JP2002082170A - Ionization chamber type radiation detection device and ionization chamber inspecting method - Google Patents

Ionization chamber type radiation detection device and ionization chamber inspecting method

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Publication number
JP2002082170A
JP2002082170A JP2000272102A JP2000272102A JP2002082170A JP 2002082170 A JP2002082170 A JP 2002082170A JP 2000272102 A JP2000272102 A JP 2000272102A JP 2000272102 A JP2000272102 A JP 2000272102A JP 2002082170 A JP2002082170 A JP 2002082170A
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JP
Japan
Prior art keywords
ionization chamber
voltage
dose rate
radiation
low
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000272102A
Other languages
Japanese (ja)
Other versions
JP4499262B2 (en
Inventor
Shohei Matsubara
昌平 松原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Aloka Co Ltd
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Filing date
Publication date
Application filed by Aloka Co Ltd filed Critical Aloka Co Ltd
Priority to JP2000272102A priority Critical patent/JP4499262B2/en
Publication of JP2002082170A publication Critical patent/JP2002082170A/en
Application granted granted Critical
Publication of JP4499262B2 publication Critical patent/JP4499262B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Electron Tubes For Measurement (AREA)

Abstract

PROBLEM TO BE SOLVED: To inspect detection characteristics of an ionization chamber at a high dose rate, without having to use using a high-radiation source. SOLUTION: A low-radiation source 48 is arranged at a prescribed position. Then a low voltage is applied to the ionization chamber 12, by switching a normally-used high-voltage source 30 to a low-voltage power source 32 using a switch mechanism 34 of a power unit 14 and the voltage signal obtained, by converting the output current has its value recorded by a counting arithmetic part 18. According to a series of voltage signals which are recorded, it is decided whether detection characteristics of the ionization chamber 12 are proper.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は電離箱型放射線検出
装置及び電離箱の検査方法に関し、特に高線量率の放射
線に対する電離箱の検出特性の検査に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an ionization chamber type radiation detector and an inspection method of an ionization chamber, and more particularly to an inspection of an ionization chamber detection characteristic with respect to high dose rate radiation.

【0002】[0002]

【従来の技術及びその課題】原子力発電所等、放射性物
質を取扱う施設では、一般に、施設外部や施設敷地内に
環境放射線監視装置を設けて、施設内及びその周辺の放
射線を監視している。環境放射線監視装置としては空間
γ線量率を測定するモニタリングポストが知られてい
る。モニタリングポストはγ線を検出するための電離箱
やNaI型検出器等をモニタリングポスト建屋(局舎)
屋上に備え、その測定信号を処理する各種モジュールを
局舎内に収納する。
2. Description of the Related Art In a facility handling radioactive materials, such as a nuclear power plant, an environmental radiation monitoring device is generally provided outside the facility or on the site of the facility to monitor radiation in and around the facility. As an environmental radiation monitoring device, a monitoring post for measuring an air gamma dose rate is known. The monitoring post includes an ionization chamber for detecting γ-rays, a NaI detector, etc.
Various modules for processing the measurement signals are stored in the office building on the rooftop.

【0003】モニタリングポストで使用される電離箱容
器内には加圧ガス(例えば希ガス)が封入されている。
放射線の入射に起因して封入されているガスが電離し、
これにより生じた電荷を補集することで放射線の線量率
が測定される。
[0003] A pressurized gas (for example, a rare gas) is sealed in an ionization chamber used for the monitoring post.
The enclosed gas is ionized due to the incidence of radiation,
The dose rate of the radiation is measured by collecting the generated charges.

【0004】その出力電流は、入射する放射線の線量率
に比例するが、電離箱の使用中に容器内表面からの不純
ガスの湧き出しや、封入していたガスのリーク等が起こ
ると検出器からの出力電流が減少し、電離箱の性能が劣
化する。
[0004] The output current is proportional to the dose rate of the incident radiation. However, when an impurity gas leaks out of the inner surface of the container during use of the ionization chamber or a leak of the enclosed gas occurs, a detector is used. The output current from the ionizer decreases, and the performance of the ionization chamber deteriorates.

【0005】そこで、モニタリングポストの電離箱の検
出特性が変化していないかどうかを確認するためには、
定期的に照射試験を行い、電離箱の出力電流を検査する
必要がある。放射線の線量率が低い領域、例えば吸収線
量率が数μGy/hにおける電離箱の検出特性に関して
は、137Cs(3.7MBq)等の低放射能線源を電離
箱から所定の距離だけ離れた位置に設置して検査を行っ
ている。具体的には、局舎屋上から例えば、1メートル
の高さに密封線源を固定して検査が行われる。
Therefore, in order to confirm whether the detection characteristics of the ionization chamber of the monitoring post have not changed,
It is necessary to perform an irradiation test periodically to check the output current of the ionization chamber. Regarding the detection characteristics of the ionization chamber in a region where the radiation dose rate is low, for example, when the absorbed dose rate is several μGy / h, a low radioactivity source such as 137 Cs (3.7 MBq) is separated from the ionization chamber by a predetermined distance. It is installed at a location for inspection. Specifically, the inspection is performed by fixing the sealed radiation source at a height of, for example, 1 meter from the roof of the station building.

【0006】一方、放射線の線量率が高い領域、例えば
吸収線量率が100mGy/hにおける電離箱の性能を
検査する場合、もし前述した方法で検査を行おうとする
とモニタリングポスト近傍に60Co(370GBq)等
の高放射能線源を設置しなければならない。しかしなが
ら、そのような線源を持ち込んで作業するのは非常に危
険であり、局舎付近における検査は実際上不可能であ
る。このため、高放射能線源を使う場合は、それを取扱
うことができる別の施設に電離箱を移して検査を行う必
要がある。
On the other hand, when inspecting the performance of an ionization chamber in a region where the radiation dose rate is high, for example, when the absorbed dose rate is 100 mGy / h, if the inspection is to be performed by the above-described method, 60 Co (370 GBq) is placed near the monitoring post. And other high radiation sources must be installed. However, it is very dangerous to work with such a source and inspection near the station is practically impossible. For this reason, when using a high radioactivity source, it is necessary to move the ionization chamber to another facility that can handle it and conduct inspections.

【0007】しかし、検査の度に、局舎屋上に設置され
た電離箱を取外し、また細心の注意を必要とする高放射
能線源を使用して検査を行うのは非常に時間と労力がか
かる等問題がある。
[0007] However, it is very time-consuming and labor-intensive to remove the ionization chamber installed on the rooftop of the station building and perform the inspection using a high-radiation source that requires close attention. There are problems such as this.

【0008】本発明は上記課題に鑑みてなされたもので
あり、その目的は高線量率における電離箱の検出特性を
高放射能線源を利用することなく検査できる電離箱型放
射線検出装置及び電離箱の検査方法を提供することにあ
る。
The present invention has been made in view of the above problems, and has as its object to provide an ionization chamber type radiation detection apparatus and an ionization chamber capable of inspecting the detection characteristics of an ionization chamber at a high dose rate without using a high radiation source. An object of the present invention is to provide a method for inspecting a box.

【0009】[0009]

【課題を解決するための手段】上記目的を達成するため
に本発明に係る電離箱型放射線検出装置は放射線を検出
する電離箱と、前記電離箱に電圧を印加する電源と、前
記電源の印加電圧を切り換える電圧切換手段と、を含
み、低線量率の放射線を照射する線源を利用して高線量
率での電離箱の検出特性を検査する場合に、前記電源の
印加電圧が低電圧に切り換えられることを特徴とする。
In order to achieve the above object, an ionization chamber type radiation detecting apparatus according to the present invention comprises: an ionization chamber for detecting radiation; a power supply for applying a voltage to the ionization chamber; Voltage switching means for switching the voltage, including, when inspecting the detection characteristics of the ionization chamber at a high dose rate using a radiation source that irradiates a low dose rate radiation, the applied voltage of the power supply to a low voltage It can be switched.

【0010】上記のように構成すれば、電圧切換手段に
より前記電離箱に印加される電圧を低電圧に切り換え、
電離箱に低線量率の放射線を照射する線源を利用して、
高線量率における電離箱の検出特性を検査できる。
[0010] With the above configuration, the voltage applied to the ionization chamber is switched to a low voltage by the voltage switching means.
Using a source that irradiates the ionization chamber with low dose rate radiation,
It can inspect the detection characteristics of the ionization chamber at high dose rates.

【0011】後述するように、高電圧を印加した電離箱
に高線量率の放射線を照射した場合の電離箱の検出特性
と低電圧を印加した電離箱に低線量率の放射線を照射し
た場合の電離箱の検出特性との間には相関関係があり、
その関係に基づけば高線量率における検出特性を検査す
るために必ずしも高線量率の放射線を電離箱に照射する
必要はない。すなわち、低放射能線源を使用して、電離
箱に低い線量率の放射線を照射し、当該線量率に応じて
印加電圧を下げて検出特性を検査するこで、前記高線量
率における検出特性を間接的に検査できる。
As will be described later, the detection characteristics of the ionization chamber when the ionization chamber to which a high voltage is applied are irradiated with radiation at a high dose rate, and the detection characteristics when the ionization chamber to which a low voltage is applied are irradiated with radiation at a low dose rate. There is a correlation between the detection characteristics of the ionization chamber,
Based on this relationship, it is not necessary to irradiate the ionization chamber with high dose rate radiation in order to inspect the detection characteristics at high dose rates. That is, by using a low radiation source, irradiating the ionization chamber with a low dose rate of radiation, and lowering the applied voltage according to the dose rate and inspecting the detection properties, the detection properties at the high dose rate Can be inspected indirectly.

【0012】ここでの電離箱検査方法は特に電離箱が屋
外に固定設置されている場合、例えば前述のモニタリン
グポストに使用される電離箱の検査には特に有用であ
る。この場合においては、高線量率とは例えば従来施設
に電離箱を移して検査を行う必要がある線量率のレベル
をいう。
The method for inspecting an ionization chamber is particularly useful when the ionization chamber is fixedly installed outdoors, for example, for inspecting an ionization chamber used for the above-mentioned monitoring post. In this case, the high dose rate refers to, for example, the level of the dose rate at which the ionization chamber needs to be moved to a conventional facility for inspection.

【0013】望ましくは、前記電離箱へ印加する低電圧
を可変する低電圧可変手段を含む。こうすれば、高線量
率における電離箱の検出特性を詳細に検査することがで
きる。また、前記電離箱の出力電流に基づいて、当該電
離箱の検出特性の良否判定を行う良否判定手段をさらに
含む。
Preferably, the apparatus further includes low voltage variable means for varying a low voltage applied to the ionization chamber. This makes it possible to inspect the detection characteristics of the ionization chamber at a high dose rate in detail. In addition, the apparatus further includes a pass / fail determination unit that determines pass / fail of detection characteristics of the ionization chamber based on an output current of the ionization chamber.

【0014】上記目的を達成するために本発明に係る電
離箱検査方法は、電離箱に対して低線量率で放射線を照
射する工程と、前記電離箱への印加電圧を通常の使用電
圧から低電圧に切り換えて、当該電離箱の出力電流を検
出する工程と、を含む。
In order to achieve the above object, an ionization chamber inspection method according to the present invention comprises a step of irradiating the ionization chamber with radiation at a low dose rate, and a step of lowering a voltage applied to the ionization chamber from a normal operating voltage. Switching to voltage and detecting the output current of the ionization chamber.

【0015】上記のように構成すれば、電離箱に対して
低線量率で放射線を照射しつつ、前記電離箱への印加電
圧を通常の使用電圧から低電圧に切り換えて、当該電離
箱の出力電流を検出し、それに基づいて高線量率におけ
る電離箱の検出特性を検査できる。
According to the above configuration, while irradiating the ionization chamber with radiation at a low dose rate, the voltage applied to the ionization chamber is switched from a normal operating voltage to a low voltage, and the output of the ionization chamber is reduced. By detecting the current, the detection characteristics of the ionization chamber at a high dose rate can be inspected based on the current.

【0016】望ましくは、低線量率における電離箱の検
出特性を検査する第1検査工程と、高線量率における前
記電離箱の検出特性を検査する第2検査工程と、を含
み、前記第1検査工程は、前記電離箱に対して低線量率
で放射線を照射する第1照射工程と、前記電離箱へ高電
圧を印加して、当該電離箱の出力電流を検出する第1検
出工程と、を含み、前記第2検査工程は、前記電離箱に
対して低線量率で放射線を照射する第2照射工程と、前
記電離箱へ低電圧を印加して、当該電離箱の出力電流を
検出する第2検出工程と、を含む。
Preferably, the first inspection includes a first inspection step of inspecting a detection characteristic of the ionization chamber at a low dose rate, and a second inspection step of inspecting a detection characteristic of the ionization chamber at a high dose rate. The step includes: a first irradiation step of irradiating the ionization chamber with radiation at a low dose rate; and a first detection step of applying a high voltage to the ionization chamber and detecting an output current of the ionization chamber. The second inspection step includes irradiating the ionization chamber with radiation at a low dose rate, and applying a low voltage to the ionization chamber to detect an output current of the ionization chamber. 2 detection steps.

【0017】上記のように構成すれば、前記第1検査工
程において、電離箱に対して低線量率で放射線を照射し
つつ、電離箱に高電圧を印加し、電離箱から前記放射線
の線量率における出力電流を検出し、それに基づいて低
線量率における電離箱の検出特性を検査できる。また、
前記第2検査工程において、電離箱に対して低線量率で
放射線を照射しつつ、電離箱に低電圧を印加し、電離箱
から前記放射線の線量率における出力電流を検出し、そ
れに基づいて高線量率における電離箱の検出特性を検査
できる。
According to the above configuration, in the first inspection step, a high voltage is applied to the ionization chamber while irradiating the ionization chamber with radiation at a low dose rate, and the radiation dose rate of the radiation is measured from the ionization chamber. And the detection characteristics of the ionization chamber at a low dose rate can be inspected based on the output current. Also,
In the second inspection step, a low voltage is applied to the ionization chamber while irradiating the ionization chamber with radiation at a low dose rate, an output current at the dose rate of the radiation is detected from the ionization chamber, and a high current is detected based on the output current. It is possible to inspect the detection characteristics of the ionization chamber at the dose rate.

【0018】[0018]

【発明の実施の形態】以下、本発明の実施の形態(以
下、実施形態という)を図面を用いて説明する。
Embodiments of the present invention (hereinafter, referred to as embodiments) will be described below with reference to the drawings.

【0019】図1は、本発明の実施形態に係る電離箱型
放射線検出装置を設けたモニタリングポスト10の全体
構成を示す図である。モニタリングポスト10は設置場
所における放射線環境を監視する設備である。
FIG. 1 is a view showing an entire configuration of a monitoring post 10 provided with an ionization chamber type radiation detecting apparatus according to an embodiment of the present invention. The monitoring post 10 is a facility for monitoring the radiation environment at the installation location.

【0020】最初にモニタリングポスト10の構成及び
監視時の動作について説明する。電離箱型放射線検出装
置は、電離箱12、電離箱12に電圧を印加する電源ユ
ニット14、電離箱12からの出力電流を電圧信号に変
換するエレクトロメータ16、エレクトロメータ16か
らの電圧信号に基づいて線量率等を演算する計数演算部
18、計数演算部18による演算結果を出力する表示器
20とから構成され、モニタリングポスト10はさら
に、記録媒体22、送信器24とから構成される。な
お、電離箱12とエレクトロメータ16はモニタリング
ポスト局舎上に設けられる。また、計数演算部18等は
局舎内に設けられる。
First, the configuration of the monitoring post 10 and the operation during monitoring will be described. The ionization chamber type radiation detection apparatus includes an ionization chamber 12, a power supply unit 14 for applying a voltage to the ionization chamber 12, an electrometer 16 for converting an output current from the ionization chamber 12 into a voltage signal, and a voltage signal from the electrometer 16. The monitoring post 10 further includes a recording medium 22 and a transmitter 24. The counting post 18 calculates the dose rate and the like, and the display unit 20 outputs the result of the calculation by the counting post. In addition, the ionization chamber 12 and the electrometer 16 are provided on the monitoring post office building. The counting operation unit 18 and the like are provided in the station building.

【0021】電離箱12は、例えば球形の集電極26と
それを取り囲む球殻状の容器電極28とから構成され
る。容器電極28は略球形に構成されているため全方向
に対して放射線を検出できる。容器電極28内部には加
圧した希ガスが封入されており、放射線が入射すると内
部に封入されたガスが電離する。電離箱12に高電圧を
印加し、電離により生じた電荷を補集し、出力電流とし
て電離箱12から取り出す。容器電極28は例えば、半
径30cm、容量14lで、内部には例えば圧力4at
mのArガスが封入されている。但し、電離箱12の形
状、及び封入ガスの種類は本実施例にあげたものに限ら
ない。封入ガスとしては、一旦電離した電子等が付着し
にくい窒素ガス等を使用してもよい。
The ionization chamber 12 comprises, for example, a spherical collector electrode 26 and a spherical container electrode 28 surrounding the collector electrode 26. Since the container electrode 28 is formed in a substantially spherical shape, radiation can be detected in all directions. A pressurized rare gas is sealed inside the container electrode 28, and when radiation is incident, the gas sealed inside is ionized. A high voltage is applied to the ionization chamber 12 to collect electric charges generated by the ionization and take out the ionization chamber 12 as an output current. The container electrode 28 has, for example, a radius of 30 cm and a capacity of 14 l, and has a pressure of 4 at, for example.
m Ar gas is sealed. However, the shape of the ionization chamber 12 and the type of gas filling are not limited to those described in the present embodiment. As the filling gas, a nitrogen gas or the like to which electrons and the like once ionized are unlikely to adhere may be used.

【0022】電離箱12へ電圧を印加する電源ユニット
14は、使用時の電圧を供給する高電圧電源30と高線
量率における電離箱12の検出特性検査用の低電圧電源
32とを含む。また、電源ユニット14に設けられたス
イッチ機構34により高電圧電源30と低電圧電源32
は切り換え可能である。通常の装置使用時には高電圧電
源30により容器電極28には例えば−1000Vの電
圧が印加される。また、低電圧電源32の印加電圧は例
えば−数Vであり、電圧値は可変することができる。
The power supply unit 14 for applying a voltage to the ionization chamber 12 includes a high-voltage power supply 30 for supplying a voltage at the time of use and a low-voltage power supply 32 for testing the detection characteristics of the ionization chamber 12 at a high dose rate. A high-voltage power supply 30 and a low-voltage power supply 32 are controlled by a switch mechanism 34 provided in the power supply unit 14.
Is switchable. During normal use of the apparatus, a voltage of, for example, −1000 V is applied to the container electrode 28 by the high-voltage power supply 30. The applied voltage of the low-voltage power supply 32 is, for example, −several volts, and the voltage value can be changed.

【0023】集電極26には導線36の一端が接続され
ており、導線36の他端は絶縁体38を介して容器電極
28から電離箱12外部に引出される。導線36を介し
て電離箱12から取り出された出力電流はエレクトロメ
ータ16で電圧信号に変換され、計数演算部18に入力
される。エレクトロメータ16はオペアンプ40、抵抗
42、コンデンサ44から構成されており、抵抗42及
びコンデンサ44はフィードバック素子として使用され
る。例えば、抵抗値は1.5TΩ〜1.5×10MΩま
で段階的に切り換えることができ、またコンデンサ44
の容量は5pFである。エレクトロメータ16から出力
される電圧信号の大きさは、補集された電荷の平均電流
と抵抗42の抵抗値できまり、また電圧信号のパルスの
時定数は抵抗42の抵抗値とコンデンサ44の容量との
積により定まる。したがって、上記のように抵抗42及
びコンデンサ44をフィードバック素子として使用すれ
ば、補集した電荷の平均電流に応じた電圧信号を得るこ
とができる。ここで、計数演算部18の前段に適宜、増
幅器、波形整形回路等を設けてもよい。
One end of a conducting wire 36 is connected to the collecting electrode 26, and the other end of the conducting wire 36 is drawn out of the ionization chamber 12 from the container electrode 28 via an insulator 38. The output current taken out of the ionization chamber 12 via the conducting wire 36 is converted into a voltage signal by the electrometer 16 and input to the counting operation unit 18. The electrometer 16 includes an operational amplifier 40, a resistor 42, and a capacitor 44. The resistor 42 and the capacitor 44 are used as a feedback element. For example, the resistance value can be switched stepwise from 1.5 TΩ to 1.5 × 10 MΩ.
Has a capacitance of 5 pF. The magnitude of the voltage signal output from the electrometer 16 is determined by the average current of the collected electric charge and the resistance of the resistor 42, and the time constant of the pulse of the voltage signal is determined by the resistance of the resistor 42 and the capacitance of the capacitor 44. It is determined by the product of Therefore, if the resistor 42 and the capacitor 44 are used as feedback elements as described above, a voltage signal corresponding to the average current of the collected charges can be obtained. Here, an amplifier, a waveform shaping circuit, and the like may be provided at a stage preceding the counting operation unit 18 as appropriate.

【0024】計数演算部18は、エレクトロメータ16
からの電圧信号に基づいて放射線の線量率等を演算し、
演算結果を表示器20、記録媒体22、送信器24に出
力する。また、図1に示す例では、計数演算部18は電
離箱12の検出特性検査時に良否判定を行う判定部46
を含み、計数演算部18及び判定部46はマイコン上で
実現される。但し、判定部46を特別に設けず、良否判
定を人為的に行う場合も本発明の一態様である。
The counting operation section 18 includes an electrometer 16
Calculate radiation dose rate etc. based on the voltage signal from
The calculation result is output to the display 20, the recording medium 22, and the transmitter 24. Further, in the example shown in FIG.
, And the count calculation unit 18 and the determination unit 46 are realized on a microcomputer. However, a case where the quality determination is performed artificially without specially providing the determination unit 46 is also one embodiment of the present invention.

【0025】表示器20はモニタリングポストの局舎正
面等に設けられ、検出した放射線の線量率等を表示す
る。また、記録媒体22は計数演算部18からの線量率
データ等を保存するメモリである。こうすれば、放射線
環境に関するデータを後日詳細に分析できる。送信器2
4は線量率データ等を遠隔の監視センタ(図示せず)等
に送信する。こうすれば、放射線環境を遠隔地にて把握
できる。
The display 20 is provided at the front of the monitoring post or the like, and displays the detected radiation dose rate and the like. The recording medium 22 is a memory for storing dose rate data and the like from the counting operation unit 18. In this way, data on the radiation environment can be analyzed in detail at a later date. Transmitter 2
4 transmits dose rate data and the like to a remote monitoring center (not shown) and the like. In this way, the radiation environment can be grasped at a remote place.

【0026】次に、電離箱12の低線量率(例えば数μ
Gy/h)及び高線量率(例えば100mGy/h)に
おける検出特性を検査する方法について説明するが、そ
の前に電離箱12の正常動作時及び劣化時における検出
特性を説明する。
Next, the low dose rate of the ionization chamber 12 (for example, several μm)
Before describing the method of inspecting the detection characteristics at Gy / h) and a high dose rate (for example, 100 mGy / h), the detection characteristics at the time of normal operation and at the time of deterioration of the ionization chamber 12 will be described.

【0027】図2は、電離箱12に照射される放射線の
線量率を固定した場合における電離箱12に対する印加
電圧と出力電流との関係(飽和特性)を示した図であ
る。横軸は電離箱12に印加する電圧の大きさ、縦軸は
電離箱12の出力電流を示す。実線は電離箱12が正常
な場合の飽和特性を示しており、一点鎖線は電離箱12
の検出特性が劣化した場合、例えば容器内表面からの不
純ガスの湧き出しや、封入していたガスのリーク等が起
こった場合の飽和特性を示している。
FIG. 2 is a diagram showing the relationship (saturation characteristic) between the applied voltage and the output current to the ionization chamber 12 when the dose rate of the radiation applied to the ionization chamber 12 is fixed. The horizontal axis represents the magnitude of the voltage applied to the ionization chamber 12, and the vertical axis represents the output current of the ionization chamber 12. The solid line indicates the saturation characteristics when the ionization chamber 12 is normal, and the dashed line indicates the ionization chamber 12.
When the detection characteristic of the sample is deteriorated, for example, the saturation characteristic is shown when an impure gas flows out from the inner surface of the container or a leak of the sealed gas occurs.

【0028】電離箱12の検出特性が正常な場合、印加
電圧を低電圧側から上げていくにしたがって、電離箱1
2の出力電流は増加する(図中、A再結合領域参照)。
しかし、さらに印加電圧を上げると出力電流はある値で
飽和し、それ以上印加電圧を上げても一定範囲において
は出力電流の値にあまり変化が見られない(図中、B飽
和領域参照)。なぜなら、印加電圧が低い領域では、電
離箱12内に生成される電場が弱いため、電離で生じた
イオンの速度が遅く、集電極26、或いは容器電極28
に到達する前に、正負のイオンが結合するからである。
これは周知のように再結合といわれる。すなわち、印加
電圧を上げていくと、イオンの速度が増し、電極に到達
する前に結合する割合が減少するので出力電流は増加す
る。さらに印加電圧を増加すると、電離で生じたイオン
のほとんどすべてを電極に集めることができるので、出
力電力はそれ以上増加せず飽和値に達する。この飽和領
域にある出力電流は飽和電流と称される。
When the detection characteristics of the ionization chamber 12 are normal, as the applied voltage is increased from the low voltage side, the ionization chamber 1
The output current of No. 2 increases (see the A recombination region in the figure).
However, when the applied voltage is further increased, the output current saturates at a certain value, and even when the applied voltage is further increased, the output current value does not change much within a certain range (see the B saturation region in the figure). This is because, in a region where the applied voltage is low, the electric field generated in the ionization chamber 12 is weak, so that the speed of ions generated by ionization is low, and the collector electrode 26 or the container electrode 28
Before the ions arrive at the positive and negative ions.
This is known as recombination. That is, as the applied voltage is increased, the speed of the ions increases, and the ratio of the ions before they reach the electrodes decreases, so that the output current increases. When the applied voltage is further increased, almost all of the ions generated by ionization can be collected on the electrode, and the output power reaches the saturation value without further increasing. An output current in this saturation region is called a saturation current.

【0029】電離箱12が劣化した場合、例えば容器内
表面からの不純ガスの湧き出しが起こった場合は電離箱
12内の不純ガス濃度が増加するために、正常時よりも
イオンの再結合する割合が多くなる。それゆえ、出力電
流が飽和電流に達するためには正常時よりも高電圧を印
加する必要がある。図2において、印加電圧V0におけ
る出力電流は正常時は飽和電流に達していたが、劣化時
には出力電流が減少しており、飽和電流からの損失分
(図中、a参照)が見られる。
When the ionization chamber 12 is deteriorated, for example, when an impure gas spouts from the inner surface of the container, the concentration of the impurity gas in the ionization chamber 12 increases, and the ions recombine more than in the normal state. The percentage increases. Therefore, in order for the output current to reach the saturation current, it is necessary to apply a higher voltage than normal. In FIG. 2, the output current at the applied voltage V 0 has reached the saturation current in the normal state, but the output current has decreased at the time of deterioration, and a loss from the saturation current (see a in the figure) is seen.

【0030】なお、図2に示した飽和特性の振る舞いは
基本的に電離箱12に照射される放射線の線量率の大き
さによらない。すなわち、印加電圧を上げていくにした
がって、電離箱12の出力電流は増加し、さらに印加電
圧をあげると出力電流はある値で飽和する。ただし、電
離により生成されるイオン数は線量率に比例するので、
飽和電流の値は線量率に比例する。
The behavior of the saturation characteristic shown in FIG. 2 basically does not depend on the magnitude of the dose rate of the radiation applied to the ionization chamber 12. That is, as the applied voltage increases, the output current of the ionization chamber 12 increases, and when the applied voltage is further increased, the output current saturates at a certain value. However, since the number of ions generated by ionization is proportional to the dose rate,
The value of the saturation current is proportional to the dose rate.

【0031】次に、図3を用いて放射線の線量率を変化
させた場合、電離箱12の出力電流の変化を説明する。
ここで、電離箱12には通常の使用電圧(高電圧:10
00V)が印加されている。横軸は電離箱12に照射さ
れた放射線の吸収線量率、縦軸は電離箱12の出力電流
を示す。実線は電離箱12の検出特性が正常な場合を示
しており、一点鎖線は電離箱12の検出特性が劣化した
場合のものを示している。
Next, the change in the output current of the ionization chamber 12 when the radiation dose rate is changed will be described with reference to FIG.
Here, a normal operating voltage (high voltage: 10) is applied to the ionization chamber 12.
00V) is applied. The horizontal axis indicates the absorbed dose rate of the radiation applied to the ionization chamber 12, and the vertical axis indicates the output current of the ionization chamber 12. The solid line indicates the case where the detection characteristics of the ionization chamber 12 are normal, and the dashed line indicates the case where the detection characteristics of the ionization chamber 12 are deteriorated.

【0032】電離箱12の検出特性が正常な場合、出力
電流が入射する放射線の線量率に比例している(線量率
直線性)。なお、各線量率における出力電流は飽和電流
である。一方、一点鎖線は電離箱12の検出特性が劣化
した場合であり、低線量率側で出力電流は線量率にほぼ
比例しているが、高線量率側では線量率直線性が低下し
ている。これは、電離箱12内の不純ガス濃度が増加
し、出力電流に飽和電流からの損失分(図中、b参照)
が生じるためである。高線量率側で、損失分の割合が大
きくなるのは、イオンの再結合する割合がその密度に依
存するためであり、イオンの密度が大きいほど再結合す
る割合が多くなるからである。
When the detection characteristics of the ionization chamber 12 are normal, the output current is proportional to the dose rate of the incident radiation (dose rate linearity). The output current at each dose rate is a saturation current. On the other hand, an alternate long and short dash line indicates a case where the detection characteristics of the ionization chamber 12 are deteriorated. The output current is almost proportional to the dose rate on the low dose rate side, but the dose rate linearity is reduced on the high dose rate side. This is because the impurity gas concentration in the ionization chamber 12 increases and the output current is reduced by the amount of loss from the saturation current (see b in the figure).
Is caused. On the high dose rate side, the proportion of the loss is increased because the rate of recombination of ions depends on its density, and the proportion of recombination increases as the density of ions increases.

【0033】したがって、一般に所定の線量率における
電離箱12の検出特性を検査するには電離箱12に使用
電圧を印加し、目的の線量率に応じた線源により電離箱
12を照射しそこからの出力電流を検出して出力電流が
飽和電流に達しているかを検査すればよい。
Therefore, in general, in order to inspect the detection characteristics of the ionization chamber 12 at a predetermined dose rate, a working voltage is applied to the ionization chamber 12, and the ionization chamber 12 is irradiated with a radiation source corresponding to a target dose rate, and the ion beam is irradiated therefrom. May be detected to check whether the output current has reached the saturation current.

【0034】以下、図4に低線量率、例えば吸収線量率
が数μGy/hにおける電離箱の検出特性を検査する工
程を示す。まず、低放射能の線源48(図1中、点線参
照)、例えば137Cs(3.7MBq)等を所定の位置
に配置し、低線量率で放射線を電離箱12に照射する
(S101)。ここで、線源48は例えば局舎屋上から
1メートルの位置に固定される。次に、高電圧電源30
により使用電圧を電離箱12に印加した状態で、電離箱
12からの出力電流をエレクトロメータ16により検出
する(S102)。エレクトロメータ16は出力電流を
電圧信号に変換し、それに基づいて、電離箱12の検出
特性の良否判定を予め定められた基準に基づいて行う
(S103)。判定方法としては、例えば飽和電流に対
して検出された飽和電流からの損失分の割合が±5%以
内なら検出特性が正常であると判定し、そうでない場合
は電離箱12が劣化していると判定すればよい。判定結
果は表示器20、記録媒体22、送信器24等に出力さ
れる。
FIG. 4 shows a process of inspecting the detection characteristics of the ionization chamber at a low dose rate, for example, an absorption dose rate of several μGy / h. First, a low-radiation radiation source 48 (see a dotted line in FIG. 1), for example, 137 Cs (3.7 MBq) or the like is arranged at a predetermined position, and the radiation is irradiated onto the ionization chamber 12 at a low dose rate (S101). . Here, the radiation source 48 is fixed, for example, at a position one meter from the roof of the station building. Next, the high voltage power supply 30
With the use voltage applied to the ionization chamber 12, the output current from the ionization chamber 12 is detected by the electrometer 16 (S102). The electrometer 16 converts the output current into a voltage signal, and based on the converted signal, determines whether the detection characteristics of the ionization chamber 12 are good or not based on a predetermined reference (S103). As a determination method, for example, if the ratio of the loss from the detected saturation current to the saturation current is within ± 5%, it is determined that the detection characteristics are normal. Otherwise, the ionization chamber 12 is deteriorated. Should be determined. The determination result is output to the display 20, the recording medium 22, the transmitter 24, and the like.

【0035】検出特性を検査するに際し、検査したい線
量率の値が十分低ければ目的の線量率に応じた線源を使
えばよいが、目的とする線量率が高い場合(例えば数1
00mGy/h)、高線量率の線源を直接使えない場合
があり、その時は上記の方法は使えない。
In inspecting the detection characteristics, if the value of the dose rate to be inspected is sufficiently low, a radiation source corresponding to the target dose rate may be used, but if the target dose rate is high (for example,
00mGy / h), there are cases where a high-dose-rate source cannot be used directly, in which case the above method cannot be used.

【0036】しかしながら、使用電圧を印加した電離箱
12に高線量率の放射線を照射した場合の電離箱12の
検出特性は使用電圧よりも低電圧を印加した電離箱12
に低線量率の放射線を照射した場合の電離箱12の検出
特性と相関があり、高線量率の線源を使わずに低線量率
の線源を使って電離箱12の検出特性を検査することが
できる。
However, when the ionization chamber 12 to which the working voltage is applied is irradiated with radiation at a high dose rate, the detection characteristics of the ionization chamber 12 are as follows.
There is a correlation with the detection characteristics of the ionization chamber 12 when irradiating low dose rate radiation to the ion beam, and the detection characteristics of the ionization chamber 12 are inspected using a low dose rate source without using a high dose rate source. be able to.

【0037】図5は高線量率(100mGy/h)にお
いて使用電圧(高電圧:1000V)付近の電圧を印加
した場合の電離箱12の飽和特性と低線量率(数μGy
/h)において低電圧(数V)を印加した場合の電離箱
12の飽和特性を図示したものである。横軸は電離箱1
2に印加する電圧の大きさ、縦軸は電離箱12の出力電
流を示す。実線は正常時の飽和特性であり、点線は劣化
時の飽和特性である。右上には、吸収線量率が100m
Gy/hにおける飽和特性の一部が示されている。一
方、左下には吸収線量率が数μGy/hにおける飽和特
性が示されている。図からわかるように、高線量率の放
射線を照射し、高電圧を印加した場合の飽和特性と、低
線量率の放射線を照射し、低電圧を印加した場合の飽和
特性とは類似しており、両者に相関関係があることがわ
かる。
FIG. 5 shows the saturation characteristics of the ionization chamber 12 and the low dose rate (several μGy) when a voltage near the working voltage (high voltage: 1000 V) is applied at a high dose rate (100 mGy / h).
/ H) illustrates the saturation characteristics of the ionization chamber 12 when a low voltage (several V) is applied. The horizontal axis is the ionization chamber 1
2, the vertical axis indicates the output current of the ionization chamber 12. The solid line is the saturation characteristic at the time of normal operation, and the dotted line is the saturation characteristic at the time of deterioration. Above right, absorbed dose rate is 100m
Part of the saturation characteristic at Gy / h is shown. On the other hand, the lower left shows the saturation characteristics when the absorbed dose rate is several μGy / h. As can be seen from the figure, the saturation characteristics when applying high dose rate radiation and applying high voltage are similar to the saturation characteristics when applying low dose rate radiation and applying low voltage. It can be seen that there is a correlation between the two.

【0038】印加電圧が1000Vの場合、正常時は飽
和電流I1が出力電流であり、劣化時は再結合による飽
和電流からの損失分δI1(図中、c参照)を生じる。
一方、低電圧側において、正常時に得られる飽和電流を
2とし、劣化した場合の飽和電流からの損失分をδI2
(図中、d参照)とすると、電圧の値をうまく選ぶこと
により飽和電流と損失分の比δI1/I1とδI2/I2
が等しくなるようにすることができる。逆にいえば、I
2及びδI2を測定すれば、吸収線量率が100mGy/
h、印加電圧が1000Vにおける電離箱12の検出特
性が検査できる。
When the applied voltage is 1000 V, the saturation current I 1 is an output current in a normal state, and a loss δI 1 (see c in the figure) from the saturation current due to recombination occurs in a degraded state.
On the other hand, on the low voltage side, the saturation current obtained under normal conditions is defined as I 2, and the loss from the saturation current when deteriorated is represented by δI 2
(See d in the figure) By properly selecting the value of the voltage, the ratio of the saturation current to the loss δI 1 / I 1 and δI 2 / I 2 can be made equal. Conversely, I
2 and δI 2 , the absorbed dose rate is 100 mGy /
h. The detection characteristics of the ionization chamber 12 at an applied voltage of 1000 V can be inspected.

【0039】以下、簡単のために平行平板電極間に電圧
を印加した電離箱において上記の相関関係を具体的にみ
る。電離箱の飽和電流Iと再結合による飽和電流からの
損失分δIとの比δI/Iは次式で与えられる。
Hereinafter, for simplicity, the above correlation will be specifically examined in an ionization chamber in which a voltage is applied between parallel plate electrodes. The ratio δI / I between the saturation current I of the ionization chamber and the loss δI from the saturation current due to recombination is given by the following equation.

【0040】[0040]

【数1】 δI/I=(α・N0・d2)/(6・w+・w-) (1) ただし、δIは損失する場合を正にとる。ここでαは再
結合係数、N0は単位時間あたりのイオン発生率、dは
電極間距離、w+は正のイオンの速度、w-は負のイオン
の速度、である。正/負イオンの速度w±は、電離箱内
の電場E、電離箱内のガスの封入圧P、正/負イオンの
移動度μ±により定まり、w±=μ±・E/Pの関係が
ある。ここで、単位時間あたりのイオン発生率N0が吸
収線量率に比例していること、また電場が電圧とE=V
/dの関係にあることに注意すると、δI/Iは吸収線
量率に比例し、V2に反比例する。使用電圧1000V
を印加し、高線量率、例えば100mGy/hの吸収線
量率におけるδI/Iを測定したい場合、低放射能線源
を使用して同じδI/Iが測定できる。例えば吸収線量
率が0.3μGy/hとすると簡単な計算で印加電圧を
約1.7Vまで下げれば同じδI/Iを測定できる。
## EQU1 ## δI / I = (α · N 0 · d 2 ) / (6 · w + · w ) (1) where δI is positive when loss occurs. Here, α is the recombination coefficient, N 0 is the ion generation rate per unit time, d is the distance between the electrodes, w + is the speed of positive ions, and w - is the speed of negative ions. The velocity w ± of the positive / negative ions is determined by the electric field E in the ionization chamber, the gas pressure P in the ionization chamber, and the mobility μ ± of the positive / negative ions, and the relation of w ± = μ ± E / P There is. Here, the ion generation rate N 0 per unit time is proportional to the absorbed dose rate, and the electric field is expressed as voltage and E = V
Note that δI / I is proportional to absorbed dose rate and inversely proportional to V 2 . Working voltage 1000V
When it is desired to measure δI / I at a high dose rate, for example, an absorbed dose rate of 100 mGy / h, the same δI / I can be measured using a low-activity source. For example, if the absorbed dose rate is 0.3 μGy / h, the same δI / I can be measured by reducing the applied voltage to about 1.7 V by simple calculation.

【0041】なお、式(1)は平行平板電極を備えた電
離箱においてのみ成立する関係であるが、電離箱の飽和
電流Iと再結合による飽和電流からの損失分δIとの比
δI/Iが吸収線量率が大きくなれば大きくなり、また
印加電圧、すなわち電離箱内の電場が大きくなれば小さ
くなるという関係は電離箱の形状によらず一般的に成立
する。
Equation (1) holds true only in the ionization chamber having the parallel plate electrodes, and the ratio δI / I of the saturation current I of the ionization chamber and the loss δI from the saturation current due to recombination is obtained. Generally, the relationship that the ratio increases when the absorbed dose rate increases and decreases when the applied voltage, that is, the electric field in the ionization chamber increases, generally holds regardless of the shape of the ionization chamber.

【0042】したがって、高線量率の線源を使わない
で、高線量率における電離箱12の検出特性を検査する
には、低線量率の線源で電離箱12を照射し、印加電圧
を使用電圧から低電圧に切り換えて電離箱12の出力電
流を検出し、低線量率の線源で電離箱12を照射した場
合の正常時の出力電流と比較すればよい。
Therefore, in order to inspect the detection characteristics of the ionization chamber 12 at a high dose rate without using a high dose rate radiation source, the ionization chamber 12 is irradiated with a low dose rate radiation source and the applied voltage is used. The output current of the ionization chamber 12 may be detected by switching from the voltage to the low voltage, and may be compared with the normal output current when the ionization chamber 12 is irradiated with a low dose rate radiation source.

【0043】以下、図6に高線量率、例えば吸収線量率
が100mGy/hにおける電離箱の検出特性を高放射
能線源を用いずに検査する工程を示す。まず、低放射能
の線源48(図1中、点線参照)、例えば137Cs
(3.7MBq)等を所定の位置に配置し、低線量率で
放射線を電離箱12に照射する(S201)。ここで、
当該低放射能の線源48は前述の低線量率における電離
箱の検出特性を検査する際に使用した線源と同じものを
使用してもよい。次に、スイッチ機構34により電離箱
12の電源を高電圧電源30から低電圧電源32に切り
換えた状態において、電離箱12からの出力電流をエレ
クトロメータ16により検出する(S202)。計数演
算部18はエレクトロメータ16からの電圧信号を記録
する(S203)。次に、印加電圧を変化させて(S2
04)その変化にともなう電圧信号を逐次、計数演算部
18により記録する。その記録に基づいて、予め定めら
れた基準と照らして電離箱12の検出特性の良否を判定
し(S205)、その結果を表示器20、記録媒体2
2、送信器24に出力する。
FIG. 6 shows a process for inspecting the detection characteristics of the ionization chamber at a high dose rate, for example, at an absorbed dose rate of 100 mGy / h, without using a high radiation source. First, a low-radiation source 48 (see the dotted line in FIG. 1), for example, 137 Cs
(3.7 MBq) or the like is placed at a predetermined position, and the radiation is applied to the ionization chamber 12 at a low dose rate (S201). here,
As the low-radiation source 48, the same source as that used when inspecting the detection characteristics of the ionization chamber at the low dose rate described above may be used. Next, while the power supply of the ionization chamber 12 is switched from the high voltage power supply 30 to the low voltage power supply 32 by the switch mechanism 34, the output current from the ionization chamber 12 is detected by the electrometer 16 (S202). The counting operation unit 18 records the voltage signal from the electrometer 16 (S203). Next, the applied voltage is changed (S2
04) The voltage signal associated with the change is sequentially recorded by the counting operation unit 18. Based on the record, the quality of the detection characteristics of the ionization chamber 12 is determined based on a predetermined reference (S205), and the result is displayed on the display 20 and the recording medium 2 (S205).
2. Output to the transmitter 24.

【0044】良否判定は、印加電圧を変化させずに行っ
てもよく、その場合、例えば飽和電流に対して検出され
た飽和電流からの損失分の割合が±5%以内なら検出特
性が正常であると判定し、そうでない場合は電離箱12
が劣化していると判定すればよい。印加電圧を変化させ
る場合は、電離箱12の正常時に得られる既知の電圧信
号と比較してもよいし、印加電圧の変化にともない得ら
れた一連の電圧信号のグラフ形状例えば傾き等に基づい
てもよい。また、良否判定は本実施形態においては判定
部46において行われるが、人為的に行う場合も本発明
の一態様である。
The pass / fail judgment may be made without changing the applied voltage. In this case, if the ratio of the loss from the detected saturation current to the saturation current is within ± 5%, the detection characteristics are normal. It is determined that there is, and if not, the ionization chamber 12
May be determined to be degraded. When the applied voltage is changed, the voltage may be compared with a known voltage signal obtained when the ionization chamber 12 is normal, or based on a graph shape, for example, a slope of a series of voltage signals obtained with the change in the applied voltage. Is also good. In this embodiment, the pass / fail determination is performed by the determination unit 46. However, a case where the determination is performed artificially is one aspect of the present invention.

【0045】本実施形態においては、高線量率における
電離箱の検出特性を低放射能線源を用いて検査したが、
一般には所定の線量率の放射線を電離箱に照射した状態
で、印加電圧を変化させれば、任意の線量率における電
離箱の検出特性が検査できる。
In the present embodiment, the detection characteristics of the ionization chamber at a high dose rate were examined using a low radiation source.
In general, by changing the applied voltage while irradiating the ionization chamber with radiation of a predetermined dose rate, the detection characteristics of the ionization chamber at an arbitrary dose rate can be inspected.

【0046】また、電源ユニット14のスイッチによる
電圧電源の切り換えは手動で行ってもよく、判定部46
で制御するようにしてもよい。
The switching of the voltage power supply by the switch of the power supply unit 14 may be performed manually.
The control may be performed by using.

【0047】上記の電離箱型放射線検出装置及び電離箱
検査方法は、γ線測定用電離箱に限らず、封入ガスの電
離作用を利用するものであればいずれの電離箱にも適用
可能である。
The ionization chamber type radiation detector and the ionization chamber inspection method described above are not limited to the ionization chamber for gamma ray measurement, but can be applied to any ionization chamber as long as it utilizes the ionization effect of the sealed gas. .

【0048】[0048]

【発明の効果】上記のように構成したので、本発明に係
る電離箱型放射線検出装置および電離箱検査方法によれ
ば高線量率における電離箱の検出特性を高放射能線源を
利用することなく検査できる。
As described above, according to the ionization chamber type radiation detection apparatus and the ionization chamber inspection method of the present invention, the ionization chamber detection characteristics at a high dose rate can be obtained by using a high radiation source. Can be inspected.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明の実施形態に係る電離箱型放射線検出
装置を設けたモニタリングポストを示す図である。
FIG. 1 is a diagram showing a monitoring post provided with an ionization chamber type radiation detection device according to an embodiment of the present invention.

【図2】 電離箱の飽和特性を示す図である。FIG. 2 is a diagram showing a saturation characteristic of an ionization chamber.

【図3】 電離箱の検出特性を示す図である。FIG. 3 is a diagram showing detection characteristics of an ionization chamber.

【図4】 低線量率における電離箱の検出特性を検査す
る工程を示すフローチャートである。
FIG. 4 is a flowchart showing a process of inspecting the detection characteristics of the ionization chamber at a low dose rate.

【図5】 高線量率における電離箱の飽和特性と低線量
率におけるものとの相関関係を示す図である。
FIG. 5 is a diagram showing a correlation between the saturation characteristics of the ionization chamber at a high dose rate and those at a low dose rate.

【図6】 高線量率における電離箱の検出特性を検査す
る工程を示すフローチャートである。
FIG. 6 is a flowchart showing a process of inspecting a detection characteristic of an ionization chamber at a high dose rate.

【符号の説明】[Explanation of symbols]

10 モニタリングポスト、12 電離箱、14 電源
ユニット、16 エレクトロメータ、18 計数演算
部、20 表示器、22 記録媒体、24 送信器。
Reference Signs List 10 monitoring post, 12 ionization chamber, 14 power supply unit, 16 electrometer, 18 counting operation unit, 20 display, 22 recording medium, 24 transmitter.

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 放射線を検出する電離箱と、 前記電離箱に電圧を印加する電源と、 前記電源の印加電圧を切り換える電圧切換手段と、 を含み、 低線量率の放射線を照射する線源を利用して高線量率で
の電離箱の検出特性を検査する場合に、前記電源の印加
電圧が低電圧に切り換えられることを特徴とする電離箱
型放射線検出装置。
1. An ionization chamber for detecting radiation, a power supply for applying a voltage to the ionization chamber, and voltage switching means for switching a voltage applied to the power supply, comprising: An ionization chamber type radiation detection apparatus, wherein the applied voltage of the power supply is switched to a low voltage when inspecting the detection characteristics of the ionization chamber at a high dose rate using the apparatus.
【請求項2】 請求項1記載の電離箱型放射線検出装置
において、 前記電離箱へ印加する低電圧を可変する低電圧可変手段
を含むことを特徴とする電離箱型放射線検出装置。
2. The ionization chamber type radiation detection apparatus according to claim 1, further comprising: a low voltage variable unit that varies a low voltage applied to the ionization chamber.
【請求項3】 請求項1又は2記載の電離箱型放射線検
出装置において、 前記電離箱の出力電流に基づいて、当該電離箱の検出特
性の良否判定を行う良否判定手段を含むことを特徴とす
る電離箱型放射線検出装置。
3. The ionization chamber-type radiation detection device according to claim 1, further comprising a pass / fail determination unit that determines pass / fail of a detection characteristic of the ionization chamber based on an output current of the ionization chamber. Ionization chamber type radiation detector.
【請求項4】 高線量率での電離箱の検出特性を検査す
る電離箱検査方法であって、 前記電離箱に対して低線量率で放射線を照射する工程
と、 前記電離箱への印加電圧を通常の使用電圧から低電圧に
切り換えて、当該電離箱の出力電流を検出する工程と、 を含むことを特徴とする電離箱検査方法。
4. An ionization chamber inspection method for inspecting the detection characteristics of an ionization chamber at a high dose rate, comprising: irradiating the ionization chamber with radiation at a low dose rate; and applying a voltage to the ionization chamber. Switching from a normal operating voltage to a low voltage to detect an output current of the ionization chamber.
【請求項5】 低線量率における電離箱の検出特性を検
査する第1検査工程と、 高線量率における前記電離箱の検出特性を検査する第2
検査工程と、 を含み、 前記第1検査工程は、 前記電離箱に対して低線量率で放射線を照射する第1照
射工程と、 前記電離箱へ高電圧を印加して、当該電離箱の出力電流
を検出する第1検出工程と、 を含み、 前記第2検査工程は、 前記電離箱に対して低線量率で放射線を照射する第2照
射工程と、 前記電離箱へ低電圧を印加して、当該電離箱の出力電流
を検出する第2検出工程と、 を含むことを特徴とする電離箱検査方法。
5. A first inspection step for inspecting a detection characteristic of the ionization chamber at a low dose rate, and a second inspection step for inspecting a detection characteristic of the ionization chamber at a high dose rate.
An inspection step, wherein the first inspection step includes: a first irradiation step of irradiating the ionization chamber with radiation at a low dose rate; and applying a high voltage to the ionization chamber to output the ionization chamber. A first detection step of detecting a current; a second irradiation step of irradiating the ionization chamber with radiation at a low dose rate; and applying a low voltage to the ionization chamber. A second detection step of detecting an output current of the ionization chamber.
JP2000272102A 2000-09-07 2000-09-07 Ionization chamber type radiation detector and ionization chamber inspection method Expired - Fee Related JP4499262B2 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100753688B1 (en) * 2005-01-18 2007-08-31 류성석 manhole apparatus
KR100803537B1 (en) * 2006-04-11 2008-02-15 주식회사 두산콘크리트 Manhole with exhaust and supply of water touch pump
JP2013047634A (en) * 2011-08-29 2013-03-07 Fuji Electric Co Ltd Ionization chamber type radiation detector
JP2013186014A (en) * 2012-03-09 2013-09-19 Hitachi Ltd Calibration method of radiation detector and radiation monitoring device
KR101412611B1 (en) 2012-11-09 2014-06-26 부산대학교병원 Apparatus and method for enhance spatial resoution in ion chamber array
WO2023095576A1 (en) * 2021-11-25 2023-06-01 学校法人東京理科大学 Radiation detection device

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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100753688B1 (en) * 2005-01-18 2007-08-31 류성석 manhole apparatus
KR100803537B1 (en) * 2006-04-11 2008-02-15 주식회사 두산콘크리트 Manhole with exhaust and supply of water touch pump
JP2013047634A (en) * 2011-08-29 2013-03-07 Fuji Electric Co Ltd Ionization chamber type radiation detector
JP2013186014A (en) * 2012-03-09 2013-09-19 Hitachi Ltd Calibration method of radiation detector and radiation monitoring device
KR101412611B1 (en) 2012-11-09 2014-06-26 부산대학교병원 Apparatus and method for enhance spatial resoution in ion chamber array
WO2023095576A1 (en) * 2021-11-25 2023-06-01 学校法人東京理科大学 Radiation detection device

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