JP2001296225A - Material tester - Google Patents

Material tester

Info

Publication number
JP2001296225A
JP2001296225A JP2000117182A JP2000117182A JP2001296225A JP 2001296225 A JP2001296225 A JP 2001296225A JP 2000117182 A JP2000117182 A JP 2000117182A JP 2000117182 A JP2000117182 A JP 2000117182A JP 2001296225 A JP2001296225 A JP 2001296225A
Authority
JP
Japan
Prior art keywords
sample
displacement
indenter
current
load
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000117182A
Other languages
Japanese (ja)
Other versions
JP3740943B2 (en
Inventor
Tsukasa Nishimura
司 西村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP2000117182A priority Critical patent/JP3740943B2/en
Publication of JP2001296225A publication Critical patent/JP2001296225A/en
Application granted granted Critical
Publication of JP3740943B2 publication Critical patent/JP3740943B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To provide a material tester, capable of obtaining a true load on a real-time basis without correcting the measured value after a test. SOLUTION: A load F applied to a sample 4 is inputted to a CPU 20 by a load set section 21, and a current is fed to a solenoid coil 8a from a current feed section 14 via a D/A converter 17. An indenter 5 is lowered via a fulcrum 7 by the repulsion against a magnet 8b. When the indenter 5 is kept with contact with the sample 4, α=I/d is obtained from the linear correlation between the current I and a displacement d of the indenter 5. When the indenter 5 is brought into contact with the sample 4 during the test, the displacement d is measured by a displacement measurement section 16, and F=k(I-αd) is calculated by the CPU on a real-time basis. When this value reaches the set load F, the test is finished, and the true force and the displacement d are displayed on a display section 22.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、材料試験機に係わ
り、特に、圧子を試験材料に押しつけてその圧痕から試
料の硬度を測定する微小硬度計や圧縮・引張試験機に関
する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a material testing machine, and more particularly to a microhardness tester and a compression / tensile testing machine for measuring the hardness of a sample from an indentation by pressing an indenter against the test material.

【0002】[0002]

【従来の技術】材料の硬度を評価するために、所定の荷
重をかけられた圧子が試料に押し込まれ、その圧痕から
試料の硬さを測定する微小硬度計がある。ビッカース硬
度計などにおいては、先端が所定の形状に形成された圧
子を試料に押しこむために、永久磁石と電磁コイルを利
用した負荷装置が使用されている。図3に従来の微小硬
度計を示す。枠体1内に昇降可能に設けられた試料台2
には、互いに直交するXY方向に移動可能なステージ3
が着脱自在に設けられ、ステージ3上に試料4が載置固
定される。
2. Description of the Related Art In order to evaluate the hardness of a material, there is a microhardness tester in which an indenter applied with a predetermined load is pressed into a sample and the hardness of the sample is measured from the indentation. In a Vickers hardness tester or the like, a load device using a permanent magnet and an electromagnetic coil is used to press an indenter having a tip formed into a predetermined shape into a sample. FIG. 3 shows a conventional microhardness tester. A sample table 2 that can be moved up and down in a frame 1
Has a stage 3 movable in XY directions orthogonal to each other.
Are provided detachably, and the sample 4 is placed and fixed on the stage 3.

【0003】枠体1内に設けられた自動平衡型電子天秤
タイプの荷重装置9は、図4に詳しく示すように、マグ
ネット8bおよび電磁コイル8aからなる電磁力発生装
置8を有し、この電磁力発生装置8は制御部13aから
電磁コイル8aに供給される電流に応じた力を発生す
る。電磁力発生装置8の下方には、支点7回りに揺動可
能なレバー24の一端が位置して電磁コイル8aと連結
され、電磁力発生装置8で発生する力によりレバー24
が支点7を中心に回動する。電磁コイル8aへの供給電
流を増加させることによりレバー24の回動量が増加
し、供給電流を一定値に保持するとレバー24はそのと
きの回動姿勢で保持される。
As shown in detail in FIG. 4, a self-balancing electronic balance type load device 9 provided in a frame 1 has an electromagnetic force generating device 8 comprising a magnet 8b and an electromagnetic coil 8a. The force generator 8 generates a force according to the current supplied from the control unit 13a to the electromagnetic coil 8a. One end of a lever 24 that can swing around the fulcrum 7 is located below the electromagnetic force generator 8 and is connected to the electromagnetic coil 8a.
Rotates about the fulcrum 7. The amount of rotation of the lever 24 is increased by increasing the supply current to the electromagnetic coil 8a, and when the supply current is maintained at a constant value, the lever 24 is held in the rotation posture at that time.

【0004】レバー24の他端は板バネ25およびブラ
ケット26を介して圧子保持部材27に連結され、保持
部材27の図示下端には上記ステージ3上の試料4を抑
圧するための圧子5が取付けられている。リンク29
は、一端が保持部材27の上下部に、他端が固定部28
にそれぞれ回動可能に連結された一対のリンクであり、
これらのリンク29により平行リンク機構が構成され
る。レバー24の回動に従って保持部材27すなわち圧
子5は、平行リンク機構の作用により同一姿勢を保ちつ
つ昇降する。
The other end of the lever 24 is connected to an indenter holding member 27 via a leaf spring 25 and a bracket 26, and an indenter 5 for suppressing the sample 4 on the stage 3 is attached to the lower end of the holding member 27 in the figure. Have been. Link 29
Has one end at the upper and lower portions of the holding member 27 and the other end
A pair of links each rotatably connected to the
These links 29 constitute a parallel link mechanism. As the lever 24 rotates, the holding member 27, that is, the indenter 5, moves up and down while maintaining the same posture by the action of the parallel link mechanism.

【0005】図3の6は、圧子5の変位量を検出する差
動トランス式の変位検出器であり、その検出結果は制御
部13aの変位測定部16に入力される。制御部13a
は、変位検出器6からの入力信号により変位測定部16
で測定された変位dと、負荷設定部21で所定の荷重レ
ベルを設定し、電流供給部14から電磁コイル8aへ電
力が供給され、電流測定部15で測定された電流Iから
得られる圧子5の試料4への押圧荷重F=kI(k:電
流と力の変換係数)に基づいて所定の演算処理を行い、
試料4の硬さデータとして、見かけの力Fと変位dと硬
度を表示部22に表示する。なお、10は補助的装置と
しての光学モニタであり、対物レンズ11や接眼レンズ
12等を備え、試料4の表面における試験位置を測定し
たり、圧子5によって試料表面に形成された窪みの状態
を作業者が観察するために用いられる。
[0005] Reference numeral 6 in FIG. 3 denotes a differential transformer type displacement detector for detecting the amount of displacement of the indenter 5, and the detection result is input to a displacement measuring unit 16 of the control unit 13a. Control unit 13a
Is a displacement measuring unit 16 based on an input signal from the displacement detector 6.
, A predetermined load level is set by the load setting unit 21, power is supplied from the current supply unit 14 to the electromagnetic coil 8 a, and the indenter 5 is obtained from the current I measured by the current measurement unit 15. A predetermined calculation process is performed based on the pressing load F = kI (k: conversion coefficient between current and force) on the sample 4 of
The apparent force F, the displacement d, and the hardness are displayed on the display unit 22 as the hardness data of the sample 4. Reference numeral 10 denotes an optical monitor as an auxiliary device, which includes an objective lens 11 and an eyepiece 12, and measures the test position on the surface of the sample 4 and checks the state of the dent formed on the sample surface by the indenter 5. Used for observation by workers.

【0006】[0006]

【発明が解決しようとする課題】従来の材料試験機は以
上のように構成されているが、電磁力発生装置8の電磁
コイル8aに流れる電流Iを電流測定部15で測定し、
その電流Iの値から圧子5の押圧荷重Fを演算する時、
単純に電流Iと見かけの力Fとの変換係数kを乗ずるこ
とにより押圧荷重F=kIを算出していた。あるいは、
試験後に、試料4に接触するまでの変位dと電流Iの相
関を求め、この値により上記押圧荷重Fを補正して真の
押圧荷重F’としていた。
The conventional material testing machine is constructed as described above, but the current I flowing through the electromagnetic coil 8a of the electromagnetic force generator 8 is measured by the current measuring unit 15,
When calculating the pressing load F of the indenter 5 from the value of the current I,
The pressing load F = kI was calculated simply by multiplying the conversion coefficient k between the current I and the apparent force F. Or,
After the test, the correlation between the displacement d until contact with the sample 4 and the current I was obtained, and the pressing load F was corrected based on this value to obtain a true pressing load F ′.

【0007】上記のように、単純に電流Iと見かけの力
Fとの変換係数kを乗ずることにより押圧荷重F=kI
を算出する方法は、圧子5の無負荷時の電流値Iによる
補正がなされていないので誤差を含んだ値となり、ま
た、試験後に計算して補正する方法では、リアルタイム
に測定値を得ることが出来ないという問題がある。その
ため設定された力まで負荷することができないという問
題がある。
As described above, by simply multiplying the conversion coefficient k between the current I and the apparent force F, the pressing load F = kI
In the method of calculating, a value including an error is obtained because the current value I when the indenter 5 is not loaded is not corrected. In the method of calculating and correcting after the test, a measured value can be obtained in real time. There is a problem that can not be done. For this reason, there is a problem that the set force cannot be applied.

【0008】本発明は、このような事情に鑑みてなされ
たものであって、試験後に測定値を補正するような方法
でなく、リアルタイムで真の押圧荷重Fを得ることがで
きる材料試験機を提供することを目的とする。
The present invention has been made in view of such circumstances, and is not a method of correcting a measured value after a test, but a material testing machine capable of obtaining a real pressing load F in real time. The purpose is to provide.

【0009】[0009]

【課題を解決するための手段】上記の目的を達成するた
め、本発明の材料試験機は、電磁力発生手段によって所
定の荷重を試料に加えその変形量を計測して試料の硬さ
や圧縮・引張強度を測定する材料試験機において、電磁
力発生手段に電流を流し、駆動される圧子が試料に接触
するまでの間の圧子の変位と電流を計測する機能を有
し、それによって圧子の無負荷時の変位と電流の相関関
係のデータをCPUに取り込み、所定の荷重を試料に加
えた時の圧子の変位量と電流値が、変位測定部と電流測
定部で測定され、圧子の非接触時の変位と電流の相関関
係のデータから補正値が算出され、リアルタイムで補正
されて真の押圧荷重が演算され、真の押圧荷重が設定値
に到達したら試験を終了し、演算された真の荷重値と変
位量を表示部に表示するものである。
In order to achieve the above object, a material tester according to the present invention applies a predetermined load to a sample by means of an electromagnetic force generating means, measures a deformation amount of the sample, and measures the hardness or compression of the sample. In a material testing machine for measuring tensile strength, a current is applied to an electromagnetic force generating means, and a function of measuring displacement and current of the indenter until the driven indenter comes into contact with the sample has a function of measuring the indenter's absence. The data of the correlation between the displacement under load and the current is taken into the CPU, and the displacement amount and current value of the indenter when a predetermined load is applied to the sample are measured by the displacement measurement unit and the current measurement unit. The correction value is calculated from the data of the correlation between the displacement at the time and the current, corrected in real time, the true pressing load is calculated, and when the true pressing load reaches the set value, the test is terminated, and the calculated true Display the load value and displacement on the display Is shall.

【0010】本発明の材料試験機は上記のように構成さ
れており、電磁力発生手段に電流を流し、駆動される圧
子が試料に接触するまでの間の圧子の変位と電流が、変
位測定部と電流測定部で測定され、CPUがその非接触
時の変位と電流の相関関係のデータから補正値を算出
し、そして、試験中に、見かけ上の力から非接触時の力
を差し引いた補正を、リアルタイムでCPUで行ない、
真の力が試料に荷重されるところで試験を終了すること
ができる。また、演算された真の荷重値と変位量を表示
部に表示することができる。
[0010] The material testing machine of the present invention is configured as described above. The current is applied to the electromagnetic force generating means, and the displacement and current of the indenter until the driven indenter comes into contact with the sample are measured for displacement. The CPU calculates a correction value from the data of the correlation between the displacement and the current at the time of non-contact, and subtracts the force at the time of non-contact from the apparent force during the test. Correction is performed by the CPU in real time,
The test can be terminated when the true force is applied to the sample. Further, the calculated true load value and displacement amount can be displayed on the display unit.

【0011】[0011]

【発明の実施の形態】本発明の材料試験機の一実施例を
図1を参照しながら説明する。図1は本発明の材料試験
機の計測システムを示す図である。本材料試験機は、試
験機本体と、その制御部13と、表示部22から構成さ
れている。試験機本体は、従来の微小硬度計と同じで、
ステージ3を設けその上に試料4が載置固定され昇降可
能な試料台2と、枠体1内に設けられた、自動平衡型電
子天秤タイプの荷重装置9と、圧子5の変位を検出する
変位検出器6と、補助的装置としての光学モニタ10と
から構成されている。
DESCRIPTION OF THE PREFERRED EMBODIMENTS One embodiment of the material testing machine of the present invention will be described with reference to FIG. FIG. 1 is a diagram showing a measurement system of a material testing machine according to the present invention. This material testing machine includes a testing machine main body, a control unit 13 thereof, and a display unit 22. The testing machine body is the same as the conventional micro hardness tester,
A stage 3 is provided, on which a sample 4 is mounted and fixed, and on which the sample 4 can be moved up and down, a load device 9 of an automatic balance type electronic balance type provided in the frame 1, and a displacement of the indenter 5 is detected. It comprises a displacement detector 6 and an optical monitor 10 as an auxiliary device.

【0012】試料台2は、互いに直交するXY方向に移
動可能なステージ3が着脱自在に設けられ、ステージ3
上に試料4が載置固定されて、昇降可能な機構を有す
る。荷重装置9は、図4に示すように、マグネット8b
および電磁コイル8aからなる電磁力発生装置8を有
し、この装置8は、制御部13から電磁コイル8aに供
給される電流に応じた力を発生する。電磁力発生装置8
の下方には、支点7の回りに揺動可能なレバー24の一
端が位置して電磁コイル8aと連結され、電磁力発生装
置8で発生する力によりレバー24が支点7を中心に回
動する。電磁コイル8aへの供給電流を増加させること
によりレバー24の回動量が増加し、供給電流を一定値
に保持すると、レバー24はそのときの回動姿勢で保持
される。
The sample stage 2 is provided with a stage 3 which is movable in XY directions orthogonal to each other, and is detachably provided.
The sample 4 is mounted and fixed thereon, and has a mechanism capable of moving up and down. As shown in FIG. 4, the load device 9 includes a magnet 8b.
And an electromagnetic force generating device 8 including an electromagnetic coil 8a. The device 8 generates a force according to the current supplied from the control unit 13 to the electromagnetic coil 8a. Electromagnetic force generator 8
One end of a lever 24 that can swing around the fulcrum 7 is located below and is connected to the electromagnetic coil 8a, and the lever 24 rotates around the fulcrum 7 by the force generated by the electromagnetic force generator 8. . The amount of rotation of the lever 24 increases by increasing the supply current to the electromagnetic coil 8a, and when the supply current is maintained at a constant value, the lever 24 is held in the rotation posture at that time.

【0013】レバー24の他端は板バネ25およびブラ
ケット26を介して圧子保持部材27に連結され、保持
部材27の図示下端には上記ステージ3上の試料4を抑
圧するための圧子5が取付けられている。リンク29
は、一端が保持部材27の上下部に、他端が固定部28
にそれぞれ回動可能に連結された一対のリンクであり、
これらのリンク29により平行リンク機構が構成され
る。レバー24の回動に従って保持部材27すなわち圧
子5は、平行リンク機構の作用により同一姿勢を保ちつ
つ昇降する。
The other end of the lever 24 is connected to an indenter holding member 27 via a leaf spring 25 and a bracket 26. An indenter 5 for suppressing the sample 4 on the stage 3 is attached to the lower end of the holding member 27 in the figure. Have been. Link 29
Has one end at the upper and lower portions of the holding member 27 and the other end
A pair of links each rotatably connected to the
These links 29 constitute a parallel link mechanism. As the lever 24 rotates, the holding member 27, that is, the indenter 5, moves up and down while maintaining the same posture by the action of the parallel link mechanism.

【0014】変位検出器6は、圧子5の変位量を検出す
る差動トランス式のものであり、その検出結果は制御部
13の変位測定部16に入力される。光学モニタ10
は、補助的装置として使用され、対物レンズ11や接眼
レンズ12等を備え、試料4の表面における試験位置を
測定したり、圧子5によって試料表面に形成された窪み
の状態を作業者が観察するために用いられる。
The displacement detector 6 is of a differential transformer type that detects the amount of displacement of the indenter 5, and the detection result is input to a displacement measuring unit 16 of the control unit 13. Optical monitor 10
Is used as an auxiliary device and includes an objective lens 11 and an eyepiece lens 12, etc., and measures a test position on the surface of the sample 4 and an operator observes a state of a depression formed on the sample surface by the indenter 5. Used for

【0015】制御部13は、荷重装置9の電磁コイル8
aに電流を供給するための電流供給部14と、その電磁
コイル8aに流れる電流を測定する電流測定部15と、
その電流によって駆動される荷重装置9の圧子5の変位
量を変位検出部6で検出し測定する変位測定部16と、
負荷値を設定する負荷設定部21と、各部の制御と取り
込んだデータから補正値を算出し真の押圧荷重Fを演算
するデータ処理装置のCPU20と、CPU20と各部
とのインターフェースとしてのD/A変換器17及びA
/D変換器18、19とから構成されている。負荷設定
部21は、試料4の押圧荷重Fを設定するもので、その
設定値がCPU20を介してD/A変換器17でアナロ
グ値に変換され、電流供給部14から電流が電磁コイル
8aに供給される。
The control unit 13 controls the electromagnetic coil 8 of the load device 9.
a current supply unit 14 for supplying a current to a, a current measurement unit 15 for measuring a current flowing through the electromagnetic coil 8a,
A displacement measuring unit 16 for detecting and measuring a displacement amount of the indenter 5 of the load device 9 driven by the current by the displacement detecting unit 6;
A load setting unit 21 for setting a load value, a CPU 20 of a data processing device for calculating a correction value from a control of each unit and the acquired data and calculating a true pressing load F, and a D / A as an interface between the CPU 20 and each unit. Converter 17 and A
/ D converters 18 and 19. The load setting unit 21 sets the pressing load F of the sample 4, the set value is converted into an analog value by the D / A converter 17 via the CPU 20, and the current is supplied from the current supply unit 14 to the electromagnetic coil 8a. Supplied.

【0016】電流測定部15は、電磁コイル8aに流れ
る電流を測定するもので、圧子5が試料4に接触するま
での変位に対してリニヤな関係の電流値と、接触して設
定押圧荷重になった時の電流値とを測定し、その値はA
/D変換器18でデジタル値に変換され、CPUで演算
処理される。変位測定部16は、圧子5の変位量を変位
検出器6で検出するもので、その値はA/D変換器19
でデジタル値に変換され、CPUで演算処理される。表
示部22は、制御部13のCPU20で演算された真の
押圧荷重Fと、圧子5による試料4の変位dと、その結
果による硬度、及びその他の試料の情報などを表示す
る。
The current measuring unit 15 measures a current flowing through the electromagnetic coil 8a, and a current value linearly related to a displacement until the indenter 5 comes into contact with the sample 4, and a set pressing load upon contact. And the current value at which the
The data is converted into a digital value by the / D converter 18 and processed by the CPU. The displacement measuring section 16 detects the amount of displacement of the indenter 5 with the displacement detector 6, and the value of the displacement is measured by the A / D converter 19.
Is converted into a digital value, and is processed by the CPU. The display unit 22 displays the true pressing load F calculated by the CPU 20 of the control unit 13, the displacement d of the sample 4 by the indenter 5, the resulting hardness, other information of the sample, and the like.

【0017】次に本材料試験機の操作、及び、CPU2
0のデータ処理について説明する。まず、押圧荷重値が
負荷設定部21でCPU20に入力される。その値に応
じて電流供給部14から電流が電磁コイル8aに供給さ
れ、マグネット8bとの反発力で支点7により圧子5に
力が加えられる。圧子5が試料4に接触するまでの間
は、図2に示すように、電流Iと圧子5の変位dは、リ
ニヤな相関関係が存在する。この電流Iと変位dのα=
I/dをCPU20は演算する。このα値を記憶装置に
格納しておく。この作業は試験前に行なっておいても良
い。
Next, the operation of the material testing machine and the CPU 2
The data processing of 0 will be described. First, a pressing load value is input to the CPU 20 by the load setting unit 21. According to the value, a current is supplied from the current supply unit 14 to the electromagnetic coil 8a, and a force is applied to the indenter 5 by the fulcrum 7 by a repulsive force with the magnet 8b. Until the indenter 5 contacts the sample 4, as shown in FIG. 2, the current I and the displacement d of the indenter 5 have a linear correlation. This current I and α of displacement d =
The CPU 20 calculates I / d. This α value is stored in the storage device. This operation may be performed before the test.

【0018】圧子5が試料に接触したことを検知する方
法として、圧子5が試料に接触するまでは、α=I/d
の値が一定で変化しないが、接触すると同時にαの値が
増加する。その時点を接触時とする。そして、試験中に
は圧子5が試料4に接触し、所定の押圧荷重値になるま
で電流が流されて、圧子5が試料4に押し当てられた時
の圧子5の変位dと電流Iが、変位測定部16と電流測
定部15で測定される。その時、CPU20は演算式F
=k(I−αd)を演算する。ここでkは、電流Iと力
Fの変換係数とする。このF値が負荷設定部21で設定
した押圧荷重値になれば、試験を終了する。
As a method of detecting the contact of the indenter 5 with the sample, α = I / d until the indenter 5 contacts the sample.
Is constant and does not change, but the value of α increases upon contact. The point in time is the time of contact. Then, during the test, the indenter 5 comes into contact with the sample 4, and a current is applied until a predetermined pressing load value is reached. When the indenter 5 is pressed against the sample 4, the displacement d of the indenter 5 and the current I are determined. Are measured by the displacement measuring unit 16 and the current measuring unit 15. At that time, the CPU 20 calculates the arithmetic expression F
= K (I-αd). Here, k is a conversion coefficient between the current I and the force F. When the F value reaches the pressing load value set by the load setting unit 21, the test is terminated.

【0019】演算式F=k(I−αd)の第一項kI
は、見かけ上の力を表し、第二項kαdは、圧子5が試
料4に接触しない時の力であり、この第二項kαdの力
は、試料4に加えられる力ではない。したがって、この
成分を補正するために第一項から第二項の分を差し引い
た補正を必要とする。CPU20はこの演算をリアルタ
イムで行なう。
The first term kI of the equation F = k (I-αd)
Represents the apparent force, the second term kαd is the force when the indenter 5 does not contact the sample 4, and the force of the second term kαd is not the force applied to the sample 4. Therefore, in order to correct this component, it is necessary to correct the first term by subtracting the second term. CPU 20 performs this calculation in real time.

【0020】上記の実施例ではCPU20を用いてデジ
タル制御を行なったが、D/A変換器17、A/D変換
器18、19を用いずにアナログ制御の電気回路でもデ
ータ処理F=k(I−αd)の演算を行なうこともでき
る。また、上記の実施例では微小硬度計について説明し
たが、試験材料に圧縮荷重または引張荷重をかける圧縮
・引張試験機にも同様に適用することができる。
In the above-described embodiment, digital control is performed using the CPU 20, but data processing F = k (E) is performed by an analog-controlled electric circuit without using the D / A converter 17, the A / D converters 18 and 19. The operation of I-αd) can also be performed. Further, in the above embodiment, the microhardness tester was described, but the present invention can be similarly applied to a compression / tensile tester for applying a compressive load or a tensile load to a test material.

【0021】[0021]

【発明の効果】本発明の材料試験機は上記のように構成
されており、試験以前に求められた圧子の非接触時の電
流と変位の相関関係を用いて、試験中に、見かけ上の力
から非接触時の力を差し引いた補正を、リアルタイムで
CPUで行ない、真の力が試料に荷重されるところで試
験を終了することができる。そのため、従来のような試
験後のデータ補正を必要とせず、補正された力を使っ
て、設定された押圧荷重に到達すれば試験が終了するの
で、本機能を有する硬度計、圧縮・引張試験機において
安価で精密な測定を行なうことができる。
The material testing machine of the present invention is constructed as described above, and uses the correlation between the current and the displacement when the indenter is not in contact before the test to obtain an apparent value during the test. Correction by subtracting the force at the time of non-contact from the force is performed by the CPU in real time, and the test can be terminated when the true force is applied to the sample. As a result, the test is completed when the set pressure is reached by using the corrected force without the need for the post-test data correction as in the past, and the hardness tester with this function, compression / tensile test Inexpensive and precise measurement can be performed on the machine.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明の材料試験機の一実施例を示す図であ
る。
FIG. 1 is a view showing one embodiment of a material testing machine of the present invention.

【図2】 圧子が試料に接するまでの変位と駆動電流の
関係を示す図である。
FIG. 2 is a diagram showing a relationship between a displacement until an indenter contacts a sample and a driving current.

【図3】 従来の材料試験機を示す図である。FIG. 3 is a view showing a conventional material testing machine.

【図4】 材料試験機の駆動部の機構を示す図である。FIG. 4 is a diagram illustrating a mechanism of a driving unit of the material testing machine.

【符号の説明】[Explanation of symbols]

1…枠体 2…試料台 3…ステージ 4…試料 5…圧子 6…変位検出器 7…支点 8…電磁力発生装置 8a…電磁コイル 8b…マグネット 9…荷重装置 10…光学モニタ 11…対物レンズ 12…接眼レンズ 13…制御部 14…電流供給部 15…電流測定部 16…変位測定部 17…D/A変換器 18…A/D変換器 19…A/D変換器 20…CPU 21…負荷設定部 22…表示部 23…押圧荷重演算部 24…レバー 25…板バネ 26…ブラケット 27…保持部材 28…固定部 29…リンク DESCRIPTION OF SYMBOLS 1 ... Frame 2 ... Sample stage 3 ... Stage 4 ... Sample 5 ... Indenter 6 ... Displacement detector 7 ... Support point 8 ... Electromagnetic force generator 8a ... Electromagnetic coil 8b ... Magnet 9 ... Load device 10 ... Optical monitor 11 ... Objective lens DESCRIPTION OF SYMBOLS 12 ... Eyepiece 13 ... Control part 14 ... Current supply part 15 ... Current measurement part 16 ... Displacement measurement part 17 ... D / A converter 18 ... A / D converter 19 ... A / D converter 20 ... CPU 21 ... Load Setting part 22 ... Display part 23 ... Pressing load calculating part 24 ... Lever 25 ... Leaf spring 26 ... Bracket 27 ... Holding member 28 ... Fixing part 29 ... Link

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】電磁力発生手段によって所定の荷重を試料
に加え、その変形量を計測して試料の硬さや圧縮・引張
強度を測定する材料試験機において、電磁力発生手段に
電流を流す電流供給部と、駆動される圧子が試料に接触
するまでの間、および所定の荷重を試料に加えた時の圧
子の変位を測定する変位測定部と、電流を測定する電流
測定部と、その測定されたデータを処理する制御部とを
備え、制御部は圧子の無負荷時の変位と電流の相関関係
のデータから補正値を算出し、リアルタイムで補正して
真の押圧荷重を演算し、真の押圧荷重が設定値に到達し
たら試験を終了し、演算された真の荷重値と変位量を表
示部に表示することを特徴とする材料試験機。
A material tester for applying a predetermined load to a sample by means of an electromagnetic force generating means and measuring the deformation of the sample to measure the hardness and compression / tensile strength of the sample. A supply unit, a displacement measuring unit that measures displacement of the indenter until the driven indenter contacts the sample, and when a predetermined load is applied to the sample, a current measuring unit that measures current, and the measurement thereof And a control unit for processing the obtained data.The control unit calculates a correction value from the data of the correlation between the displacement of the indenter when no load is applied and the current, corrects the data in real time, calculates the true pressing load, and A material testing machine characterized in that the test is terminated when the pressing load of the sample reaches a set value, and the calculated true load value and displacement are displayed on a display unit.
JP2000117182A 2000-04-13 2000-04-13 Material testing machine Expired - Lifetime JP3740943B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000117182A JP3740943B2 (en) 2000-04-13 2000-04-13 Material testing machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
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Publications (2)

Publication Number Publication Date
JP2001296225A true JP2001296225A (en) 2001-10-26
JP3740943B2 JP3740943B2 (en) 2006-02-01

Family

ID=18628538

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP3740943B2 (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004251698A (en) * 2003-02-19 2004-09-09 Akashi Corp Hardness tester
US7121136B2 (en) 2002-12-25 2006-10-17 Mitutoyo Corporation Hardness testing apparatus
WO2007148380A1 (en) * 2006-06-20 2007-12-27 Shimadzu Corporation Indenting type material testing machine, testing method, and testing program product
CN109932239A (en) * 2019-04-22 2019-06-25 广州建设工程质量安全检测中心有限公司 A kind of protective device of concrete anti-compression testing machine
CN110208120A (en) * 2019-05-27 2019-09-06 平湖莱顿光学仪器制造有限公司 A kind of multi link loading device and microscope
CN114659550A (en) * 2022-02-17 2022-06-24 贵州安吉华元科技发展有限公司 Device for detecting electromagnetic force and displacement

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7121136B2 (en) 2002-12-25 2006-10-17 Mitutoyo Corporation Hardness testing apparatus
US7380443B2 (en) 2002-12-25 2008-06-03 Mitutoyo Corporation Hardness testing apparatus
JP2004251698A (en) * 2003-02-19 2004-09-09 Akashi Corp Hardness tester
WO2007148380A1 (en) * 2006-06-20 2007-12-27 Shimadzu Corporation Indenting type material testing machine, testing method, and testing program product
JP4793445B2 (en) * 2006-06-20 2011-10-12 株式会社島津製作所 Indentation type material testing machine, test method, and test program product
US8156794B2 (en) 2006-06-20 2012-04-17 Shimadzu Corporation Indenting type material testing machine, testing method, and testing program product
DE112006003935B4 (en) * 2006-06-20 2012-12-20 Shimadzu Corp. Material testing machine of the penetration type, test method and test program product
CN109932239A (en) * 2019-04-22 2019-06-25 广州建设工程质量安全检测中心有限公司 A kind of protective device of concrete anti-compression testing machine
CN110208120A (en) * 2019-05-27 2019-09-06 平湖莱顿光学仪器制造有限公司 A kind of multi link loading device and microscope
CN110208120B (en) * 2019-05-27 2024-06-11 平湖莱顿光学仪器制造有限公司 Multi-connecting rod loading device and microscope
CN114659550A (en) * 2022-02-17 2022-06-24 贵州安吉华元科技发展有限公司 Device for detecting electromagnetic force and displacement
CN114659550B (en) * 2022-02-17 2024-01-26 贵州安吉华元科技发展有限公司 Device for detecting electromagnetic force and displacement

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