JP2002046060A - Polishing apparatus - Google Patents

Polishing apparatus

Info

Publication number
JP2002046060A
JP2002046060A JP2000238134A JP2000238134A JP2002046060A JP 2002046060 A JP2002046060 A JP 2002046060A JP 2000238134 A JP2000238134 A JP 2000238134A JP 2000238134 A JP2000238134 A JP 2000238134A JP 2002046060 A JP2002046060 A JP 2002046060A
Authority
JP
Japan
Prior art keywords
polishing
chamber
brush
liquid
mist
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000238134A
Other languages
Japanese (ja)
Inventor
Takemi Miyamoto
武美 宮本
Shozo Iwabuchi
省蔵 岩渕
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hoya Corp
Original Assignee
Hoya Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hoya Corp filed Critical Hoya Corp
Priority to JP2000238134A priority Critical patent/JP2002046060A/en
Publication of JP2002046060A publication Critical patent/JP2002046060A/en
Pending legal-status Critical Current

Links

Landscapes

  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a polishing apparatus capable of preventing leakage of a polishing liquid or its mist. SOLUTION: A shutoff portion (e.g. cover member 7) for preventing the polishing liquid scattered within a polishing chamber 6 and a mist of the polishing liquid floating in the polishing chamber from leaking out of the upper portion (opening 61) of the polishing chamber 6 without impeding reciprocation of the rotating shaft 41 of a polishing brush 4 or the like in B direction in the figure and its movement in A direction in the figure is provided at the upper portion of the polishing chamber 6.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、研磨装置等に関
し、特に磁気記録媒体用ガラス基板等の外周端面部分の
研磨に好適に使用できる研磨装置等に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a polishing apparatus and the like, and more particularly to a polishing apparatus and the like which can be suitably used for polishing an outer peripheral end portion of a glass substrate for a magnetic recording medium.

【0002】[0002]

【従来の技術】磁気ディスク等の磁気記録媒体用基板と
しては、アルミニウム基板が広く用いられてきたが、磁
気ディスクの小型・薄板化と、高密度記録化に伴い、ア
ルミニウム基板に比べ基板表面の平坦性及び基板強度に
優れたガラス基板に徐々に置き換わりつつある。この磁
気記録媒体用ガラス基板には、一般に基板強度を上げる
ため、化学強化されたガラス基板や、結晶化によって基
板強度を上げた結晶化ガラス基板が用いられている。
2. Description of the Related Art Aluminum substrates have been widely used as substrates for magnetic recording media such as magnetic disks. However, as magnetic disks have become smaller and thinner and higher density recording has been required, the surface of the substrate has become larger than that of aluminum substrates. It is gradually being replaced by a glass substrate having excellent flatness and substrate strength. As the glass substrate for a magnetic recording medium, a glass substrate which is chemically strengthened or a crystallized glass substrate whose substrate strength is increased by crystallization is generally used to increase the substrate strength.

【0003】また、磁気ヘッドの方も高密度記録化に伴
って、薄膜ヘッドから、磁気抵抗型ヘッド(MRヘッ
ド)、巨大磁気抵抗型ヘッド(GMRヘッド)へと推移
してきている。したがって、ガラス基板を用いた磁気記
録媒体を磁気抵抗型ヘッドで再生することが、これから
の大きな潮流となりつつある。
[0003] In addition, the magnetic head has been changing from a thin film head to a magnetoresistive head (MR head) and a giant magnetoresistive head (GMR head) with the increase in recording density. Therefore, reproducing a magnetic recording medium using a glass substrate with a magnetoresistive head is becoming a big trend in the future.

【0004】このように磁気ディスクは高密度記録化の
ため種々の改良が加えられており、このような磁気ディ
スクの進歩に伴って、磁気記録媒体用ガラス基板にも次
々に新しい課題が発生してきている。その一つにガラス
基板表面の高清浄化がある。これは、ガラス基板表面に
異物が付着していると、ガラス基板表面上に形成する薄
膜の膜欠陥の原因となったり、薄膜表面の凸部となっ
て、適正なグライド・ハイトが得られないといった問題
を引き起こす。また、ガラス基板を用いた磁気記録媒体
を磁気抵抗型ヘッドで再生する際、記録密度の向上を求
めてヘッドのフライングハイト(浮上高さ)を下げる
と、再生の誤動作、あるいは、再生が不可能になる現象
に遭遇することがあり、問題となっている。この原因
は、磁気ディスク表面にガラス基板上のパーティクルに
よって形成された凸部が、サーマル・アスペリティ(Th
ermal Asperity)となって、磁気抵抗型ヘッドに熱が発
生し、ヘッドの抵抗値を変動させ、電磁変換に悪影響を
与えていることがその原因である。
[0004] As described above, various improvements have been made to the magnetic disk in order to increase the recording density, and with the progress of such a magnetic disk, new problems have arisen in glass substrates for magnetic recording media one after another. ing. One of them is high purification of the glass substrate surface. This is because if foreign matter adheres to the glass substrate surface, it causes a film defect of the thin film formed on the glass substrate surface, or it becomes a convex portion of the thin film surface, so that an appropriate glide height cannot be obtained. Cause such problems. In addition, when reproducing a magnetic recording medium using a glass substrate with a magnetoresistive head, if the flying height (flying height) of the head is lowered in order to improve the recording density, the reproducing operation malfunctions or the reproduction becomes impossible. Phenomena may be encountered, which is a problem. The cause is that the protrusions formed by particles on the glass substrate on the surface of the magnetic disk cause thermal asperity (Th
As a result, heat is generated in the magnetoresistive head, which changes the resistance value of the head and adversely affects electromagnetic conversion.

【0005】一方、上述したような磁気記録媒体用ガラ
ス基板表面の異物の原因は、ガラス基板の外周端面部分
の表面状態が平滑でないため、この外周端面部分が樹脂
製ケースの壁面と擦れ合い、この擦れ合いによって発生
する樹脂やガラスのパーティクルや、ガラス基板の外周
端面部分に捕捉されるその他のパーティクルが、表面に
付着することが大きな要因となっている。
On the other hand, the cause of the foreign matter on the surface of the glass substrate for a magnetic recording medium as described above is that the outer peripheral end portion of the glass substrate is not smooth, so that the outer peripheral end portion rubs against the wall surface of the resin case. A major factor is that particles of resin or glass generated by the rubbing and other particles captured on the outer peripheral end surface of the glass substrate adhere to the surface.

【0006】上述した問題を回避する目的ではなく、主
として加工精度の向上や基板の破損防止の目的から、磁
気記録媒体用ガラス基板の外周端面部分の鏡面研磨が従
来行われている。例えば、図5に示すように、中心部に
円孔を有する円板状のガラス基板1を複数枚重ねた状態
の積層ガラス基板10を回転させ、この積層ガラス基板
10の外周端面部分に研磨ブラシ4を回転接触させ、前
記積層ガラス基板10の外周端面部分と研磨ブラシ4の
ブラシ毛43との間に研磨液を供給して研磨を行う研磨
装置が提案されている(特開平11−28649号公
報)。
Conventionally, the outer peripheral end portion of a glass substrate for a magnetic recording medium has been mirror-polished not for the purpose of avoiding the above-mentioned problem but mainly for the purpose of improving processing accuracy and preventing damage to the substrate. For example, as shown in FIG. 5, a laminated glass substrate 10 in a state in which a plurality of disk-shaped glass substrates 1 each having a circular hole in the center portion are rotated, and a polishing brush is applied to an outer peripheral end surface portion of the laminated glass substrate 10. A polishing apparatus has been proposed in which a polishing liquid is supplied between the outer peripheral end surface portion of the laminated glass substrate 10 and the brush bristles 43 of the polishing brush 4 to perform polishing by bringing the polishing liquid 4 into rotary contact (Japanese Patent Laid-Open No. 11-28649). Gazette).

【0007】[0007]

【発明が解決しようとする課題】しかし、上記外周端面
研磨装置では、回転する研磨ブラシとガラス基板とが擦
れて研磨が行われるので、研磨ブラシ、積層ガラス基
板、及び周囲の雰囲気がそれぞれ非常に高温の状態にな
る。このような環境下で供給された研磨液は、周囲に飛
散すると共に、高温のミストとなって周囲に舞い、研磨
ブラシの回転に伴って発生する気流等によって上方に巻
き上げられる。そして、装置上方に設けられた研磨ブラ
シの回転軸の駆動モーターの冷却ファン等からモーター
内に入り込んでモーターの故障を起こしたり、装置にお
けるその他の機械系や電気系の故障を引き起こす原因と
なっていた。また、装置の周囲に舞うミスト(mis
t)による作業環境の悪化を招いていた。
However, in the above outer peripheral end surface polishing apparatus, since the rotating polishing brush and the glass substrate are rubbed and polished, the polishing brush, the laminated glass substrate and the surrounding atmosphere are very different. It becomes hot. The polishing liquid supplied in such an environment is scattered around and around the surroundings as a high-temperature mist, and is lifted upward by an air current generated as the polishing brush rotates. Then, the motor enters the motor from the cooling fan of the drive motor of the rotating shaft of the polishing brush provided above the apparatus and causes a failure of the motor or a failure of other mechanical or electrical systems in the apparatus. Was. In addition, mist (mis) flying around the device
t) resulted in deterioration of the working environment.

【0008】本発明は上述した背景の下になされたもの
であり、上述した問題を解消できる研磨装置の提供を目
的とする。
The present invention has been made under the above-mentioned background, and has as its object to provide a polishing apparatus which can solve the above-mentioned problems.

【0009】[0009]

【課題を解決するための手段】上記目的を達成するため
に本発明は以下の構成としてある。
In order to achieve the above object, the present invention has the following constitution.

【0010】(構成1) 中心部に円孔を有する円板状
の基板を複数枚重ねて保持する保持手段と、該保持手段
を回転させる手段と、前記複数枚重ねられた基板の外周
端面部分に接触する研磨ブラシ又は研磨パッドと、該研
磨ブラシ又は研磨パッドを回転させる手段と、前記複数
枚重ねられた基板の外周端面部分に研磨液を供給する研
磨液供給手段とを少なくとも備えた研磨装置であって、
研磨の際に周囲に飛散する研磨液及び周囲に舞っている
研磨液のミストが外部に漏れぬように研磨が行われる部
位の周囲に研磨室を設け、該研磨室を密閉可能な構造と
したことを特徴とする研磨装置。
(Structure 1) Holding means for holding a plurality of disc-shaped substrates having circular holes at the center thereof, means for rotating the holding means, and an outer peripheral end face portion of the plurality of stacked substrates A polishing brush or a polishing pad that comes into contact with the substrate, a means for rotating the polishing brush or the polishing pad, and a polishing liquid supply means for supplying a polishing liquid to an outer peripheral end portion of the plurality of stacked substrates. And
A polishing chamber is provided around a portion where polishing is performed so that the mist of the polishing liquid scattered around and the mist of the polishing liquid flying around during the polishing does not leak outside, and the polishing chamber has a structure capable of sealing. A polishing apparatus characterized in that:

【0011】(構成2) 中心部に円孔を有する円板状
の基板を複数枚重ねて保持する保持手段と、該保持手段
を回転させる手段と、前記複数枚重ねられた基板の外周
端面部分に接触する研磨ブラシ又は研磨パッドと、該研
磨ブラシ又は研磨パッドの上方部に設けられ該研磨ブラ
シ又は研磨パッドを回転させる手段と、前記研磨ブラシ
又は研磨パッドを回転軸方向に往復動させる手段と、前
記保持手段と研磨ブラシ又は研磨パッドとの間の距離を
調整するため研磨ブラシ又は研磨パッドの回転軸を移動
させる手段と、前記複数枚重ねられた基板の外周端面部
分に研磨液を供給する研磨液供給手段と、研磨が行われ
る研磨部の周囲を囲む研磨室と、を少なくとも備えた研
磨装置であって、研磨室の上方部に、研磨ブラシ又は研
磨パッドの回転軸の前記往復動及び前記移動を妨げるこ
となく、かつ、研磨室内に飛散する研磨液及び研磨室内
に舞っている研磨液のミストが研磨室の上方部から外部
に漏れぬようにする研磨液遮断部を設けたことを特徴と
する研磨装置。
(Structure 2) Holding means for holding a plurality of disc-shaped substrates having circular holes at the center thereof, means for rotating the holding means, and outer peripheral end portions of the plurality of stacked substrates A polishing brush or a polishing pad that comes into contact with, a means provided above the polishing brush or the polishing pad for rotating the polishing brush or the polishing pad, and a means for reciprocating the polishing brush or the polishing pad in a rotation axis direction; Means for moving the rotation axis of the polishing brush or the polishing pad to adjust the distance between the holding means and the polishing brush or the polishing pad, and supplying the polishing liquid to the outer peripheral end portion of the plurality of stacked substrates. A polishing apparatus comprising at least a polishing liquid supply means and a polishing chamber surrounding a polishing section in which polishing is performed, wherein an upper portion of the polishing chamber has a rotating shaft of a polishing brush or a polishing pad. A polishing liquid blocking portion that does not hinder the reciprocation and the movement, and that prevents the mist of the polishing liquid flying in the polishing chamber and the mist of the polishing liquid flying in the polishing chamber from leaking from the upper part of the polishing chamber to the outside. A polishing apparatus characterized by being provided.

【0012】(構成3) 研磨室の天井壁と研磨ブラシ
又は研磨パッドの回転軸の軸受け部との間に、研磨室内
に飛散する研磨液及び研磨室内に舞っている研磨液のミ
ストを遮断するカバー部材を設けたことを特徴とする構
成2記載の研磨装置。
(Structure 3) Between the ceiling wall of the polishing chamber and the bearing of the rotating shaft of the polishing brush or polishing pad, the polishing liquid scattered in the polishing chamber and the mist of the polishing liquid flying in the polishing chamber are shut off. 3. The polishing apparatus according to Configuration 2, further comprising a cover member.

【0013】(構成4) 研磨室の天井壁と研磨ブラシ
又は研磨パッドの回転軸との間に、研磨室内に飛散する
研磨液及び研磨室内に舞っている研磨液のミストを遮断
する作用を有する部材を介在させたことを特徴とする構
成2記載の研磨装置。
(Structure 4) Between the ceiling wall of the polishing chamber and the rotating shaft of the polishing brush or polishing pad, there is an action of shutting off the polishing liquid scattered in the polishing chamber and the mist of the polishing liquid flying in the polishing chamber. 3. The polishing apparatus according to Configuration 2, wherein a member is interposed.

【0014】(構成5) 前記研磨室内に舞っている研
磨液のミストを吸引する吸引装置を設けたことを特徴と
する構成1ないし4のいずれかに記載の研磨装置。
(Structure 5) The polishing apparatus according to any one of structures 1 to 4, further comprising a suction device for sucking a mist of the polishing liquid flowing in the polishing chamber.

【0015】[0015]

【作用】[Action]

【0016】構成1によれば、研磨の際に周囲に飛散す
る研磨液及び周囲に舞っている研磨液のミストが外部に
漏れぬように研磨が行われる部位の周囲に研磨室を設
け、この研磨室を密閉可能な構造としてあるので、研磨
液や研磨液のミストが外部に漏れることがない。したが
って、装置における機械系や電気系等の故障を回避でき
る。特に、研磨ブラシ等の駆動モーター内に研磨液のミ
ストが入り込んでモーターが故障するのを回避できる。
また、装置の周囲に舞う研磨液のミストによる作業環境
の悪化を大幅に改善できる。なお、モータの冷却ファン
の吸引口にフィルタを設けたり、モータを研磨室の下方
に設置するなどの対処も、モータの故障回避の点ではあ
る程度有効であるが、モーター以外の装置の故障や作業
環境の面では効果がない。
According to the first aspect, a polishing chamber is provided around a portion where the polishing is performed so that the polishing liquid scattered around and the mist of the polishing liquid flying around during the polishing do not leak outside. Since the polishing chamber has a sealable structure, the polishing liquid and the mist of the polishing liquid do not leak to the outside. Therefore, it is possible to avoid a failure of the mechanical system or the electrical system in the device. In particular, it is possible to prevent the mist of the polishing liquid from entering the driving motor such as the polishing brush and causing the motor to fail.
Further, the deterioration of the working environment due to the mist of the polishing liquid flying around the apparatus can be greatly improved. In addition, measures such as installing a filter at the suction port of the cooling fan of the motor or installing the motor below the polishing chamber are also effective to some extent in terms of avoiding the failure of the motor. It has no effect on the environment.

【0017】構成2によれば、研磨が行われる研磨室の
上方部に、研磨ブラシ又は研磨パッドの回転軸の往復動
及び回転軸に垂直な方向への回転軸の移動を妨げること
なく、かつ、研磨室内に飛散し、舞っているミストが研
磨室の上方部から外部に漏れぬようにする研磨液遮断部
を設けているので、研磨液や研磨液のミストが装置上方
部に漏れることがない。したがって、装置上方部におけ
る機械系や電気系等の故障を回避できる。特に、研磨ブ
ラシ等の回転に伴って発生する気流等によって上方に巻
き上げられた研磨液のミストが、装置上方に設けられた
研磨ブラシ等の駆動モーター内に入り込んでモーターが
故障するのを回避できる。また、装置の周囲に舞う研磨
液のミストを低減でき作業環境の悪化を改善できる。
According to the second aspect, the reciprocating motion of the rotating shaft of the polishing brush or the polishing pad and the movement of the rotating shaft in the direction perpendicular to the rotating shaft are not hindered in the upper portion of the polishing chamber where the polishing is performed, and Since a polishing liquid blocking portion is provided to prevent mist flying and flying in the polishing chamber from leaking from the upper part of the polishing chamber to the outside, the polishing liquid or mist of the polishing liquid may leak to the upper part of the apparatus. Absent. Therefore, a failure of a mechanical system, an electric system, or the like in an upper portion of the apparatus can be avoided. In particular, it is possible to avoid a situation in which the mist of the polishing liquid wound up by an air current or the like generated by the rotation of the polishing brush or the like enters a driving motor such as a polishing brush provided above the apparatus and breaks down the motor. . Further, the mist of the polishing liquid flowing around the apparatus can be reduced, and the deterioration of the working environment can be improved.

【0018】構成3によれば、構成2の効果に加え、例
えば図1に示すように、研磨室6の天井壁62と研磨ブ
ラシ又は研磨パッドの回転軸41の軸受け部44との間
に、カバー部材7を研磨液や研磨液のミストが漏れる隙
間が生じないように張り渡しているので、研磨ブラシ4
等の回転及び回転軸41の図示B方向への往復動及び図
示A方向への移動を妨げることなく、研磨液のミスト等
の装置上方への舞い上がりを低コストで防止できる。な
お、カバー部材は、研磨ブラシ等の回転を妨げることが
なように研磨ブラシ等の軸受け部などの非回転部等に取
り付ければよい。なお、図1では、研磨ブラシ4が最大
限上方に位置するため、カバー部材7は弛みのない状態
であるが、伸縮性のないカバー部材の場合にあっては、
研磨ブラシの図示B方向への往復動及び図示A方向への
移動を妨げることがなように弛ませた状態でカバー部材
7を取り付けることが好ましい。伸縮性のあるカバー部
材の場合にあっては、弛ませた状態で取り付けなくても
よい。カバー部材は研磨液や研磨液のミストの遮断に適
したものであればよい。カバー部材の材料としては、樹
脂シート、ゴムシート、防水布など耐水性、防水性、防
湿性等を有し、ミストを完全に遮断できるものが好まし
い。カバー部材は、伸縮自在の蛇腹を利用して作製する
こともできる。
According to the configuration 3, in addition to the effect of the configuration 2, for example, as shown in FIG. 1, the space between the ceiling wall 62 of the polishing chamber 6 and the bearing 44 of the rotating shaft 41 of the polishing brush or the polishing pad. Since the cover member 7 is stretched so as not to form a gap through which the polishing liquid or the mist of the polishing liquid leaks, the polishing brush 4
The rotation of the rotary shaft 41 and the reciprocating movement of the rotating shaft 41 in the direction B and the movement in the direction A can be prevented at low cost without the polishing liquid mist or the like rising over the apparatus. The cover member may be attached to a non-rotating part such as a bearing part of the polishing brush or the like so as not to hinder rotation of the polishing brush or the like. In FIG. 1, since the polishing brush 4 is positioned at the highest position, the cover member 7 is in a state without slack. However, in the case of a cover member having no elasticity,
It is preferable that the cover member 7 is attached in a state where the polishing brush is slackened so as not to hinder the reciprocation of the polishing brush in the direction B and the movement in the direction A. In the case of an elastic cover member, it is not necessary to attach the cover member in a loosened state. The cover member may be any one that is suitable for blocking the polishing liquid or the mist of the polishing liquid. As a material of the cover member, a resin sheet, a rubber sheet, a waterproof cloth, or the like having water resistance, waterproofness, moistureproofness, and the like, and capable of completely blocking mist is preferable. The cover member can also be manufactured using an elastic bellows.

【0019】構成4は、構成3のカバー部材の代わり
に、研磨液や研磨液のミスト等を遮断する作用を有する
部材を介在させたものである。研磨液や研磨液のミスト
を遮断する作用を有する部材としては、例えば、フィル
タ作用を有する公知の部材を利用できるが、耐水性等を
有するものが好ましい。フィルタ作用を有する部材は、
図1に示すカバー部材7の代わりにシート状のフィルタ
材料を取り付けることができる。また、図3に示すよう
に、研磨室の天井壁62の開口部61にスポンジなど伸
縮性のあるフィルタ材料66を介在させ塞ぐ態様などが
ある。この場合、研磨ブラシ4等の回転軸41の図示A
方向への移動を妨げることがないようにスポンジなどを
圧縮した状態で介在させることが好ましい。回転軸方向
への往復動は、スポンジなどの伸縮及び回転軸41がス
ポンジなどに対し滑ることによって、妨げられない。な
お、図4に示すように、研磨室の天井壁62の開口部6
1に、毛67を密集させて配設することによって研磨液
や研磨液のミストをある程度遮断することもできるが、
十分に遮断することはできない。この場合も、研磨ブラ
シの回転軸41の図示A方向への移動は妨げられず、回
転軸方向への往復動も妨げられりことはない。毛67と
しては、天然又は合成樹脂製の各種ブラシ毛などを利用
できる。天然のブラシ毛としては、例えば、ほうきの毛
(例えばほうき草の赤い茎や枝など)が挙げられる。
In the structure 4, a member having an action of blocking a polishing liquid or a mist of the polishing liquid is interposed instead of the cover member of the structure 3. As the polishing liquid or a member having a function of blocking the mist of the polishing liquid, for example, a known member having a filter function can be used, but a member having water resistance or the like is preferable. The member having the filter action is
A sheet-like filter material can be attached instead of the cover member 7 shown in FIG. As shown in FIG. 3, there is a mode in which an elastic filter material 66 such as sponge is interposed in the opening 61 of the ceiling wall 62 of the polishing chamber. In this case, the rotary shaft 41 of the polishing brush 4 and the like
It is preferable to interpose a sponge or the like in a compressed state so as not to hinder the movement in the direction. The reciprocating motion in the direction of the rotation axis is not hindered by the expansion and contraction of the sponge or the like and the rotation shaft 41 sliding on the sponge or the like. As shown in FIG. 4, the opening 6 in the ceiling wall 62 of the polishing chamber is provided.
1, by arranging the bristles 67 densely, the polishing liquid and the mist of the polishing liquid can be cut off to some extent.
It cannot be shut off enough. Also in this case, the movement of the rotating shaft 41 of the polishing brush in the direction A in the drawing is not hindered, and the reciprocating motion in the direction of the rotating shaft is not hindered. As the bristles 67, various brush bristles made of natural or synthetic resin can be used. Examples of the natural brush bristles include broom bristles (for example, red stems and branches of broom grass).

【0020】構成5によれば、前記研磨室内に舞ってい
るミストを吸引する吸引装置を設けているので、研磨終
了後基板を取り出す際に、研磨液のミストが周囲に流出
することがなく、作業環境を改善できるとともに、装置
の故障をより低減できる。吸引のタイミングは、基板の
取り出し前が好ましい。研磨中や研磨終了前、基板の取
り出し中に吸引を行うこともできる。吸引口(吸引ダク
ト)は研磨室の壁面の任意の箇所に一箇所又は複数箇所
設けることができる。吸引したミストは、フィルターで
除去することが好ましい。
According to the fifth aspect, since the suction device for sucking the mist flying in the polishing chamber is provided, the mist of the polishing liquid does not flow out to the surroundings when the substrate is taken out after polishing. The working environment can be improved, and failures of the device can be further reduced. The suction timing is preferably before the substrate is taken out. Suction can also be performed during or before polishing, or during removal of the substrate. One or a plurality of suction ports (suction ducts) can be provided at arbitrary positions on the wall surface of the polishing chamber. The sucked mist is preferably removed by a filter.

【0021】[0021]

【発明の実施の形態】以下、本発明の研磨装置の一実施
の形態を図面に基づいて詳細に説明する。図1は本発明
の一実施の形態に係る研磨装置の要部を正面から見た部
分断面図、図2は天井壁を除いて見た研磨室の平面図で
ある。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, an embodiment of the polishing apparatus of the present invention will be described in detail with reference to the drawings. FIG. 1 is a partial cross-sectional view of a main part of a polishing apparatus according to an embodiment of the present invention, as viewed from the front, and FIG. 2 is a plan view of a polishing chamber without a ceiling wall.

【0022】図1において、1は研磨対象である磁気デ
ィスク用ガラス基板(以下MD基板という)、2は多数
のMD基板1を重ねて保持する保持手段、3は保持手段
2を回動自在に保持する回転保持台、4は多数枚重ねら
れたMD基板1の外周端面部分に接触する研磨ブラシ、
5は研磨液を供給する研磨液供給手段、6は研磨室、7
はカバー部材である。
In FIG. 1, 1 is a glass substrate for a magnetic disk to be polished (hereinafter referred to as an MD substrate), 2 is a holding means for holding a large number of MD substrates 1 on top of each other, and 3 is a holding means 2 which is rotatable. A rotary holding table 4 for holding, a polishing brush for contacting an outer peripheral end surface portion of the MD substrate 1 on which a large number of MD substrates 1 are stacked;
5 is a polishing liquid supply means for supplying a polishing liquid, 6 is a polishing chamber, 7
Is a cover member.

【0023】基板保持手段2は、軸21に挿入したMD
基板1を受け部材22で受け、軸方向上部からカラー2
3を介して締め付け治具24で積層MD基板を締め込む
ことで、各MD基板1どうしの主表面間の摩擦係数によ
り、基板保持手段2の回転や研磨ブラシ4の回転によっ
てずれることなくMD基板1を保持する機構を有する。
基板保持手段2の軸21の上端は、研磨室6の天井壁6
2に回転自在な状態で取り付けられている。
The substrate holding means 2 includes an MD inserted into the shaft 21.
The substrate 1 is received by the receiving member 22, and the collar 2 is received from the upper part in the axial direction.
By tightening the stacked MD substrates with the tightening jig 24 via the 3, the MD substrates are not shifted by the rotation of the substrate holding means 2 or the rotation of the polishing brush 4 due to the friction coefficient between the main surfaces of the MD substrates 1. 1 is provided.
The upper end of the shaft 21 of the substrate holding means 2 is
2 is attached in a rotatable state.

【0024】回転保持台3は、回転軸31に結合され、
その回転軸31を回転駆動する回転駆動装置(図示せ
ず)によって正逆の双方向に回転できるようになってい
る。なお、この回転駆動装置はその回転数を可変できる
ようになっており、研磨目的に応じた適切な回転数を選
定できるようになっている。回転軸31は、研磨室6の
底面に回転自在かつシールされた状態で取り付けられて
いる。
The rotation holder 3 is connected to a rotation shaft 31,
A rotation driving device (not shown) for driving the rotation shaft 31 can rotate in both forward and reverse directions. In addition, this rotation driving device can change its rotation speed, and can select an appropriate rotation speed according to a polishing purpose. The rotating shaft 31 is rotatably and sealedly mounted on the bottom surface of the polishing chamber 6.

【0025】研磨ブラシ4は、回転駆動装置(図示せ
ず)の回転軸41に接続されており、正逆の双方向に回
転可能に構成されている。研磨ブラシ4は、基板セッテ
ィング時に図示A方向に退避可能に構成されている。ま
た、研磨ブラシ4は、ブラシ毛43のMD基板1への接
触長さを加減するため、MD基板1の外周端面部分への
押しつけ量を調整可能に構成されている。研磨ブラシ4
は、カム機構(図示せず)によって、ブラシの回転軸方
向(図示B方向)に沿って往復運動ができるように構成
されている。この際、研磨ブラシ4の往復運動範囲は、
セットされたMD基板1の最下部から最上部までの範囲
が研磨ブラシ4のブラシ毛の植毛範囲内に収まる範囲内
とする。
The polishing brush 4 is connected to a rotary shaft 41 of a rotary drive (not shown), and is configured to be rotatable in both forward and reverse directions. The polishing brush 4 is configured to be retractable in the direction A in the drawing when setting the substrate. In addition, the polishing brush 4 is configured to be able to adjust the pressing amount of the brush bristles 43 against the outer peripheral end surface portion of the MD substrate 1 in order to adjust the length of contact of the brush bristles 43 with the MD substrate 1. Polishing brush 4
Is configured to be able to reciprocate along the rotation axis direction (B direction in the drawing) of the brush by a cam mechanism (not shown). At this time, the reciprocating range of the polishing brush 4 is
The range from the lowermost portion to the uppermost portion of the set MD substrate 1 is set to be within the range in which the bristle of the polishing brush 4 is implanted.

【0026】なお、研磨ブラシ4は、回転駆動装置側の
回転軸41とは反対側(図示下側)に回転軸を有してい
ないが、回転軸41の反対側にも回転軸及びこの回転軸
を固定する軸受を設けることにより、外周端面部分の研
磨時においても研磨ブラシ4の回転軸がずれることがな
く研磨することができ、表面粗さ、サイズにばらつきが
ない高精度な研磨を行うことができるので好ましい。軸
受としては、べアリング、ボ−ル軸受、ころ軸受、すべ
り軸受など公知の軸受を使用することができる。軸受
は、研磨ブラシ4の回転軸の複数箇所に設けることがで
き、回転駆動装置側の回転軸41にも設けることができ
る。この場合、回転軸41を図示A方向へ移動させるに
は、例えば、一旦回転軸41を持ち上げ軸受けから抜い
た後A方向へ移動させるか、あるいは軸受けの方を回転
軸41に対し挿脱可能にすればよい。
Although the polishing brush 4 does not have a rotating shaft on the opposite side (lower side in the figure) of the rotating shaft 41 on the side of the rotary driving device, the rotating shaft and the rotating shaft are also provided on the opposite side of the rotating shaft 41. By providing a bearing for fixing the shaft, the rotation shaft of the polishing brush 4 can be polished without shifting even during polishing of the outer peripheral end face portion, and high-precision polishing without variation in surface roughness and size is performed. It is preferable because it can be used. Known bearings such as bearings, ball bearings, roller bearings, and slide bearings can be used as the bearings. Bearings can be provided at a plurality of positions on the rotating shaft of the polishing brush 4, and can also be provided on the rotating shaft 41 on the rotation drive device side. In this case, in order to move the rotating shaft 41 in the illustrated A direction, for example, once the rotating shaft 41 is lifted and removed from the bearing, and then moved in the A direction, or the bearing can be inserted into and removed from the rotating shaft 41. do it.

【0027】研磨ブラシ4は、例えば、円筒形の胴部に
ブラシ毛を帯状且つ螺旋状に植毛したものである。研磨
ブラシ4の他の態様としては、円筒形の胴部にブラシ毛
を点在して植毛した部分植毛などの態様が挙げられる。
また、ブラシ毛43としては、例えば、蛇行形にカール
させたナイロン繊維(直径0.1〜0.3mm、長さ1
0〜30mm)が使用されている。ブラシ毛43の他の
態様としては、ナイロン繊維の代わりに塩化ビニル繊
維、豚毛、ピアノ線、ステンレス製繊維などが挙げられ
る。
The polishing brush 4 is obtained by, for example, implanting brush bristles in a belt shape and a spiral shape on a cylindrical body. As another embodiment of the polishing brush 4, there is an embodiment such as partial planting in which brush bristles are scattered and planted in a cylindrical body.
In addition, as the brush bristles 43, for example, a meandering curled nylon fiber (diameter: 0.1 to 0.3 mm, length: 1)
0-30 mm). Other embodiments of the brush bristles 43 include vinyl chloride fiber, pig hair, piano wire, stainless steel fiber and the like instead of nylon fiber.

【0028】本発明では、研磨ブラシ4に替えて、研磨
パッドを用いることができる。研磨パッドとしては、例
えば、スウェード、ベロアを素材とする軟質ポリシャ
や、硬質ベロア、ウレタン発砲、ピッチ含浸スウェード
等の硬質ポリシャなどが挙げられる。研磨パッドは、例
えば、円筒形の胴部に研磨パッドを全周に巻き付けて配
設したものが好ましい。
In the present invention, a polishing pad can be used in place of the polishing brush 4. Examples of the polishing pad include soft polishers made of suede and velor, and hard polishers such as hard velor, urethane foam, and pitch impregnated suede. As the polishing pad, for example, it is preferable that the polishing pad is provided by winding the polishing pad around the entire circumference of a cylindrical body.

【0029】研磨液供給手段5は、研磨液供給ノズル5
1、研磨液供給管53等からなり、積層ガラス基板10
に研磨液50を供給する。研磨液供給手段5’は、研磨
液供給口52、研磨液供給管53等からなり、積層ガラ
ス基板10’に研磨液50を図5に示す態様で供給す
る。なお、本発明の研磨装置は図1には図示していない
が、研磨液供給手段から供給した研磨液を研磨室6の底
面64に設けた回収口(図示せず)から回収する研磨液
回収部と、回収した研磨液を清浄にし、再び研磨液供給
手段へと循環させる循環機構が装備されている。
The polishing liquid supply means 5 includes a polishing liquid supply nozzle 5
1, a polishing liquid supply pipe 53, etc.
Is supplied with a polishing liquid 50. The polishing liquid supply means 5 'includes a polishing liquid supply port 52, a polishing liquid supply pipe 53, and the like, and supplies the polishing liquid 50 to the laminated glass substrate 10' in a manner shown in FIG. Although not shown in FIG. 1, the polishing apparatus of the present invention collects the polishing liquid supplied from the polishing liquid supply means from a recovery port (not shown) provided on the bottom surface 64 of the polishing chamber 6. And a circulating mechanism for cleaning the collected polishing liquid and circulating it again to the polishing liquid supply means.

【0030】研磨室6は、天井壁62、側壁63、底面
64からなる。研磨室6の天井壁62には、研磨ブラシ
4等の回転及び回転軸41の図示B方向への往復動及び
図示A方向への移動を妨げることないように、開口部6
1が設けられている。研磨室6の天井壁62と研磨ブラ
シ4の回転軸41の軸受け部44との間に、カバー部材
7を研磨液や研磨液のミストが漏れる隙間が生じないよ
うに張り渡すことによって、開口部61から研磨液のミ
スト等が装置上方へ漏れるのを防止している。研磨室6
の作業側の側壁63には、開閉扉65が設けられ、この
開閉扉65によって研磨室6内を密閉可能に構成されて
いる。
The polishing chamber 6 includes a ceiling wall 62, side walls 63, and a bottom surface 64. An opening 6 is formed in the ceiling wall 62 of the polishing chamber 6 so as not to hinder the rotation of the polishing brush 4 and the like and the reciprocation of the rotating shaft 41 in the direction B and the movement in the direction A.
1 is provided. The cover member 7 is stretched between the ceiling wall 62 of the polishing chamber 6 and the bearing portion 44 of the rotating shaft 41 of the polishing brush 4 so as not to form a gap through which the polishing liquid or the mist of the polishing liquid leaks. The mist of the polishing liquid or the like is prevented from leaking from above 61 to the upper part of the apparatus. Polishing room 6
An opening / closing door 65 is provided on the side wall 63 on the working side, and the inside of the polishing chamber 6 can be sealed by the opening / closing door 65.

【0031】以上好ましい実施の態様を挙げて本発明を
説明したが、本発明は上記実施の態様に限定されない。
Although the present invention has been described with reference to the preferred embodiments, the present invention is not limited to the above embodiments.

【0032】例えば、カバー部材の代わりに、図3や図
4に示すように、研磨液のミスト等を遮断する作用を有
する部材を開口部61等に介在させることができる。ま
た、図1や図2の構成に加え、研磨室内に舞っている研
磨液のミストを吸引する吸引装置を、吸引口(吸引ダク
ト)を介して設けてもよい。吸引口は、研磨室の下方な
どに設けられる。本発明の構成は内周端面研磨にも応用
できる。例えば、中心部に円孔を有する円板状の基板を
複数枚重ねて保持する保持手段と、前記保持手段を回転
させる手段と、前記複数枚重ねられた基板の内周端面部
分に接触する研磨ブラシ又は研磨パッドと、前記研磨ブ
ラシ又は研磨パッドを回転させる手段と、前記複数枚重
ねられた基板の内周端面部分に研磨液を供給する研磨液
供給手段とを少なくとも備えた内周端面研磨装置におい
て、研磨の際に周囲に飛散する研磨液及び周囲に舞って
いる研磨液のミストが外部に漏れぬように研磨が行われ
る部位の周囲に研磨室を設け、この研磨室を密閉可能な
構造とした研磨装置とすることができる。同様に、前記
内周端面研磨装置において、上述した外周端面研磨装置
における研磨液遮断部、カバー部材、吸引装置等を同様
に設けることもできる。例えば、内周端面研磨装置にお
いて、研磨が行われる研磨部の周囲を囲む研磨室の上方
部に、研磨ブラシ又は研磨パッドの回転軸の回転及び回
転軸の往復動や各種移動を妨げることなく、かつ、研磨
室内に飛散する研磨液及び研磨室内に舞っている研磨液
のミストが研磨室の上方部から外部に漏れぬようにする
研磨液遮断部を設けることができる。より具体的には、
例えば、内周端面研磨装置において、研磨室の天井壁と
研磨ブラシ又は研磨パッドの回転軸の軸受け部との間
に、研磨室内に飛散する研磨液及び研磨室内に舞ってい
る研磨液のミストを遮断するカバー部材を設けることが
できる。また、内周端面研磨装置において、研磨室の天
井壁と研磨ブラシ又は研磨パッドの回転軸との間に、研
磨室内に飛散する研磨液及び研磨室内に舞っている研磨
液のミストを遮断する作用を有する部材を介在させるこ
とができる。本発明の研磨装置は、例えば、アルミノシ
リケートガラス、ソーダライムガラス、ソーダアルミノ
ケイ酸ガラス、アルミノボロシリケートガラス、ボロシ
リケートガラス、石英ガラスなどのガラス基板や、結晶
化ガラス基板等の磁気ディスク用のガラス基板の研磨装
置として好適に使用できる。
For example, instead of the cover member, as shown in FIGS. 3 and 4, a member having a function of blocking a mist or the like of the polishing liquid can be interposed in the opening 61 or the like. Further, in addition to the configuration shown in FIGS. 1 and 2, a suction device for sucking mist of the polishing liquid flowing in the polishing chamber may be provided via a suction port (suction duct). The suction port is provided below the polishing chamber. The configuration of the present invention can also be applied to inner peripheral end surface polishing. For example, holding means for stacking and holding a plurality of disc-shaped substrates having circular holes in the center, means for rotating the holding means, and polishing for contacting the inner peripheral end surface portion of the plurality of stacked substrates An inner peripheral end surface polishing apparatus comprising at least a brush or a polishing pad, a means for rotating the polishing brush or the polishing pad, and a polishing liquid supply means for supplying a polishing liquid to an inner peripheral end surface portion of the plurality of stacked substrates. In the structure, a polishing chamber is provided around a portion where polishing is performed so that a mist of the polishing liquid scattered around the polishing liquid and a mist of the polishing liquid flying therearound does not leak outside, and the polishing chamber can be sealed. The polishing apparatus can be made as follows. Similarly, in the inner peripheral end surface polishing apparatus, the polishing liquid blocking portion, the cover member, the suction device, and the like in the above-described outer peripheral end surface polishing apparatus can be similarly provided. For example, in the inner peripheral end surface polishing apparatus, in the upper portion of the polishing chamber surrounding the periphery of the polishing section where polishing is performed, without hindering the rotation of the rotation axis of the polishing brush or polishing pad and the reciprocating movement and various movements of the rotation axis, In addition, a polishing liquid blocking portion can be provided to prevent the polishing liquid scattered in the polishing chamber and the mist of the polishing liquid flying in the polishing chamber from leaking from the upper part of the polishing chamber to the outside. More specifically,
For example, in an inner peripheral end surface polishing apparatus, between a ceiling wall of a polishing chamber and a bearing of a rotating shaft of a polishing brush or a polishing pad, a polishing liquid scattered in the polishing chamber and a mist of the polishing liquid flying in the polishing chamber are removed. A cover member for blocking can be provided. Further, in the inner peripheral end surface polishing apparatus, an action of shutting off a polishing liquid scattered in the polishing chamber and a mist of the polishing liquid flying in the polishing chamber between the ceiling wall of the polishing chamber and the rotating shaft of the polishing brush or the polishing pad. Can be interposed. The polishing apparatus of the present invention includes, for example, glass substrates such as aluminosilicate glass, soda lime glass, soda aluminosilicate glass, aluminoborosilicate glass, borosilicate glass, quartz glass, and glass for magnetic disks such as crystallized glass substrates. It can be suitably used as a substrate polishing apparatus.

【0033】[0033]

【発明の効果】以上説明したように本発明の研磨装置に
よれば、研磨液や研磨液のミストが外部に漏れることを
防止できる。したがって、装置における機械系や電気系
等の故障を回避できる。特に、研磨ブラシの駆動モータ
ー内に研磨液のミストが入り込んでモーターが故障する
のを回避できる。また、装置の周囲に舞う研磨液のミス
トによる作業環境の悪化を大幅に改善できる。
As described above, according to the polishing apparatus of the present invention, it is possible to prevent the polishing liquid and the mist of the polishing liquid from leaking to the outside. Therefore, it is possible to avoid a failure of the mechanical system or the electrical system in the device. In particular, it is possible to prevent the mist of the polishing liquid from entering the drive motor of the polishing brush and causing the motor to break down. Further, the deterioration of the working environment due to the mist of the polishing liquid flying around the apparatus can be greatly improved.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施の形態に係る研磨装置の要部を
正面から見た部分断面図である。
FIG. 1 is a partial cross-sectional view of a main part of a polishing apparatus according to an embodiment of the present invention as viewed from the front.

【図2】本発明の一実施の形態に係る研磨装置の要部の
平面図である。
FIG. 2 is a plan view of a main part of the polishing apparatus according to one embodiment of the present invention.

【図3】本発明の他の実施の形態に係る研磨装置の要部
の平面図である。
FIG. 3 is a plan view of a main part of a polishing apparatus according to another embodiment of the present invention.

【図4】本発明の他の実施の形態に係る研磨装置の要部
の平面図である。
FIG. 4 is a plan view of a main part of a polishing apparatus according to another embodiment of the present invention.

【図5】実施例における研磨液の供給態様を示す側面図
である。
FIG. 5 is a side view showing a supply mode of a polishing liquid in an example.

【図6】外周端面部分の研磨の様子を示す平面図であ
る。
FIG. 6 is a plan view showing a state of polishing an outer peripheral end surface portion.

【符号の説明】[Explanation of symbols]

1 ガラス基板(MD基板) 1a 側壁部 1b 面取部 2 基板保持手段 3 回転保持台 4 研磨ブラシ 5、5’研磨液供給手段 6 研磨室 7 カバー部材 10、10’積層ガラス基板 31 回転軸 41 回転軸 43 ブラシ毛 50 研磨液 62 天井壁 REFERENCE SIGNS LIST 1 glass substrate (MD substrate) 1 a side wall portion 1 b chamfered portion 2 substrate holding means 3 rotation holding table 4 polishing brush 5, 5 'polishing liquid supply means 6 polishing chamber 7 cover member 10, 10' laminated glass substrate 31 rotation axis 41 Rotating shaft 43 Brush hair 50 Polishing liquid 62 Ceiling wall

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 中心部に円孔を有する円板状の基板を複
数枚重ねて保持する保持手段と、該保持手段を回転させ
る手段と、前記複数枚重ねられた基板の外周端面部分に
接触する研磨ブラシ又は研磨パッドと、該研磨ブラシ又
は研磨パッドを回転させる手段と、前記複数枚重ねられ
た基板の外周端面部分に研磨液を供給する研磨液供給手
段とを少なくとも備えた研磨装置であって、 研磨の際に周囲に飛散する研磨液及び周囲に舞っている
研磨液のミストが外部に漏れぬように研磨が行われる部
位の周囲に研磨室を設け、該研磨室を密閉可能な構造と
したことを特徴とする研磨装置。
1. A holding means for stacking and holding a plurality of disc-shaped substrates having a circular hole at a center portion, a means for rotating the holding means, and a contacting means for contacting an outer peripheral end surface portion of the plurality of stacked substrates. A polishing brush or a polishing pad, a means for rotating the polishing brush or the polishing pad, and a polishing liquid supply means for supplying a polishing liquid to an outer peripheral end surface portion of the plurality of stacked substrates. A polishing chamber is provided around a portion where polishing is performed so that a polishing liquid scattered around the polishing liquid and a mist of the polishing liquid flying around the liquid do not leak outside, and the polishing chamber can be hermetically sealed. A polishing apparatus characterized in that:
【請求項2】 中心部に円孔を有する円板状の基板を複
数枚重ねて保持する保持手段と、該保持手段を回転させ
る手段と、前記複数枚重ねられた基板の外周端面部分に
接触する研磨ブラシ又は研磨パッドと、該研磨ブラシ又
は研磨パッドの上方部に設けられ該研磨ブラシ又は研磨
パッドを回転させる手段と、前記研磨ブラシ又は研磨パ
ッドを回転軸方向に往復動させる手段と、前記保持手段
と研磨ブラシ又は研磨パッドとの間の距離を調整するた
め研磨ブラシ又は研磨パッドの回転軸を移動させる手段
と、前記複数枚重ねられた基板の外周端面部分に研磨液
を供給する研磨液供給手段と、研磨が行われる研磨部の
周囲を囲む研磨室と、を少なくとも備えた研磨装置であ
って、 前記研磨室の上方部に、研磨ブラシ又は研磨パッドの回
転軸の前記往復動及び前記移動を妨げることなく、か
つ、研磨室内に飛散する研磨液及び研磨室内に舞ってい
る研磨液のミストが研磨室の上方部から外部に漏れぬよ
うにする研磨液遮断部を設けたことを特徴とする研磨装
置。
2. A holding means for stacking and holding a plurality of disc-shaped substrates having a circular hole at a central portion, a means for rotating the holding means, and a contacting means for contacting an outer peripheral end surface portion of the plurality of stacked substrates. A polishing brush or a polishing pad, means for rotating the polishing brush or the polishing pad provided above the polishing brush or the polishing pad, means for reciprocating the polishing brush or the polishing pad in a rotation axis direction, Means for moving the rotation axis of the polishing brush or the polishing pad to adjust the distance between the holding means and the polishing brush or the polishing pad; and a polishing liquid for supplying a polishing liquid to the outer peripheral end portion of the plurality of stacked substrates. A polishing apparatus comprising at least a supply unit and a polishing chamber surrounding a polishing section where polishing is performed, wherein an upper portion of the polishing chamber includes a polishing brush or a rotating shaft of a polishing pad. A polishing liquid blocking section is provided to prevent the polishing liquid scattered in the polishing chamber and the mist of the polishing liquid flying in the polishing chamber from leaking from the upper part of the polishing chamber to the outside without hindering the backward movement and the movement. Polishing apparatus, characterized in that:
【請求項3】 研磨室の天井壁と研磨ブラシ又は研磨パ
ッドの回転軸の軸受け部との間に、研磨室内に飛散する
研磨液及び研磨室内に舞っている研磨液のミストを遮断
するカバー部材を設けたことを特徴とする請求項2記載
の研磨装置。
3. A cover member that intercepts a polishing liquid scattered in the polishing chamber and a mist of the polishing liquid flying in the polishing chamber between a ceiling wall of the polishing chamber and a bearing portion of a rotating shaft of the polishing brush or the polishing pad. 3. The polishing apparatus according to claim 2, further comprising:
【請求項4】 研磨室の天井壁と研磨ブラシ又は研磨パ
ッドの回転軸との間に、研磨室内に飛散する研磨液及び
研磨室内に舞っている研磨液のミストを遮断する作用を
有する部材を介在させたことを特徴とする請求項2記載
の研磨装置。
4. A member having a function of blocking a polishing liquid scattered in the polishing chamber and a mist of the polishing liquid flying in the polishing chamber is provided between a ceiling wall of the polishing chamber and a rotating shaft of the polishing brush or the polishing pad. The polishing apparatus according to claim 2, wherein the polishing apparatus is interposed.
【請求項5】 前記研磨室内に舞っている研磨液のミス
トを吸引する吸引装置を設けたことを特徴とする請求項
1ないし4のいずれかに記載の研磨装置。
5. The polishing apparatus according to claim 1, further comprising a suction device for suctioning a mist of the polishing liquid flowing in the polishing chamber.
JP2000238134A 2000-08-07 2000-08-07 Polishing apparatus Pending JP2002046060A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000238134A JP2002046060A (en) 2000-08-07 2000-08-07 Polishing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000238134A JP2002046060A (en) 2000-08-07 2000-08-07 Polishing apparatus

Publications (1)

Publication Number Publication Date
JP2002046060A true JP2002046060A (en) 2002-02-12

Family

ID=18729882

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000238134A Pending JP2002046060A (en) 2000-08-07 2000-08-07 Polishing apparatus

Country Status (1)

Country Link
JP (1) JP2002046060A (en)

Similar Documents

Publication Publication Date Title
KR100536513B1 (en) Chemical mechanical polishing conditioner
JP2008288599A (en) Method and apparatus for polishing notch of substrate using polishing pad
JP2008306179A (en) Method and apparatus for removing film and foil from edge on both sides of substrate by using backing pad
JPH11176779A (en) Washing method and system
JP2009004765A (en) Method and apparatus for using rolling backing pad for substrate polishing
US6252742B1 (en) Disk drive and floating head slider with means for minimizing dust accumulation thereon
JP2002046060A (en) Polishing apparatus
JP2007201427A (en) Stain removing mechanism of rotary roll
CN1253857C (en) Magnetic reproducing unit
JPH06203548A (en) Magnetic disk device
JP2007258467A (en) Sucking apparatus, polishing apparatus, semiconductor-device manufacturing method, and semiconductor device manufactured by same method
JP2002177898A (en) Substrate cleaning apparatus, substrate cleaning method, and cleaning brush
KR100200850B1 (en) Head cleaner
CN219846386U (en) Wiper mounting and connecting structure and floor wiping machine
US20020030910A1 (en) Method and apparatus for magnetic transfer
KR20190119305A (en) Substrate processing apparatus
JP2003203335A (en) Magnetic transfer method
JPH0729223A (en) Production of stamper and device for polishing rear surface of stamper
JP2004039155A (en) Optical disk polishing device
JPH02304787A (en) Optical disk medium cleaner
CN100334617C (en) Magnetic copy device
JP2012018723A (en) Method for manufacturing magnetic recording medium and system for manufacturing magnetic recording medium
JP2002046066A (en) Polishing apparatus and method and method of manufacturing glass substrate for magnetic storage medium and magnetic storage medium
JPS63180459A (en) Polishing of magnetic head
JPH03142770A (en) Optical disk medium cleaner

Legal Events

Date Code Title Description
A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20040325

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20040406

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20040803