JP2002235943A - Clean space structure - Google Patents

Clean space structure

Info

Publication number
JP2002235943A
JP2002235943A JP2001030502A JP2001030502A JP2002235943A JP 2002235943 A JP2002235943 A JP 2002235943A JP 2001030502 A JP2001030502 A JP 2001030502A JP 2001030502 A JP2001030502 A JP 2001030502A JP 2002235943 A JP2002235943 A JP 2002235943A
Authority
JP
Japan
Prior art keywords
clean space
clean
space structure
panel
air
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2001030502A
Other languages
Japanese (ja)
Inventor
Tetsunori Otaguro
徹典 大田黒
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hirata Corp
Original Assignee
Hirata Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hirata Corp filed Critical Hirata Corp
Priority to JP2001030502A priority Critical patent/JP2002235943A/en
Publication of JP2002235943A publication Critical patent/JP2002235943A/en
Withdrawn legal-status Critical Current

Links

Landscapes

  • Ventilation (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide structure to prevent disturbance of an air flow of purified air, flowing in from an upper part and, since, compared with conventional clean space equipment, no uneven part and no groove are formed, to obtain the high degree of cleanness since an element to accumulate dust is eliminated, and to provide structure to improve the degree of purification in clean space equipment. SOLUTION: In a clean space structure used in a semiconductor substrate and liquid crystal substrate manufacturing equipment to feed clean air from an upper part in an internal part and discharge it to below, four sides to surround an internal part join together panel-form plates having neither column nor beam for constitution and a joint between the panel-form plates is not protruded to an internal part. This constitution eliminates a factor to cause disturbance of clean air and accumulation of particles and enables provision of a higher clean space.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は半導体基板や液晶基
板等の高い清浄環境での生産に用いる屋内設置の清浄空
間構造体に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a clean space structure installed indoors used for production of a semiconductor substrate, a liquid crystal substrate, and the like in a high clean environment.

【0002】[0002]

【従来の技術】半導体基板や液晶基板等の製造において
コスト削減を目的として近年ミニエンバイロメント方式
が採用されている。大型のクリーンルームを維持する経
費は莫大であるためウエハ等の製品をFOUPやPOD
で搬送し、基板処理は小型のクリーンルームとしての清
浄空間構造体内で行なう方式である。従来の清浄空間構
造体の構造は、図1に示すようにクリーンルームと同
様、骨組みとなる構造補強部材110にパネル状の板材
111(壁材)を貼り付けて空間をつくり、上方から清
浄空気を送り込み下方から排気を行なう構造になってい
る。骨組みとなる構造補強部材110を床面から垂直に
設けただけでは強度が不十分である場合は、これらの間
に床面と水平になるように別の構造補強部材112を組
み込むこともあった。一般的にこれら清浄空間構造体は
前記構造補強部材で骨組みをつくり外周にパネル状板材
を貼り付けて構成されているため内部は構造補強部材が
むき出しとなり隙間や凹凸がある空間となっていた。
2. Description of the Related Art In the manufacture of semiconductor substrates, liquid crystal substrates and the like, mini-environment systems have recently been adopted for the purpose of cost reduction. Since the cost of maintaining a large clean room is enormous, products such as wafers must be
The substrate processing is performed in a clean space structure as a small clean room. As shown in FIG. 1, the structure of a conventional clean space structure is similar to that of a clean room, in which a panel-like plate member 111 (wall material) is attached to a structural reinforcing member 110 serving as a frame to create a space, and clean air is supplied from above. It is structured to exhaust air from below the feed. If the strength is not sufficient simply by providing the structural reinforcing member 110 as a skeleton vertically from the floor, another structural reinforcing member 112 may be incorporated between them so as to be horizontal with the floor. . In general, these clean space structures are formed by forming a frame with the structural reinforcing member and attaching a panel-like plate material to the outer periphery, so that the structural reinforcing member is exposed inside, so that there is a space having gaps and irregularities.

【0003】[0003]

【発明が解決しようとする課題】前記清浄空間構造体の
中に上方から清浄空気を送り込むと、構造補強部材の凹
凸により空気のダウンフロー方向の断面変化が避けられ
ず気流の乱れや速度変化を起こし塵埃発生を誘起してい
た。そのため清浄空間構造体内に塵埃が発生した場合、
上方から送込まれる清浄空気とともに速やかに下方に落
ちること無く、乱流によりいつまでも清浄空間構造体内
を浮遊していた。また、構造補強部材の水平面上又は略
水平面上や構造補強部材とパネル状板材の間の接着部分
にある隙間に塵埃の堆積の可能性が高い構造をしてお
り、塵埃が堆積したまま床へと落ちることなく、常に塵
埃が清浄空間構造体内に存在することになる。これらの
事情により清浄空間の確保上は改善の余地のある構造で
あった。
When clean air is sent from above into the clean space structure, a change in the cross section in the downflow direction of the air is unavoidable due to the unevenness of the structural reinforcing member, and the turbulence and speed change of the air flow are reduced. This caused the generation of dust. Therefore, if dust is generated inside the clean space structure,
Without falling quickly downward together with the clean air sent from above, it was floating in the clean space structure forever due to turbulence. In addition, there is a structure with a high possibility of dust accumulation on the horizontal plane or substantially horizontal plane of the structural reinforcing member or in the gap between the structural reinforcing member and the panel-like plate material. Dust will always be present in the clean space structure without falling off. Due to these circumstances, there was room for improvement in securing a clean space.

【0004】[0004]

【課題を解決するための手段と効果】清浄空間構造体の
内部に停滞する塵埃を最小限にとどめるため本発明は清
浄空間構造体の構造に着目し、内部空間に凹凸や隙間を
少なくするため骨組みとなる構造補強部材は一切使わず
パネル状板材のみで構成された清浄空間構造体を提供す
る。
SUMMARY OF THE INVENTION The present invention focuses on the structure of a clean space structure and minimizes irregularities and gaps in the internal space in order to minimize dust stagnating inside the clean space structure. Provided is a clean space structure composed only of panel-shaped plate members without using any structural reinforcing member as a frame.

【0005】請求項1に記載のように柱や梁を一切使用
せず、パネル状板材のみで構成すると清浄空間構造体内
に凹凸が無くなり、また柱・梁とパネルの接合部分に出
来る隙間が無くなる。凹凸が無くなると上方からの清浄
空気の流れを妨げる障害がなくなるため該清浄空間構造
体内の気流の乱れが起こらず、清浄空気がスムーズに上
から下へ流れていくことになる。従って清浄空間構造体
内の塵埃が乱流によりいつまでも浮遊することがなく上
方からの空気とともに速やかに外部へ排出され、常に清
浄な空間が保てることになる。また、梁とパネル状板材
の接合によってできる隙間や梁の水平面上及び略水平面
上には塵埃が堆積しやすかったが、パネル状板材同士の
接合面は床に対し垂直であり、塵埃堆積が起こる要因が
減少される。
[0005] As described in the first aspect, if no pillars or beams are used at all, and only the panel-shaped plate material is used, there is no unevenness in the clean space structure, and no gap is formed at the joint between the pillars / beams and the panel. . When the unevenness is eliminated, there is no obstacle that obstructs the flow of the clean air from above, so that the turbulence of the air flow in the clean space structure does not occur, and the clean air flows smoothly from top to bottom. Therefore, the dust in the clean space structure does not float indefinitely due to the turbulent flow and is quickly discharged to the outside together with the air from above, so that a clean space can be always maintained. In addition, dust easily accumulates on gaps formed by joining the beam and the panel-like plate material and on the horizontal plane and substantially the horizontal plane of the beam, but the joint surface between the panel-like plate members is perpendicular to the floor, and dust accumulation occurs Factors are reduced.

【0006】パネル状板材同士の接合方法はいろいろあ
るが請求項2に記載のようにパネル状板材の接合部を清
浄空間構造体内部ではなく外部に設けることで該清浄空
間構造体内部の凹凸が無くなり、パネル状板材のみで構
成されていても接合部が柱の代わりとなり従来の構造に
比べ強度はほぼ変わらず、はるかに清浄な空間を創るこ
とが可能となる。
Although there are various methods for joining the panel-shaped plate members to each other, the unevenness inside the clean space structure can be reduced by providing the joint portion of the panel-shaped plate members outside the inside of the clean space structure instead of inside the clean space structure. Even if it is composed only of the panel-shaped plate material, the joints can be replaced with pillars, and the strength is almost unchanged as compared with the conventional structure, so that a much cleaner space can be created.

【0007】[0007]

【実施例】好適な実施例をFOUPオープナのドア開閉
に伴う塵埃発生度合いを調べる評価機として使用する形
態を図2、3をもとに以下に説明する。FOUPオープ
ナ17はFOUP15を載せる設置台10、FOUPド
ア18と一体になって開閉を行なう開閉扉16、前記設
置台10の下に前記開閉扉16の動作を行なう開閉機構
21がある。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment in which the preferred embodiment is used as an evaluator for checking the degree of dust generation due to opening and closing of a door of a FOUP opener will be described below with reference to FIGS. The FOUP opener 17 includes an installation table 10 on which the FOUP 15 is mounted, an opening / closing door 16 that opens and closes integrally with the FOUP door 18, and an opening / closing mechanism 21 that operates the opening / closing door 16 below the installation table 10.

【0008】評価機1の壁は略コ字型のアルミ製パネル
11aと11bを図6に示すように2枚組み合せ、ボル
ト9で締結する。略コ字型のパネル状板材を2枚向かい
合わせに組合わせると柱が無くとも強度的には問題無
く、内部には凹凸の無い中空の直方体が出来上がる。締
結に際しボルト9の挿入は評価機1の外側から行ない、
評価機1内部にはボルト9が露出しないようにする。こ
れも評価機1内に塵埃が堆積するような凹凸をつくらな
いようにするためである。本実施例ではアルミ製パネル
を使用するが、材質については鋼、アルミ、樹脂等清浄
空間構造体に使用するに際し適している材質であれば特
に問わない。評価機1は側壁四面中の一面に下端より切
り欠き部23を形成している。切り欠き部23の幅はF
OUPオープナ17の開閉扉16の幅に合わせて作成し
てある。
As shown in FIG. 6, the wall of the evaluation machine 1 is formed by combining two substantially U-shaped aluminum panels 11 a and 11 b and fastening them with bolts 9. When two substantially U-shaped panel-shaped plate members are combined face-to-face, there is no problem in strength even without columns, and a hollow rectangular parallelepiped with no unevenness inside is completed. At the time of fastening, the bolt 9 is inserted from the outside of the evaluation machine 1,
The bolt 9 is not exposed inside the evaluation machine 1. This is also to prevent unevenness such that dust accumulates in the evaluation device 1. Although an aluminum panel is used in this embodiment, the material is not particularly limited as long as it is a material suitable for use in a clean space structure such as steel, aluminum, and resin. The evaluation machine 1 has a cutout 23 formed on one of the four side walls from the lower end. The width of the notch 23 is F
It is created according to the width of the opening / closing door 16 of the OUP opener 17.

【0009】前記FOUPオープナ17と前記評価機1
は離脱可能に構成されており、使用においてはFOUP
オープナ17の開閉扉16の上側面16aと評価機1の
切欠き部23の上側面23aを密着させる。前記評価機
1の上部は塵埃除去のためのフィルタ13で覆われ、その
上に外部からの空気をファンで評価機1内に送り込む送
風装置14を設置する。ここでは外部からのエアを取り込
むためファンが付いた送風装置を設置したが、清浄空間
構造体の上部構造は清浄空気を送り込むダクトを備えた
り、クリーンルーム内で使用する場合はクリーンルーム
上部から流れ込む空気を清浄空間構造体内へ取り込むた
め単にフィルターで覆うのみでもよい。評価機1内に取
り込まれた清浄空気は図3の矢印で示すように床と評価
機1の間にできた隙間12から排出される。前記評価機
1の下には評価機内部の空気を取り込むように吸気ホー
ス19が床との隙間12から差し込まれており、吸気ホ
ース19で取り込んだ空気はパーティクルカウンター2
0へと送られる。前記評価機1の下部構造は四隅に車輪
8がついたブラケット7が評価機1の外部からボルト6
で固定されている。この場合も前記評価機1内部に凹凸
をつくらないようにボルト6を評価機1の内部に露出し
ない設計にする。前記ブラケット7の他端にはアジャス
タボルト5が連結されており、前記アジャスタボルト5
のナット4を回転させるとナット4に固着されたねじ切
シャフト3が回転し評価機1の高さ調整が可能となる。
ねじ切シャフト3には据付座2が取付けられており、評
価機1を安定して設置することが可能である。前記評価
機1を移動させたい場合は各車輪8が床に接し据付座2
が床から離れる位置までナット4を回し、評価機1を移
動させる。設置場所が決まったら、四隅の車輪8が床か
ら離れる高さまで各ナット4を回し、据付座2を床に密
着させ設置する。また、評価機1は高さが調整可能であ
るため評価対象とする同規格サイズの他種FOUPオー
プナに対しても容易に対応できる。
[0009] The FOUP opener 17 and the evaluator 1
Is configured to be detachable. In use, FOUP
The upper surface 16a of the opening / closing door 16 of the opener 17 and the upper surface 23a of the notch 23 of the evaluation machine 1 are brought into close contact with each other. The upper part of the evaluator 1 is covered with a filter 13 for removing dust, and an air blower 14 for sending air from the outside into the evaluator 1 by a fan is installed thereon. Here, a blower with a fan was installed to take in air from the outside. The filter may be simply covered with a filter to be taken into the clean space structure. The clean air taken into the evaluation device 1 is discharged from a gap 12 formed between the floor and the evaluation device 1 as shown by an arrow in FIG. Under the evaluator 1, an intake hose 19 is inserted from the gap 12 with the floor so as to take in the air inside the evaluator.
Sent to 0. The lower structure of the evaluator 1 is such that a bracket 7 having wheels 8 at four corners is provided with bolts 6 from outside the evaluator 1.
It is fixed at. Also in this case, the bolts 6 are designed so as not to be exposed inside the evaluator 1 so as not to form irregularities inside the evaluator 1. An adjuster bolt 5 is connected to the other end of the bracket 7.
When the nut 4 is rotated, the threaded shaft 3 fixed to the nut 4 rotates, and the height of the evaluator 1 can be adjusted.
The installation seat 2 is attached to the threaded shaft 3, and the evaluation machine 1 can be stably installed. When it is desired to move the evaluator 1, each wheel 8 is in contact with the floor and
Turns the nut 4 to a position where it is separated from the floor, and moves the evaluator 1. When the installation location is determined, the nuts 4 are turned to a height at which the wheels 8 at the four corners are separated from the floor, and the installation seat 2 is placed in close contact with the floor. Further, since the height of the evaluator 1 is adjustable, it can easily cope with other types of FOUP openers of the same standard size to be evaluated.

【0010】清浄空間構造体の下部構成についてはクリ
ーンルームで使用し、床に排気用の穴のあいたパンチン
グメタルを敷いてある場合は排気用の床との隙間は必要
無いので本実施例のように高さ調整機構を付加せず、床
に直接置いてもよい。
[0010] The lower structure of the clean space structure is used in a clean room, and when a perforated metal with holes for exhaust is laid on the floor, there is no need for a gap with the floor for exhaust. It may be placed directly on the floor without adding a height adjustment mechanism.

【0011】次にFOUPオープナ17の開閉動作と開
閉動作に伴う塵埃発生を測定する手順を説明する。FO
UPオープナ17の設置台10にFOUP15のFOU
Pドア18が開閉扉16に向いて接触するように載せ
る。その後、開閉作動スイッチ(記載省略)を操作する
とFOUPドア18の施錠は解除され、開閉扉16がF
OUPドア18を吸着し一体となって下降する。再び前
記開閉作動スイッチを操作するとFOUPドア18及び
開閉扉16は上昇し、FOUPドア18はFOUP15
のボックス23に嵌め込まれ施錠をされる。施錠後、開
閉扉16はFOUPドア18から離脱可能となりFOU
Pドア18の開閉動作は完了する。
Next, a description will be given of the opening and closing operation of the FOUP opener 17 and a procedure for measuring the generation of dust accompanying the opening and closing operation. FO
The FOU of the FOUP 15 is set on the installation table 10 of the UP opener 17.
The P door 18 is placed so as to be in contact with the opening / closing door 16. Thereafter, when an open / close operation switch (not shown) is operated, the lock of the FOUP door 18 is released, and the open / close door 16 is
The OUP door 18 is sucked and lowered integrally. When the open / close operation switch is operated again, the FOUP door 18 and the open / close door 16 are raised, and the FOUP door 18 is moved to the FOUP 15.
And is locked. After locking, the opening / closing door 16 can be released from the FOUP door 18 so that the FOU
The opening / closing operation of the P door 18 is completed.

【0012】FOUPオープナ17の評価機1はFOU
Pドア18の開閉動作にともない、どのくらいの塵埃が
発生するかを測定することを目的としている。そのため
FOUPオープナ17の開閉機構21を囲むように狭い
清浄空間をつくり、開閉動作中または開閉動作が済んだ
直後に前記清浄空間内部のエアを吸気ホース19で取込
みパーティクルカウンター20で測定する。従って、前
回の使用で発生した塵埃が評価機1内に停滞してしまえ
ば1回の開閉動作で発生する塵埃がどのくらいあるのか
正確な測定ができなくなってしまう。従来のような清浄
空間構造体であれば、以前から該清浄空間構造体内に停
滞していた塵埃も測定してしまうためFOUPオープナ
の発塵評価としては信頼性に乏しかった。本発明のよう
な清浄空間構造体内が凹凸の無い構造であれば上方から
の清浄空気は気流を乱すこと無くダウンフローするため
塵埃は清浄空気とともに速やかに外部へ排出され、ま
た、塵埃が堆積しやすい平面が無いので常に清浄な空間
を得ることが可能でありパーティクルカウンターの測定
値は信頼性の高いものとなる。
The evaluation machine 1 of the FOUP opener 17 is FOU
The purpose is to measure how much dust is generated with the opening and closing operation of the P door 18. Therefore, a narrow clean space is formed so as to surround the opening / closing mechanism 21 of the FOUP opener 17, and the air inside the clean space is taken in by the intake hose 19 and measured by the particle counter 20 during or immediately after the opening / closing operation is completed. Therefore, if the dust generated in the previous use stays in the evaluation device 1, it becomes impossible to accurately measure how much dust is generated by one opening / closing operation. In the case of a conventional clean space structure, dust that has been stagnant in the clean space structure for a long time is also measured, so that the reliability of the FOUP opener for dust generation evaluation was poor. If the inside of the clean space structure has no irregularities as in the present invention, the clean air from above flows down without disturbing the airflow, so that the dust is quickly discharged to the outside together with the clean air, and the dust is accumulated. Since there is no easy plane, a clean space can always be obtained, and the measured value of the particle counter is highly reliable.

【0013】他の実施形態を以下に説明する。前記実施
例とは異なる形状の略L字型のパネル状板材を2枚組合
わせた清浄空間構造体を図4に示す。比較的、小さな清
浄空間構造体はパネル状板材を2枚接合したのみでも十
分な強度は得られるが、多少、広めの清浄空間構造体を
つくる場合は2枚のパネル状板材の接合では十分な強度
が得られないため、図5に示すように複数枚のパネル状
板材を貼り合わせていく。パネル状板材同士の接合部分
は清浄空間構造体外部で締結し、接合部分が内部に張り
出さない構造とした。これにより清浄空間構造体内部に
は凹凸が無くなり、上方からの清浄空気の気流を乱すこ
となく、塵埃が堆積する要因が無くなる。パネルの接合
方法は特に問わないが、いずれの場合も前記実施例のよ
うにボルト締結でもよいし、図7のようにジョイント材
22を使用し締結してもよい。また、この場合も前記実
施例と同様、清浄空間構造体の上部はフィルタや清浄空
気送風装置を設置し、下部は上方からの空気が排出され
る隙間がある構造を有していれば、特に限定しない。
Another embodiment will be described below. FIG. 4 shows a clean space structure in which two substantially L-shaped panel-shaped plate members having different shapes from those of the above embodiment are combined. For a relatively small clean space structure, sufficient strength can be obtained only by bonding two panel-shaped plate members, but when a slightly wider clean space structure is to be made, it is sufficient to bond two panel-shaped plate members. Since strength cannot be obtained, a plurality of panel-like plate members are bonded together as shown in FIG. The joints between the panel-shaped plate members were fastened outside the clean space structure, and the joints did not protrude inside. As a result, there is no unevenness inside the clean space structure, and the factor of dust accumulation is eliminated without disturbing the air flow of clean air from above. The method of joining the panels is not particularly limited, but in any case, bolt fastening may be used as in the above-described embodiment, or fastening may be performed using a joint material 22 as shown in FIG. Also, in this case, similarly to the above embodiment, if the upper part of the clean space structure is provided with a filter or a clean air blower, and the lower part has a structure having a space through which air is discharged from above, particularly, Not limited.

【0014】[0014]

【発明の効果】従来の清浄空間設備と比較すると内部に
凹凸や溝がないため、上部から流れ込む清浄空気の気流
を妨げることなく、また、塵埃が堆積する要素がなくな
ったため高いクリーン度が得られるようになった。
As compared with the conventional clean space equipment, there is no unevenness or grooves inside, so that the clean air flowing from above is not obstructed, and a high degree of cleanliness can be obtained because there is no dust accumulation element. It became so.

【図面の簡単な説明】[Brief description of the drawings]

【図1】従来技術を示す斜視図FIG. 1 is a perspective view showing a conventional technique.

【図2】第一の実施例である評価機の構造を示す外観図FIG. 2 is an external view showing the structure of an evaluator according to the first embodiment.

【図3】FOUPオープナの評価機として使用する際の
断面図
FIG. 3 is a cross-sectional view when used as an evaluation device for a FOUP opener.

【図4】他の実施例を示す斜視図FIG. 4 is a perspective view showing another embodiment.

【図5】他の実施例を示す斜視図FIG. 5 is a perspective view showing another embodiment.

【図6】評価機の平面断面図FIG. 6 is a cross-sectional plan view of the evaluation machine.

【図7】パネル状板材同士を接合する方法を示す斜視図FIG. 7 is a perspective view showing a method of joining panel-shaped plate members to each other.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 上方より清浄空気が内部へ供給され下方
へ排出される半導体基板及び液晶基板製造設備に使用さ
れる清浄空間構造体において、内部を囲む四側面が柱や
梁の無いパネル状板材を接合して構成したことを特徴と
する清浄空間構造体。
1. A clean space structure used for a semiconductor substrate and a liquid crystal substrate manufacturing facility in which clean air is supplied from the upper side to the inside and discharged to the lower side, and a panel-like plate member having four sides surrounding the inside without pillars or beams. A clean space structure characterized by being constructed by joining together.
【請求項2】 前記パネル状板材の接合部分が内部に張
り出さないことを特徴とした請求項1に記載の清浄空間
構造体。
2. The clean space structure according to claim 1, wherein a joint portion of the panel-shaped plate member does not protrude inside.
JP2001030502A 2001-02-07 2001-02-07 Clean space structure Withdrawn JP2002235943A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001030502A JP2002235943A (en) 2001-02-07 2001-02-07 Clean space structure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001030502A JP2002235943A (en) 2001-02-07 2001-02-07 Clean space structure

Publications (1)

Publication Number Publication Date
JP2002235943A true JP2002235943A (en) 2002-08-23

Family

ID=18894713

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001030502A Withdrawn JP2002235943A (en) 2001-02-07 2001-02-07 Clean space structure

Country Status (1)

Country Link
JP (1) JP2002235943A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005031822A1 (en) * 2003-09-29 2005-04-07 Nikon Corporation Working chamber, maintenance method, exposure apparatus, and environment chamber
JP2016010793A (en) * 2014-06-04 2016-01-21 ニッタ株式会社 Air cleaning device
KR20190083367A (en) * 2016-12-02 2019-07-11 어플라이드 머티어리얼스, 인코포레이티드 Advanced in situ particle detection system for semiconductor substrate processing systems

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005031822A1 (en) * 2003-09-29 2005-04-07 Nikon Corporation Working chamber, maintenance method, exposure apparatus, and environment chamber
JP2016010793A (en) * 2014-06-04 2016-01-21 ニッタ株式会社 Air cleaning device
KR20190083367A (en) * 2016-12-02 2019-07-11 어플라이드 머티어리얼스, 인코포레이티드 Advanced in situ particle detection system for semiconductor substrate processing systems
JP2020513692A (en) * 2016-12-02 2020-05-14 アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated Advanced in situ particle detection system for semiconductor substrate processing system
US10883932B2 (en) 2016-12-02 2021-01-05 Applied Materials, Inc. Advanced in-situ particle detection system for semiconductor substrate processing systems
KR102440197B1 (en) * 2016-12-02 2022-09-02 어플라이드 머티어리얼스, 인코포레이티드 Advanced In-Situ Particle Detection System for Semiconductor Substrate Processing Systems

Similar Documents

Publication Publication Date Title
US7988122B2 (en) Vibration control pedestal and installation method thereof
US4667579A (en) Cleanroom structure
US5125203A (en) Floating connector system between ceiling and wall structure
JP2002235943A (en) Clean space structure
JPH07166728A (en) Clean room wall system
WO2003009348A2 (en) Facilities connection bucket for pre/facilitation of wafer fabrication equipment
KR101977904B1 (en) rail guide support apparatus for transport robot
KR200268196Y1 (en) A supporting block unit for mounting floor panels of clean room
JP4602795B2 (en) Clean booth
KR20080022898A (en) Floor system of clean room
JP3261705B2 (en) Simple clean room
JP6346473B2 (en) Support structure for outer panel
JP3513670B2 (en) Fasteners for connecting building panels
KR200413668Y1 (en) inner panel assembly of clean room elevator
JPH0114838Y2 (en)
JPH05156444A (en) Structure for installation of device in clean room
WO2003079412A2 (en) Facilities connection bucket for pre-facilitation of wafer fabrication equipment
JP3060263U (en) Spinner cover device in semiconductor manufacturing equipment
JPH0522748Y2 (en)
JP2835595B2 (en) Partition support and wall mounting leg
JP2001020549A (en) Semiconductor manufacturing factory
JPH10332171A (en) Drain pan fixing device of air conditioner
JPS6313315Y2 (en)
JPH06240783A (en) Air permeable wall panel
JPH1030289A (en) Magnetic shield unit wall

Legal Events

Date Code Title Description
A300 Withdrawal of application because of no request for examination

Free format text: JAPANESE INTERMEDIATE CODE: A300

Effective date: 20080513