JP2000314674A - Inspection method for display device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an inspection method for a display device which easily and surely inspects dot-like defects on a screen. SOLUTION: An inspection device which inspects a liquid-crystal panel built in a projector comprises a projector device which, with a liquid-crystal panel attached, projects its picture onto a screen. An operator observes a display projected on the screen (a display to be inspected) for inspecting dot-like defects (bright point and unilluminated point) on the liquid-crystal panel. Here, a display which is to be inspected and comprises a specified inspection pattern is projected on the screen. The inspection pattern comprises a first inspection pattern which comprises a rectangular central region displayed in black and a peripheral region displayed in white around it, and a second inspection pattern which comprises a central region displayed in white and a peripheral region displayed in black. The first and second inspection patterns are alternately displayed for easy inspection for presence, position, and number of bright points.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a display device inspection method, and more particularly, to a display device inspection method for inspecting abnormal display pixels on a screen.

[0002]

2. Description of the Related Art Conventionally, for example, a liquid crystal display device is known as a display device. Liquid crystal display devices are widely used in various fields as monitor devices for notebook computers, word processors, small TVs, desktop personal computers, and projectors because of their features such as thinness, light weight, and low power consumption. ing. At present, development is being pursued to further increase the screen size, increase the definition, and reduce the thickness.

A liquid crystal display device is constituted by electrodes such as scanning lines and signal lines and elements such as thin film transistors.
PE for thin film formation process, photoresist mask formation
It is manufactured by repeating a P process, an etching process for removing unnecessary portions of the thin film, and the like.

[0004] Although the above manufacturing process is performed in a clean room, abnormal pixels may be generated due to dust, static electricity, or the like, and display failure may occur. Display defects include, for example, dot-like defects that occur on the screen of a liquid crystal panel due to abnormal characteristics of a thin film transistor. In the case of a normally white liquid crystal panel, a desired voltage is not displayed on a corresponding pixel due to a defective characteristic of a thin film transistor and the desired voltage is not applied to the corresponding pixel, but the pixel is displayed as a bright point. Is displayed as a dark spot.

[0005] In an inspection process during the manufacture of a liquid crystal panel, the presence or absence of a point-like defect on the screen is inspected, and based on the inspection result, whether the liquid crystal panel is good or defective is determined. Further, in the liquid crystal panel, the generated point-like defect is detected and repaired to repair the defect or make it less noticeable. The number of repairs is limited, and a liquid crystal panel exceeding a predetermined number of repairs is treated as a defective product.

In the inspection process of the point defect, first, the position of the abnormal pixel on the screen to be inspected is inspected, and whether or not the found abnormal pixel is a bright spot defect is inspected based on the luminance. . That is, an abnormal pixel exceeding the limit is determined to be a bright spot defect.

[0007]

By the way, the point defects in the area near the center of the screen are more conspicuous than the point defects in the area near the frame of the screen. Has a large effect on the display. For this reason,
When inspecting the position of a point defect, it is known to divide the screen into a central area and a peripheral area and inspect which area the point defect belongs to.

For example, a transparent sheet in which a rectangular frame dividing a central area and a peripheral area is drawn is put on the screen by an operator's hand, and it is visually determined which area the point defect is in. It is.

However, in this method, the positioning accuracy when the transparent sheet is brought into contact with the screen is poor, and it may not be possible to accurately determine which area the point defect belongs to. Further, it is necessary to prepare transparent sheets according to the size of the screen of the liquid crystal panel to be inspected, and it is necessary to prepare transparent sheets for the number of operators to be inspected.

In the case of inspecting a liquid crystal panel incorporated in a projection TV, a liquid crystal panel as an object to be inspected is mounted on a projection device for inspection, and the position of a point-like defect is observed by looking at a screen projected on a screen. In order to judge, the inspection using the transparent sheet as described above is impossible.

In the inspection process, when an abnormal pixel is found on the screen, for example, a pixel displayed with a higher brightness than usual, it is determined whether or not the pixel is a bright spot defect based on the degree of the brightness. According to the method, a sample set in advance to the brightness level of the limit for luminance defect determination prepared for each color in accordance with the inspection process, for example, a plurality of samples with gradually different brightness are arranged and drawn for each color If the operator compares the brightness of the limit sample with the brightness of the bright spot on the screen, and determines that the brightness of the bright spot is brighter than a specific sample of the limit sample, the abnormal pixel is determined to be a luminance defect. As another method, there is known an inspection method for determining the presence or absence of a bright spot defect based on whether an abnormal pixel is confirmed in a state where a filter having a predetermined transmittance is arranged on a screen.

However, in the inspection method using the limit sample,
Depending on the type of LCD panel to be inspected, it is necessary to prepare a sample of the brightness limit at the level according to the quality required by the customer, and it is also necessary to prepare multiple samples of the same brightness limit according to the number of operators The management of limit samples was troublesome.

In the inspection method using a limit sample or a filter, accurate inspection cannot be performed because the brightness of a luminescent spot does not look the same unless the brightness of a light source used for the inspection is completely the same. For example, since the brightness of the luminescent spot on the liquid crystal panel changes depending on the brightness of the backlight or the light source for projection, it is determined whether or not the abnormal pixel is a luminance defect by comparing it with a limit sample or using a filter. Difficult.

SUMMARY OF THE INVENTION The present invention has been made in view of the above points, and an object of the present invention is to provide an inspection method capable of reliably and easily determining whether a display device is good or bad.

[0015]

According to the present invention, when the position of an abnormal display pixel on a screen on which a plurality of display pixels are arranged is inspected, the screen is displayed with a display brightness or a display brightness. An inspection pattern divided into a plurality of regions having different colors is displayed on the screen, and a region where the abnormal display pixel is located is specified.

Further, according to the present invention, when inspecting the position of an abnormal display pixel which is displayed with a higher display luminance than other display pixels on a screen on which a plurality of display pixels are arranged, the center of the screen can be checked. A first inspection pattern in which the region is displayed in black and a peripheral region around the central region is displayed in white, and a second inspection pattern in which the central region is displayed in white and the peripheral region is displayed in black are alternately provided via the screen. Then, it is determined which of the central area and the peripheral area has the abnormal display pixel.

According to the present invention, when inspecting the position of an abnormal display pixel which is displayed at a lower display luminance than other display pixels on a screen on which a plurality of display pixels capable of color display are arranged, A first inspection pattern in which a substantially central area of the screen is displayed in red and a peripheral area around the central area is displayed in green or blue; a second inspection pattern in which the central area is displayed in green and the peripheral area is displayed in blue or red; And a third inspection pattern in which the central region is displayed in blue and the peripheral region is displayed in red or green is sequentially displayed through the screen, and the abnormal display pixel is located in any of the central region and the peripheral region Is specified, and the color of the abnormal display pixel is specified.

Further, according to the present invention, a first abnormal display pixel or another display pixel which is displayed at a higher display brightness than other display pixels on a screen on which a plurality of display pixels capable of color display are arranged. When inspecting the position of the second abnormal display pixel displayed at a lower display luminance, a first inspection pattern in which a substantially central area of the screen is displayed in black and a peripheral area around the central area is displayed in white, A second inspection pattern in which the central area is displayed in white and the peripheral area is displayed in black; a third inspection pattern in which the central area is displayed in red and the peripheral area is displayed in green or blue; the central area is displayed in green; A fourth inspection pattern in which the peripheral area is displayed in blue or red, and a fifth inspection pattern in which the central area is displayed in blue and the peripheral area is displayed in red or green through the screen,
In addition to specifying whether the first or second abnormal display pixel is in the central area or the peripheral area, the color of the second abnormal display pixel is specified.

Further, according to the present invention, when inspecting the brightness of an abnormal display pixel which is displayed at a higher display brightness than other display pixels on a screen on which a plurality of display pixels are arranged, a reference display is used. An inspection pattern having a sample image including an area in which the luminance varies stepwise is displayed through the screen, and the luminance defect is identified by comparing the display luminance of each area of the sample image with the luminance of the abnormal display pixel. I do.

Further, according to the present invention, a display which is a reference when inspecting the brightness of an abnormal display pixel which is displayed at a higher display brightness than other display pixels on a screen on which a plurality of display pixels are arrayed. An inspection pattern having a sample image including an area having a stepwise difference in luminance and a screen to be inspected on which the abnormal display pixels are displayed are alternately displayed, and the display luminance of a specific area of the sample image of the inspection pattern and the inspection luminance are displayed. The luminance defect is identified by comparing the luminance of the abnormal display pixel on the inspection screen with the luminance.

According to the present invention, when inspecting abnormal display pixels on a screen on which a plurality of display pixels are arranged, the first inspection pattern obtained by dividing the screen into a plurality of areas having different display luminances is used. , And specifies the area where the abnormal display pixel is located. If the abnormal display pixel is displayed at a higher display luminance than the other display pixels, the reference display luminance includes an area where the display luminance is different stepwise. A second inspection pattern having a sample image is displayed instead of the first inspection pattern, and a luminance defect is identified by comparing the display luminance of each region of the sample image with the luminance of the abnormal display pixel.

According to the present invention, when inspecting an abnormal display pixel on a screen on which a plurality of display pixels are arranged, the first inspection pattern obtained by dividing the screen into a plurality of regions having different display luminances is used. , And specifies the area where the abnormal display pixel is located. If the abnormal display pixel is displayed at a higher display luminance than the other display pixels, the reference display luminance includes an area where the display luminance is different stepwise. A second inspection pattern having a sample image and a screen to be inspected on which the abnormal display pixels are displayed are alternately displayed instead of the first inspection pattern, and a display luminance of a specific area of the sample image and the abnormal display pixels are displayed. The luminance defect is specified by comparing the luminance with the luminance.

Further, according to the present invention, when inspecting an abnormal display pixel which is displayed at a higher display luminance than other display pixels on a screen on which a plurality of display pixels are arranged, a substantially central area of the screen is removed. A first inspection pattern in which black display is performed and a peripheral area around the central area is displayed in white, and a second inspection pattern in which the central area is displayed in white and the peripheral area is displayed in black are alternately displayed via the screen. A third inspection pattern having a sample image including a plurality of regions whose reference display luminances are different in a stepwise manner from the central region and the peripheral region.
Alternatively, display is performed in place of the second inspection pattern, and the luminance defect is identified by comparing the display luminance of a specific area of the sample image with the luminance of the abnormal display pixel.

Further, according to the present invention, a first abnormal display pixel displayed at a higher display brightness than other display pixels on a screen on which a plurality of display pixels are arranged, or a display lower than other display pixels. When inspecting a second abnormal display pixel displayed in luminance, a first inspection pattern in which a substantially central area of the screen is displayed in black and a peripheral area around the central area is displayed in white, and the central area is displayed in white The second inspection pattern, which is displayed and the peripheral area is displayed in black, is sequentially displayed through the screen, and in which of the central area and the peripheral area the first abnormal display pixel is located is specified. A third inspection pattern in which the central area is displayed in red and the peripheral area is displayed in green or blue, a fourth inspection pattern in which the central area is displayed in green and the peripheral area is displayed in blue or red, and the central area is displayed in blue And The fifth inspection pattern in which the peripheral region is displayed in red or green is sequentially displayed through the screen, and in which of the central region and the peripheral region the second abnormal display pixel is located is specified. When the color of the second abnormal display pixel is specified and the first abnormal display pixel is displayed, the sixth inspection pattern having a sample image including a plurality of regions in which the reference display luminance gradually changes is referred to as The inspection screen on which the first abnormal display pixel is displayed is alternately displayed instead of the first or second inspection pattern, and the display luminance of a specific area of the sample image and the display luminance of the first abnormal display pixel are displayed. The luminance defect is specified by comparing the luminance with the luminance.

[0025]

Embodiments of the present invention will be described below in detail with reference to the drawings.

FIG. 1 shows a schematic configuration of an inspection device 10 for inspecting a liquid crystal panel 1 (display device) incorporated in a projector. The inspection apparatus 10 is incorporated in a part of a production line of a projector, and includes a liquid crystal panel 1.
Are inspected for point defects (described later).

For example, a liquid crystal panel 1 for a projector
Is the inspection device 1 before being incorporated into the projector.
0 is attached to the projection device 4. Then, the screen to be inspected of the liquid crystal panel 1 is projected on the screen 2, and the inspected image enlarged and projected on the screen 2 is checked by the operator, and the presence or absence of a point defect is inspected.

As a result of the inspection, the liquid crystal panel 1 in which it is determined that the state of the point-like defect is lower than a certain level, together with management information based on a bar code (not shown) given to the panel, is used in the next step of the driving circuit. Sent to the mounting process,
The liquid crystal panel 1 determined to be defective is eliminated without being sent to the next step.

The liquid crystal panel 1 to be inspected is composed of electrodes such as scanning lines and signal lines, and elements such as thin film transistors. A thin film forming step, a PEP step of forming a photoresist mask, and no thin film are required. It is manufactured by repeating an etching process for removing portions and the like.
Although the liquid crystal panel 1 is manufactured in a clean room, an abnormality due to dust, static electricity, or the like may occur and display failure may occur. The display failure includes, for example, a dot-like defect generated on the screen of the liquid crystal panel due to an abnormality of the thin film transistor. In the case of a normally white liquid crystal panel, a dot defect is displayed as a bright point without applying a desired voltage to a corresponding pixel due to a defective characteristic of a thin film transistor, or an undesired voltage is applied between electrodes of a certain pixel. Is displayed as a dark spot.

For this reason, the inspection apparatus 10 inspects the liquid crystal panel 1 for point defects such as the above-mentioned bright spots and dark spots, and repairs the point defects that can be repaired. Only the thing is sent to the next process. At this time, the presence / absence and number of the point-like defects serve as a judgment material for determining whether the liquid crystal panel 1 is good or bad.

When inspecting the liquid crystal panel 1 for point defects,
The liquid crystal panel 1 as the object to be inspected is attached to the mounting
The inspection screen of the liquid crystal panel 1 is enlarged and projected on the screen 2 by a light source (not shown). At this time, a plurality of inspection patterns, which will be described later, prepared in advance for inspecting the point-like defects of the liquid crystal panel 1, that is, the bright spots and the dark spots, are sequentially selected by the operator via the operation unit 8, Is selectively projected. Then, the screen to be inspected including the inspection pattern projected on the screen 2 in this way is recognized by the operator, and the presence or absence of a bright spot or a dark spot on the screen to be inspected is inspected.

In the inspection for point-like defects, first, the liquid crystal panel 1
The position of the abnormal pixel on the screen to be inspected is detected, and it is determined whether or not the found abnormal pixel is a bright spot.

Generally, a point defect in the area near the center of the screen to be inspected is more conspicuous than a point defect in the area near the frame of the screen. Therefore, the point defect in the center area gives a display. A large impact. For this reason, when inspecting the position of a point defect, the screen is divided into a central region and a peripheral region, and it is inspected to which region the point defect belongs.

Here, a method of inspecting the position of the abnormal pixel of the liquid crystal panel 1 will be described.

FIG. 2 and FIG. 3 show examples of a screen to be inspected including an inspection pattern for inspecting the position of an abnormal pixel. In these inspection patterns, the screen to be inspected is divided into a rectangular central area and a peripheral area around the rectangular area. Using these inspection patterns, it is inspected in which area the abnormal pixel is located.

For example, when inspecting the position of an abnormal pixel which is displayed with a higher luminance than usual, the liquid crystal panel 1 which can be inspected, for example, which can display a color, is mounted on the inspection apparatus 10 and the inspection apparatus shown in FIG. A screen to be inspected including an inspection pattern as shown in FIG. 2B is sequentially projected via the screen 2. In the test pattern of FIG. 2A, the central region is displayed in black and the peripheral region is displayed in white, and in the test pattern of FIG. 2B, the central region is displayed in white and the peripheral region is displayed in black.

According to the screen to be inspected alternately projected on the screen 2 in this manner, an abnormal pixel having a display luminance higher than normal is recognized by the operator in a corresponding color, and in which region, It is determined how many abnormal pixels exist. In the example of FIG. 2, an abnormal pixel corresponding to a green pixel is displayed in the center area of the screen to be inspected in FIG. 2A, and a red pixel is displayed in a peripheral area of the screen to be inspected in FIG. Since the corresponding abnormal pixel is displayed, it can be easily determined that there is one green abnormal pixel in the central area, and it can be easily determined that there is one red abnormal pixel in the peripheral area.

When inspecting the position of an abnormal pixel which is displayed at a display luminance lower than normal, FIG.
A screen to be inspected including three types of inspection patterns as shown in (c) is sequentially projected via the screen 2. FIG.
In the inspection pattern of FIG. 3A, the central area is displayed in red and the peripheral area is displayed in green. In the inspection pattern of FIG. 3B, the central area is displayed in green and the peripheral area is displayed in blue. )
In the inspection pattern of, the central region is displayed in blue, and the peripheral region is displayed in red.

According to the screen to be inspected alternately projected on the screen 2 in this manner, it is confirmed that an abnormal pixel having a display luminance lower than usual is abnormally displayed by the operator. It is determined how many abnormal pixels corresponding to what color pixels exist in the area. In the example of FIG. 3, there is an abnormal pixel corresponding to a red pixel in the center area of the screen to be inspected in FIG. 3A, and an abnormal pixel corresponding to a blue pixel in a peripheral area of the screen to be inspected in FIG. Since there is a pixel and there is no abnormal display pixel on the screen to be inspected in FIG. 3C, there is one abnormal pixel corresponding to a red pixel in the central area and an abnormal pixel corresponding to a blue pixel in the peripheral area. Can be easily determined.

As a test pattern for testing an abnormal pixel, as shown in FIGS. 3A to 3C, R
By using three test patterns combining three colors of GB, the number of test patterns to be used can be minimized.

Next, a method for judging the quality of an abnormal display pixel on a screen to be inspected will be described.

As described above, FIG. 2A and FIG.
When an abnormal pixel having a display luminance higher than normal is found on the screen to be inspected using the inspection pattern of (b), the inspection shown in FIG. 4 is continued from the inspection pattern of FIG. 2 (a) or FIG. 2 (b). The pattern is projected on the screen 2. That is, it is determined that an abnormal pixel on the screen to be inspected is a bright spot defect only when its brightness exceeds a certain level of brightness.

The inspection pattern for inspecting the brightness of the abnormal pixel is formed by forming a plurality of sample images arranged in a line on a black screen with the brightness gradually changing for each of the RGB colors. In each color sample, there is a reference sample whose gradation is set in advance to a limit at which the brightness of the bright spot becomes defective.
In this inspection pattern, the reference pattern is marked with an arrow. The operator compares the brightness of the marked reference sample with the brightness of the abnormal pixel on the screen to be inspected, and determines that the defective pixel is a bright spot defect when the brightness of the abnormal pixel is higher than the brightness of the reference sample. . The reference sample can be set arbitrarily from a plurality of samples.

The inspection pattern shown in FIG. 4 may be displayed simultaneously on the screen to be inspected having abnormal pixels, but in the present embodiment, the inspection pattern and the screen to be inspected are arranged at predetermined time intervals. The brightness is alternately displayed a plurality of times, and the brightness of the reference sample and the brightness of the abnormal pixel are compared by the operator. Further, it is not necessary to prepare a plurality of sample images arranged for each color as in the present embodiment, and it is possible to display only a sample corresponding to the color of the found abnormal pixel, and furthermore, a reference sample of the corresponding color. May be displayed. Further, the reference sample to be compared can be moved closer to the abnormal pixel to facilitate the brightness comparison.

Next, an example of the inspection method of the present invention will be described.
This will be described with reference to the flowchart of FIG.

First, the liquid crystal panel 1 as an object to be inspected is mounted on the projection device 4 of the inspection device 10 by an operator (step 1).

Then, the screen to be inspected including the inspection pattern of FIG. 2A (here, the first inspection pattern) and the inspection pattern of FIG. 2B (here, the second inspection pattern) Are projected alternately via the screen 2 (steps 2 and 3), and the operator checks the screen to be inspected to determine whether there is an abnormal pixel having a higher luminance than usual on the screen to be inspected. It is determined whether or not it is (step 4).

Subsequently, the screen to be inspected including the inspection pattern of FIG. 3A (here, the third inspection pattern) and the inspection pattern of FIG. 3B (here, the fourth inspection pattern) And the inspection screen including the inspection pattern of FIG. 3C (here, the fifth inspection pattern) is alternately projected via the screen 2 (steps 5 to 7), and the operator By checking the screen to be inspected, the presence / absence, position, color, number of pixels, and the like of abnormal pixels having luminance lower than normal are determined (step 8). Then, based on the determination result, whether the liquid crystal panel 1 is good or bad is determined (step 9). The determination result is written into the system together with the barcode information given to the liquid crystal panel 1 to be inspected.

On the other hand, if it is determined in step 4 that there is an abnormal pixel which is brighter than normal (step 4; Yes), the screen to be inspected including the inspection pattern of FIG. Instead of the first or second inspection pattern including the abnormal pixel, the image is alternately projected on the screen 2 at a predetermined time interval (step 10), and the operator checks the screen to be inspected, whereby the brightness of the abnormal pixel and the reference sample are checked. Then, the abnormal pixel brighter than the reference sample, that is, the position, color, number, etc. of the bright spot defect are determined (step 11). Then, based on the determination result, the quality of the liquid crystal panel is determined (step 12),
The process proceeds to step 5 on condition that there is no bright spot defect. The result of the determination in step 11 is written into the system together with the bar code information given to the liquid crystal panel 1 to be inspected.

Then, the liquid crystal panel 1 is determined to be good or bad based on the results of the determinations in steps 9 and 12, and the liquid crystal panel 1 is processed based on the results of the determination. The liquid crystal panel 1 is put into the inspection apparatus 10, and the above-described processing of steps 1 to 12 is performed on another liquid crystal panel. In this way, the plurality of liquid crystal panels 1 are inspected in order, and only the liquid crystal panels having the point-like defects below a certain level are sent to the next step.

As described above, according to the inspection method of the present invention, various inspection patterns for inspecting an abnormal pixel are displayed on the screen of the display device to be inspected. There is no need to arrange the drawn transparent sheet or filter on the screen, or to compare the sample brightness limit with the abnormal pixel (bright spot) on the screen for inspection. Therefore, according to the present invention, compared with the conventional inspection method,
There is no hassle of producing and managing transparent sheets, filters, and limit samples.

Further, according to the present invention, there is no need to position the transparent sheet or the filter with respect to the screen, and the position determination of the abnormal pixel does not become inaccurate due to the displacement of the sheet or the film. A certain area of a pixel can be reliably specified. In particular, the present invention is effective when inspecting a liquid crystal panel for a projector.

Further, according to the present invention, since the sample image which gives the reference of the brightness of the abnormal pixel is displayed through the screen to be inspected, even if the brightness of the light source is different, the brightness of the sample as well as the brightness of the abnormal pixel is changed. The brightness level of the bright spot can be reliably inspected without being affected by the light amount. In particular, when inspecting using another inspection apparatus, such as when inspecting a liquid crystal panel for a projector, the light source for inspection is different from the light source at the time of commercialization. Is valid.

The present invention is not limited to the above-described embodiment, but can be variously modified within the scope of the present invention. For example, in the above-described embodiment, the case where the point-like defect of the liquid crystal panel for the projector is inspected has been described.
The present invention can be applied to a PDP, an EL panel, and the like.

Further, in the present embodiment, the inspection pattern for specifying the position of the abnormal pixel is divided into a rectangular central region and a peripheral region. However, the division of the inspection pattern region depends on the type of inspection. It is changed as appropriate.

[0056]

As described above, according to the inspection method of the present invention, zone divisions and limit samples are displayed via the screen of the display device, so that point-like defects on the screen of the display device can be reliably and easily detected. Can be inspected.

[Brief description of the drawings]

FIG. 1 is a schematic diagram of an inspection device for implementing the present invention.

FIG. 2 is a view showing an example of a screen to be inspected for inspecting an abnormal pixel, which is displayed via a screen of the inspection apparatus in FIG. 1;

FIG. 3 is a view showing an example of a screen to be inspected for inspecting an abnormal pixel, which is displayed via a screen of the inspection apparatus in FIG. 1;

FIG. 4 is a view showing an example of a screen to be inspected for inspecting the brightness of an abnormal pixel, which is displayed via a screen of the inspection apparatus in FIG. 1;

FIG. 5 is a flowchart for explaining a method of inspecting a liquid crystal panel by the inspection device of FIG. 1;

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 ... Liquid crystal panel, 2 ... Screen, 4 ... Projection device, 6 ... Mounting port, 8 ... Operation part, 10 ... Inspection device.

──────────────────────────────────────────────────続 き Continued on the front page (51) Int.Cl. ⁷ Identification symbol FI Theme coat ゛ (Reference) H04N 17/04 H04N 17/04 Z 5G435 F-term (Reference) 2G086 EE10 2H088 EA12 FA11 MA20 5C006 AA22 AF35 AF44 BB11 EB01 EC11 FA41 5C061 BB01 BB02 BB09 CC05 EE21 5C080 AA10 BB05 CC03 DD15 EE30 JJ01 JJ02 JJ07 5G435 AA17 BB12 BB17 CC12 DD02 DD04 GG46 KK05 LL15

Claims (10)

[Claims] 1. A method of inspecting a display device for inspecting a position of an abnormal display pixel on a screen on which a plurality of display pixels are arranged, comprising the steps of: A method for inspecting a display device, wherein the display is performed via the screen and an area where the abnormal display pixel is located is specified. 2. An inspection method for a display device for inspecting a position of an abnormal display pixel displayed at a higher display luminance than another display pixel on a screen on which a plurality of display pixels are arranged, comprising: And a second inspection pattern in which the central area is displayed in white and the peripheral area is displayed in black.
An inspection method for a display device, wherein inspection patterns are alternately displayed via the screen, and which of the central area and the peripheral area has the abnormal display pixel is specified. 3. A method of inspecting a display device for inspecting a position of an abnormal display pixel displayed at a display luminance lower than other display pixels on a screen on which a plurality of display pixels capable of color display are arranged, the method comprising: A first inspection pattern in which a substantially central area is displayed in red and a peripheral area around the central area is displayed in green or blue, a second inspection pattern in which the central area is displayed in green and the peripheral area is displayed in blue or red, and A third inspection pattern in which the central area is displayed in blue and the peripheral area is displayed in red or green is sequentially displayed through the screen, and which of the central area and the peripheral area has the abnormal display pixel And a color of the abnormal display pixel is specified. 4. A first abnormal display pixel displayed at a higher display luminance than another display pixel on a screen on which a plurality of display pixels capable of color display are arranged, or a display luminance lower than the other display pixels. A method for inspecting a position of a second abnormal display pixel displayed in the first inspection pattern, wherein a substantially central area of the screen is displayed in black, and a peripheral area around the central area is displayed in white. A second inspection pattern in which a central area is displayed in white and the peripheral area is displayed in black; a third inspection pattern in which the central area is displayed in red and the peripheral area is displayed in green or blue; the central area is displayed in green; A fourth inspection pattern in which the peripheral region is displayed in blue or red, and a fifth inspection pattern in which the central region is displayed in blue and the peripheral region is displayed in red or green are sequentially displayed through the screen, With 2 abnormal display pixel to determine whether it is any region of the central region and the peripheral region, the inspection method of a display device and identifies the color of the second abnormality display pixels. 5. A display device inspection method for inspecting the brightness of an abnormal display pixel displayed at a higher display luminance than another display pixel on a screen on which a plurality of display pixels are arranged, the display luminance being a reference. Displays an inspection pattern having a sample image including regions that differ stepwise through the screen, and identifies a luminance defect by comparing the display luminance of each region of the sample image with the luminance of the abnormal display pixel. A method for inspecting a display device, comprising: 6. A method for inspecting the brightness of an abnormal display pixel which is displayed at a higher display luminance than another display pixel on a screen on which a plurality of display pixels are arranged, the display luminance being a reference. Alternately displays an inspection pattern having a sample image including regions that are stepwise different from each other and a screen to be inspected on which the abnormal display pixels are displayed, and displays the display luminance of a specific region of the sample image of the inspection pattern and the inspection target. By comparing the brightness of the abnormal display pixel on the screen with
A method for inspecting a display device, wherein a luminance defect is specified. 7. A method for inspecting a display device for inspecting abnormal display pixels on a screen on which a plurality of display pixels are arranged, wherein the first screen is divided into a plurality of areas having different display luminances.
The inspection pattern is displayed via the screen, and the area where the abnormal display pixel is located is specified. If the abnormal display pixel is displayed at a higher display luminance than the other display pixels, the reference display luminance is stepwise. A second inspection pattern having a sample image including a different area is displayed in place of the first inspection pattern, and the display luminance of each area of the sample image is compared with the luminance of the abnormal display pixel to reduce luminance defects. A method for inspecting a display device, comprising: 8. A method of inspecting a display device for inspecting an abnormal display pixel on a screen on which a plurality of display pixels are arranged, wherein the screen is divided into a plurality of areas having different display luminances.
The inspection pattern is displayed via the screen, and the area where the abnormal display pixel is located is specified. If the abnormal display pixel is displayed at a higher display luminance than the other display pixels, the reference display luminance is stepwise. A second inspection pattern having a sample image including a different region and a screen to be inspected on which the abnormal display pixels are displayed are displayed alternately in place of the first inspection pattern, and display luminance of a specific region of the sample image is displayed. A luminance defect by comparing the luminance of the abnormal display pixel with the luminance of the abnormal display pixel. 9. A method of inspecting a display device for inspecting an abnormal display pixel which is displayed at a higher display luminance than another display pixel on a screen on which a plurality of display pixels are arranged, wherein a substantially central area of the screen is black. A first inspection pattern that displays and displays the peripheral area around the central area in white; and a second inspection pattern that displays the central area in white and displays the peripheral area in black.
Inspection patterns are alternately displayed via the screen, and which of the central area and the peripheral area has an abnormal display pixel is specified, and a sample including a plurality of areas whose reference display brightness is different in a stepwise manner. A third inspection pattern having an image is displayed in place of the first or second inspection pattern, and a luminance defect is identified by comparing display luminance of a specific area of the sample image with luminance of the abnormal display pixel. A method for inspecting a display device, comprising: 10. A first abnormal display pixel which is displayed at a higher display luminance than another display pixel on a screen on which a plurality of display pixels are arranged, or is displayed at a lower display luminance than another display pixel. In the inspection method of a display device for inspecting a second abnormal display pixel, a first inspection pattern in which a substantially central area of the screen is displayed in black and a peripheral area around the central area is displayed in white, and the central area is displayed in white And the peripheral area is displayed in black.
Inspection patterns are sequentially displayed through the screen, and it is specified which of the central region and the peripheral region has the first abnormal display pixel. The central region is displayed in red and the peripheral region is green. Or a third inspection pattern in which blue is displayed, a fourth inspection pattern in which the central area is displayed in green and the peripheral area is displayed in blue or red, and a fourth inspection pattern in which the central area is displayed in blue and the peripheral area is displayed in red or green. The five inspection patterns are sequentially displayed through the screen, and in which of the central area and the peripheral area the second abnormal display pixel is located, the color of the second abnormal display pixel is identified. When the first abnormal display pixel is displayed, a sixth inspection pattern having a sample image including a plurality of regions whose reference display luminances are different in a stepwise manner and the first abnormal display pixel are displayed. The displayed screen to be inspected is alternately displayed in place of the first or second inspection pattern, and the display luminance of a specific area of the sample image is compared with the luminance of the first abnormal display pixel to thereby obtain luminance. A method for inspecting a display device, comprising identifying a defect.