JP2001513452A5 - - Google Patents

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Publication number
JP2001513452A5
JP2001513452A5 JP2000507089A JP2000507089A JP2001513452A5 JP 2001513452 A5 JP2001513452 A5 JP 2001513452A5 JP 2000507089 A JP2000507089 A JP 2000507089A JP 2000507089 A JP2000507089 A JP 2000507089A JP 2001513452 A5 JP2001513452 A5 JP 2001513452A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000507089A
Other languages
Japanese (ja)
Other versions
JP2001513452A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/US1998/016266 external-priority patent/WO1999007518A1/en
Publication of JP2001513452A publication Critical patent/JP2001513452A/ja
Publication of JP2001513452A5 publication Critical patent/JP2001513452A5/ja
Pending legal-status Critical Current

Links

JP2000507089A 1997-08-06 1998-08-05 連続的に変化し得る平坦化及び研磨パッドシステム Pending JP2001513452A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US5490797P 1997-08-06 1997-08-06
US60/054,907 1997-08-06
PCT/US1998/016266 WO1999007518A1 (en) 1997-08-06 1998-08-05 Continuously variable planarization and polishing pad system

Publications (2)

Publication Number Publication Date
JP2001513452A JP2001513452A (ja) 2001-09-04
JP2001513452A5 true JP2001513452A5 (cs) 2006-01-05

Family

ID=21994296

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000507089A Pending JP2001513452A (ja) 1997-08-06 1998-08-05 連続的に変化し得る平坦化及び研磨パッドシステム

Country Status (2)

Country Link
JP (1) JP2001513452A (cs)
WO (1) WO1999007518A1 (cs)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6093085A (en) * 1998-09-08 2000-07-25 Advanced Micro Devices, Inc. Apparatuses and methods for polishing semiconductor wafers
US6390890B1 (en) 1999-02-06 2002-05-21 Charles J Molnar Finishing semiconductor wafers with a fixed abrasive finishing element
US6641463B1 (en) 1999-02-06 2003-11-04 Beaver Creek Concepts Inc Finishing components and elements
US6746311B1 (en) * 2000-01-24 2004-06-08 3M Innovative Properties Company Polishing pad with release layer
DE60110226T2 (de) * 2000-06-30 2006-03-09 Rohm and Haas Electronic Materials CMP Holdings, Inc., Wilmington Unterlage für polierscheibe
WO2002005337A1 (fr) * 2000-07-10 2002-01-17 Shin-Etsu Handotai Co., Ltd. Tranche a chanfreinage en miroir, tissu a polir pour chanfreinage en miroir, machine a polir pour chanfreinage en miroir et procede associe
US20220048156A1 (en) * 2020-08-14 2022-02-17 Steven Anneker Polishing pad assembly

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4220491A (en) * 1978-10-19 1980-09-02 Ppg Industries, Inc. Method for forming an accurately assembled laminate utilizing a vacuum holding press
US5081421A (en) * 1990-05-01 1992-01-14 At&T Bell Laboratories In situ monitoring technique and apparatus for chemical/mechanical planarization endpoint detection
JPH04201181A (ja) * 1990-11-30 1992-07-22 Ichikawa Woolen Textile Co Ltd 研磨用フェルト
US5196353A (en) * 1992-01-03 1993-03-23 Micron Technology, Inc. Method for controlling a semiconductor (CMP) process by measuring a surface temperature and developing a thermal image of the wafer
US5310455A (en) * 1992-07-10 1994-05-10 Lsi Logic Corporation Techniques for assembling polishing pads for chemi-mechanical polishing of silicon wafers
US5551986A (en) * 1995-02-15 1996-09-03 Taxas Instruments Incorporated Mechanical scrubbing for particle removal
US5665656A (en) * 1995-05-17 1997-09-09 National Semiconductor Corporation Method and apparatus for polishing a semiconductor substrate wafer
JPH0963995A (ja) * 1995-08-28 1997-03-07 Hitachi Ltd 研磨装置およびそれを用いた研磨方法
JPH09115862A (ja) * 1995-10-20 1997-05-02 Hitachi Ltd 研磨工具と、それを用いた研磨方法および研磨装置

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