JP2001159736A5 - - Google Patents

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Publication number
JP2001159736A5
JP2001159736A5 JP2000285256A JP2000285256A JP2001159736A5 JP 2001159736 A5 JP2001159736 A5 JP 2001159736A5 JP 2000285256 A JP2000285256 A JP 2000285256A JP 2000285256 A JP2000285256 A JP 2000285256A JP 2001159736 A5 JP2001159736 A5 JP 2001159736A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
JP2000285256A
Other languages
Japanese (ja)
Other versions
JP2001159736A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2000285256A priority Critical patent/JP2001159736A/ja
Priority claimed from JP2000285256A external-priority patent/JP2001159736A/ja
Publication of JP2001159736A publication Critical patent/JP2001159736A/ja
Publication of JP2001159736A5 publication Critical patent/JP2001159736A5/ja
Abandoned legal-status Critical Current

Links

JP2000285256A 1999-09-20 2000-09-14 観察物体の物理量を検出するための方法およびこれを用いた検出装置 Abandoned JP2001159736A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000285256A JP2001159736A (ja) 1999-09-20 2000-09-14 観察物体の物理量を検出するための方法およびこれを用いた検出装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP11-304467 1999-09-20
JP30446799 1999-09-20
JP2000285256A JP2001159736A (ja) 1999-09-20 2000-09-14 観察物体の物理量を検出するための方法およびこれを用いた検出装置

Publications (2)

Publication Number Publication Date
JP2001159736A JP2001159736A (ja) 2001-06-12
JP2001159736A5 true JP2001159736A5 (enrdf_load_stackoverflow) 2007-11-01

Family

ID=26563921

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000285256A Abandoned JP2001159736A (ja) 1999-09-20 2000-09-14 観察物体の物理量を検出するための方法およびこれを用いた検出装置

Country Status (1)

Country Link
JP (1) JP2001159736A (enrdf_load_stackoverflow)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4689171B2 (ja) * 2004-02-06 2011-05-25 オリンパス株式会社 培養細胞の状態計測方法及び計測装置
US7453577B2 (en) * 2004-12-14 2008-11-18 Asml Netherlands B.V. Apparatus and method for inspecting a patterned part of a sample
JP4718231B2 (ja) * 2005-04-20 2011-07-06 オリンパス株式会社 形状計測装置、及びプログラム
JP4917404B2 (ja) * 2006-10-18 2012-04-18 オリンパス株式会社 位相物体の可視化方法とその顕微鏡システム
JP2008292939A (ja) * 2007-05-28 2008-12-04 Graduate School For The Creation Of New Photonics Industries 定量位相顕微鏡

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