JP2000306428A - Anisotropic conductive adhesive and conductive connection structure - Google Patents

Anisotropic conductive adhesive and conductive connection structure

Info

Publication number
JP2000306428A
JP2000306428A JP11111830A JP11183099A JP2000306428A JP 2000306428 A JP2000306428 A JP 2000306428A JP 11111830 A JP11111830 A JP 11111830A JP 11183099 A JP11183099 A JP 11183099A JP 2000306428 A JP2000306428 A JP 2000306428A
Authority
JP
Japan
Prior art keywords
conductive
connection
film
particles
connection terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11111830A
Other languages
Japanese (ja)
Inventor
Shinichi Kato
真一 加藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Casio Computer Co Ltd
Original Assignee
Casio Computer Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Casio Computer Co Ltd filed Critical Casio Computer Co Ltd
Priority to JP11111830A priority Critical patent/JP2000306428A/en
Publication of JP2000306428A publication Critical patent/JP2000306428A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73203Bump and layer connectors
    • H01L2224/73204Bump and layer connectors the bump connector being embedded into the layer connector

Abstract

PROBLEM TO BE SOLVED: To prevent conductive connection defects from occurring if the distance between connection terminals is increased to some extent by a temperature change, etc., in a use environment. SOLUTION: Conductive particles 17 in an anisotropic conductive adhesive 15 are each made up by forming an insulation film 17b made of silicon oxide, glass, resin, etc., on a surface of a core 17a or a relatively hard metal particle such as nickel particle with corners or projections, and forming a conductive film 17c of metal plating such as nickel plating on a surface of the insulation film 17b. If the distance between connection terminals 12, 14 facing each other is increased to some extent, the conductive films 17c stuck on and biting into the connection terminals 12, 14 can prevent conducting connection defects from occurring by being appropriately peeled off from the insulation films 17b or being appropriately peeled, together with the insulation films 17b, off from the cores 17a.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】この発明は異方性導電接着剤
及び導電接続構造に関する。
The present invention relates to an anisotropic conductive adhesive and a conductive connection structure.

【0002】[0002]

【従来の技術】例えば液晶表示装置においては、液晶表
示パネルを構成する一方のガラス基板上に液晶表示パネ
ル駆動用のLSI等からなる半導体チップを異方性導電
接着剤を介して搭載することがある。
2. Description of the Related Art In a liquid crystal display device, for example, a semiconductor chip composed of an LSI or the like for driving a liquid crystal display panel is mounted on one glass substrate constituting the liquid crystal display panel via an anisotropic conductive adhesive. is there.

【0003】図2(A)は従来のこのような液晶表示装
置の一例の一部の断面図を示したものである。液晶表示
パネルを構成する一方のガラス基板1の上面の所定の箇
所にはアルミニウムやアルミニウム合金等のアルミニウ
ム系金属からなる接続端子2が設けられている。液晶表
示パネル駆動用のLSI等からなる半導体チップ3の下
面の所定の箇所には金バンプからなる接続端子4が設け
られている。異方性導電接着剤5は、熱硬化性樹脂等か
らなる絶縁性接着剤6中に導電性粒子7を分散したもの
からなっている。この場合、導電性粒子7として、図2
(B)に示すように、角または突起を有するニッケル等
の比較的硬質の金属粒子からなるコア7aの表面に半田
等の比較的軟質の金属からなる被覆膜7bが形成された
ものを用いるとする(特開平5−12916号公報参
照)。
FIG. 2A is a partial cross-sectional view of an example of such a conventional liquid crystal display device. A connection terminal 2 made of an aluminum-based metal such as aluminum or an aluminum alloy is provided at a predetermined position on the upper surface of one glass substrate 1 constituting the liquid crystal display panel. A connection terminal 4 made of a gold bump is provided at a predetermined position on a lower surface of a semiconductor chip 3 made of an LSI or the like for driving a liquid crystal display panel. The anisotropic conductive adhesive 5 is formed by dispersing conductive particles 7 in an insulating adhesive 6 made of a thermosetting resin or the like. In this case, as the conductive particles 7, FIG.
As shown in (B), a core 7a made of relatively hard metal particles such as nickel having corners or projections and a coating film 7b made of a relatively soft metal such as solder formed on the surface is used. (See Japanese Patent Application Laid-Open No. 5-12916).

【0004】そして、ガラス基板1の接続端子2を含む
接続部分と半導体チップ3の接続端子4を含む接続部分
との間に異方性導電接着剤5が介在され、熱圧着される
と、異方性導電接着剤5の導電性粒子7の一部が相対向
する接続端子2、4に共に接触し、これにより相対向す
る接続端子2、4間が導電接続される。また、異方性導
電接着剤5の絶縁性接着剤6が硬化することにより、ガ
ラス基板1の接続端子2を含む接続部分と半導体チップ
3の接続端子4を含む接続部分とが接着される。かくし
て、ガラス基板1の上面に半導体チップ3が異方性導電
接着剤5を介して搭載される。
When an anisotropic conductive adhesive 5 is interposed between the connection portion including the connection terminal 2 of the glass substrate 1 and the connection portion including the connection terminal 4 of the semiconductor chip 3 and is thermally compressed, a difference occurs. A part of the conductive particles 7 of the isotropic conductive adhesive 5 comes into contact with the connection terminals 2 and 4 facing each other, whereby the connection terminals 2 and 4 facing each other are conductively connected. When the insulating adhesive 6 of the anisotropic conductive adhesive 5 is cured, the connection portion including the connection terminal 2 of the glass substrate 1 and the connection portion including the connection terminal 4 of the semiconductor chip 3 are bonded. Thus, the semiconductor chip 3 is mounted on the upper surface of the glass substrate 1 via the anisotropic conductive adhesive 5.

【0005】ところで、導電性粒子7のコア7aは角ま
たは突起を有するニッケル等の比較的硬質の金属粒子か
らなっているので、ガラス基板1のアルミニウム系金属
からなる接続端子2の表面に自然酸化膜(図示せず)が
形成されていても、熱圧着により変形した被覆膜7bか
ら露出されたコア7aの角または突起がこの自然酸化膜
を突き破って接続端子2の表面に食い込むことにより、
相対向する接続端子2、4間の導電接続が確保される。
Since the core 7a of the conductive particles 7 is made of relatively hard metal particles such as nickel having corners or protrusions, the surface of the connection terminal 2 made of aluminum-based metal on the glass substrate 1 is naturally oxidized. Even if a film (not shown) is formed, the corners or projections of the core 7a exposed from the coating film 7b deformed by the thermocompression bonding penetrate the natural oxide film and bite into the surface of the connection terminal 2, whereby
Conductive connection between the connection terminals 2 and 4 facing each other is ensured.

【0006】[0006]

【発明が解決しようとする課題】しかしながら、従来の
このような導電接続構造では、導電性粒子7として、角
または突起を有するニッケル等の比較的硬質の金属粒子
からなるコア7aの表面に半田等の比較的軟質の金属か
らなる被覆膜7bが形成されたものを用いているので、
熱圧着により変形した被覆膜7bが熱圧着後においても
その変形状態を維持することになる。このため、使用環
境の温度変化等により、相対向する接続端子2、4間の
間隔がある程度大きくなった場合には、導電性粒子7が
両接続端子2、4の少なくともいずれか一方から離れた
状態となり、導電接続不良が発生してしまうという問題
があった。この発明の課題は、相対向する接続端子間の
間隔がある程度大きくなっても、導電接続不良が発生し
ないようにすることである。
However, in such a conventional conductive connection structure, as the conductive particles 7, solder or the like is formed on the surface of a core 7a made of relatively hard metal particles such as nickel having corners or projections. Since a coating film 7b made of relatively soft metal is used,
The coating film 7b deformed by the thermocompression bonding maintains its deformed state even after the thermocompression bonding. For this reason, when the interval between the connection terminals 2 and 4 facing each other becomes large to some extent due to a temperature change of the use environment or the like, the conductive particles 7 are separated from at least one of the connection terminals 2 and 4. State, resulting in a problem that conductive connection failure occurs. SUMMARY OF THE INVENTION It is an object of the present invention to prevent a conductive connection failure from occurring even when the interval between connection terminals facing each other is increased to some extent.

【0007】[0007]

【課題を解決するための手段】請求項1記載の発明は、
絶縁性接着剤中に導電性粒子を分散してなる異方性導電
接着剤において、前記導電性粒子を、角または突起を有
する金属粒子からなるコアの表面に絶縁膜が形成され、
該絶縁膜の表面に導電膜が形成されたものによって構成
したものである。請求項3記載の発明は、一の電子部品
の接続端子を含む接続部分と他の電子部品の接続端子を
含む接続部分との間に絶縁性接着剤中に導電性粒子を分
散してなる異方性導電接着剤が介在され、前記一の電子
部品の接続端子と前記他の電子部品の接続端子とが前記
導電性粒子を介して導電接続された導電接続構造におい
て、前記導電性粒子を、角または突起を有する金属粒子
からなるコアの表面に絶縁膜が形成され、該絶縁膜の表
面に導電膜が形成されたものによって構成したものであ
る。この発明によれば、導電性粒子を、角または突起を
有する金属粒子からなるコアの表面に絶縁膜が形成さ
れ、この絶縁膜の表面に導電膜が形成されたものによっ
て構成しているので、コアの角または突起に対応する部
分における導電膜が接続端子の表面に食い込むことによ
り、相対向する接続端子間の導電接続が確保されること
になる。そして、相対向する接続端子間の間隔がある程
度大きくなった場合には、接続端子の表面に食い込んで
付着している導電膜が絶縁膜から適宜に剥がれあるいは
絶縁膜と共にコアから適宜に剥がれ、これにより導電接
続不良が発生しないようにすることができる。
According to the first aspect of the present invention,
In an anisotropic conductive adhesive obtained by dispersing conductive particles in an insulating adhesive, the conductive particles, an insulating film is formed on the surface of a core made of metal particles having corners or protrusions,
It is constituted by a conductive film formed on the surface of the insulating film. According to a third aspect of the present invention, a conductive particle is dispersed in an insulating adhesive between a connection portion including a connection terminal of one electronic component and a connection portion including a connection terminal of another electronic component. In a conductive connection structure in which an isotropic conductive adhesive is interposed and the connection terminal of the one electronic component and the connection terminal of the other electronic component are conductively connected via the conductive particles, An insulating film is formed on a surface of a core made of metal particles having corners or projections, and a conductive film is formed on the surface of the insulating film. According to the present invention, the conductive particles are formed by forming an insulating film on the surface of a core made of metal particles having corners or protrusions, and forming a conductive film on the surface of the insulating film. When the conductive film in the portion corresponding to the corner or the protrusion of the core bites into the surface of the connection terminal, the conductive connection between the connection terminals facing each other is secured. When the distance between the connection terminals facing each other becomes large to some extent, the conductive film that bites into and adheres to the surfaces of the connection terminals is appropriately peeled off from the insulating film or from the core together with the insulating film. Accordingly, it is possible to prevent a conductive connection failure from occurring.

【0008】[0008]

【発明の実施の形態】図1(A)はこの発明の一実施形
態における異方性導電接着剤を用いて、ガラス基板の接
続端子と半導体チップの接続端子とを導電接続した状態
の断面図を示し、図1(B)はその一部の拡大断面図を
示したものである。ガラス基板11の上面の所定の箇所
にはアルミニウムやアルミニウム合金等のアルミニウム
系金属からなる接続端子12が設けられている。半導体
チップ13の下面の所定の箇所には金バンプからなる接
続端子14が設けられている。
DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1A is a sectional view showing a state in which a connection terminal of a glass substrate and a connection terminal of a semiconductor chip are conductively connected using an anisotropic conductive adhesive according to an embodiment of the present invention. FIG. 1B is an enlarged cross-sectional view of a part of FIG. A connection terminal 12 made of an aluminum-based metal such as aluminum or an aluminum alloy is provided at a predetermined location on the upper surface of the glass substrate 11. At predetermined positions on the lower surface of the semiconductor chip 13, connection terminals 14 made of gold bumps are provided.

【0009】異方性導電接着剤15は、熱硬化性樹脂等
からなる絶縁性接着剤16中に導電性粒子17を分散し
たものからなっている。この場合、導電性粒子17は、
角または突起を有する金属粒子からなるコア17aの表
面に酸化シリコン、ガラス、樹脂等からなる絶縁膜17
bが形成され、絶縁膜17bの表面に金属メッキからな
る導電膜17cが形成されたものからなっている。コア
17aの材料は、硬さが接続端子12、14よりも硬い
金属(合金を含む)であり、具体的にはニッケル、クロ
ム、鉄、ステンレス、銅等であり、好ましくは表面突起
性を有するニッケルである。導電膜17cの材料は、硬
さが接続端子12、14とほぼ同じかそれよりも硬い金
属(合金を含む)であり、具体的にはアルミニウム系金
属、金、銀、ニッケル、クロム、銅等であり、好ましく
はコア17aの材料と同じニッケルである。コア17a
の平均直径は3〜5μm程度であり、絶縁膜17bの厚
さは数千Å程度であり、導電膜17cの厚さは数千Å程
度である。
The anisotropic conductive adhesive 15 is formed by dispersing conductive particles 17 in an insulating adhesive 16 made of a thermosetting resin or the like. In this case, the conductive particles 17
An insulating film 17 made of silicon oxide, glass, resin, or the like is formed on the surface of a core 17a made of metal particles having corners or projections.
b, and a conductive film 17c made of metal plating is formed on the surface of the insulating film 17b. The material of the core 17a is a metal (including an alloy) that is harder than the connection terminals 12 and 14, specifically, nickel, chromium, iron, stainless steel, copper, or the like, and preferably has a surface projection property. Nickel. The material of the conductive film 17c is a metal (including an alloy) having a hardness substantially equal to or higher than that of the connection terminals 12 and 14, specifically, an aluminum-based metal, gold, silver, nickel, chromium, copper, or the like. , Preferably nickel, which is the same as the material of the core 17a. Core 17a
Has an average diameter of about 3 to 5 μm, the thickness of the insulating film 17b is about several thousand Å, and the thickness of the conductive film 17c is about several thousand Å.

【0010】そして、ガラス基板11の接続端子12を
含む接続部分と半導体チップ13の接続端1子4を含む
接続部分との間に異方性導電接着剤15が介在され、熱
圧着されると、異方性導電接着剤15の導電性粒子17
の一部が相対向する接続端子12、14に共に接触し、
これにより相対向する接続端子12、14間が導電接続
される。また、異方性導電接着剤15の絶縁性接着剤1
6が硬化することにより、ガラス基板11の接続端子1
2を含む接続部分と半導体チップ13の接続端子14を
含む接続部分とが接着される。かくして、ガラス基板1
1の上面に半導体チップ13が異方性導電接着剤15を
介して搭載される。
Then, an anisotropic conductive adhesive 15 is interposed between the connection portion including the connection terminal 12 of the glass substrate 11 and the connection portion including the connection terminal 1 of the semiconductor chip 13, and is thermocompression-bonded. , Conductive particles 17 of anisotropic conductive adhesive 15
Are in contact with the connection terminals 12 and 14 facing each other,
Thus, the connection terminals 12 and 14 facing each other are conductively connected. The insulating adhesive 1 of the anisotropic conductive adhesive 15
6 is cured, the connection terminals 1 of the glass substrate 11 are hardened.
2 and the connection portion including the connection terminal 14 of the semiconductor chip 13 are bonded. Thus, the glass substrate 1
A semiconductor chip 13 is mounted on an upper surface of the semiconductor chip 1 via an anisotropic conductive adhesive 15.

【0011】ところで、導電性粒子17のコア17aは
接続端子12、14よりも硬質で角または突起を有する
金属粒子からなり、導電膜17cは硬さが接続端子1
2、14とほぼ同じかそれよりも硬い金属メッキ膜から
なっているので、ガラス基板11のアルミニウム系金属
からなる接続端子12の表面に自然酸化膜12aが形成
されていても、コア17aの角または突起に対応する部
分における導電膜17cがこの自然酸化膜12aを突き
破って接続端子12の表面に食い込み、またコア17a
の角または突起に対応する部分における導電膜17cが
半導体チップ13の金バンプからなる接続端子14の表
面に食い込み、これにより相対向する接続端子12、1
4間の導電接続が確保される。そして、使用環境の温度
変化等により、相対向する接続端子12、14間の間隔
がある程度大きくなった場合には、図示していないが、
接続端子12、14の表面に食い込んで付着している導
電膜17cの少なくともいずれか一方側が絶縁膜17b
から適宜に剥がれあるいは絶縁膜17bと共にコア17
aから適宜に剥がれ、これにより導電接続不良が発生し
ないようにすることができ、ひいては導電接続の信頼性
を向上することができる。
The core 17a of the conductive particles 17 is made of metal particles which are harder than the connection terminals 12 and 14 and have corners or projections.
Since a metal plating film substantially the same as or harder than the metal plating films 2 and 14 is used, even if a natural oxide film 12a is formed on the surface of the connection terminal 12 made of an aluminum-based metal on the glass substrate 11, the corner of the core 17a is formed. Alternatively, the conductive film 17c in a portion corresponding to the protrusion penetrates the natural oxide film 12a and cuts into the surface of the connection terminal 12, and the core 17a
The conductive film 17c at a portion corresponding to the corner or protrusion of the semiconductor chip 13 cuts into the surface of the connection terminal 14 formed of the gold bump of the semiconductor chip 13, thereby forming the connection terminal 12, 1
A conductive connection between the four is ensured. Although not illustrated, when the distance between the connection terminals 12 and 14 facing each other is increased to some extent due to a temperature change of the use environment or the like,
At least one side of the conductive film 17c biting and adhering to the surfaces of the connection terminals 12 and 14 is an insulating film 17b.
From the core 17 together with the insulating film 17b.
a can be appropriately peeled off, thereby preventing a conductive connection failure from occurring, and thereby improving the reliability of the conductive connection.

【0012】なお、上記実施形態では、ガラス基板11
に形成されたアルミニウム系金属からなる接続端子12
と半導体チップに形成された金バンプからなる接続端子
14とを導電接続する場合について説明したが、これに
限定されるものではない。例えば、ガラス基板に形成さ
れたアルミニウム系金属やITO等からなる接続端子と
フレキシブル配線基板に形成された銅等からなる接続端
子とを導電接続するようにしてもよい。また、フレキシ
ブル配線基板に形成された銅等からなる接続端子とCS
P(chip size package)等と呼ばれる半導体装置に形成
された金等の柱状電極からなる接続端子とを導電接続す
るようにしてもよい。
In the above embodiment, the glass substrate 11
Terminal 12 made of aluminum-based metal formed on
A case has been described in which conductive connection is made between the semiconductor device and the connection terminal 14 formed of a gold bump formed on a semiconductor chip. However, the present invention is not limited to this. For example, a connection terminal made of an aluminum-based metal or ITO formed on a glass substrate and a connection terminal made of copper or the like formed on a flexible wiring substrate may be conductively connected. In addition, a connection terminal made of copper or the like formed on a flexible wiring board and CS
A connection terminal formed of a columnar electrode made of gold or the like formed on a semiconductor device and called a P (chip size package) or the like may be conductively connected.

【0013】[0013]

【発明の効果】以上説明したように、この発明によれ
ば、導電性粒子を、角または突起を有する金属粒子から
なるコアの表面に絶縁膜が形成され、この絶縁膜の表面
に導電膜が形成されたものによって構成しているので、
相対向する接続端子間の間隔がある程度大きくなった場
合には、接続端子の表面に食い込んで付着している導電
膜が絶縁膜から適宜に剥がれあるいは絶縁膜と共にコア
から適宜に剥がれ、これにより導電接続不良が発生しな
いようにすることができ、ひいては導電接続の信頼性を
向上することができる。
As described above, according to the present invention, the conductive film is formed on the surface of the core made of metal particles having corners or projections, and the conductive film is formed on the surface of the insulating film. Because it is composed by what is formed,
When the distance between the connection terminals facing each other becomes large to some extent, the conductive film that bites into and adheres to the surface of the connection terminal is appropriately peeled off from the insulating film or from the core together with the insulating film. The connection failure can be prevented from occurring, and the reliability of the conductive connection can be improved.

【図面の簡単な説明】[Brief description of the drawings]

【図1】(A)はこの発明の一実施形態における異方性
導電接着剤を用いて、ガラス基板の接続端子と半導体チ
ップの接続端子とを導電接続した状態の断面図、(B)
はその一部の拡大断面図。
FIG. 1A is a cross-sectional view of a state in which a connection terminal of a glass substrate and a connection terminal of a semiconductor chip are conductively connected using an anisotropic conductive adhesive according to one embodiment of the present invention;
Is an enlarged sectional view of a part thereof.

【図2】(A)は従来の異方性導電接着剤を用いて、ガ
ラス基板の接続端子と半導体チップの接続端子とを導電
接続した状態の断面図、(B)は異方性導電接着剤の導
電性粒子の拡大断面図。
FIG. 2A is a cross-sectional view showing a state in which a connection terminal of a glass substrate and a connection terminal of a semiconductor chip are conductively connected using a conventional anisotropic conductive adhesive, and FIG. FIG. 3 is an enlarged cross-sectional view of the conductive particles of the agent.

【符号の説明】[Explanation of symbols]

11 ガラス基板 12 接続端子 13 半導体チップ 14 接続端子 15 異方性導電接着剤 16 絶縁性接着剤 17 導電性粒子 17a コア 17b 絶縁膜 17c 導電膜 Reference Signs List 11 glass substrate 12 connection terminal 13 semiconductor chip 14 connection terminal 15 anisotropic conductive adhesive 16 insulating adhesive 17 conductive particles 17a core 17b insulating film 17c conductive film

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) H01B 5/16 H01B 5/16 H01L 21/60 311 H01L 21/60 311S H01R 11/01 H01R 11/01 H ──────────────────────────────────────────────────続 き Continued on the front page (51) Int.Cl. 7 Identification symbol FI Theme coat ゛ (Reference) H01B 5/16 H01B 5/16 H01L 21/60 311 H01L 21/60 311S H01R 11/01 H01R 11/01 H

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 絶縁性接着剤中に導電性粒子を分散して
なる異方性導電接着剤において、前記導電性粒子は、角
または突起を有する金属粒子からなるコアの表面に絶縁
膜が形成され、該絶縁膜の表面に導電膜が形成されたも
のからなることを特徴とする異方性導電接着剤。
1. An anisotropic conductive adhesive in which conductive particles are dispersed in an insulating adhesive, wherein the conductive particles form an insulating film on a surface of a core made of metal particles having corners or protrusions. A conductive film formed on the surface of the insulating film.
【請求項2】 請求項1記載の発明において、前記コア
はニッケル粒子からなり、前記導電膜はニッケルメッキ
膜からなることを特徴とする異方性導電接着剤。
2. The anisotropic conductive adhesive according to claim 1, wherein the core is made of nickel particles, and the conductive film is made of a nickel plating film.
【請求項3】 一の電子部品の接続端子を含む接続部分
と他の電子部品の接続端子を含む接続部分との間に絶縁
性接着剤中に導電性粒子を分散してなる異方性導電接着
剤が介在され、前記一の電子部品の接続端子と前記他の
電子部品の接続端子とが前記導電性粒子を介して導電接
続された導電接続構造において、前記導電性粒子は、角
または突起を有する金属粒子からなるコアの表面に絶縁
膜が形成され、該絶縁膜の表面に導電膜が形成されたも
のからなることを特徴とする導電接続構造。
3. An anisotropic conductive material in which conductive particles are dispersed in an insulating adhesive between a connection portion including a connection terminal of one electronic component and a connection portion including a connection terminal of another electronic component. In a conductive connection structure in which an adhesive is interposed and a connection terminal of the one electronic component and a connection terminal of the other electronic component are conductively connected via the conductive particles, the conductive particles may have corners or protrusions. A conductive connection structure comprising an insulating film formed on a surface of a core made of metal particles having a conductive film formed on the surface of the insulating film.
【請求項4】 請求項3記載の発明において、前記コア
はニッケル粒子からなり、前記導電膜はニッケルメッキ
膜からなることを特徴とする導電接続構造。
4. The conductive connection structure according to claim 3, wherein the core is made of nickel particles, and the conductive film is made of a nickel plating film.
【請求項5】 請求項4記載の発明において、前記一の
電子部品の接続端子はアルミニウム系金属からなり、前
記他の電子部品の接続端子は金バンプからなることを特
徴とする導電接続構造。
5. The conductive connection structure according to claim 4, wherein the connection terminals of the one electronic component are made of an aluminum-based metal, and the connection terminals of the other electronic component are made of gold bumps.
JP11111830A 1999-04-20 1999-04-20 Anisotropic conductive adhesive and conductive connection structure Pending JP2000306428A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11111830A JP2000306428A (en) 1999-04-20 1999-04-20 Anisotropic conductive adhesive and conductive connection structure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11111830A JP2000306428A (en) 1999-04-20 1999-04-20 Anisotropic conductive adhesive and conductive connection structure

Publications (1)

Publication Number Publication Date
JP2000306428A true JP2000306428A (en) 2000-11-02

Family

ID=14571247

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11111830A Pending JP2000306428A (en) 1999-04-20 1999-04-20 Anisotropic conductive adhesive and conductive connection structure

Country Status (1)

Country Link
JP (1) JP2000306428A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003081606A1 (en) * 2002-03-25 2003-10-02 Sony Chemicals Corporation Conductive particle and adhesive agent
JP2010073681A (en) * 2009-07-16 2010-04-02 Sony Chemical & Information Device Corp Conductive particles, anisotropic conductive film, assembly, and connection method
JP2015005503A (en) * 2013-05-22 2015-01-08 積水化学工業株式会社 Connection structure
JP2015028920A (en) * 2013-06-26 2015-02-12 積水化学工業株式会社 Connection structure
JP2017111883A (en) * 2015-12-14 2017-06-22 日立金属株式会社 Crimp terminal and wire with terminal
US9812625B2 (en) 2014-02-18 2017-11-07 Nichia Corporation Light-emitting device having resin member with conductive particles
US10312604B2 (en) 2017-06-07 2019-06-04 Hitachi Metals, Ltd. Crimping terminal and electric wire with crimping terminal

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003081606A1 (en) * 2002-03-25 2003-10-02 Sony Chemicals Corporation Conductive particle and adhesive agent
US7413686B2 (en) 2002-03-25 2008-08-19 Sony Chemicals Corporation Conductive particle and adhesive agent
JP2010073681A (en) * 2009-07-16 2010-04-02 Sony Chemical & Information Device Corp Conductive particles, anisotropic conductive film, assembly, and connection method
JP2015005503A (en) * 2013-05-22 2015-01-08 積水化学工業株式会社 Connection structure
JP2015028920A (en) * 2013-06-26 2015-02-12 積水化学工業株式会社 Connection structure
US9812625B2 (en) 2014-02-18 2017-11-07 Nichia Corporation Light-emitting device having resin member with conductive particles
JP2017111883A (en) * 2015-12-14 2017-06-22 日立金属株式会社 Crimp terminal and wire with terminal
US10312604B2 (en) 2017-06-07 2019-06-04 Hitachi Metals, Ltd. Crimping terminal and electric wire with crimping terminal

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