JP2000344529A - Composition for forming lsco conductive thin film, and formation of lsco conductive thin film - Google Patents

Composition for forming lsco conductive thin film, and formation of lsco conductive thin film

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Publication number
JP2000344529A
JP2000344529A JP15812199A JP15812199A JP2000344529A JP 2000344529 A JP2000344529 A JP 2000344529A JP 15812199 A JP15812199 A JP 15812199A JP 15812199 A JP15812199 A JP 15812199A JP 2000344529 A JP2000344529 A JP 2000344529A
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JP
Japan
Prior art keywords
thin film
lsco
conductive thin
composition
forming
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP15812199A
Other languages
Japanese (ja)
Inventor
Nobuyuki Soyama
信幸 曽山
Yoshihiko Tsuchikida
芳彦 土木田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Materials Corp
Original Assignee
Mitsubishi Materials Corp
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Filing date
Publication date
Application filed by Mitsubishi Materials Corp filed Critical Mitsubishi Materials Corp
Priority to JP15812199A priority Critical patent/JP2000344529A/en
Publication of JP2000344529A publication Critical patent/JP2000344529A/en
Withdrawn legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To provide a composition for LSCO conductive thin film excellent in long-term preservation stability, and to provide the method for forming the LSCO conductive thin film by using the composition. SOLUTION: In this composition for forming the perovskite type LSCO conductive thin film containing metallic alkoxides of La, Sr and Co, the partially hydrolyzed material and/or an organic acid salt, the particles having >=0.5 μm is <=50 pieces/ml. The LSCO conductive thin film is formed by repeating a process that the composition is applied on a heat resistant substrate and heated in the air, an oxidizing atmosphere or a steam-containing atmosphere until a film having a desirable film thickness is obtained and firing the film at least during heating or after heating in the final process at a temp. equal to or above the crystallization temp.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、その電気的性質に
より各種デバイスへの応用が期待されるLSCO導電性
薄膜を形成するための組成物及び形成方法に関する。
The present invention relates to a composition and a method for forming an LSCO conductive thin film expected to be applied to various devices due to its electrical properties.

【0002】[0002]

【従来の技術】LSCO薄膜は、その優れた導電特性か
ら電極材等として注目されており、種々のデバイスへの
応用が期待されている。このLSCO導電性薄膜の形成
方法には、スパッタリング法、MOCVD法等がある
が、比較的安価で簡便な薄膜形成法として、ゾルゲル法
がある。ゾルゲル法は、U. S. Pat. filing No. 09/061
362に記載の通り、有機金属化合物の溶液よりなる薄膜
形成用組成物を基板に塗布し、塗布後に加水分解させて
酸化物薄膜とした後、焼成して結晶化させることにより
薄膜を形成する方法であり、原料の有機金属化合物とし
ては、一般に、金属アルコキシドやその部分加水分解
物、或いは有機酸塩が用いられている。
2. Description of the Related Art LSCO thin films are attracting attention as electrode materials and the like because of their excellent conductive properties, and are expected to be applied to various devices. As a method of forming the LSCO conductive thin film, there are a sputtering method, an MOCVD method, and the like. As a relatively inexpensive and simple thin film forming method, there is a sol-gel method. The sol-gel method is described in US Pat. Filing No. 09/061
As described in 362, a method for forming a thin film by applying a thin film forming composition comprising a solution of an organometallic compound to a substrate, hydrolyzing the coated film to form an oxide thin film, and then firing and crystallizing the oxide thin film In general, a metal alkoxide, a partial hydrolyzate thereof, or an organic acid salt is used as an organic metal compound as a raw material.

【0003】[0003]

【発明が解決しようとする課題】従来用いられているL
SCO導電性薄膜形成用組成物では、長期間保存した場
合、液中の重合反応等により、パーティクルの増加、沈
殿の発生の問題があり、長期的に安定して使用すること
ができなかった。
SUMMARY OF THE INVENTION Conventionally used L
When the composition for forming an SCO conductive thin film is stored for a long period of time, there is a problem of an increase in particles and generation of a precipitate due to a polymerization reaction in the liquid and the like, and thus the composition cannot be used stably for a long period of time.

【0004】本発明は、上記従来の問題点を解決し、長
期保存安定性に優れたLSCO導電性薄膜形成用組成物
とこのLSCO導電性薄膜形成用組成物を用いたLSC
O導電性薄膜の形成方法を提供することを目的とする。
The present invention solves the above-mentioned conventional problems, and provides a composition for forming an LSCO conductive thin film having excellent long-term storage stability and an LSC using the composition for forming an LSCO conductive thin film.
An object of the present invention is to provide a method for forming an O conductive thin film.

【0005】[0005]

【課題を解決するための手段】本発明のLSCO導電性
薄膜形成用組成物は、ペロブスカイト型LSCO導電性
薄膜を形成するための有機金属化合物溶液よりなるLS
CO導電性薄膜形成用組成物において、粒径0.5μm
以上のパーティクルの存在量が50個/mL以下である
ことを特徴とする。
SUMMARY OF THE INVENTION The composition for forming an LSCO conductive thin film of the present invention comprises an LSCO solution comprising an organometallic compound solution for forming a perovskite-type LSCO conductive thin film.
In the composition for forming a CO conductive thin film, the particle size is 0.5 μm
The present invention is characterized in that the abundance of the particles is 50 particles / mL or less.

【0006】即ち、本発明者らは、LSCO導電性薄膜
形成用組成物の長期保存安定性を改善すべく鋭意検討を
重ねた結果、LSCO導電性薄膜形成用組成物の有機金
属化合物溶液中において、沈殿発生の初期核となる初期
パーティクル数を極力減らすことで、長期保存時のパー
ティクルの増加、沈殿の発生を飛躍的に低減することが
できることを見出し、本発明に到達した。
That is, the present inventors have intensively studied to improve the long-term storage stability of the composition for forming an LSCO conductive thin film, and as a result, the composition of the composition for forming an LSCO conductive thin film in an organometallic compound solution was found. The present inventors have found that by minimizing the number of initial particles serving as initial nuclei for the generation of sediment as much as possible, it is possible to drastically reduce the increase in particles and the generation of sediment during long-term storage, and have reached the present invention.

【0007】本発明のLSCO導電性薄膜の形成方法
は、このような本発明のLSCO導電性薄膜形成用組成
物を耐熱性基板に塗布し、空気中、酸化雰囲気中又は含
水蒸気雰囲気中で加熱する工程を所望の厚さの膜が得ら
れるまで繰り返し、少なくとも最終工程における加熱中
或いは加熱後に該膜を結晶化温度以上で焼成することを
特徴とするものであり、この方法によれば、LSCO導
電性薄膜形成用組成物を長期保存した後も、均質で膜品
質の高い良好なLSCO導電性薄膜を形成することがで
きる。
In the method for forming an LSCO conductive thin film of the present invention, such a composition for forming an LSCO conductive thin film of the present invention is applied to a heat-resistant substrate and heated in air, an oxidizing atmosphere or a steam-containing atmosphere. This step is repeated until a film having a desired thickness is obtained, and the film is fired at or above a crystallization temperature at least during or after heating in the final step. Even after the composition for forming a conductive thin film has been stored for a long period of time, a good LSCO conductive thin film having a uniform and high film quality can be formed.

【0008】[0008]

【発明の実施の形態】以下に本発明の実施の形態を詳細
に説明する。
Embodiments of the present invention will be described below in detail.

【0009】本発明で用いる有機金属化合物原料は、具
体的には、La,Sr及びCoの金属アルコキシド、そ
の部分加水分解物及び/又は有機酸塩であり、このう
ち、La化合物としてはランタン−2−メトキシエトキ
シド等のアルコキシドが挙げられる。Sr化合物として
は2−エチルヘキサン酸ストロンチウム等の有機酸塩、
ストロンチウム−2−メトキシエトキシド等のアルコキ
シドが挙げられる。Co化合物としては、オクチル酸コ
バルト等の有機酸塩が挙げられる。金属アルコキシドは
そのまま使用してもよいが、分解を促進させるためにそ
の部分加水分解物を使用してもよい。
The raw material of the organometallic compound used in the present invention is, specifically, a metal alkoxide of La, Sr and Co, a partial hydrolyzate thereof and / or an organic acid salt. Alkoxides such as 2-methoxyethoxide are exemplified. Organic acid salts such as strontium 2-ethylhexanoate as the Sr compound,
Alkoxides such as strontium-2-methoxyethoxide are exemplified. Examples of the Co compound include an organic acid salt such as cobalt octylate. The metal alkoxide may be used as it is, or its partial hydrolyzate may be used to accelerate the decomposition.

【0010】本発明のLSCO導電性薄膜形成用組成物
を調製するには、これらの原料有機金属化合物を、所望
のLSCO導電性薄膜組成に相当する比率で適当な溶媒
に溶解して、塗布に適した濃度に調製する。
In order to prepare the composition for forming an LSCO conductive thin film of the present invention, these starting organometallic compounds are dissolved in an appropriate solvent in a ratio corresponding to a desired LSCO conductive thin film composition, and the composition is applied. Adjust to an appropriate concentration.

【0011】ここで用いるLSCO導電性薄膜形成用組
成物の溶媒は、原料有機金属化合物に応じて適宜決定さ
れるが、一般的には、カルボン酸、アルコール、エステ
ル、ケトン類(例えば、アセトン、メチルエチルケト
ン)、エーテル類(例えば、ジメチルエーテル、ジエチ
ルエーテル)、シクロアルカン類(例えば、シクロヘキ
サン、シクロヘキサノール)、芳香族系(例えば、ベン
ゼン、トルエン、キシレン)、その他テトラヒドロフラ
ン等、或いはこれらの2種以上の混合溶媒を用いること
ができる。
The solvent of the LSCO conductive thin film forming composition used here is appropriately determined according to the starting organometallic compound. Generally, carboxylic acids, alcohols, esters, ketones (for example, acetone, Methyl ethyl ketone), ethers (e.g., dimethyl ether, diethyl ether), cycloalkanes (e.g., cyclohexane, cyclohexanol), aromatics (e.g., benzene, toluene, xylene), tetrahydrofuran, and the like, or two or more of these A mixed solvent can be used.

【0012】カルボン酸としては、具体的には、n−酪
酸、α−メチル酪酸、i−吉草酸、2−エチル酪酸、
2,2−ジメチル酪酸、3,3−ジメチル酪酸、2,3
−ジメチル酪酸、3−メチルペンタン酸、4−メチルペ
ンタン酸、2−エチルペンタン酸、3−エチルペンタン
酸、2,2−ジメチルペンタン酸、3,3−ジメチルペ
ンタン酸、2,3−ジメチルペンタン酸、2−エチルヘ
キサン酸、3−エチルヘキサン酸を用いるのが好まし
い。
Specific examples of the carboxylic acid include n-butyric acid, α-methylbutyric acid, i-valeric acid, 2-ethylbutyric acid,
2,2-dimethylbutyric acid, 3,3-dimethylbutyric acid, 2,3
-Dimethylbutyric acid, 3-methylpentanoic acid, 4-methylpentanoic acid, 2-ethylpentanoic acid, 3-ethylpentanoic acid, 2,2-dimethylpentanoic acid, 3,3-dimethylpentanoic acid, 2,3-dimethylpentane It is preferable to use an acid, 2-ethylhexanoic acid, or 3-ethylhexanoic acid.

【0013】また、エステルとしては、酢酸エチル、酢
酸プロピル、酢酸n−ブチル、酢酸sec−ブチル、酢
酸tert−ブチル、酢酸イソブチル、酢酸n−アミ
ル、酢酸sec−アミル、酢酸tert−アミル、酢酸
イソアミルを用いるのが好ましく、アルコールとして
は、1−プロパノール、2−プロパノール、1−ブタノ
ール、2−ブタノール、イソ−ブチルアルコール、1−
ペンタノール、2−ペンタノール、2−メチル−2−ペ
ンタノール、2−メトキシエタノールを用いるのが好適
である。
Examples of the ester include ethyl acetate, propyl acetate, n-butyl acetate, sec-butyl acetate, tert-butyl acetate, isobutyl acetate, n-amyl acetate, sec-amyl acetate, tert-amyl acetate, and isoamyl acetate. It is preferable to use 1-propanol, 2-propanol, 1-butanol, 2-butanol, iso-butyl alcohol, 1-propanol.
It is preferable to use pentanol, 2-pentanol, 2-methyl-2-pentanol, and 2-methoxyethanol.

【0014】なお、LSCO導電性薄膜形成用組成物の
有機金属化合物溶液中の有機金属化合物の合計濃度は、
金属酸化物換算量で0.1〜20重量%程度とするのが
好ましい。
The total concentration of the organometallic compound in the organometallic compound solution of the composition for forming an LSCO conductive thin film is as follows:
It is preferable to be about 0.1 to 20% by weight in terms of metal oxide.

【0015】この有機金属化合物溶液中には、必要に応
じて安定化剤として、β−ジケトン類(例えば、アセチ
ルアセトン、ヘプタフルオロブタノイルピバロイルメタ
ン、ジピバロイルメタン、トリフルオロアセチルアセト
ン、ベンゾイルアセトン等)、ケトン酸類(例えば、ア
セト酢酸、プロピオニル酢酸、ベンゾイル酢酸等)、こ
れらのケトン酸のメチル、プロピル、ブチル等の低級ア
ルキルエステル類、オキシ酸類(例えば、乳酸、グリコ
ール酸、α−オキシ酪酸、サリチル酸等)、これらのオ
キシ酸の低級アルキルエステル類、オキシケトン類(例
えば、ジアセトンアルコール、アセトイン等)、α−ア
ミノ酸類(例えば、グリシン、アラニン等)、アルカノ
ールアミン類(例えば、ジェタノールアミン、トリエタ
ノールアミン、モノエタノールアミン)等を、(安定化
剤分子数)/(金属原子数)で0.2〜3程度添加して
も良い。
In this organometallic compound solution, if necessary, β-diketones (eg, acetylacetone, heptafluorobutanoylpivaloylmethane, dipivaloylmethane, trifluoroacetylacetone, benzoyl) may be used as a stabilizer. Acetone, etc.), ketone acids (eg, acetoacetic acid, propionylacetic acid, benzoylacetic acid, etc.), lower alkyl esters of these ketone acids such as methyl, propyl, butyl, etc., and oxyacids (eg, lactic acid, glycolic acid, α-oxy acid) Butyric acid, salicylic acid, etc.), lower alkyl esters of these oxyacids, oxyketones (eg, diacetone alcohol, acetoin, etc.), α-amino acids (eg, glycine, alanine, etc.), alkanolamines (eg, jetanol) Amine, triethanolamine, mono The ethanolamine) or the like, may be added from 0.2 to 3 approximately at (stabilizer number of molecules) / (number of metal atoms).

【0016】本発明では、このようにして調製された有
機金属化合物溶液を濾過処理するなどして、パーティク
ルを除去し、粒径0.5μm以上のパーティクルの個数
が溶液1mL当り50個/mL以下となるようにする。
In the present invention, the organometallic compound solution thus prepared is filtered to remove particles, and the number of particles having a particle size of 0.5 μm or more is 50 particles / mL or less per 1 mL of the solution. So that

【0017】有機金属化合物溶液中の粒径0.5μm以
上のパーティクルの個数が50個/mLを超えると、長
期保存安定性が劣るものとなる。この有機金属化合物溶
液中の粒径0.5μm以上のパーティクルの個数は少な
い程好ましく、特に30個/mL以下であることが好ま
しい。
When the number of particles having a particle size of 0.5 μm or more in the organometallic compound solution exceeds 50 particles / mL, the long-term storage stability becomes poor. The number of particles having a particle size of 0.5 μm or more in this organometallic compound solution is preferably as small as possible, and particularly preferably 30 particles / mL or less.

【0018】このようなパーティクル個数となるよう
に、調製後の有機金属化合物溶液を処理する方法として
は特に制限はないが、具体的には次のような方法が挙げ
られる。 市販の0.2μm孔径のメンブランフィルターを使
用し、シリンジで圧送する濾過法。 市販の0.05μm孔径のメンブランフィルターと
加圧タンクを組み合せた加圧濾過法。 上記のフィルターと溶液循環槽を組み合せた循環
濾過法。
The method for treating the prepared organometallic compound solution so that the number of particles is as described above is not particularly limited, but specific examples include the following methods. A filtration method in which a commercially available membrane filter having a pore size of 0.2 μm is used and the solution is pumped by a syringe. A pressure filtration method combining a commercially available membrane filter with a pore size of 0.05 μm and a pressure tank. A circulation filtration method combining the above filter and a solution circulation tank.

【0019】いずれの方法においても、溶液圧送圧力に
より、フィルターによるパーティクル捕捉率が異なる。
圧力が低いほど捕捉率が高くなることは一般的に知られ
ており、特に、,について、本発明のパーティクル
50個以下の条件を実現するためには、低圧で非常にゆ
っくりとフィルターに通す必要がある。後述の実施例に
おいて、,の方法ではパーティクル50個以下を実
現していないが、当然圧力を下げれば本発明の条件を達
成可能である。
In any of the methods, the particle capture rate by the filter differs depending on the solution pressure.
It is generally known that the lower the pressure, the higher the trapping rate. In particular, in order to achieve the condition of 50 particles or less according to the present invention, it is necessary to pass the filter very slowly at a low pressure. There is. In the embodiments described later, the method of (1) does not realize 50 particles or less, but naturally the condition of the present invention can be achieved by lowering the pressure.

【0020】このようなLSCO導電性薄膜形成用組成
物により、本発明の方法に従って、LSCO導電性薄膜
を形成するには、上述の本発明のLSCO導電性薄膜形
成用組成物をスピンコート、ディップコート、LSMC
D(Liquid Source Misted Ch
emical Deposition)法等の塗布法に
より基板上に塗布し、乾燥(仮焼成)及び本焼成を行
う。
In order to form an LSCO conductive thin film according to the method of the present invention from such a composition for forming an LSCO conductive thin film, the above-described composition for forming an LSCO conductive thin film of the present invention is spin-coated and dipped. Coat, LSMC
D (Liquid Source Misted Ch)
It is applied onto a substrate by a coating method such as an electronic deposition method, and is dried (temporarily baked) and baked.

【0021】使用される基板の具体例としては、基板表
層部に、単結晶Si、多結晶Si,Pt,Pt(最上
層)/Ti,Pt(最上層)/Ta,Ru,RuO2
Ru(最上層)/RuO2,RuO2(最上層)/Ru,
Ir,IrO2,Ir(最上層)/IrO2,Pt(最上
層)/Ir,Pt(最上層)/IrO2,SrRuO3
は(LaxSr1-x)CoO3等のペロブスカイト型導電
性酸化物等を用いた基板が挙げられるが、これらに限定
されるものではない。
As a specific example of the substrate used, monocrystalline Si, polycrystalline Si, Pt, Pt (top layer) / Ti, Pt (top layer) / Ta, Ru, RuO 2 ,
Ru (top layer) / RuO 2 , RuO 2 (top layer) / Ru,
Perovskite-type conductivity such as Ir, IrO 2 , Ir (top layer) / IrO 2 , Pt (top layer) / Ir, Pt (top layer) / IrO 2 , SrRuO 3 or (La x Sr 1 -x ) CoO 3 A substrate using an oxide or the like can be given, but not limited thereto.

【0022】なお、1回の塗布では、所望の膜厚が得ら
れない場合には、塗布、乾燥の工程を複数回繰り返し行
った後、本焼成を行う。
If the desired film thickness cannot be obtained by one coating, the steps of coating and drying are repeated a plurality of times, followed by main baking.

【0023】ここで、仮焼成は、溶媒を除去すると共に
有機金属化合物を加水分解して複合酸化物に転化させる
ために行うことから、空気中、酸化雰囲気中、又は含水
蒸気雰囲気中で行う。空気中での加熱でも、加水分解に
必要な水分は空気中の湿気により十分に確保される。こ
の加熱は、溶媒の除去のための低温加熱と、有機金属化
合物の分解のための高温加熱の2段階で実施しても良
い。
Here, the calcination is performed in air, in an oxidizing atmosphere, or in a steam-containing atmosphere since the calcination is performed to remove the solvent and hydrolyze the organic metal compound to convert it to a complex oxide. Even when heated in the air, the water required for hydrolysis is sufficiently ensured by the humidity in the air. This heating may be performed in two stages of low-temperature heating for removing the solvent and high-temperature heating for decomposing the organometallic compound.

【0024】本焼成は、仮焼成で得られた薄膜を結晶化
温度以上の温度で焼成して結晶化させるための工程であ
り、これによりLSCO導電性薄膜が得られる。
[0024] The main firing is a step for firing the thin film obtained by the preliminary firing at a temperature higher than the crystallization temperature to crystallize, thereby obtaining an LSCO conductive thin film.

【0025】一般に、仮焼成は、150〜550℃で行
われ、本焼成は450〜800℃で行われる。
Generally, the calcination is performed at 150 to 550 ° C., and the main calcination is performed at 450 to 800 ° C.

【0026】[0026]

【実施例】以下に実施例及び比較例を挙げて本発明をよ
り具体的に説明する。
The present invention will be described more specifically below with reference to examples and comparative examples.

【0027】なお、以下の実施例及び比較例において、
有機金属化合物原料としては、次のものを用いた。 La化合物: ランタン−2−メトキシエトキシド Sr化合物: ストロンチウム−2−メトキシエトキシ
ド Co化合物: オクチル酸コバルト 実施例1〜3、比較例1〜12 有機溶媒としてトルエンを使用し、これに上記金属化合
物を溶解させ、溶媒沸点下で24時間環流し、複合化反
応を行った。更に、溶液安定化のために、アセチルアセ
トンをLaとSrの合計モル数に対して1.5倍モル加
え、環流下で1時間反応を行った。この溶液中の有機金
属化合物の合計濃度は、金属酸化物換算濃度で約8重量
%であった。
In the following Examples and Comparative Examples,
The following were used as organometallic compound raw materials. La compound: lanthanum-2-methoxyethoxide Sr compound: strontium-2-methoxyethoxide Co compound: cobalt octylate Examples 1-3, Comparative Examples 1-12 Toluene was used as an organic solvent, and the above metal compound was used for this. Was dissolved and refluxed at a solvent boiling point for 24 hours to carry out a complexing reaction. Further, for the purpose of stabilizing the solution, acetylacetone was added in a molar amount of 1.5 times the total number of moles of La and Sr, and the reaction was performed under reflux for 1 hour. The total concentration of the organometallic compound in this solution was about 8% by weight in terms of metal oxide.

【0028】得られた溶液について、下記の方法で濾過
を行い、濾過処理後の溶液中の、粒径0.5μm以上の
パーティクルの個数を液中パーティクルカウンターによ
り測定し、結果を表1に示した。ただし、比較例1,
5,9においては、濾過を行わず、そのままパーティク
ル個数を測定した。
The obtained solution was filtered by the following method, and the number of particles having a particle size of 0.5 μm or more in the solution after the filtration was measured by a submerged particle counter. The results are shown in Table 1. Was. However, Comparative Example 1,
In Nos. 5 and 9, the number of particles was measured without filtering.

【0029】[濾過方法] A:前記濾過法により濾過した液と原液の9:1混合
液 B:前記濾過法 C:前記濾過法 D:前記濾過法 その後、各々の溶液を遮光した状態で室温にて長期保管
したときの、溶液中の粒径0.5μm以上のパーティク
ルの個数を液中パーティクルカウンターにより測定し、
その経時変化を表1に示した。
[Filtration method] A: 9: 1 mixture of the liquid filtered by the filtration method and the stock solution B: The filtration method C: The filtration method D: The filtration method Then, each solution is shielded from light at room temperature. When stored for a long time, the number of particles having a particle size of 0.5 μm or more in the solution is measured by a submerged particle counter,
The changes over time are shown in Table 1.

【0030】また、実施例1〜3において、各溶液を濾
過後3ヶ月保管した後、下記方法によりゾルゲル法によ
る薄膜の形成を行った。
In Examples 1 to 3, each solution was stored for 3 months after filtration, and then a thin film was formed by the sol-gel method according to the following method.

【0031】即ち、各々の溶液をスピンコート法により
3000rpmで15秒間の条件で6インチシリコン基
板上に塗布した。得られた塗膜の表面の膜品質を光学顕
微鏡観察により、ストリエーションの有無を調べること
により確認し、下記基準で評価を行い、結果を表1に示
した。 ○: 良好 △: ほぼ良好 ×: 不良 また、上記の如く、塗布した後400℃で10分間乾燥
し、この塗布、乾燥を4回繰り返した後、800℃の酸
素雰囲気中で1分間RTA(急速加熱処理装置)で焼成
して膜厚2800ÅのLSCO導電性薄膜を形成した。
このLSCO導電性薄膜の導電特性を四探針式表面抵抗
計により調べ、結果を表1に示した。
That is, each solution was applied on a 6-inch silicon substrate by spin coating at 3000 rpm for 15 seconds. The film quality of the surface of the obtained coating film was confirmed by examining the presence or absence of striation by optical microscopic observation, and evaluated according to the following criteria. The results are shown in Table 1. :: good △: almost good ×: bad Also, as described above, after application, drying was performed at 400 ° C. for 10 minutes. This application and drying were repeated four times, and then RTA (rapid) was performed in an oxygen atmosphere at 800 ° C. for 1 minute. LSCO conductive thin film having a thickness of 2800 ° was formed by baking with a heat treatment device).
The conductive properties of this LSCO conductive thin film were examined with a four-probe surface resistance meter, and the results are shown in Table 1.

【0032】[0032]

【表1】 [Table 1]

【0033】表1より、溶液中の初期パーティクル(粒
径0.5μm以上のパーティクル)数を50個/mL以
下にすることで保存安定性を3ヶ月以上も維持すること
ができる、長期使用安定性に優れたLSCO導電性薄膜
形成用組成物が提供されることがわかる。また、このよ
うなLSCO導電性薄膜形成用組成物を用いることで、
長期保管後も高品質な塗膜を形成することができ、これ
により導電特性及びその再現性に優れたLSCO導電性
薄膜を形成することができることがわかる。
From Table 1, it can be seen that the storage stability can be maintained for more than 3 months by setting the number of initial particles (particles having a particle size of 0.5 μm or more) in the solution to 50 particles / mL or less. It can be seen that a composition for forming an LSCO conductive thin film having excellent properties is provided. Further, by using such a composition for forming an LSCO conductive thin film,
It can be seen that a high-quality coating film can be formed even after long-term storage, whereby a LSCO conductive thin film having excellent conductive properties and its reproducibility can be formed.

【0034】[0034]

【発明の効果】以上詳述した通り、本発明によれば、長
期間保管後も沈殿発生やパーティクルの増加の問題のな
い、長期保存安定性が著しく良好で、実用性の高いLS
CO導電性薄膜形成用組成物が提供され、このようなL
SCO導電性薄膜形成用組成物を用いて、高品質で導電
特性に優れたLSCO導電性薄膜を再現性良く形成する
ことができる。
As described in detail above, according to the present invention, LS which has no problem of generation of precipitates and increase of particles even after long-term storage, has extremely good long-term storage stability, and has high practicality.
A composition for forming a CO conductive thin film is provided.
Using the composition for forming an SCO conductive thin film, a LSCO conductive thin film having high quality and excellent conductive properties can be formed with good reproducibility.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 ペロブスカイト型LSCO導電性薄膜を
形成するための有機金属化合物溶液よりなるLSCO導
電性薄膜形成用組成物において、 粒径0.5μm以上のパーティクルの存在量が50個/
mL以下であることを特徴とするLSCO導電性薄膜形
成用組成物。
1. A composition for forming an LSCO conductive thin film comprising an organometallic compound solution for forming a perovskite-type LSCO conductive thin film, wherein an amount of particles having a particle diameter of 0.5 μm or more is 50 particles /
mL or less, a composition for forming an LSCO conductive thin film.
【請求項2】 請求項1に記載のLSCO導電性薄膜形
成用組成物を耐熱性基板に塗布し、空気中、酸化雰囲気
中又は含水蒸気雰囲気中で加熱する工程を所望の厚さの
膜が得られるまで繰り返し、少なくとも最終工程におけ
る加熱中或いは加熱後に該膜を結晶化温度以上で焼成す
ることを特徴とするLSCO導電性薄膜の形成方法。
2. The step of applying the composition for forming an LSCO conductive thin film according to claim 1 to a heat-resistant substrate and heating the composition in air, an oxidizing atmosphere, or a steam-containing atmosphere to form a film having a desired thickness. A method for forming an LSCO conductive thin film, characterized in that the film is repeatedly fired at or above a crystallization temperature during or after heating in a final step at least until obtained.
JP15812199A 1999-06-04 1999-06-04 Composition for forming lsco conductive thin film, and formation of lsco conductive thin film Withdrawn JP2000344529A (en)

Priority Applications (1)

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Application Number Priority Date Filing Date Title
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Publication Number Publication Date
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ID=15664767

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Country Link
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