JP2002148212A5 - - Google Patents
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- JP2002148212A5 JP2002148212A5 JP2000343175A JP2000343175A JP2002148212A5 JP 2002148212 A5 JP2002148212 A5 JP 2002148212A5 JP 2000343175 A JP2000343175 A JP 2000343175A JP 2000343175 A JP2000343175 A JP 2000343175A JP 2002148212 A5 JP2002148212 A5 JP 2002148212A5
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- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000343175A JP3839658B2 (ja) | 2000-11-10 | 2000-11-10 | Ｘ線検査装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000343175A JP3839658B2 (ja) | 2000-11-10 | 2000-11-10 | Ｘ線検査装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2002148212A JP2002148212A (ja) | 2002-05-22 |
| JP2002148212A5 true JP2002148212A5 (cs) | 2006-06-29 |
| JP3839658B2 JP3839658B2 (ja) | 2006-11-01 |
Family
ID=18817582
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000343175A Expired - Fee Related JP3839658B2 (ja) | 2000-11-10 | 2000-11-10 | Ｘ線検査装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3839658B2 (cs) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1906480B (zh) * | 2004-06-24 | 2012-08-08 | 株式会社石田 | X射线检查装置和x射线检查装置的图像处理顺序的生成方法 |
| JP4519789B2 (ja) * | 2006-03-01 | 2010-08-04 | アンリツ産機システム株式会社 | Ｘ線検査装置 |
| JP4444240B2 (ja) * | 2006-06-15 | 2010-03-31 | アンリツ産機システム株式会社 | Ｘ線異物検出装置 |
| JP5156546B2 (ja) * | 2008-08-28 | 2013-03-06 | 株式会社イシダ | Ｘ線検査装置 |
| KR101321378B1 (ko) * | 2013-04-10 | 2013-10-23 | (주)자비스 | 컨베이어를 이용한 모바일 기기 엑스레이검사 방법 |
| JP6757970B2 (ja) * | 2016-09-20 | 2020-09-23 | 株式会社イシダ | 光検査装置及び光検査方法 |
| JP6655570B2 (ja) * | 2017-03-07 | 2020-02-26 | アンリツインフィビス株式会社 | 物品検査装置およびその検査対象品種切替方法 |
| JP7499097B2 (ja) | 2019-12-20 | 2024-06-13 | 株式会社エー・アンド・デイ | Ｘ線検査方法および装置 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1998011456A1 (en) * | 1996-09-12 | 1998-03-19 | Anritsu Corporation | Apparatus for detecting foreign matter with high selectivity and high sensitivity by image processing |
| JP2000135268A (ja) * | 1998-08-26 | 2000-05-16 | Yuyama Seisakusho:Kk | 錠剤検査装置 |
| JP3339431B2 (ja) * | 1998-11-11 | 2002-10-28 | 株式会社日立製作所 | 制御対象モデル構築方法および制御対象応答範囲表示方法、ならびにそのシステム |
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2000
- 2000-11-10 JP JP2000343175A patent/JP3839658B2/ja not_active Expired - Fee Related