JP2002212129A5 - - Google Patents
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- JP2002212129A5 JP2002212129A5 JP2001004625A JP2001004625A JP2002212129A5 JP 2002212129 A5 JP2002212129 A5 JP 2002212129A5 JP 2001004625 A JP2001004625 A JP 2001004625A JP 2001004625 A JP2001004625 A JP 2001004625A JP 2002212129 A5 JP2002212129 A5 JP 2002212129A5
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- JP
- Japan
- Prior art keywords
- thin film
- chelate complex
- metal chelate
- represented
- dimethyl
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Description
【特許請求の範囲】
【請求項1】 次の式(1)に示される金属キレート錯体。
【化1】
但し、MはPb2+、Zr4+、La3+、Ba2+、Sr2+又はCa2+で表される金属イオンであり、xは金属イオンMの価数であり、dmhdは次の式(2)で表される2,6−ジメチル−3,5−ヘプタンジオン残基である。
【化2】
【請求項2】 鉛化合物、ジルコニウムブトキシド、ランタン化合物、バリウム、ストロンチウム又はカルシウムを有機溶媒に溶解した後、2,6−ジメチル−3,5−ヘプタンジオンを加えて、加熱還流することを特徴とする金属キレート錯体の合成方法。
【請求項3】
請求項1記載の金属キレート錯体又は請求項2記載の方法により合成した金属キレート錯体を用いて、有機金属化学蒸着法により誘電体薄膜を作製することを特徴とする誘電体薄膜の製造方法。
【請求項4】
作製する誘電体薄膜がチタン酸鉛薄膜、チタン酸ジリコン酸鉛薄膜、チタン酸ジリコン酸ランタン鉛薄膜、チタン酸ストロンチウム薄膜、チタン酸バリウム薄膜又はチタン酸バリウムストロンチウム薄膜である請求項3記載の製造方法。
[Claims]
1. A metal chelate complex represented by the following formula (1).
Embedded image
However, M is Pb 2+, Zr 4+, La 3+ , Ba 2+, a metal ion represented by Sr 2+ or Ca 2+, x is the valence of the metal ion M, dmhd the following 2,6-dimethyl-3,5-heptanedione residue represented by the formula (2).
Embedded image
2. A method comprising dissolving a lead compound, zirconium butoxide, a lanthanum compound, barium, strontium or calcium in an organic solvent, adding 2,6-dimethyl-3,5-heptanedione and heating under reflux. Of synthesizing a metal chelate complex.
(3)
A method for producing a dielectric thin film, comprising using the metal chelate complex according to claim 1 or the metal chelate complex synthesized according to the method according to claim 2 to form a dielectric thin film by an organometallic chemical vapor deposition method.
(4)
The method according to claim 3, wherein the dielectric thin film to be produced is a lead titanate thin film, a lead zirconate titanate thin film, a lanthanum lead titanate titanate thin film, a strontium titanate thin film, a barium titanate thin film or a barium strontium titanate thin film. .
請求項2に係る発明は、鉛化合物、ジルコニウムブトキシド、ランタン化合物、バリウム、ストロンチウム又はカルシウムを有機溶媒に溶解した後、2,6−ジメチル−3,5−ヘプタンジオンを加えて、加熱還流することを特徴とする金属キレート錯体の合成方法である。
請求項3に係る発明は、請求項1記載の金属キレート錯体又は請求項2記載の方法により合成した金属キレート錯体を用いて、有機金属化学蒸着法により誘電体薄膜を作製することを特徴とする誘電体薄膜の製造方法である。
請求項4に係る発明は、請求項3に係る発明であって、作製する誘電体薄膜がPT薄膜、PZT薄膜、PLZT薄膜、ST薄膜、BT薄膜又はBST薄膜である製造方法である。
The invention according to claim 2 is that, after dissolving a lead compound, zirconium butoxide, a lanthanum compound, barium, strontium or calcium in an organic solvent, 2,6-dimethyl-3,5-heptanedione is added, and the mixture is heated to reflux. A method for synthesizing a metal chelate complex.
The invention according to claim 3 is characterized in that a dielectric thin film is produced by a metal organic chemical vapor deposition method using the metal chelate complex according to claim 1 or the metal chelate complex synthesized by the method according to claim 2. This is a method for manufacturing a dielectric thin film.
The invention according to claim 4 is the manufacturing method according to claim 3, wherein the dielectric thin film to be manufactured is a PT thin film, a PZT thin film, a PLZT thin film, an ST thin film, a BT thin film or a BST thin film.
Claims (3)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001004625A JP2002212129A (en) | 2001-01-12 | 2001-01-12 | Metal chelate complex and method for synthesizing the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001004625A JP2002212129A (en) | 2001-01-12 | 2001-01-12 | Metal chelate complex and method for synthesizing the same |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2002212129A JP2002212129A (en) | 2002-07-31 |
JP2002212129A5 true JP2002212129A5 (en) | 2006-04-20 |
Family
ID=18872784
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2001004625A Pending JP2002212129A (en) | 2001-01-12 | 2001-01-12 | Metal chelate complex and method for synthesizing the same |
Country Status (1)
Country | Link |
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JP (1) | JP2002212129A (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004066388A1 (en) * | 2003-01-17 | 2004-08-05 | Fujitsu Limited | Ferroelectric capacitor and method for fabricating the same |
JP4313797B2 (en) * | 2003-06-06 | 2009-08-12 | 富士通マイクロエレクトロニクス株式会社 | Manufacturing method of semiconductor device |
KR100725081B1 (en) * | 2005-06-14 | 2007-06-08 | 후지쯔 가부시끼가이샤 | Method for fabricating semiconductor device |
JP2009129965A (en) * | 2007-11-20 | 2009-06-11 | Fujitsu Microelectronics Ltd | Film formation method and method for manufacturing semiconductor device |
JP2010258046A (en) * | 2009-04-21 | 2010-11-11 | Ulvac Japan Ltd | Method for forming pzt thin film, and method for manufacturing semiconductor device |
-
2001
- 2001-01-12 JP JP2001004625A patent/JP2002212129A/en active Pending
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