JP2001297127A - Method for optimizing delay of logic circuit - Google Patents

Method for optimizing delay of logic circuit

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Publication number
JP2001297127A
JP2001297127A JP2000113761A JP2000113761A JP2001297127A JP 2001297127 A JP2001297127 A JP 2001297127A JP 2000113761 A JP2000113761 A JP 2000113761A JP 2000113761 A JP2000113761 A JP 2000113761A JP 2001297127 A JP2001297127 A JP 2001297127A
Authority
JP
Japan
Prior art keywords
cell
logic
delay
violation
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000113761A
Other languages
Japanese (ja)
Inventor
Yoshitaka Kitao
嘉貴 北尾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP2000113761A priority Critical patent/JP2001297127A/en
Publication of JP2001297127A publication Critical patent/JP2001297127A/en
Pending legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To solve the conventional problems such that much manhour is required and the area of a layout is increased because the change, optimization and re-layout processing of a circuit are repeated until a delay restriction condi tion is satisfied in order to retry the timing verification of the whole logic circuit when violation of delay restriction is generated in a part of the circuit though there is an already optimized result. SOLUTION: A delay restriction violation cell is specified, a 2nd logic cell existing near the violation cell and having the same logic as the violation cell and high driving capacity is retrieved on the basis of the arrangement cell information of all logic cells and wiring information, a net list is prepared by substituting the 2nd logic cell for the violation cell, and the timing of a signal route including the substituted cell is verified. When there is no restriction violation, wiring correction for substituting the input/output of the 2nd logic cell for that of the violation cell is performed and it is confirmed that there is no restriction violation in the whole logic circuit. Thus delay restriction violation can be quickly improved only by wiring correction without changing a mask layout.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、半導体論理回路の
タイミング設計において、LSIの動作周波数を決定す
るクリティカルパスの遅延検証方法に関するものであ
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a critical path delay verification method for determining an operating frequency of an LSI in a timing design of a semiconductor logic circuit.

【0002】[0002]

【従来の技術】従来の技術として、図3に論理回路の一
般的な遅延検証方法を示す。図3において101は初期
合成工程、102は初期レイアウト工程、103は回路
の最適化工程、104は再レイアウト工程、105は遅
延制約違反判定工程である。
2. Description of the Related Art As a prior art, FIG. 3 shows a general delay verification method for a logic circuit. In FIG. 3, 101 is an initial synthesis step, 102 is an initial layout step, 103 is a circuit optimization step, 104 is a re-layout step, and 105 is a delay constraint violation determination step.

【0003】初期レイアウト後の回路に対し、回路の最
適化と再レイアウト処理を遅延制約が満足するまで繰り
返して行う。
The circuit after the initial layout is repeatedly subjected to circuit optimization and re-layout until the delay constraint is satisfied.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、前記従
来の技術構成では、既に最適化を行なった結果が存在す
るにも関わらず、一部の回路で遅延制約違反が発生する
と、論理回路全体のタイミング検証をやり直す為に回路
の変更、最適化と再レイアウト処理を遅延制約条件を満
足するまで繰り返し、多大な工数を発生させ、あるいは
レイアウト面積増大を招いていた。
However, in the above-mentioned conventional technology configuration, if a delay constraint violation occurs in some circuits even though the result of optimization already exists, the timing of the entire logic circuit is reduced. In order to perform verification again, circuit change, optimization, and re-layout processing are repeated until the delay constraint condition is satisfied, resulting in a large number of steps or an increase in layout area.

【0005】[0005]

【課題を解決するための手段】本発明は、論理機能を含
むセルを複数配置し、前記セル相互間を配線して形成す
る論理回路の遅延検証方法において、予め遅延制約が設
定されている信号経路間の遅延値を求め、制約違反の有
無を確認する制約違反判定工程と、前記制約違反判定に
基づいて制約違反を起こした信号経路を特定する違反要
因解析工程と、制約違反を起こした信号経路に含まれる
第1のセルと近傍に存在し論理が同一でかつより駆動能
力が高い第2のセルをレイアウト上の他の信号経路で配
置セル情報と配線情報に基づいて検索する工程と、第1
のセルの入出力を第2のセルの入出力とつなぎ替えて
も、双方の信号経路で遅延制約違反を発生しないことを
確認する工程と、第1のセルと第2のセルの入出力をつ
なぎ替える回路修正工程とを備える。
According to the present invention, there is provided a method for verifying the delay of a logic circuit formed by arranging a plurality of cells each having a logic function and interconnecting the cells with each other. A constraint violation determining step of determining a delay value between paths and confirming the presence or absence of a constraint violation; a violation factor analyzing step of identifying a signal path that has caused a constraint violation based on the constraint violation determination; and a signal having a constraint violation. Searching for a second cell having the same logic and a higher driving capability in the vicinity of the first cell included in the path, based on the arrangement cell information and the wiring information in another signal path on the layout; First
A step of confirming that a delay constraint violation does not occur in both signal paths even when the input / output of the cell is reconnected to the input / output of the second cell; and the input / output of the first cell and the second cell And a circuit correcting step of reconnecting.

【0006】さらに、置換回路修正工程で作成する修正
レイアウトでは制約違反が解消できないと判定した場合
には、セル機能を更に展開した論理レベル情報に基づ
き、前記第1のセルを第1の論理レベルに展開し、置換
可能でかつ駆動能力が高い第2の論理レベルを前記第1
のレベル近傍に検索する工程と、第1の論理レベルの入
出力を第2の論理レベルの入出力とつなぎ替えた置換回
路で、双方の信号経路で遅延制約違反を発生しないこと
を確認する工程と、第1のセルと第2のセルの入出力を
つなぎ替える置換回路修正工程とを備える。
Further, if it is determined that the constraint violation cannot be eliminated by the modified layout created in the replacement circuit modifying step, the first cell is placed in the first logical level based on the logical level information obtained by further expanding the cell function. And replaces the second logic level which is replaceable and has a high driving capability with the first logic level.
And a step of confirming that the replacement of the input / output of the first logic level with the input / output of the second logic level does not cause a delay constraint violation in both signal paths. And a replacement circuit correcting step for switching the input and output of the first cell and the second cell.

【0007】[0007]

【発明の実施の形態】(実施の形態1)以下、本発明の
一実施の形態について図面を参照して説明する。図1は
本発明の実施の形態1における遅延最適化方法のアルゴ
リズムを示す。
(Embodiment 1) Hereinafter, an embodiment of the present invention will be described with reference to the drawings. FIG. 1 shows an algorithm of a delay optimizing method according to the first embodiment of the present invention.

【0008】先ず図1において、工程101での初期合
成及び工程102での初期レイアウトを基に工程103
で最適化を実施した後、工程104で再レイアウトする
が、この工程104で配置される全論理セルの駆動能力
・遅延係数、面積等の配置セル情報111、及び全論理
セル間配線の抵抗値、容量値、配線形状等の配線情報1
12を抽出する。工程105では予め設定している全信
号経路の遅延制約と工程104で決定する実遅延情報と
を比較し全信号経路において制約違反の有無を判定す
る。制約違反無しの場合は工程104での再レイアウト
結果が最終データとなり遅延最適化を終了する。制約違
反有りの場合に関して、図6を用いて説明する。図6は
制約違反有りの場合のアルゴリズム詳細を示す。工程1
06で制約違反を発生している信号経路を制約違反要因
解析し、工程131で制約違反セルを特定する。特定し
た制約違反セルを置換する置換セル検索工程107は近
傍に存在する制約違反セルと同一論理である置換候補セ
ルを検索する工程132と、置換候補セルの駆動能力を
比較する工程133と、置換対象セルを決定する工程1
34を含んでいる。置換回路確認工程108は、セル置
換後の双方の入出力をつなぎ替えたネットリスト作成工
程135、つなぎ替えた双方のパスのタイミング検証工
程136、遅延制約違反の有無を判定する工程137を
含む。置換回路修正工程109は双方の入出力をつなぎ
替えたセル置換後のレイアウト作成工程138を行な
う。以上の工程を図4,5,7,8を用いて具体的に説
明する。図4は配置セル情報の一例、図5は配線情報の
一例、図7はネットリストA(論理セル置換元ネットリ
スト)の一例、図8はネットリストB(論理セル置換後
ネットリスト)の一例を示す。図4において、論理セル
211〜233を含む全セルの駆動能力、遅延時間、面
積等の情報が配置セル情報111に含まれ、図5におい
て、論理セル211〜233を含む全セルを接続する全
配線の抵抗、容量、配線形状等の情報が配線情報112
に含まれている。図6の違反セル特定工程131におい
て、図7に示すネットリストAにおける遅延制約違反セ
ルが論理セル212と特定した場合、図4に示す配置セ
ル情報より論理セル212のセル情報401、図5に示
す配線情報より論理セル212の入出力配線情報411
・412を参照し、同一論理ABCであり、かつ近傍に
存在する論理セルを工程132で検索する。検索した結
果、置換候補セルが論理セル232であれば、工程13
3で駆動能力比較を行なう。論理セル212・232に
関してセル情報401・403より駆動能力D2がD1
より高ければ、工程134で論理セル212の置換対象
セルが論理セル232で決定する。工程135では図8
に示す論理セル212・232を置換したネットリスト
Bを作成する。ネットリストAとBにおいて異なるのは
置換した論理セル212と232の各々を含む信号経路
だけである。工程136で置換した双方の論理セルを含
む信号経路に関するタイミング検証を実行、工程137
では検証結果により制約違反の有無を判定、すなわち前
記したネットリストBで置換した論理セル212と23
2の各々を含む信号経路で遅延制約違反が解消する、か
つ新規発生していないかを判定する。遅延制約違反が有
れば工程132に戻り、再度置換対象セルを検索し、1
32〜137の工程を再実行する。遅延制約違反が無い
場合は、置換回路工程109に進み、置換後のレイアウ
ト作成工程138において、論理セル212・232の
双方の入出力をつなぎ替えるレイアウト修正を配線情報
112を基に配線修正のみで実行し、再度、論理回路全
体を対象とした制約違反判定工程105にて遅延制約違
反の有無を判定する。前記各工程により論理回路全体と
して遅延制約違反無しと判定された場合は工程109で
のレイアウト修正結果が最終データとなり遅延最適化を
終了する。
First, referring to FIG. 1, a step 103 is performed based on the initial synthesis in the step 101 and the initial layout in the step 102.
After performing the optimization in step 104, the layout is re-laid out in step 104. The placement cell information 111 such as the driving capacity / delay coefficient and area of all the logic cells placed in this step 104, and the resistance value of the wiring between all the logic cells Information 1 such as wiring, capacitance value, wiring shape, etc.
Extract 12 In step 105, the delay constraint of all signal paths set in advance and the actual delay information determined in step 104 are compared to determine whether there is a constraint violation in all signal paths. If there is no constraint violation, the re-layout result in step 104 becomes the final data, and the delay optimization ends. The case where there is a constraint violation will be described with reference to FIG. FIG. 6 shows details of the algorithm when there is a constraint violation. Step 1
In step 06, the signal path causing the constraint violation is analyzed for the constraint violation factor, and in step 131, the constraint violation cell is specified. A replacement cell search step 107 for replacing the specified constraint violation cell includes a step 132 of searching for a replacement candidate cell having the same logic as a neighboring constraint violation cell, a step 133 of comparing the driving capability of the replacement candidate cell, and a replacement step. Step 1 for determining target cell
34. The replacement circuit confirmation step 108 includes a netlist creation step 135 in which both inputs and outputs after cell replacement are reconnected, a timing verification step 136 for both reconnected paths, and a step 137 for determining whether there is a delay constraint violation. The replacement circuit correction step 109 performs a layout creation step 138 after cell replacement in which both inputs and outputs are connected. The above steps will be specifically described with reference to FIGS. 4 shows an example of arrangement cell information, FIG. 5 shows an example of wiring information, FIG. 7 shows an example of a netlist A (a net list after replacement of a logic cell), and FIG. 8 shows an example of a netlist B (a netlist after replacement of a logic cell). Is shown. In FIG. 4, information such as the driving capability, delay time, and area of all the cells including the logic cells 211 to 233 is included in the arrangement cell information 111. In FIG. 5, all the cells including the logic cells 211 to 233 are connected. Information such as wiring resistance, capacitance, and wiring shape is wiring information 112.
Included in. In the violating cell specifying step 131 of FIG. 6, when the delay constraint violating cell in the netlist A shown in FIG. 7 is specified as the logical cell 212, the cell information 401 of the logical cell 212 and the cell information 401 of FIG. The input / output wiring information 411 of the logic cell 212 is obtained from the indicated wiring information.
-With reference to 412, a logic cell which is the same logic ABC and exists in the vicinity is searched in step 132. If the result of the search indicates that the replacement candidate cell is the logic cell 232, step 13
At 3, the driving capability is compared. For the logic cells 212 and 232, the driving capability D2 is D1 based on the cell information 401 and 403.
If it is higher, the replacement cell of the logic cell 212 is determined by the logic cell 232 in step 134. In step 135, FIG.
A netlist B is created by replacing the logic cells 212 and 232 shown in FIG. The only difference between netlists A and B is the signal path including each of the replaced logic cells 212 and 232. Perform timing verification on the signal path including both logic cells replaced in step 136, step 137
Then, the presence or absence of a constraint violation is determined based on the verification result, that is, the logic cells 212 and 23 replaced with the netlist B described above.
It is determined whether the delay constraint violation has been eliminated in the signal path including each of the two and whether a new occurrence has occurred. If there is a violation of the delay constraint, the process returns to step 132, and the replacement target cell is searched again.
The steps 32 to 137 are executed again. If there is no violation of the delay constraint, the process proceeds to the replacement circuit step 109, and in the layout creation step 138 after replacement, the layout correction for switching the input and output of both the logic cells 212 and 232 is performed only by the wiring correction based on the wiring information 112. Then, the presence or absence of a delay constraint violation is determined again in the constraint violation determination step 105 for the entire logic circuit. If it is determined in each of the above steps that there is no violation of the delay constraint in the entire logic circuit, the layout correction result in step 109 becomes the final data, and the delay optimization is completed.

【0009】(実施の形態2)図2は図1の遅延最適化
方法のアルゴリズムでは遅延制約違反が解消できない場
合、各セル機能を更に展開した論理機能レベル情報に基
づいて、論機能レベルを置換して遅延最適化を行なうア
ルゴリズムである。
(Embodiment 2) FIG. 2 shows that when the delay constraint violation cannot be eliminated by the algorithm of the delay optimizing method shown in FIG. 1, the logic function level is replaced based on logical function level information obtained by further expanding each cell function. This is an algorithm for performing delay optimization.

【0010】図2において、101〜112は図1すな
わち、第1の実施の形態と同一内容である。図2のアル
ゴリズムは図1に加えて、判定工程121にて遅延制約
違反セルが前回解析結果と同一か、すなわち第1の実施
の形態のアルゴリズムで遅延制約違反が解決できたか否
かを判定し、遅延制約違反が解決できていない場合は、
各論理セルが有する論理機能レベル情報123に基づい
て、配置されている論理セルを論理機能レベルに展開
し、遅延制約違反を発生している第1の論理機能レベル
の近傍に存在し、同一論理機能であり、かつ駆動能力が
高い第2の論理機能レベルを検索する置換論理レベル検
索工程122を備えた事を特徴としている。第1と第2
の論理機能レベルの双方の入出力をつなぎ替えても双方
のパスで遅延制約違反を発生しないことを置換回路確認
工程108で確認し、置換回路修正工程109で双方の
論理機能レベル入出力をつなぎ替えたレイアウト修正を
行ない、再度、論理回路全体を対象とした制約違反判定
工程105にて遅延制約違反の有無を判定する。以上の
工程を図9,10,11,12を用いて具体的に説明す
る。図9は論理レベル情報の一例、図10は本発明の第
2の実施の形態における論理回路の遅延最適化方法のア
ルゴリズム詳細、図11はネットリストC(論理レベル
置換元ネットリスト)の一例、図12はネットリストD
(論理レベル置換後ネットリスト)の一例を示す。図1
1において、論理セル311〜333を含む全論理機能
レベルの論理機能、駆動能力、遅延係数等の情報が論理
レベル情報123に含まれている。図10の置換論理レ
ベル検索工程122において、図11に示すネットリス
トCにおける遅延制約違反論理レベル312の置換候補
論理レベルを検索する工程142は、図9に示す論理レ
ベル312の論理機能レベル情報421を参照し、同一
論理機能aであり、かつ近傍に存在する置換候補論理レ
ベル332を検索する。工程143では論理レベル31
2・332の駆動能力比較を行なう。論理レベル312
・332に関して論理レベル情報421・423より駆
動能力d3がd1より高ければ、工程144で論理レベ
ル312の置換対象論理レベルが論理レベル332で決
定する。工程145では図12に示す論理レベル312
・332を置換したネットリストDを作成する。ネット
リストCとDにおいて異なるのは置換した論理レベル3
12と332の各々を含む信号経路だけである。工程1
46で置換した双方の論理レベルを含む信号経路に関す
るタイミング検証を実行、工程147では検証結果によ
り制約違反の有無を判定、すなわち前記したネットリス
トDで置換した論理レベル312と332の各々を含む
信号経路で遅延制約違反が解消する、かつ新規発生して
いないかを判定する。遅延制約違反が有れば工程142
に戻り、再度置換対象論理レベルを検索し、142〜1
47の工程を再実行する。遅延制約違反が無い場合は、
置換回路工程109に進み、置換後のレイアウト作成工
程138において、論理レベル312・332の双方の
入出力をつなぎ替えるレイアウト修正を配線情報112
を基に配線修正のみで実行し、再度、論理回路全体を対
象とした制約違反判定工程105にて遅延制約違反の有
無を判定する。前記各工程により論理回路全体として遅
延制約違反無しと判定された場合は工程109でのレイ
アウト修正結果が最終データとなり遅延最適化を終了す
る。
In FIG. 2, reference numerals 101 to 112 have the same contents as in FIG. 1, that is, the first embodiment. In addition to the algorithm of FIG. 1, the algorithm of FIG. 2 determines in a decision step 121 whether the delay constraint violation cell is the same as the previous analysis result, that is, whether the delay constraint violation has been solved by the algorithm of the first embodiment. , If the late constraint violation has not been resolved,
Based on the logic function level information 123 of each logic cell, the arranged logic cells are expanded to the logic function level, and the logic cells existing near the first logic function level causing the delay constraint violation and having the same logic It is characterized by having a replacement logic level search step 122 for searching for a second logic function level that is functional and has a high driving capability. First and second
In the replacement circuit confirmation step 108, it is confirmed that the delay constraint violation does not occur in both paths even when the input and output of both logic function levels are switched, and both logic function level inputs and outputs are connected in the replacement circuit correction step 109. The changed layout is corrected, and the presence or absence of the delay constraint violation is determined again in the constraint violation determination step 105 for the entire logic circuit. The above steps will be specifically described with reference to FIGS. FIG. 9 shows an example of logic level information, FIG. 10 shows details of an algorithm of a delay optimization method for a logic circuit according to the second embodiment of the present invention, FIG. 11 shows an example of a netlist C (logic level replacement source netlist), FIG. 12 shows the netlist D.
An example of (a netlist after logic level replacement) is shown. FIG.
In 1, the logic level information 123 includes information such as logic functions, drive capabilities, and delay coefficients of all logic function levels including the logic cells 311 to 333. In the replacement logic level search step 122 of FIG. 10, the step 142 of searching for a replacement candidate logic level of the delay constraint violation logic level 312 in the netlist C shown in FIG. 11 is performed by the logic function level information 421 of the logic level 312 shown in FIG. , And searches for a replacement candidate logical level 332 which is of the same logical function a and exists in the vicinity. In step 143, the logic level 31
A comparison of the driving ability of 2.332 is performed. Logic level 312
If the drive capability d3 is higher than d1 from the logical level information 421 and 423 with respect to 332, the logical level to be replaced with the logical level 312 is determined by the logical level 332 in step 144. In step 145, the logic level 312 shown in FIG.
Create a netlist D with 332 replaced. The difference between netlists C and D is the replaced logic level 3.
There is only a signal path that includes each of 12 and 332. Step 1
In step 147, the presence or absence of a constraint violation is determined based on the verification result, that is, a signal including each of the logic levels 312 and 332 replaced with the netlist D described above. It is determined whether the violation of the delay constraint has been eliminated in the route and whether a new occurrence has occurred. Step 142 if the delay constraint is violated
To search for the replacement target logical level again,
Step 47 is executed again. If there is no violation of the delay constraint,
Proceeding to the replacement circuit step 109, in the layout creation step 138 after replacement, the layout correction for switching the input and output of both the logic levels 312 and 332 is made to the wiring information 112.
Is performed based on only the wiring correction, and the presence or absence of a delay constraint violation is determined again in the constraint violation determination step 105 for the entire logic circuit. If it is determined in each of the above steps that there is no violation of the delay constraint in the entire logic circuit, the layout correction result in step 109 becomes the final data, and the delay optimization is completed.

【0011】[0011]

【発明の効果】以上に説明したように本発明の遅延検証
方法は、極力マスクレイアウトを変更すること無く配線
層にのみによる修正で、レイアウト面積増大を招かずに
短期間で遅延制約違反を改善する。
As described above, the delay verification method of the present invention improves the delay constraint violation in a short period of time without increasing the layout area by modifying only the wiring layer without changing the mask layout as much as possible. I do.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明による論理回路の遅延最適化方法のアル
ゴリズムを示す図
FIG. 1 is a diagram showing an algorithm of a logic circuit delay optimization method according to the present invention;

【図2】本発明の第2の実施の形態における論理回路の
遅延最適化方法のアルゴリズムを示す図
FIG. 2 is a diagram showing an algorithm of a logic circuit delay optimization method according to a second embodiment of the present invention;

【図3】論理回路の遅延最適化方法を説明するため、一
般的なアルゴリズムを示した図
FIG. 3 is a diagram showing a general algorithm for explaining a delay optimization method of a logic circuit;

【図4】配置セル情報の一例を示す図FIG. 4 is a diagram showing an example of arrangement cell information.

【図5】配線情報の一例を示す図FIG. 5 is a diagram illustrating an example of wiring information;

【図6】本発明による論理回路の遅延最適化方法のアル
ゴリズム詳細を示す図
FIG. 6 is a diagram showing details of an algorithm of a delay optimization method for a logic circuit according to the present invention;

【図7】ネットリストA(論理セル置換元ネットリス
ト)の具体例を示す回路図
FIG. 7 is a circuit diagram showing a specific example of a netlist A (logical cell replacement source netlist).

【図8】ネットリストB(論理セル置換後ネットリス
ト)の具体例を示す回路図
FIG. 8 is a circuit diagram showing a specific example of a netlist B (a netlist after logic cell replacement).

【図9】論理レベル情報の一例を示す図FIG. 9 is a diagram showing an example of logical level information.

【図10】本発明の第2の実施の形態における論理回路
の遅延最適化方法のアルゴリズム詳細を示す図
FIG. 10 is a diagram showing details of an algorithm of a delay optimization method for a logic circuit according to the second embodiment of the present invention;

【図11】ネットリストC(論理レベル置換元ネットリ
スト)の具体例を示す回路図
FIG. 11 is a circuit diagram showing a specific example of a netlist C (a logic level replacement source netlist).

【図12】ネットリストD(論理レベル置換後ネットリ
スト)の具体例を示す回路図
FIG. 12 is a circuit diagram showing a specific example of a netlist D (netlist after logical level replacement).

【符号の説明】[Explanation of symbols]

101 初期合成工程 102 初期レイアウト工程 103 最適化工程 104 再レイアウト工程 105 制約違反判定工程 106 違反要因解析工程 107 置換セル検索工程 108 置換回路確認工程 109 置換回路修正工程 111 配置セル情報 112 配線情報 121 遅延制約違反セルが前回解析結果と同一か否か
を判定する工程 122 置換可能な論理レベルを検索する工程 123 各セルが元々有する論理機能レベル情報 131 違反セル特定工程 132 置換候補セル検索工程 133 駆動能力比較工程 134 置換対象セル決定工程 135 置換後のネットリスト作成工程 136 タイミング検証工程 137 制約違反判定工程 138 置換後のレイアウト作成工程 142 置換候補論理レベル検索工程 143 駆動能力比較工程 144 置換対象論理レベル決定工程 145 置換後のネットリスト作成工程 146 タイミング検証工程 147 制約違反判定工程 211〜233 論理セル 401〜403 配置セル情報 411〜414 配線情報 421〜423 論理レベル情報
101 Initial Synthesis Step 102 Initial Layout Step 103 Optimization Step 104 Re-Layout Step 105 Constraint Violation Determination Step 106 Violation Factor Analysis Step 107 Replacement Cell Search Step 108 Replacement Circuit Confirmation Step 109 Replacement Circuit Correction Step 111 Placement Cell Information 112 Wiring Information 121 Delay Step 122 of determining whether the constraint violation cell is the same as the previous analysis result 122 Searching for a replaceable logic level 123 Logic function level information originally possessed by each cell 131 Violation cell identification step 132 Replacement candidate cell search step 133 Driving capability Comparison step 134 replacement target cell determination step 135 netlist creation step after replacement 136 timing verification step 137 constraint violation determination step 138 layout creation step after replacement 142 replacement candidate logical level search step 143 drive capability comparison step 144 Replacement target logic level determination step 145 Replacement net list creation step 146 Timing verification step 147 Constraint violation determination step 211-233 Logic cell 401-403 Placement cell information 411-414 Wiring information 421-423 Logic level information

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】論理機能を含むセルを複数配置し、前記セ
ル相互間を配線して形成する論理回路の遅延最適化方法
において、予め遅延制約が設定されている信号経路間の
遅延値を求め、制約違反の有無を確認する制約違反判定
工程と、前記制約違反判定に基づいて制約違反を起こし
た信号経路を特定する違反要因解析工程と、制約違反を
起こした信号経路に含まれる第1のセルと近傍に存在し
論理が同一でかつより駆動能力が高い第2のセルをレイ
アウト上の他の信号経路で配置セル情報と配線情報に基
づいて置換セルとして検索する工程と、第1のセルの入
出力を第2のセルの入出力とつなぎ替えた置換回路で、
双方の信号経路で遅延制約違反を発生しないことを確認
する工程と、第1のセルと第2のセルの入出力をつなぎ
替える置換回路修正工程とを備えた事を特徴とする論理
回路の遅延最適化方法。
In a method for optimizing a delay of a logic circuit formed by arranging a plurality of cells including a logic function and interconnecting the cells, a delay value between signal paths in which delay constraints are set in advance is obtained. A constraint violation determining step of confirming the presence or absence of a constraint violation, a violation factor analyzing step of identifying a signal path in which the constraint violation has occurred based on the constraint violation determination, and a first constraint included in the signal path in which the constraint violation has occurred. A step of searching for a second cell which is close to the cell, has the same logic, and has a higher driving capability as a replacement cell on another signal path on the layout based on the arrangement cell information and the wiring information; The input / output of the second cell is replaced with the input / output of the second cell.
A delay of a logic circuit, comprising: a step of confirming that a delay constraint violation does not occur in both signal paths; and a replacement circuit correction step of switching input / output of a first cell and a second cell. Optimization method.
【請求項2】論理機能を含むセルを複数配置し、前記セ
ル相互間を配線して形成する論理回路の遅延最適化方法
において、置換回路修正工程で作成する修正レイアウト
では制約違反が解消できないと判定した場合には、セル
機能を更に展開した論理レベル情報に基づき、前記第1
のセルを第1の論理レベルに展開し、置換可能でかつ駆
動能力が高い第2の論理レベルを前記第1の論理レベル
近傍に検索する工程と、第1の論理レベルの入出力を第
2の論理レベルの入出力とつなぎ替えた置換回路で、双
方の信号経路で遅延制約違反を発生しないことを確認す
る工程と、第1のセルと第2のセルの入出力をつなぎ替
える置換回路修正工程とを備えた事を特徴とする論理回
路の遅延最適化方法。
2. A delay optimization method for a logic circuit in which a plurality of cells including a logic function are arranged and the cells are wired with each other, the constraint violation cannot be eliminated by a repair layout created in a replacement circuit repair step. If it is determined, the first function is determined based on the logic level information obtained by further developing the cell function.
Expanding the cells to the first logic level, searching for a second logic level that is replaceable and has a high driving capability near the first logic level, and inputting / outputting the first logic level to the second logic level. A step of confirming that a delay constraint violation does not occur in both signal paths in a replacement circuit reconnected with the input / output of the logic level of the above, and a replacement circuit modification for reconnecting the input / output of the first cell and the second cell And a method for optimizing a delay of a logic circuit.
JP2000113761A 2000-04-14 2000-04-14 Method for optimizing delay of logic circuit Pending JP2001297127A (en)

Priority Applications (1)

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Application Number Priority Date Filing Date Title
JP2000113761A JP2001297127A (en) 2000-04-14 2000-04-14 Method for optimizing delay of logic circuit

Publications (1)

Publication Number Publication Date
JP2001297127A true JP2001297127A (en) 2001-10-26

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Family Applications (1)

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Country Status (1)

Country Link
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8966422B1 (en) 2014-01-07 2015-02-24 International Business Machines Corporation Median line based critical timing path optimization

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8966422B1 (en) 2014-01-07 2015-02-24 International Business Machines Corporation Median line based critical timing path optimization

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