JP2001305038A5 - - Google Patents
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- Publication number
- JP2001305038A5 JP2001305038A5 JP2000121198A JP2000121198A JP2001305038A5 JP 2001305038 A5 JP2001305038 A5 JP 2001305038A5 JP 2000121198 A JP2000121198 A JP 2000121198A JP 2000121198 A JP2000121198 A JP 2000121198A JP 2001305038 A5 JP2001305038 A5 JP 2001305038A5
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- JP
- Japan
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Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000121198A JP2001305038A (ja) | 2000-04-21 | 2000-04-21 | 近接場光学顕微鏡および近接場光学顕微鏡用探針 |
| US09/571,442 US6469288B1 (en) | 1999-05-17 | 2000-05-15 | Near field optical microscope and probe for near field optical microscope |
| EP00110546A EP1054283A3 (en) | 1999-05-17 | 2000-05-17 | Near field optical microscope and probe for near field optical microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000121198A JP2001305038A (ja) | 2000-04-21 | 2000-04-21 | 近接場光学顕微鏡および近接場光学顕微鏡用探針 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2001305038A JP2001305038A (ja) | 2001-10-31 |
| JP2001305038A5 true JP2001305038A5 (enExample) | 2008-09-11 |
Family
ID=18631887
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000121198A Pending JP2001305038A (ja) | 1999-05-17 | 2000-04-21 | 近接場光学顕微鏡および近接場光学顕微鏡用探針 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2001305038A (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3522261B2 (ja) * | 2002-04-18 | 2004-04-26 | 日本電気株式会社 | ナノチューブ、近接場光検出装置および近接場光検出方法 |
| JP2010139306A (ja) * | 2008-12-10 | 2010-06-24 | Shoichi Shimada | 測定装置 |
| JP5969876B2 (ja) * | 2012-09-28 | 2016-08-17 | 株式会社日立ハイテクノロジーズ | 熱アシスト磁気ヘッド検査方法および熱アシスト磁気ヘッド検査装置 |
| JP5957352B2 (ja) * | 2012-09-28 | 2016-07-27 | 株式会社日立ハイテクノロジーズ | 熱アシスト磁気ヘッド検査方法および熱アシスト磁気ヘッド検査装置 |
| CN109682995A (zh) * | 2019-01-21 | 2019-04-26 | 仪晟科学仪器(嘉兴)有限公司 | 一种散射式低温扫描近场光学显微镜 |
| JP2023028765A (ja) * | 2021-08-20 | 2023-03-03 | 株式会社日立ハイテク | 走査プローブ顕微鏡とそれに使用される試料 |
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2000
- 2000-04-21 JP JP2000121198A patent/JP2001305038A/ja active Pending