JP2001153605A5 - - Google Patents
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- Publication number
- JP2001153605A5 JP2001153605A5 JP2000310386A JP2000310386A JP2001153605A5 JP 2001153605 A5 JP2001153605 A5 JP 2001153605A5 JP 2000310386 A JP2000310386 A JP 2000310386A JP 2000310386 A JP2000310386 A JP 2000310386A JP 2001153605 A5 JP2001153605 A5 JP 2001153605A5
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19949760A DE19949760A1 (de) | 1999-10-15 | 1999-10-15 | Interferometer |
| DE19949760.5 | 1999-10-15 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2001153605A JP2001153605A (ja) | 2001-06-08 |
| JP2001153605A5 true JP2001153605A5 (ja) | 2007-12-13 |
| JP4934244B2 JP4934244B2 (ja) | 2012-05-16 |
Family
ID=7925778
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000310386A Expired - Fee Related JP4934244B2 (ja) | 1999-10-15 | 2000-10-11 | 部品の位置を検出する装置 |
Country Status (3)
| Country | Link |
|---|---|
| EP (1) | EP1092943B1 (ja) |
| JP (1) | JP4934244B2 (ja) |
| DE (2) | DE19949760A1 (ja) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2393263B (en) * | 2002-09-18 | 2004-10-27 | Teraview Ltd | Apparatus for varying the path length of a beam of radiation |
| AU2003271850A1 (en) | 2002-09-18 | 2004-04-08 | Teraview Limited | Apparatus for varying the path length of a beam of radiation |
| DE102015119274B4 (de) * | 2015-11-09 | 2018-07-12 | Björn Habrich | Verfahren und Vorrichtung zur Bestimmung der räumlichen Position eines Gegenstandes mittels interferometrischer Längenmessung |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2457253C2 (de) * | 1974-12-04 | 1982-09-02 | Krautkrämer, GmbH, 5000 Köln | Optisches interferometrisches Verfahren und Vorrichtung zur berührungslosen Messung der durch Ultraschallwellen verursachten Oberflächenauslenkung eines Prüflings |
| DE3585758D1 (en) * | 1984-07-18 | 1992-05-07 | Philips Nv | Interferometer. |
| JPS6130724A (ja) * | 1984-07-24 | 1986-02-13 | Jeol Ltd | 干渉計 |
| DE3446014C2 (de) * | 1984-12-17 | 1987-02-26 | Deutsche Forschungs- und Versuchsanstalt für Luft- und Raumfahrt e.V., 5000 Köln | Interferometer nach dem Michelson-Prinzip |
| JP2712061B2 (ja) * | 1991-04-11 | 1998-02-10 | 本田技研工業株式会社 | 移動体の位置検出装置 |
| JPH081398B2 (ja) * | 1991-09-26 | 1996-01-10 | 株式会社島津製作所 | 回転型干渉計 |
| US5491524A (en) * | 1994-10-05 | 1996-02-13 | Carl Zeiss, Inc. | Optical coherence tomography corneal mapping apparatus |
| US6144456A (en) * | 1995-05-04 | 2000-11-07 | Haag-Streit Ag | Apparatus having a multiple angle transparent rotating element for measuring the thickness of transparent objects |
| US6243191B1 (en) * | 1998-02-03 | 2001-06-05 | Carl Zeiss Jena Gmbh | Optical path length modulator |
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1999
- 1999-10-15 DE DE19949760A patent/DE19949760A1/de not_active Withdrawn
-
2000
- 2000-09-26 EP EP00120888A patent/EP1092943B1/de not_active Expired - Lifetime
- 2000-09-26 DE DE50008654T patent/DE50008654D1/de not_active Expired - Lifetime
- 2000-10-11 JP JP2000310386A patent/JP4934244B2/ja not_active Expired - Fee Related