JP2001194389A - Waveform measuring device - Google Patents

Waveform measuring device

Info

Publication number
JP2001194389A
JP2001194389A JP2000007722A JP2000007722A JP2001194389A JP 2001194389 A JP2001194389 A JP 2001194389A JP 2000007722 A JP2000007722 A JP 2000007722A JP 2000007722 A JP2000007722 A JP 2000007722A JP 2001194389 A JP2001194389 A JP 2001194389A
Authority
JP
Japan
Prior art keywords
trigger condition
memory
data
waveform measuring
measurement data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000007722A
Other languages
Japanese (ja)
Other versions
JP3759360B2 (en
Inventor
Takeshi Misawa
豪 三澤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Priority to JP2000007722A priority Critical patent/JP3759360B2/en
Publication of JP2001194389A publication Critical patent/JP2001194389A/en
Application granted granted Critical
Publication of JP3759360B2 publication Critical patent/JP3759360B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Recording Measured Values (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a waveform measuring device capable of surely reading the measurement data of an event satisfying a trigger condition having a high degree of importance into a memory. SOLUTION: This waveform measuring device capable of setting a plurality of trigger conditions for reading measurement data to the memory comprises a means for prioritizing the respective trigger conditions and a means for determining the order of priority of the trigger conditions in the establishment of these trigger conditions, so that the measurement data of the event where the trigger conditions are established can be read into the memory on the basis of the order of priority.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は波形測定装置に関す
るものであり、詳しくはトリガ機能の改善に関するもの
である。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a waveform measuring device, and more particularly to an improvement in a trigger function.

【0002】[0002]

【従来の技術】波形測定装置は、機械・化学・生物・地
学など各種の現象をそれぞれに適したセンサーにより電
気信号に変換して測定データとしてメモリに取り込むと
ともに、それらの測定データの時間の経過に伴う変化の
状態を波形として表示画面や記録紙に可視化表示するも
のであり、各種の分野で広く用いられている。
2. Description of the Related Art Waveform measuring devices convert various phenomena, such as mechanical, chemical, biological, and geological, into electrical signals using sensors suitable for each of the phenomena, and load the signals into a memory as measurement data. Is visualized as a waveform on a display screen or a recording paper, and is widely used in various fields.

【0003】ところで、このような波形測定装置の測定
データを格納するメモリの容量は有限であり、すべての
測定データをもれなく取り込むことは不可能である。そ
こで、それぞれの測定目的に合わせて複数の測定データ
取り込み条件をトリガ条件として設定しておき、それら
のトリガ条件が成立したらその時点を基準にして所定数
の測定データをメモリに取り込むように構成されてい
る。
Incidentally, the capacity of a memory for storing measurement data of such a waveform measuring apparatus is limited, and it is impossible to capture all the measurement data without fail. Therefore, a plurality of measurement data acquisition conditions are set as trigger conditions in accordance with each measurement purpose, and when those trigger conditions are satisfied, a predetermined number of measurement data is acquired into a memory based on the time. ing.

【0004】しかし、従来の波形測定装置における複数
トリガ条件の優先順位については格別の配慮はなされて
おらずいわば早い者勝ち状態であり、複数のトリガ条件
のいずれかが成立すると直ちにその事象の測定データの
取り込みを実行する。それらの測定データの取り込みが
完了するまでは、他のトリガ条件の成立は全く無視して
いる。
However, no special consideration is given to the priority of a plurality of trigger conditions in a conventional waveform measuring apparatus, and it is a so-called first-come-first-served state, and when any of a plurality of trigger conditions is satisfied, the event is measured immediately. Perform data capture. Until the acquisition of the measurement data is completed, the establishment of other trigger conditions is completely ignored.

【0005】図3はこのような従来の測定データの取り
込み処理の概略を示すフローチャートである。測定動作
をスタートすることにより、データを取得する(ST
1)。取得したデータがトリガ条件を満たすか否か判断
する(ST2)。トリガ条件を満たしていればそのデー
タをメモリに取り込むデータ格納処理を行い(ST
3)、満たさなければST1に戻って次のデータを取得
する。データ格納処理後は予め設定されている所定数の
データを格納したか否かを判断し(ST4)、所定数の
データを取り込むまでST3以降の処理を繰り返して所
定数のデータを取り込んだら処理を終了する。
FIG. 3 is a flowchart showing an outline of such a conventional measurement data fetching process. Data is acquired by starting the measurement operation (ST
1). It is determined whether or not the acquired data satisfies the trigger condition (ST2). If the trigger condition is satisfied, a data storage process for loading the data into the memory is performed (ST
3) If not satisfied, return to ST1 to acquire the next data. After the data storage processing, it is determined whether or not a predetermined number of data set in advance has been stored (ST4). The processing after ST3 is repeated until the predetermined number of data is captured, and the processing is performed after the predetermined number of data is captured. finish.

【0006】図4は従来の波形測定装置における測定デ
ータの取り込み説明図である。図4において、Ch1の
測定データについてはレベル1よりもハイレベルになっ
たらトリガが成立し、Ch2の測定データについてはレ
ベル2よりもローレベルになったらトリガが成立するも
のと設定されていて、トリガが成立した時点から10個
の測定データを取り込むようになっている。
FIG. 4 is an explanatory diagram for taking in measurement data in a conventional waveform measuring apparatus. In FIG. 4, it is set that the trigger is established when the measured data of Ch1 becomes higher than level 1 and the trigger is established when the measured data of Ch2 becomes lower than level 2; Ten pieces of measurement data are taken in from the time when the trigger is established.

【0007】すなわち、Ch1の測定データがレベル1
よりもハイレベルになった時点でトリガが成立し、10
点のCh1の測定データの取り込みを開始する。ここで
Ch2の測定データに注目すると、Ch1の測定データ
の9個目の直前にレベル2よりもローレベルになってい
るが、Ch1の測定データの所定数の取り込みが完了し
ていないのでCh2のトリガ条件の成立は無視されてし
まう。
That is, the measured data of Ch1 is level 1
The trigger is established when the level becomes higher than
The acquisition of the measured data of the point Ch1 is started. Focusing on the measured data of Ch2, the level is lower than the level 2 immediately before the ninth measured data of Ch1, but since a predetermined number of measured data of Ch1 has not been completely captured, the measured data of Ch2 is not completed. The satisfaction of the trigger condition is ignored.

【0008】この結果、例えばCh2のトリガ条件はC
h1のトリガ条件よりも重要度が高いとしても、Ch2
の測定データを取り込むことができないことになる。
As a result, for example, the trigger condition of Ch2 is C
Even if the degree of importance is higher than the trigger condition of h1, Ch2
Measurement data cannot be captured.

【0009】[0009]

【発明が解決しようとする課題】本発明は、このような
従来の波形測定装置の問題点に着目したものであって、
その目的は、重要度の高いトリガ条件を満たす事象の測
定データを確実にメモリに取り込むことができる波形測
定装置を提供することにある。
SUMMARY OF THE INVENTION The present invention focuses on such a problem of the conventional waveform measuring apparatus,
It is an object of the present invention to provide a waveform measuring apparatus that can reliably store measurement data of an event that satisfies a trigger condition of high importance in a memory.

【0010】[0010]

【課題を解決するための手段】このような目的を達成す
るために、本発明の請求項1記載の発明は、測定データ
をメモリに取り込むための複数のトリガ条件が設定でき
る波形測定装置において、それぞれのトリガ条件に優先
順位を付ける手段と、複数のトリガ条件が成立した場合
にそれらトリガ条件の優先順位を判断する手段とを設
け、トリガ条件が成立した事象の測定データを優先順位
に基づいてメモリに取り込むことを特徴とする。
In order to achieve the above object, according to the first aspect of the present invention, there is provided a waveform measuring apparatus capable of setting a plurality of trigger conditions for loading measurement data into a memory. Means for prioritizing each trigger condition and means for determining the priority of the trigger conditions when a plurality of trigger conditions are satisfied are provided, and the measurement data of the event for which the trigger condition is satisfied is determined based on the priority. It is characterized in that it is taken into a memory.

【0011】これにより、優先順位の高いトリガ条件が
成立する事象が発生すると優先的にその事象の測定デー
タをメモリに取り込むので、重要な事象を確実に測定で
きる。
Thus, when an event that satisfies the trigger condition with a higher priority occurs, the measurement data of the event is preferentially taken into the memory, so that an important event can be reliably measured.

【0012】本発明の請求項2記載の発明は、請求項1
記載の波形測定装置において、前記トリガ条件は複数チ
ャンネルの測定データをメモリに取り込むために各チャ
ンネル毎に優先順位を付けて設定され、トリガ条件が成
立したチャンネルの測定データを優先順位に基づいてメ
モリに取り込むことを特徴とする。
The second aspect of the present invention is the first aspect of the present invention.
In the waveform measurement device described above, the trigger condition is set with a priority order for each channel in order to load measurement data of a plurality of channels into a memory, and the measurement data of a channel for which the trigger condition is satisfied is stored based on the priority order. It is characterized by taking in.

【0013】複数チャンネルの測定データを共通のメモ
リに取り込む構成の場合、トリガ条件の優先度に基づく
測定データの取り込み制御が行える。
In the case of a configuration in which the measurement data of a plurality of channels is fetched into a common memory, the fetch control of the measurement data can be performed based on the priority of the trigger condition.

【0014】本発明の請求項3記載の発明は、請求項1
または請求項2記載の波形測定装置において、前記メモ
リに優先順位の高いトリガ条件が成立した事象の測定デ
ータを取り込む空き容量がない場合には上書きして取り
込むことを特徴とする。
The third aspect of the present invention is the first aspect of the present invention.
Alternatively, in the waveform measuring device according to claim 2, when there is no free space in the memory for acquiring the measurement data of the event in which the trigger condition with the higher priority is satisfied, the memory is overwritten and acquired.

【0015】メモリには、常にその時点で優先順位の最
も高いトリガ条件が成立している事象の測定データが取
り込まれる。
The memory always takes in the measurement data of the event in which the trigger condition having the highest priority at that time is satisfied.

【0016】本発明の請求項4記載の発明は、請求項2
記載の波形測定装置において、複数チャンネルのトリガ
条件の成立が競合した場合、前記メモリには優先順位の
低いトリガ条件が成立した事象の測定データを破棄して
優先順位の高いトリガ条件が成立した事象の測定データ
を取り込むことを特徴とする
The invention according to claim 4 of the present invention is the invention according to claim 2
In the waveform measurement device described above, when the trigger conditions of a plurality of channels conflict with each other, the memory discards the measurement data of the event in which the low-priority trigger condition is satisfied and stores the event in which the high-priority trigger condition is satisfied in the memory. Characterized by taking in measurement data

【0017】複数チャンネルの測定データを共通のメモ
リに取り込む構成において、トリガ条件の優先順位の高
いチャンネルの測定データを確実に取り込むことができ
る。
In a configuration in which the measurement data of a plurality of channels is taken into a common memory, the measurement data of a channel having a higher priority in the trigger condition can be taken in reliably.

【0018】[0018]

【発明の実施の形態】以下、本発明の実施の形態を図に
より説明する。図1は本発明に基づく波形測定装置の測
定データ取り込みの説明図であり、図4と同様な2チャ
ンネルの測定例を示している。図1と図4の異なる点
は、Ch2のトリガ条件の優先順位をCh1よりも高く
設定していて、その優先順位に基づいてメモリへの測定
データの取り込みを制御していることである。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is an explanatory diagram of measurement data acquisition by a waveform measuring apparatus according to the present invention, and shows a measurement example of two channels similar to FIG. The difference between FIG. 1 and FIG. 4 is that the priority of the trigger condition of Ch2 is set higher than that of Ch1, and the loading of the measurement data into the memory is controlled based on the priority.

【0019】図1において、Ch1の測定データがレベ
ル1よりもハイレベルになった時点でトリガが成立する
ことにより、10点のCh1の測定データの取り込みを
開始する。一方、Ch2の測定データに注目すると、C
h1の測定データの9個目の直前にレベル2よりもロー
レベルになってCh2のトリガ条件も成立する。ここ
で、Ch2のトリガ条件の優先順位はCh1よりも高く
設定されているので実行中の優先順位の低いCh1の測
定データの取り込み処理は直ちに中断し、既にメモリに
格納されているCh1の測定データを破棄して初期化す
る。そして、Ch2のトリガ条件の成立に基づきCh2
の測定データの取り込み処理を行い、10個のデータを
取り込む。
In FIG. 1, the trigger is established when the measured data of Ch1 becomes higher than the level 1, so that the acquisition of the measured data of Ch1 at 10 points is started. On the other hand, focusing on the measured data of Ch2,
Immediately before the ninth measurement data of h1, the level becomes lower than the level 2, and the trigger condition of Ch2 is satisfied. Since the priority of the trigger condition of Ch2 is set higher than that of Ch1, the process of taking in the measurement data of Ch1 with a lower priority during execution is immediately suspended, and the measurement data of Ch1 already stored in the memory is stopped. Discard and initialize. Then, based on the satisfaction of the trigger condition of Ch2, Ch2
Of 10 measurement data, and 10 data are taken.

【0020】これにより、Ch1とCh2の測定データ
を共通のメモリに取り込むように構成された波形測定装
置において、トリガ条件の優先順位の高いCh2の測定
データが確実に取り込まれる。
Thus, in the waveform measuring apparatus configured to capture the measured data of Ch1 and Ch2 into the common memory, the measured data of Ch2 having the higher priority of the trigger condition is reliably captured.

【0021】図2は図1の処理の手順を示すフローチャ
ートである。図3と同様に、測定動作をスタートするこ
とにより、データを取得する(ST1)。取得したデー
タがトリガ条件を満たすか否か判断する(ST2)。ト
リガ条件を満たしていればそのデータをメモリに取り込
むデータ格納処理を行い(ST3)、満たさなければS
T1に戻って次のデータを取得する。データ格納処理後
は予め設定されている所定数のデータを格納したか否か
を判断し(ST4)、所定数のデータを取り込んだら処
理を終了する。所定数のデータを取り込むまでST3以
降の処理を繰り返すことになるが、この繰り返し過程
で、取得した各データについてトリガ条件の優先順位が
現在格納中のものよりも高いか否か判断し(ST5)、
高くなければST3以降の処理を繰り返す。取得したデ
ータのトリガ条件の優先順位が高ければ、既に格納され
ているデータを破棄してデータ格納処理を初期化し(S
T6)、ST3以降の処理を実行する。
FIG. 2 is a flowchart showing the procedure of the process of FIG. As in FIG. 3, data is acquired by starting the measurement operation (ST1). It is determined whether or not the acquired data satisfies the trigger condition (ST2). If the trigger condition is satisfied, a data storing process for loading the data into the memory is performed (ST3).
Returning to T1, the next data is acquired. After the data storage processing, it is determined whether or not a predetermined number of data set in advance has been stored (ST4), and when the predetermined number of data has been fetched, the processing ends. The processes after ST3 are repeated until a predetermined number of data is fetched. In this repetition process, it is determined whether or not the priority of the trigger condition is higher for each of the acquired data than that currently stored (ST5). ,
If it is not higher, the processes after ST3 are repeated. If the priority of the trigger condition of the acquired data is high, the already stored data is discarded and the data storage processing is initialized (S
T6), and execute the processing after ST3.

【0022】なお、メモリに優先順位の高いトリガ条件
が成立した事象の測定データを取り込むのにあたり、メ
モリに空き容量がない場合には既に格納されている測定
データに上書きして取り込むようにしてもよい。
When fetching measurement data of an event for which a high-priority trigger condition is satisfied, the memory may overwrite the already stored measurement data if there is no free space in the memory. Good.

【0023】これにより、メモリには、常にその時点で
優先順位の最も高いトリガ条件が成立している事象の測
定データが取り込まれる。
Thus, the measured data of the event in which the trigger condition having the highest priority at that time is satisfied is always taken into the memory.

【0024】また、本発明は、複数チャンネルの測定デ
ータを共通のメモリに取り込む場合に限るものではな
く、単一チャンネルの測定データに対して複数のトリガ
条件を優先順位を付けて設定し、容量が制限されたメモ
リに常にその時点で優先順位の最も高いトリガ条件が成
立している事象の測定データを取り込む場合にも有効で
ある。
Further, the present invention is not limited to the case where the measurement data of a plurality of channels is taken into a common memory. This is also effective when the measured data of the event for which the trigger condition of the highest priority is satisfied at that time is always taken into the memory where is limited.

【0025】また、本発明におけるトリガ条件は、信号
レベルとして設定されたものでもよいし、波形パターン
として設定されたものでもよいし、さらにはこれらを組
み合わせたものでもよく、測定用途に応じて適宜使い分
ければよい。
The trigger condition in the present invention may be set as a signal level, may be set as a waveform pattern, or may be a combination of these. You can use them properly.

【0026】[0026]

【発明の効果】以上説明したように、本発明によれば、
重要度の高いトリガ条件を満たす事象の測定データを確
実にメモリに取り込むことができる波形測定装置が実現
できる。
As described above, according to the present invention,
It is possible to realize a waveform measuring device that can reliably store measurement data of an event that satisfies a trigger condition of high importance in a memory.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明に基づく波形測定装置の測定データ取り
込み状態説明図である。
FIG. 1 is an explanatory diagram of a measured data capturing state of a waveform measuring apparatus according to the present invention.

【図2】図1の処理手順を示すフローチャートである。FIG. 2 is a flowchart illustrating a processing procedure of FIG. 1;

【図3】従来の波形測定装置の測定データ取り込み状態
説明図である。
FIG. 3 is an explanatory diagram of a state in which measurement data is captured by a conventional waveform measurement device.

【図4】図3の処理手順を示すフローチャートである。FIG. 4 is a flowchart showing a processing procedure of FIG. 3;

【符号の説明】[Explanation of symbols]

Data 測定データ Level トリガレベル Data Measurement data Level Trigger level

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 測定データをメモリに取り込むための複
数のトリガ条件が設定できる波形測定装置において、 それぞれのトリガ条件に優先順位を付ける手段と、 複数のトリガ条件が成立した場合にそれらトリガ条件の
優先順位を判断する手段とを設け、 トリガ条件が成立した事象の測定データを優先順位に基
づいてメモリに取り込むことを特徴とする波形測定装
置。
1. A waveform measuring apparatus capable of setting a plurality of trigger conditions for loading measured data into a memory, a means for prioritizing each trigger condition, and a method for setting a trigger condition when the plurality of trigger conditions are satisfied. A waveform measuring device comprising: means for determining a priority order; and taking measured data of an event for which a trigger condition is satisfied into a memory based on the priority order.
【請求項2】 請求項1記載の波形測定装置において、 前記トリガ条件は複数チャンネルの測定データをメモリ
に取り込むために各チャンネル毎に優先順位を付けて設
定され、トリガ条件が成立したチャンネルの測定データ
を優先順位に基づいてメモリに取り込むことを特徴とす
る波形測定装置。
2. The waveform measuring apparatus according to claim 1, wherein the trigger condition is set with a priority order for each channel in order to load measurement data of a plurality of channels into a memory, and the measurement of the channel for which the trigger condition is satisfied is set. A waveform measuring device for taking data into a memory based on priority.
【請求項3】 請求項1または請求項2記載の波形測定
装置において、前記メモリに優先順位の高いトリガ条件
が成立した事象の測定データを取り込む空き容量がない
場合には上書きして取り込むことを特徴とする波形測定
装置。
3. The waveform measuring apparatus according to claim 1, wherein when there is no free space in the memory for acquiring measurement data of an event for which a high-priority trigger condition is satisfied, the memory is overwritten and acquired. Characteristic waveform measuring device.
【請求項4】 請求項2記載の波形測定装置において、
複数チャンネルのトリガ条件の成立が競合した場合、前
記メモリには優先順位の低いトリガ条件が成立した事象
の測定データを破棄して優先順位の高いトリガ条件が成
立した事象の測定データを取り込むことを特徴とする波
形測定装置。
4. The waveform measuring apparatus according to claim 2, wherein
When the trigger conditions of a plurality of channels conflict with each other, the memory may discard the measurement data of the event in which the low-priority trigger condition is satisfied and capture the measurement data of the event in which the high-priority trigger condition is satisfied. Characteristic waveform measuring device.
【請求項5】 請求項1〜4記載の波形測定装置におい
て、トリガ条件が信号レベルと波形パターンの少なくと
もいずれかとして設定されたことを特徴とする波形測定
装置。
5. The waveform measuring apparatus according to claim 1, wherein the trigger condition is set as at least one of a signal level and a waveform pattern.
JP2000007722A 2000-01-17 2000-01-17 Waveform measuring device Expired - Fee Related JP3759360B2 (en)

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