JP2002022682A - Sample holder for x-ray analysis - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a sample holder for X-ray analysis capable of shortening a sample mounting time and capable of accurately positioning the sample. SOLUTION: Since a sample mounting means 2 can be positioned with respect to a sample mask 4 by a positioning mechanism 8, the positioning of the samples 3 becomes easy. Since a grasping mechanism 20 grasps the samples to hold them in the direction crossing the mutual contact surfaces of the samples at right angles, even the samples difficult to grasp in a superposed state like linear samples having a trapezoidal cross-sectional shape can be easily held. Further, since the grasping mechanism 20 is changed over to a sample holding closed position and a sample releasing open position by a cam mechanism 30, the holding of the samples becomes easy.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a sample holder for holding a linear sample such as a piston ring and a wire in an X-ray analyzer such as an X-ray fluorescence analyzer.

[0002]

2. Description of the Related Art An X-ray fluorescence analyzer is an apparatus for irradiating a sample with radiation such as primary X-rays and measuring the fluorescent X-rays generated from the sample to perform elemental analysis of the sample. When analyzing a linear sample such as a piston ring or a wire with this analyzer, a plurality of the samples are used in a stack, and the sample is correctly set at the primary X-ray irradiation position, and the sample is loaded by an automatic machine. A sample holder is used to enable

[0003]

Conventionally, however, a method has been adopted in which a plurality of linear samples are fixed with an adhesive tape or the like and then attached to a sample mask. For example, a sample of a piston ring has a trapezoidal cross section. It is not easy to set the analysis surfaces flush with each other by arranging the bottom portions in contact with each other, it takes a long time to mount, and it is very difficult to position the sample.

The present invention has been made in view of the above-mentioned conventional problems, and an object of the present invention is to provide a sample holder for X-ray analysis capable of shortening a sample mounting time and accurately positioning a sample. is there.

[0005]

In order to achieve the above object, a sample holder for X-ray analysis according to the present invention comprises: a sample mounting jig for mounting a plurality of identical samples brought into contact with each other; A sample mask having an X-ray passing hole that is opposed to an analysis surface of a sample and allows X-rays to pass through and irradiates the sample, and a positioning mechanism that positions the sample mounting jig with respect to the sample mask. The sample mounting jig includes a gripping mechanism for holding the sample in a direction perpendicular to a contact surface between the samples by a pair of gripping portions being pressed by a spring, and a gripping mechanism for holding the sample. A cam mechanism for switching between a closed position and an open position for opening the sample;

According to the present invention, the sample mounting jig can be positioned with respect to the sample mask by the positioning mechanism.
The positioning of the sample becomes easy. Further, since the gripping mechanism holds the sample in a direction orthogonal to the contact surface between the samples, the sample is difficult to grip by overlapping, for example, a sample having a trapezoidal cross section. , Can be easily held. Further, since the holding mechanism is switched between the closed position for holding the sample and the open position for opening the sample by the cam mechanism, the sample is easily held.

[0007]

Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a longitudinal sectional view of a sample holder for X-ray analysis according to one embodiment of the present invention. FIG. 1 (a)
And (b) are longitudinal sectional views in which the cutting lines are different from each other by 90 °. Before explaining the sample holder 1, first, the fluorescent X
The outline of the line analyzer will be described.

In FIG. 2, an X-ray tube (radiation source) 10
Emits primary X-rays (radiation) B1 and irradiates the sample 3 with the primary X-rays B1 from below. The primary X-rays B1 applied to the sample 3 excite the atoms of the sample 3 to generate fluorescent X-rays B2 unique to the element. The fluorescent X-ray B2 from the sample 3 passes through the field-of-view limiting slit 11 and the first solar slit 12, and is incident on the spectral crystal 13 at an incident angle θ.
Only the fluorescent X-ray B2 having a predetermined wavelength satisfying the Bragg equation is diffracted at the same diffraction angle θ as the incident angle θ. The diffracted fluorescent X-ray B2 passes through the second solar slit 14, and then enters the X-ray detector 15 and is detected. The element analysis of the sample 3 is performed based on the detected value.

Next, the sample holder 1 will be described.
In FIG. 1B, the sample holder 1 has, for example, a cylindrical shape, and a sample mounting jig 2 for mounting a plurality of the same samples 3 brought into contact with each other is detachably provided in an annular wall 16 thereof. Have been. The bottom of the annular wall 16 faces the analysis surface 6 of the mounted sample 3 and the primary X
A sample mask 4 having an X-ray passage hole 7 through which a beam B1 passes and irradiates the sample 3 is fixed via a plurality of screws 40.

The sample mounting jig 2 has an upper base 17 fixed to an upper portion of an annular wall 16 of the sample holder 1. As shown in FIG. 1A, a central support plate 18 extending downward at a substantially central portion is fixed to the upper base 17 via a plurality of screws 41. The central support plate 18 has an opening 18a at the upper center.
Is provided, and a gripping mechanism 20 described later is disposed in the opening 18a. The lower part of the central support plate 18 has a curved shape, for example, following the shape of the curved linear sample 3, and supports the upper surface of the sample 3. As shown in FIG. 1B, a pair of lower support plates 19 extending downward are fixed to the upper base 17 on both sides in a direction perpendicular to the central support plate 18 via a plurality of screws 42. Have been.

The sample holder 1 is provided with a positioning mechanism 8 comprising, for example, positioning pins for positioning the sample mounting jig 2 with respect to the sample mask 4. That is, FIG.
The sample mounting jig 2 is positioned with respect to the sample mask 4 by inserting the positioning pins 8 into predetermined positions of the annular wall 16 and the upper base 17 in (a).

The fixed shaft 25 arranged in the opening 18a in FIG. 1B is fixed horizontally by screwing the screw portion 25a into the both-side support plate 19. This fixed shaft 25
The pair of grippers 21 and 21 are movably fitted to each other.
The grip portion 21 is provided between a grip upper portion 22 that engages with a cam mechanism 30 described later, a grip lower portion 23 on which a plurality of samples 3 are mounted, and upper and lower grip upper portions 22 and 23, and the fixed shaft The fitting portion 24 that fits with the fitting 25 is integrally formed. The fitting portion 24 is provided so as to protrude outward in the axial direction from the grip upper portion 22 and the grip lower portion 23.

Each of the gripping portions 21 has a fitting portion 24 between the gripping upper portion 22 and the gripping lower portion 23 and both side supporting plates 19.
The springs 26, 2
The spring 26 always presses the grip 21 inward in the axial direction. A plurality of springs 26 having different spring forces are prepared, and are selected according to the shape of the sample 3.
The upper base 17, the center support plate 18, the both side support plates 19,
19, the fixed shaft 25, the pair of grippers 21, 21 and the springs 26, 26 constitute the gripping mechanism 20. The gripping mechanism 20 is configured such that the pair of grippers 21 are pressed by the spring 26 and the sample 3
The sample 3 is held in a direction X perpendicular to the contact surfaces of the two.

A cam mechanism 3 is provided above the gripping mechanism 20.
0 is provided. The cam mechanism 30 has an oval cam 34 provided below a shaft 33 with a handle 32.
This cam 34 engages with the gripping upper part 22. The handle 32 is fixed to the shaft 33 via a plurality of screws 43. By turning the handle 32, when the short-diameter portion of the cam 34 engages with the grip upper portion 22, it is switched to the closed position for holding the sample, and when the long-diameter portion is engaged with the grip upper portion 22, it is switched to the open position for opening the sample. . The sample mounting jig 2 is constituted by the gripping mechanism 20 and the cam mechanism 30.

Next, a method of mounting the sample 3 will be described. As shown in FIG. 3, for example, when holding a linear sample 3 such as a piston ring having a trapezoidal cross section and a bottom portion serving as an analysis surface 6, a plurality of the same samples 3 are placed on a flat table D in advance. In this example, three analysis surfaces 6 are arranged in contact with each other, and the analysis surfaces 6 are kept flush.

Next, the sample 3 is held by the sample mounting jig 2 detached from the sample holder 1 of FIG. That is, the handle 32 of the cam mechanism 30 of the sample holder 1 is turned to the open position of the sample opening, and the sample 3 in the above-mentioned flush state is sandwiched between the holding lower portions 23 of the holding portions 21. In this case, in order to keep the same level, it is preferable to hold the lower portion of the holding portion 23 in a state where the bottom surface of the holding portion 23 is applied to the flat base D. After that, the handle 32 of the cam mechanism 30 is turned to set the sample holding position to the closed position, and the sample 3 is held by the grip 21.

In the present invention, the gripping mechanism 20 sandwiches the sample 3 in a direction X orthogonal to the contact surface S between the samples 3 in FIG. 3 and has an appropriate spring force for holding the sample, as shown in FIG. )
And is held using a spring 26. Therefore, in the case of the sample 3 having the shape shown in FIG. 3, if a force is applied in a direction other than the direction X, and if the force applied to the sample 3 is too strong or too weak, the samples 3 are separated from each other. In the present invention, since the sample 3 is held by the sandwiching direction X and the spring force, which are optimal for holding the sample, the analysis surface of the plurality of samples 3 is difficult to hold. 6 can be maintained flush.

The cam mechanism 30 shown in FIG.
Since the gripping mechanism 20 is easily switched between the closed position for holding the sample and the open position for opening the sample, the sample 3 can be easily held.

Finally, the sample mounting jig 2 is set on the sample holder 1 while the analysis surface 6 of the sample 3 is kept flush. In this case, the positioning mechanism 8 causes the sample mounting jig 2
Is positioned with respect to the sample mask 4, so that the sample 3 can be easily positioned with respect to the sample holder 1. Thus, the sample 3 is mounted on the sample holder 1.

In this embodiment, the sample mounting jig 2 is set on the sample holder 1 after the sample 3 is held by the gripping mechanism 20, but the sample mounting jig 2 is set on the sample holder 1 in advance. Then, the sample 3 may be held while the sample mask 4 is removed from the sample holder 1, and then the sample mask 4 may be attached to the sample holder 1.

In this embodiment, the sample holder used in the fluorescent X-ray analyzer has been described.
The present invention is also applicable to other X-ray analyzers such as a diffraction X-ray analyzer that analyzes the crystal structure of a sample based on diffraction X-rays.

[0022]

As described above, according to the present invention,
The positioning mechanism allows the sample mounting jig to be positioned with respect to the sample mask, thereby facilitating the positioning of the sample.
Further, since the gripping mechanism holds the sample in a direction orthogonal to the contact surface between the samples, the sample is difficult to grip by overlapping, for example, a sample having a trapezoidal cross section. , Can be easily gripped. Further, the holding mechanism is switched between the closed position for holding the sample and the open position for opening the sample by the cam mechanism, so that the sample can be easily held.

[Brief description of the drawings]

FIGS. 1A and 1B are longitudinal sectional views of a sample holder according to an embodiment of the present invention.

FIG. 2 is a schematic configuration diagram of a fluorescent X-ray analyzer according to the present invention.

FIG. 3 is a side view showing an operation state of the sample holder according to the present invention.

[Explanation of symbols]

DESCRIPTION OF SYMBOLS 1 ... sample holder, 2 ... sample mounting jig, 3 ... sample, 4 ... sample mask, 6 ... analysis surface, 7 ... X-ray passage hole, 8 ... positioning mechanism, 20 ... gripping mechanism, 21 ... gripping part, 26 ... Spring, 3
0 ... Cam mechanism.

 ──────────────────────────────────────────────────続 き Continued on the front page F term (reference) 2G001 AA01 BA04 BA18 CA01 EA01 GA01 JA04 JA12 KA01 LA02 MA06 QA01 QA02 QA10 SA01 SA04

Claims (1)

[Claims] 1. A sample mounting jig for mounting a plurality of identical samples that are brought into contact with each other, and an X-ray that is opposed to an analysis surface of the mounted sample and irradiates the sample with X-rays.
A sample holder for X-ray analysis, comprising: a sample mask having a line passage hole; and a positioning mechanism for positioning the sample mounting jig with respect to the sample mask, wherein the sample mounting jig has a pair of grippers. A gripping mechanism for holding the sample in a direction perpendicular to the contact surface between the samples by a part being pressed by a spring, and a cam mechanism for switching the gripping mechanism between a closed position for holding the sample and an open position for opening the sample. X with
Sample holder for line analysis.