used as the driving source. However, while the current / luminance characteristics of the EL element are stable with temperature change, the voltage / luminance characteristic is stable with temperature change. It is common to use a constant current source as a drive source for reasons such as instability.

Each of the anode drive lines is further connected to a cathode reset circuit 4. This cathode reset circuit 4
Are provided with reset switches SR1 to SRn provided for each anode drive line. When the reset switches are turned on, the anode drive line is set to the ground potential. The above-described anode line drive circuit 2, cathode line scan circuit 3, and reset circuit 4 are each driven by a command signal from a light emission control circuit (not shown).

That is, the light emission control circuit controls the anode line drive circuit 2, the cathode line scanning circuit 3, and the cathode reset circuit 4 to display an image corresponding to the image data according to the image data. In this case, the cathode line scanning circuit 3 selects one of the cathode scanning lines corresponding to the horizontal scanning period of the image data and sets it to the ground potential according to a command from the light emission control circuit, and the other cathode scanning lines are connected to the power supply circuit 5. To control the scanning switches SY1 to SYm so that the reverse bias voltage (VM) is applied.
The state shown in FIG. 7 shows a state in which the first cathode scanning line B1 is scanned.

The reverse bias voltage (VM) is applied to prevent the EL element connected to the intersection of the driven anode line and the cathode line not selected for scanning from emitting crosstalk light due to leak current. The reverse bias voltage (VM) is generally set to a voltage substantially equal to the forward voltage (VF) of the EL element driven to emit light. And the scanning switches SY1 ~
Since SYm is sequentially switched to the ground potential every horizontal scanning period, the cathode scanning line set to the ground potential functions as a scanning line that enables the EL element connected to the cathode scanning line to emit light. .

On the other hand, in the anode line drive circuit 2, the light emission control circuit determines which of the EL elements connected to the anode drive line based on the pixel information indicated by the image data at what timing and how much. A drive control signal (drive pulse) for controlling whether to emit light over the time period is supplied. The anode line drive circuit 2 drives the drive switches SX1 to SX in response to the drive control signal.
Xn are controlled to turn on, and the anode drive lines A1 to An
To supply a drive current to the corresponding EL element according to the pixel information.

Thus, the EL element supplied with the driving current is driven to emit light according to the pixel information. The state shown in FIG. 7 corresponds to the first cathode scanning line B as described above.
Since 1 is being scanned and the drive switches SX1 and SX3 are on, the EL elements E11 and E31 are driven to emit light.

The reset operation of the cathode reset circuit 4 is performed in response to a reset control signal from the light emission control circuit. This operation is described in, for example, Japanese Patent Application Laid-Open No. 9-2320.
It is disclosed in Japanese Patent Application Laid-Open No. 74-274, and when a scanning line is switched, it is made to speed up the light emission rise of the EL element driven to emit light corresponding to the next scanning line. This is because, as described above, the organic EL element has a parasitic capacitance. For example, in a case where several tens of EL elements are connected to one anode drive line, each of the organic EL elements has a parasitic capacitance as viewed from the anode drive line. A combined capacitance that is several tens of times the parasitic capacitance is connected as the load capacitance.

Therefore, at the beginning of the scanning period, the current from the anode drive line is consumed for charging the load capacitance, and a time delay occurs for charging until the light emission threshold voltage of the EL element is sufficiently exceeded. However, there arises a problem that the light emission rise of the EL element is delayed. In particular, when the constant current sources I1 to In are used as the driving sources as described above, the constant current source is a high-impedance output circuit in terms of the operation principle. Significant delay occurs. Therefore, the discharge operation of the charges by the cathode reset circuit 4 and the application operation of the reverse bias voltage VM by the cathode scanning circuit 3 instantaneously apply the emission threshold voltage to the anode terminal of the EL element driven to emit light in the next scan. It functions to give a voltage well in excess.

FIG. 8 shows a cathode reset operation by the reset circuit 4. For example, from the state where the EL element E11 connected to the first anode drive line A1 is driven to emit light, in the next scan. Similarly, a state is shown in which the EL element E12 connected to the first anode drive line A1 is driven to emit light. In FIG. 8,
The EL element driven to emit light is indicated by a symbol of a diode, and the others are indicated by a symbol of a capacitor as a parasitic capacitance.

FIG. 8A shows a state before the cathode reset operation, in which the cathode scanning line B1 is scanned and the EL element E is scanned.
Numeral 11 indicates a state of emitting light. In the next scan, the EL element E12
Before the EL element E12 emits light, the anode drive line A1 and all the cathode scan lines are reset to the ground potential to discharge all charges as shown in FIG. To this end, all of the scanning switches SY1 to SYm are connected to the ground side, and the reset switch SR1 is turned on. Next, in order to make the EL element E12 emit light,
The cathode scanning line B2 is scanned. That is, the cathode scanning line B
2 is connected to ground, and the other cathode scan lines are supplied with a reverse bias voltage VM. At this time, the drive switch SX1 is turned on, and the reset switch SR1 is turned off.

Therefore, since the electric charge of each element is discharged at the time of the above-mentioned reset, at this moment, as shown in FIG. As shown, the reverse bias voltage V
M is charged in the reverse direction, and the charging current for these is supplied via the anode drive line A1 to the next light emission E
It flows into the L element E12 and charges the parasitic capacitance of the EL element E12. At this time, the constant current source I1 connected to the drive line A1 is basically a high impedance output circuit as described above, and does not affect the movement of the charging current.

In this case, it is assumed that, for example, 64 EL elements are arranged on the drive line A1. If the reverse bias voltage VM is 10 (V), the voltage distribution is determined by the capacitance ratio. And the wiring impedance in the panel is so small that it can be neglected.
Rises instantaneously to a potential based on Equation 1 shown below. This operation is performed, for example, when the outer shape is 100 mm × 25 mm (256 mm).
× 1 dot on a display panel of about 64 dots)
It is completed in sec.

[0020]

(Equation 1)

Thereafter, the driving current from the constant current source I1 flowing through the drive line A1 causes the EL element E12 to emit light as shown in FIG. If the EL element E12 is not driven to emit light in the scanning at this time, the reset switch SR1 is turned on and the anode drive line A1 is connected to the ground, so that charging from other elements can be performed. Since all the current flows to the ground, the anode drive line A
1 has no voltage.

As described above, the above-described cathode reset method utilizes the parasitic capacitance of the EL element, which is originally an obstacle to driving, and the reverse bias voltage for preventing crosstalk emission, to sequentially turn on the EL element to be turned on next. It acts to instantaneously raise the directional voltage.

[0023]

By the way, in the case where the above-mentioned cathode reset method is used, the light emission rise of the EL element can be quickly performed by the above-described operation, but each EL element needs to be turned on every cathode scan. An operation for resetting the charge stored in the parasitic capacitance is involved. And
As shown in FIG. 8C, an operation is performed to apply a reverse bias voltage (VM) to the parasitic capacitance of the EL element to be driven next to light via the parasitic capacitance of another EL element.

For this reason, a charge current flows from the power supply circuit 5 for generating the reverse bias voltage (VM) to the parasitic capacitance of each EL element not to be scanned, and the parasitic capacitance of the next EL element to be driven to be lit. In contrast, a current obtained by adding these charge currents flows. Further, since the anode line which is turned off during scanning is grounded by the cathode reset circuit 4, the combined parasitic capacitance between the cathode and the ground is increased, and the charge current is also increased. Therefore, the peak values of these inrush currents may cause damage such as deterioration of the EL element, reduction in luminance, and generation of a leak current, resulting in a problem of shortening the life of the display panel. become.

The present invention has been made in view of the technical problem described above, and a driving apparatus for a capacitive light emitting element capable of solving the problem of causing deterioration of the light emitting element or lowering of luminance. It is intended to provide.

[0026]

In order to achieve the above-mentioned object, a driving apparatus for a capacitive light emitting device according to the present invention comprises connecting a capacitive light emitting device to each intersection of an anode line and a cathode line; By selectively connecting a driving source to a desired drive line while scanning the scan line at a predetermined period while using one of the line and the cathode line as a scan line and the other as a drive line, the light emitting elements can be selectively provided. A driving device for a capacitive light emitting element configured to perform light emission driving, wherein in a state in which one of the scanning lines is set to a reference potential and the light emitting element is driven to emit light, the scanning line is not scanned. A power supply circuit for applying a reverse bias to each light emitting element connected to the scanning line; and a peak of a charge current charged from the power supply circuit to a parasitic capacitance of each light emitting element immediately after the application of the reverse bias. Characterized in that the and a rush current limiting means for suppressing.

In a preferred embodiment,
Each of the scanning lines is provided with switching means for setting the scanning line to a reference potential in a scanning state and connecting the scanning line to the power supply circuit in a non-scanning state. The inrush current limiting means is connected between each of the switched means.

In this case, preferably, the inrush current limiting means is connected to an output terminal of the power supply circuit, and a current through the inrush current limiting means is introduced to each of the switching means. Also, a configuration in which inrush current limiting means is connected to each of the branch paths from the output terminal of the power supply circuit to each of the switching means can be suitably used.

In another preferred embodiment, each of the scanning lines is set to a reference potential in a scanning state, and each of the scanning lines is connected to the power supply circuit in a non-scanning state. Means are provided, between each of said switching means and each of said scanning lines,
Each is configured to be connected to inrush current limiting means.

According to the above-described driving device for the capacitive light emitting element, the peak of the current generated for charging the parasitic capacitance of each element every time the scanning is switched can be suppressed by the inrush current limiting means. The inrush current limiting means is connected to the output terminal of the power supply circuit, and the current flowing through the inrush current limiting means is configured to be introduced into each switching means arranged for each scanning line, thereby providing the inrush current limiting means. By providing one circuit configuration as the current limiting means, the above-described operation can be achieved.

Further, a configuration in which inrush current limiting means is disposed on each of the branch paths from the output terminal of the power supply circuit to each of the switching means, or an inrush current limiting means is provided between each switching means and each scanning line. Similar effects can be obtained in a connected configuration. In this configuration, it is necessary to prepare current limiting means corresponding to the number of scanning lines, but it is possible to use a current limiting means having a small current capacity.

[0032]

BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a perspective view of a driving device for a capacitive light emitting device according to the present invention. In the embodiment described below, an organic EL element is used as a capacitive light emitting element. In the embodiment described below, a cathode line scanning / anode line driving mode similar to that described with reference to FIG. 7 is employed, and a display panel 1, an anode line driving circuit 2, a cathode line scanning circuit 3, and a cathode reset The circuit 4 has the same configuration as that of FIG.

Therefore, in each of the drawings showing the first to third embodiments described below, some configurations of the display panel 1, the anode line drive circuit 2, and the cathode reset circuit 4 are omitted. Each component corresponding to the configuration shown in FIG. 7 is denoted by the same reference numeral.

In the first embodiment according to the present invention shown in FIG. 1, an inrush current limiting means 6 is connected to an output terminal of a power supply circuit 5 for providing a reverse bias voltage (VM). The current from the power supply circuit 5 via the limiting means 6 is supplied to each of the scanning switches SY1 to SY1 to
It is configured to be introduced into SYm. The state shown in FIG. 1 shows a scanning state in which the scanning switch SY1 is connected to the ground side. Therefore, the EL in which the cathode terminal is connected to the first cathode scanning line B1 corresponding to the scanning switch SY1 is shown.
The element E11 is turned on.

On the other hand, the scanning switches SY2 to SYm are respectively applied to the second to mth cathode scanning lines B2 to Bm in the non-scanning state.
, A reverse bias voltage (VM) is applied from the power supply circuit 5 to prevent the EL elements other than those driven for lighting from cross-lighting.

Here, in the case where the scanning of the first cathode scanning line B1 is completed and the second cathode scanning line B2 is scanned, as described with reference to FIG. The switches SY1 to SYm and the reset switch SR1 are momentarily connected to the ground, and the charges charged in the parasitic capacitance of each light emitting element are reset. Subsequently, as described with reference to FIG. 8C, the reset switch SR1 is turned off, only the second cathode scanning line B2 is connected to the ground, and the other cathode scanning lines are supplied with the reverse bias voltage. (VM) is applied.

At this time, the parasitic capacitance of each EL element whose cathode terminal is connected to each cathode scanning line other than the second cathode scanning line B2 is connected in parallel via the anode drive line A1. The parasitic capacitance of the EL element E12 whose cathode terminal is connected to the second cathode scanning line B2 is connected in series with the circuit. Then, the power supply circuit 5 is connected to the series-parallel circuit formed by the parasitic capacitances.

In this case, in the embodiment shown in FIG. 1, the inrush current limiting means 6 is connected to the output terminal of the power supply circuit 5 for providing the reverse bias voltage (VM) as described above. The current limiting means 6 acts to suppress the peak of the charge current flowing into each of the parasitic capacitances forming the series-parallel circuit.

Therefore, according to this configuration, the peak current for charging each of the parasitic capacitances constituting the series-parallel circuit causes deterioration of the EL element or reduction in luminance,
It is possible to effectively avoid a problem of causing damage such as generation of a leak current.

FIG. 2 shows a second embodiment according to the present invention. In the configuration shown in FIG. 2, inrush current limiting means 6-1 to 6-m are connected to branch paths from the output terminal of the power supply circuit 5 to each of the cathode scanning switches SY1 to SYm constituting the switching means. It is the structure which was done. Therefore, the inrush current limiting means
A number equivalent to the number of the cathode scanning switches is prepared corresponding to each of the cathode scanning switches SY1 to SYm.

According to this configuration, each peak of the charging current flowing from the power supply circuit 5 toward each of the cathode scanning switches SY1 to SYm is divided into inrush current limiting means 6-1 to 6 respectively.
Works to suppress with -m. Therefore, as each of the current limiting means 6-1 to 6-m, one having a small current capacity can be used. Also in the embodiment shown in FIG. 2, it is possible to suppress the peak of the current for charging each parasitic capacitance constituting the series-parallel circuit.

FIG. 3 shows a third embodiment according to the present invention. In the configuration shown in FIG. 3, each cathode scanning switch S
Inrush current limiting means 6-1 to 6-m are connected between Y1 to SYm and each of the cathode scanning lines B1 to Bm. Accordingly, the same number of the inrush current limiting means as the number of the cathode scanning lines is prepared corresponding to each of the cathode scanning lines B1 to Bm.

According to this configuration, each of the cathode scanning lines B1 to B1 is supplied from the power supply circuit 5 through each of the cathode scanning switches SY1 to SYm.
Each peak of the charging current divided and flowing toward m is suppressed by the inrush current limiting means 6-1 to 6-m. Therefore, also in this configuration, similarly to the configuration shown in FIG. 2, each of the current limiting means 6-1 to 6-m can be one having a small current capacity.
Also in the embodiment shown in FIG. 3, it is possible to suppress the peak of the current for charging each parasitic capacitance forming the series-parallel circuit.

FIG. 4 shows some examples of the inrush current limiting means used in each of the above embodiments. The arrows shown in each of the examples shown in FIGS. 4A to 4F indicate the direction of current flow. That is, the current flows from the left end to the right end in each example.

First, the example shown in (a) shows an example in which the rush current limiting means is constituted by the resistor R1, and this is the simplest configuration example as the rush current limiting means. According to this, the charge current which tries to flow into the parasitic capacitance from the power supply circuit 5 is suppressed by the resistor R1, and its peak value is controlled according to the resistance value of the resistor R1. (B)
In the example shown in FIG. 7, an L-type circuit is constituted by a resistor R1 and a capacitor C1. Also in this example, the charging current that is about to flow into the parasitic capacitance from the power supply circuit 5 is suppressed by the resistor R1, and the peak value and the charging time are determined by the resistor R1.
It is controlled according to the resistance value of 1 and the capacitance of the capacitor C1.

The example shown in (c) forms a T-type circuit including the resistors R1, R2 and the capacitor C1. Also in this example, the charging current that is about to flow into the parasitic capacitance from the power supply circuit 5 is suppressed by the resistors R1 and R2, and its peak value and charging time are determined according to the resistance values of the resistors R1 and R2 and the capacitance of the capacitor C1. Controlled.

The example shown in (d) shows an example in which the inrush current limiting means is constituted by the inductance L1, which is a relatively simple configuration example as the inrush current limiting means. According to this, the peak value and the charging time of the charging current to flow into the parasitic capacitance from the power supply circuit 5 are controlled by the inductance L1. Then, according to this example, it is possible to effectively suppress the current peak while reducing the influence of the voltage drop due to the pure resistance component.

Further, the example shown in (e) constitutes an L-type circuit by the inductance L1 and the capacitor C1, and the example shown in (f) shows the inductances L1 and L2.
And a capacitor C1 constitute a T-type circuit. Also in these configurations, it is possible to effectively suppress the current peak while reducing the influence of the voltage drop due to the pure resistance component. Note that the inrush current limiting means may be configured by appropriately combining the examples shown in (a) to (f) above.

[0049]

As is apparent from the above description, according to the capacitive light emitting element driving apparatus of the present invention, the charge current charged from the power supply circuit to the parasitic capacitance of each light emitting element at the time of scanning switching. Since the rush current limiting means for suppressing the peak is provided, it is possible to solve the problem of damage such as deterioration of each light emitting element, reduction of luminance, or generation of leak current.

[Brief description of the drawings]

FIG. 1 is a connection diagram showing a first embodiment of a driving device according to the present invention.

FIG. 2 is a connection diagram showing a second embodiment.

FIG. 3 is a connection diagram showing a third embodiment.

FIG. 4 is a connection diagram showing a preferred example of an inrush current limiting means used in the embodiment shown in FIGS. 1 to 3;

FIG. 5 is a diagram showing an equivalent circuit of the organic EL element.

FIG. 6 is a characteristic diagram showing various characteristics of the organic EL element.

FIG. 7 is a connection diagram showing a conventional light emission driving device using a simple matrix.

FIG. 8 is a connection diagram illustrating a cathode reset operation in the configuration shown in FIG. 7;

[Explanation of symbols]

 REFERENCE SIGNS LIST 1 display panel 2 anode line drive circuit 3 cathode line scan circuit 4 cathode line reset circuit 5 power supply circuit 6,6-1 to 6-m inrush current limiting means A1 to An anode (drive) line B1 to Bm cathode (scan) line C1 capacitor E11 to Enm Organic EL element (capacitive light emitting element) I1 to In Drive source (constant current source) R1, R2 Resistance SR1 to SRn Cathode reset switch SX1 to SXn Drive switch SY1 to SYn Scan switch

 ──────────────────────────────────────────────────続 き Continuing on the front page (72) Inventor Hiroshi Hemi 4-3-1467-1 Yawatawara, Yonezawa City, Yamagata Prefecture Inside the Yonezawa Plant of Tohoku Pioneer Co., Ltd. (72) Gen Suzuki 4-3146 Yawatahara Yonezawa City, Yamagata Prefecture 7 Tohoku Pioneer Co., Ltd. Yonezawa Plant (72) Inventor Takami Yasuku 4-36-1 Yawatahara, Yonezawa City, Yamagata Prefecture 7 Tohoku Pioneer Co., Ltd. Yonezawa Plant F term (reference) 5C080 AA06 BB05 DD03 DD10 DD18 JJ02 JJ03 JJ05

Claims (5)

[Claims] A capacitive light emitting element is connected to each intersection of an anode line and a cathode line, and one of the anode line and the cathode line is used as a scanning line and the other is used as a drive line, and the scanning line is scanned at a predetermined period. A driving source connected to a desired drive line, thereby selectively driving each of the light-emitting elements to emit light. A driving apparatus for a capacitive light-emitting element, comprising: In a state in which the light emitting elements are driven to emit light by setting the power supply circuit to apply a reverse bias to each light emitting element connected to the scanning line in a non-scanning state, and immediately after the application of the reverse bias, An inrush current limiting means for suppressing a peak of a charge current charged from the power supply circuit to a parasitic capacitance of each light emitting element. 2. Each of the scanning lines includes switching means for setting the scanning line to a reference potential in a scanning state and connecting the scanning line to the power supply circuit in a non-scanning state. 2. The driving device for a capacitive light emitting device according to claim 1, wherein said rush current limiting means is connected between each switching means arranged for each scanning line. 3. The power supply circuit according to claim 2, wherein said inrush current limiting means is connected to an output terminal of said power supply circuit, and a current passing through said inrush current limiting means is introduced into each of said switching means. A driving device for a capacitive light emitting element. 4. The driving device for a capacitive light emitting device according to claim 2, wherein inrush current limiting means is connected to each of the branch paths from the output terminal of the power supply circuit to each of the switching means. 5. Each of the scanning lines is provided with switching means for setting the scanning line to a reference potential in a scanning state and connecting the scanning line to the power supply circuit in a non-scanning state. 2. The driving device for a capacitive light emitting device according to claim 1, wherein an inrush current limiting means is connected between the scanning line and each of the scanning lines.