JP2000275017A - Judgment method and judging apparatus for distortion amount - Google Patents

Judgment method and judging apparatus for distortion amount

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Publication number
JP2000275017A
JP2000275017A JP11085778A JP8577899A JP2000275017A JP 2000275017 A JP2000275017 A JP 2000275017A JP 11085778 A JP11085778 A JP 11085778A JP 8577899 A JP8577899 A JP 8577899A JP 2000275017 A JP2000275017 A JP 2000275017A
Authority
JP
Japan
Prior art keywords
distortion
amount
shading
data
distortion amount
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11085778A
Other languages
Japanese (ja)
Inventor
Sadahiko Kimura
定彦 木村
Shiro Hamada
史郎 浜田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Heavy Industries Ltd
Original Assignee
Sumitomo Heavy Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Heavy Industries Ltd filed Critical Sumitomo Heavy Industries Ltd
Priority to JP11085778A priority Critical patent/JP2000275017A/en
Publication of JP2000275017A publication Critical patent/JP2000275017A/en
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Laser Beam Processing (AREA)

Abstract

PROBLEM TO BE SOLVED: To obtain an inline type judgment method for a distortion amount whereby the distortion amount can be judged at an equal station to a station for laser processing. SOLUTION: The method is applied to laser processing whereby a laser light is irradiated to a work to apply a distortion. An irradiation pattern of the laser light at the work is picked up by a CCD camera 32 on an equal axis to the laser light. The obtained image is processed by an image-processing apparatus 35 to obtain data related to light and dark. A distortion amount is judged with the use of the obtained data with reference to a table indicating a preliminarily obtained correspondence of the distortion amount and data related to light and dark.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、レーザ光をワーク
に照射して歪みを与えるレーザ加工に適用されてワーク
の歪量を判別するための歪量判別方法及び判別装置に関
する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and apparatus for determining the amount of distortion of a workpiece, which is applied to laser processing for applying distortion by irradiating a workpiece with laser light.

【0002】[0002]

【従来の技術】最近、ワークにレーザ光を照射して歪み
を与えるレーザ加工装置が提案されている(例えば、特
願平10−103920号)。このレーザ加工装置は、
板状のワークの一方の主面にレーザ光を照射することに
よって被照射部を局所加熱すると共に、該局所加熱後の
急冷に伴う引張(収縮)応力を被照射部に残留させ、被
照射部を含む側の主面が凹状になるようにワークを変形
させるものである。
2. Description of the Related Art Recently, a laser processing apparatus for irradiating a workpiece with a laser beam to apply distortion has been proposed (for example, Japanese Patent Application No. 10-103920). This laser processing device
The irradiated portion is locally heated by irradiating one main surface of the plate-shaped work with the laser beam, and the tensile (shrinkage) stress accompanying the rapid cooling after the local heating is left in the irradiated portion, and The workpiece is deformed so that the main surface on the side including the concave shape becomes concave.

【0003】[0003]

【発明が解決しようとする課題】ところで、この主のレ
ーザ加工では、ワーク表面にレーザ光を照射して歪みを
発生させた場合、その歪量を判別する必要がある。この
場合、加工した後、ワークを別場所に搬送して歪量を判
別したのでは、歪量判別のための工程、場所が増えるこ
とになり好ましくない。
In the main laser processing, when a distortion is generated by irradiating the surface of the work with a laser beam, it is necessary to determine the amount of the distortion. In this case, it is not preferable that the workpiece is transported to another location after processing and the amount of distortion is determined because the number of steps and locations for determining the amount of distortion increases.

【0004】そこで、本発明の課題は、レーザ加工と同
じステーションにおいて、歪量の判別が行えるインライ
ンタイプの歪量判別方法を提供することにある。
An object of the present invention is to provide an in-line type strain amount discriminating method capable of discriminating a strain amount at the same station as laser processing.

【0005】本発明の他の課題は、上記の歪量判別方法
に適した歪量判別装置を提供することにある。
Another object of the present invention is to provide a distortion amount discriminating apparatus suitable for the above-described distortion amount discriminating method.

【0006】[0006]

【課題を解決するための手段】本発明による歪量判別方
法は、レーザ光をワークに照射して歪みを与えるレーザ
加工に適用されるもので、前記ワークにおけるレーザ光
の照射パターンを該レーザ光と同軸上において撮像系で
撮像し、得られた画像を画像処理して濃淡に関するデー
タを取得し、取得したデータを用いて、あらかじめ求め
られている歪量と濃淡のデータとの対応関係を示すテー
ブルを参照して歪量を判別することを特徴とする。
The method for determining the amount of distortion according to the present invention is applied to laser processing for applying a laser beam to a workpiece to apply distortion, and the irradiation pattern of the laser beam on the workpiece is determined by the laser beam. An image is taken by an imaging system on the same axis as the image, and the obtained image is subjected to image processing to obtain data relating to shading, and the acquired data is used to indicate a correspondence relationship between a previously obtained distortion amount and shading data. The distortion amount is determined with reference to a table.

【0007】本発明による歪量判別装置は、レーザ光を
ワークに照射して歪みを与えるレーザ加工に適用され
て、インラインで前記ワークの歪量を判別する装置であ
り、前記ワークにおけるレーザ光の照射パターンを該レ
ーザ光と同軸上において撮像する撮像系と、該撮像系で
得られた画像を画像処理して濃淡に関するデータを取得
する画像処理装置と、取得したデータを用いて、あらか
じめ求められている歪量と濃淡のデータとの対応関係を
示すテーブルを参照して歪量を判別する判別手段とを備
えることを特徴とする。
[0007] A distortion amount determining apparatus according to the present invention is applied to laser processing for applying distortion by irradiating a laser beam to a work, and is an apparatus for determining the amount of distortion of the work in-line. An imaging system that captures an irradiation pattern coaxially with the laser light, an image processing device that performs image processing on an image obtained by the imaging system to obtain data regarding shading, and is obtained in advance using the obtained data. A discriminating means for discriminating the amount of distortion by referring to a table indicating a correspondence relationship between the amount of distortion and data of light and shade.

【0008】なお、前記判別手段は、前記画像処理装置
からの濃淡を示すデータを受け、照射パターンの濃淡の
レベル分けを行う濃淡レベル判別手段と、あらかじめ実
射により計測された歪量と照射パターンの濃淡のレベル
との対応関係を示すテーブルを有する比較手段とから成
る。
[0008] The discriminating means receives the data indicating the shading from the image processing apparatus, and performs shading level discrimination of the shading of the irradiation pattern. And a comparing means having a table showing a correspondence relationship between the gray level and the gray level.

【0009】また、前記テーブルに、歪量とこれに対応
する濃淡のデータの上限値及び下限値との対応関係が記
憶することにより、前記比較手段は、前記取得された濃
淡のデータが前記上限値及び下限値の範囲内に入ってい
るかどうかで歪量の良否判別を行うことができる。
The table stores the correspondence between the amount of distortion and the upper and lower limit values of the grayscale data corresponding to the distortion amount, so that the comparing means can determine whether the acquired grayscale data is the upper limit or lower limit. Whether the distortion amount is good or not can be determined based on whether the value falls within the range of the value and the lower limit value.

【0010】[0010]

【発明の実施の形態】以下に、本発明の実施の形態につ
いて説明する。図2にYAGレーザ光をセラミックスに
照射した場合の照射パターン(ここでは、矩形状)を含
む表面写真を示し、図3にYAGレーザ光のエネルギ強
度と歪量の関係を示す。勿論、YAGレーザ光のエネル
ギ強度と歪量の関係は、ワークの材料が異なれば変化す
るが、照射したエネルギを増加させるに従い、照射パタ
ーンがクリアになる。同様に、照射エネルギが大きくな
るに従い、歪量は大きくなる。すなわち、材料が変わっ
ても、照射パターンが鮮明になるほど、歪量は大きくな
る。この関係を利用して、本形態では照射パターンの画
像を用いて、歪量を判別する点に特徴を有する。
Embodiments of the present invention will be described below. FIG. 2 shows a surface photograph including an irradiation pattern (here, a rectangular shape) when the ceramic is irradiated with YAG laser light, and FIG. 3 shows the relationship between the energy intensity of YAG laser light and the amount of distortion. Of course, the relationship between the energy intensity and the amount of strain of the YAG laser beam changes depending on the material of the work, but the irradiation pattern becomes clearer as the irradiation energy increases. Similarly, the distortion amount increases as the irradiation energy increases. That is, even if the material is changed, the amount of distortion increases as the irradiation pattern becomes clearer. Using this relationship, the present embodiment is characterized in that the distortion amount is determined using the image of the irradiation pattern.

【0011】図1にレーザ加工装置と歪量判別装置の概
略を示す。YAGレーザ装置10から出射されたレーザ
光はYAG全反射ミラー11により90度折り返され、
加工レンズ12を通してワーク(例えば、セラミック
ス)13に照射される。この光学系により、歪加工が行
われる。
FIG. 1 schematically shows a laser processing apparatus and a distortion discriminating apparatus. The laser light emitted from the YAG laser device 10 is turned 90 degrees by the YAG total reflection mirror 11,
The work (for example, ceramics) 13 is irradiated through the processing lens 12. This optical system performs distortion processing.

【0012】歪量判別装置は、照明系20と画像処理系
30から成る。照明系20は照明用ファイバ21から出
た光をレンズ22、ハーフミラー23及び加工レンズ1
2を介して、ワーク表面に照射する。なお、YAG全反
射ミラー11は、YAGレーザ光のみを全反射し、可視
光は透過する。
The distortion amount discriminating apparatus includes an illumination system 20 and an image processing system 30. The illumination system 20 converts the light emitted from the illumination fiber 21 into a lens 22, a half mirror 23, and the processed lens 1.
Irradiation is performed on the work surface through the surface 2. The YAG total reflection mirror 11 totally reflects only the YAG laser beam and transmits visible light.

【0013】画像処理系30は、ワーク表面状態を加工
レンズ12及びYAG全反射ミラー11、ハーフミラー
23、レンズ31を介して、CCDカメラ32で取り込
む。この場合にも、YAG全反射ミラー11は、可視光
は透過する。また、ハーフミラー23は可視光のハーフ
ミラーであるため、50%は透過する。CCDカメラ3
2にて取り込まれた画像信号はアンプ33を介して増幅
され、モニタ34、画像処理装置35に送られる。
The image processing system 30 takes in the state of the workpiece surface with the CCD camera 32 via the processing lens 12, the YAG total reflection mirror 11, the half mirror 23, and the lens 31. Also in this case, the YAG total reflection mirror 11 transmits visible light. Since the half mirror 23 is a half mirror of visible light, 50% of the light is transmitted. CCD camera 3
The image signal captured in 2 is amplified through an amplifier 33 and sent to a monitor 34 and an image processing device 35.

【0014】モニタ34では、レーザ光の照射パターン
を含むワーク表面の画像を表示する。一方、画像処理装
置35は、画像信号を処理し、照射パターンにおける濃
淡を示すデータを出力する。濃淡を示すデータとして
は、例えば照射パターン全域における輝度値のトータル
値、あるいは照射パターン全域における輝度値の平均値
が用いられる。
The monitor 34 displays an image of the work surface including the laser beam irradiation pattern. On the other hand, the image processing device 35 processes the image signal and outputs data indicating shading in the irradiation pattern. As the data indicating the shading, for example, a total value of luminance values in the entire irradiation pattern or an average value of luminance values in the entire irradiation pattern is used.

【0015】濃淡レベル判別装置36は、画像処理装置
35から濃淡を示すデータを受け、照射パターンの濃淡
のレベル分けを行う。比較器37には、あらかじめ実射
により計測された歪量と照射パターンの濃淡のレベルと
の対応関係を示すテーブルが記憶されている。特に、濃
淡のレベルについては歪量毎にその上限値と下限値が記
憶されている。あらかじめワーク13に与えられるべき
歪量はわかっているので、比較器37では、その歪量に
対応する濃淡のレベルの上限値及び下限値を使用して、
濃淡レベル判別装置36において分類された濃淡のレベ
ルがこの上限値と下限値の範囲内に入っているかどうか
を比較し、入っていれば良品と判別し、外れていれば不
良品と判別する。
The gray level discriminating unit 36 receives the data indicating the gray level from the image processing unit 35, and classifies the levels of the irradiation pattern. The comparator 37 stores a table indicating the correspondence between the amount of distortion measured by actual shooting and the density level of the irradiation pattern in advance. In particular, the upper and lower limits of the gray level are stored for each distortion amount. Since the amount of distortion to be applied to the work 13 is known in advance, the comparator 37 uses the upper limit value and the lower limit value of the gray level corresponding to the distortion amount,
It is compared whether or not the shade level classified by the shade level discriminating device 36 falls within the range between the upper limit value and the lower limit value, and if so, it is judged as a good product, and if not, it is judged as a defective product.

【0016】なお、画像処理装置35は、YAGレーザ
装置10からレーザ照射完了信号を受けると画像処理を
開始するように構成されていることにより、ワーク毎の
良否判別が行われる。また、前に述べたように、歪量と
照射パターンの濃淡のレベルとの対応関係はワークの材
料に応じて変わるので、比較器37においては材料の種
別に応じて歪量と照射パターンの濃淡のレベルとの対応
関係を示すテーブルが用意されていることは言うまでも
無い。
The image processing device 35 is configured to start image processing upon receiving a laser irradiation completion signal from the YAG laser device 10, so that the quality of each work is determined. Further, as described above, the correspondence between the amount of distortion and the density level of the irradiation pattern changes according to the material of the work, and therefore, the comparator 37 determines the amount of distortion and the density of the irradiation pattern in accordance with the type of the material. It is needless to say that a table indicating the correspondence relationship with the level is prepared.

【0017】上記の説明では、レーザ加工においてYA
Gレーザ装置を使用する場合について述べているが、本
発明はレーザ加工装置のタイプは歪を与えるものであれ
ばどのようなレーザ発振器を使用したレーザ加工装置で
も適用可能である。
In the above description, YA is used in laser processing.
Although the case where a G laser device is used has been described, the present invention is applicable to a laser processing device using any laser oscillator as long as the type of the laser processing device imparts distortion.

【0018】[0018]

【発明の効果】本発明によれば、レーザ加工と同じステ
ーションにおいて歪量の判別を行えるインラインタイプ
としたことにより、歪量判別の工程及び場所の削減がで
きると共に、インラインでのリアルタイムの管理が可能
になる。
According to the present invention, since the strain amount can be determined at the same station as the laser processing by using an in-line type, the number of steps and locations for determining the strain amount can be reduced, and real-time in-line management can be performed. Will be possible.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明が適用されるレーザ加工装置と本発明に
よる歪量判別装置の概略構成を示した図である。
FIG. 1 is a diagram showing a schematic configuration of a laser processing apparatus to which the present invention is applied and a distortion amount determining apparatus according to the present invention.

【図2】YAGレーザ光をセラミックスに照射した場合
の照射パターン表面顕微鏡写真を示した図である。
FIG. 2 is a diagram showing an irradiation pattern surface micrograph when a ceramic is irradiated with a YAG laser beam.

【図3】YAGレーザ光のエネルギ強度と歪量の関係を
示した図である。
FIG. 3 is a diagram showing a relationship between the energy intensity of YAG laser light and the amount of distortion.

【符号の説明】[Explanation of symbols]

12 加工レンズ 20 照明系 21 照明用光ファイバ 22、31 レンズ 23 ハーフミラー 30 画像処理系 32 CCDカメラ 33 アンプ 34 モニタ 35 画像処理装置 36 濃淡レベル判別装置 37 比較器 DESCRIPTION OF SYMBOLS 12 Processing lens 20 Illumination system 21 Illumination optical fiber 22, 31 Lens 23 Half mirror 30 Image processing system 32 CCD camera 33 Amplifier 34 Monitor 35 Image processing device 36 Shade level discrimination device 37 Comparator

フロントページの続き Fターム(参考) 2F065 AA65 BB01 CC00 DD06 FF42 HH13 JJ03 JJ09 JJ26 LL00 LL02 LL04 LL20 QQ03 QQ23 QQ24 QQ25 QQ27 QQ42 RR09 SS02 SS13 4E068 AH00 CA17 CB09 CC00 CC02Continued on front page F term (reference) 2F065 AA65 BB01 CC00 DD06 FF42 HH13 JJ03 JJ09 JJ26 LL00 LL02 LL04 LL20 QQ03 QQ23 QQ24 QQ25 QQ27 QQ42 RR09 SS02 SS13 4E068 AH00 CA17 CB09 CC00 CC02

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 レーザ光をワークに照射して歪みを与え
るレーザ加工に適用され、前記ワークにおけるレーザ光
の照射パターンを該レーザ光と同軸上において撮像系で
撮像し、得られた画像を画像処理して濃淡に関するデー
タを取得し、取得したデータを用いて、あらかじめ求め
られている歪量と濃淡のデータとの対応関係を示すテー
ブルを参照して歪量を判別することを特徴とする歪量判
別方法。
The present invention is applied to laser processing in which a workpiece is irradiated with laser light to give a distortion, and an irradiation pattern of the laser light on the workpiece is imaged coaxially with the laser light by an imaging system. Processing, obtaining data relating to shading, and using the obtained data, referring to a table indicating a correspondence relationship between the previously calculated distortion amount and shading data to determine the distortion amount. Amount determination method.
【請求項2】 請求項1記載の歪量判別方法において、
前記テーブルには、歪量とこれに対応する濃淡のデータ
の上限値及び下限値との対応関係が記憶されており、前
記取得された濃淡のデータが前記上限値及び下限値の範
囲内に入っているかどうかで歪量の良否判別を行うこと
を特徴とする歪量判別方法。
2. The distortion amount determining method according to claim 1, wherein
The table stores the correspondence between the amount of distortion and the upper and lower limit values of the corresponding grayscale data, and the acquired grayscale data falls within the range of the upper and lower limit values. A distortion amount discriminating method characterized by determining whether or not the distortion amount is good or not.
【請求項3】 レーザ光をワークに照射して歪みを与え
るレーザ加工に適用されて、インラインで前記ワークの
歪量を判別する装置であって、 前記ワークにおけるレーザ光の照射パターンを該レーザ
光と同軸上において撮像する撮像系と、 該撮像系で得られた画像を画像処理して濃淡に関するデ
ータを取得する画像処理装置と、 取得したデータを用いて、あらかじめ求められている歪
量と濃淡のデータとの対応関係を示すテーブルを参照し
て歪量を判別する判別手段とを備えたことを特徴とする
歪量判別装置。
3. An apparatus which is applied to laser processing for irradiating a laser beam to a workpiece to give a distortion, and which determines an amount of distortion of the workpiece in-line, wherein an irradiation pattern of the laser beam on the workpiece is determined by the laser beam. An imaging system that performs imaging on the same axis as the above, an image processing device that performs image processing on an image obtained by the imaging system to obtain data relating to shading, and a distortion amount and shading that are obtained in advance using the obtained data. A discriminating means for discriminating the amount of distortion with reference to a table indicating a correspondence relationship with the data.
【請求項4】 請求項3記載の歪量判別装置において、
前記判別手段は、前記画像処理装置からの濃淡を示すデ
ータを受け、照射パターンの濃淡のレベル分けを行う濃
淡レベル判別手段と、あらかじめ実射により計測された
歪量と照射パターンの濃淡のレベルとの対応関係を示す
テーブルを有する比較手段とから成ることを特徴とする
歪量判別装置。
4. The distortion amount discriminating apparatus according to claim 3,
The discriminating means receives the data indicating the shading from the image processing apparatus, and performs shading level discrimination for performing shading levels of the irradiation pattern, and the distortion amount and shading level of the irradiation pattern previously measured by actual irradiation. And a comparing means having a table indicating the correspondence between the two.
【請求項5】 請求項3記載の歪量判別装置において、
前記テーブルには、歪量とこれに対応する濃淡のデータ
の上限値及び下限値との対応関係が記憶されており、前
記比較手段は、前記取得された濃淡のデータが前記上限
値及び下限値の範囲内に入っているかどうかで歪量の良
否判別を行うことを特徴とする歪量判別装置。
5. The distortion amount determining device according to claim 3, wherein
The table stores the correspondence between the amount of distortion and the upper limit value and lower limit value of the corresponding grayscale data, and the comparing means stores the obtained grayscale data in the upper limit value and the lower limit value. Wherein the quality of the distortion is determined based on whether the distortion is within the range.
JP11085778A 1999-03-29 1999-03-29 Judgment method and judging apparatus for distortion amount Pending JP2000275017A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11085778A JP2000275017A (en) 1999-03-29 1999-03-29 Judgment method and judging apparatus for distortion amount

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11085778A JP2000275017A (en) 1999-03-29 1999-03-29 Judgment method and judging apparatus for distortion amount

Publications (1)

Publication Number Publication Date
JP2000275017A true JP2000275017A (en) 2000-10-06

Family

ID=13868352

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003282674A (en) * 2002-03-26 2003-10-03 Dainippon Screen Mfg Co Ltd Positioning device for substrate used for laser working
JP2006329898A (en) * 2005-05-30 2006-12-07 Toyota Motor Corp Measuring method and device of surface distortion
CN102905841A (en) * 2010-05-11 2013-01-30 普雷茨特两合公司 Laser cutting head and method for cutting a workpiece by means of a laser cutting head
CN107824968A (en) * 2017-11-08 2018-03-23 深圳泰德激光科技有限公司 Laser welding device with CCD vision positioning function

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003282674A (en) * 2002-03-26 2003-10-03 Dainippon Screen Mfg Co Ltd Positioning device for substrate used for laser working
JP2006329898A (en) * 2005-05-30 2006-12-07 Toyota Motor Corp Measuring method and device of surface distortion
CN102905841A (en) * 2010-05-11 2013-01-30 普雷茨特两合公司 Laser cutting head and method for cutting a workpiece by means of a laser cutting head
CN102905841B (en) * 2010-05-11 2016-03-30 普雷茨特两合公司 Laser cutting head and for the method by means of laser cutting head cut workpiece
CN107824968A (en) * 2017-11-08 2018-03-23 深圳泰德激光科技有限公司 Laser welding device with CCD vision positioning function

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