JP2001159736A5 - - Google Patents
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- Publication number
- JP2001159736A5 JP2001159736A5 JP2000285256A JP2000285256A JP2001159736A5 JP 2001159736 A5 JP2001159736 A5 JP 2001159736A5 JP 2000285256 A JP2000285256 A JP 2000285256A JP 2000285256 A JP2000285256 A JP 2000285256A JP 2001159736 A5 JP2001159736 A5 JP 2001159736A5
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000285256A JP2001159736A (ja) | 1999-09-20 | 2000-09-14 | 観察物体の物理量を検出するための方法およびこれを用いた検出装置 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP30446799 | 1999-09-20 | ||
| JP11-304467 | 1999-09-20 | ||
| JP2000285256A JP2001159736A (ja) | 1999-09-20 | 2000-09-14 | 観察物体の物理量を検出するための方法およびこれを用いた検出装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2001159736A JP2001159736A (ja) | 2001-06-12 |
| JP2001159736A5 true JP2001159736A5 (sh) | 2007-11-01 |
Family
ID=26563921
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000285256A Abandoned JP2001159736A (ja) | 1999-09-20 | 2000-09-14 | 観察物体の物理量を検出するための方法およびこれを用いた検出装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2001159736A (sh) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4689171B2 (ja) * | 2004-02-06 | 2011-05-25 | オリンパス株式会社 | 培養細胞の状態計測方法及び計測装置 |
| US7453577B2 (en) * | 2004-12-14 | 2008-11-18 | Asml Netherlands B.V. | Apparatus and method for inspecting a patterned part of a sample |
| JP4718231B2 (ja) * | 2005-04-20 | 2011-07-06 | オリンパス株式会社 | 形状計測装置、及びプログラム |
| JP4917404B2 (ja) * | 2006-10-18 | 2012-04-18 | オリンパス株式会社 | 位相物体の可視化方法とその顕微鏡システム |
| JP2008292939A (ja) * | 2007-05-28 | 2008-12-04 | Graduate School For The Creation Of New Photonics Industries | 定量位相顕微鏡 |
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2000
- 2000-09-14 JP JP2000285256A patent/JP2001159736A/ja not_active Abandoned