JP2000258196A - Measuring processor - Google Patents

Abstract

PROBLEM TO BE SOLVED: To facilitate debug. SOLUTION: The measuring processor comprises a control input signal data base 30, a sensor signal data base 32, and an output signal data base 34. Based on the data of the control input signal data base 30 and the sensor signal data base 32, a pseudo signal for debug can be generated and processed and the operation results is compared with a correct data stored in the output signal data base 34 thus facilitating debug.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a measurement processing apparatus for processing a signal from a sensor, and more particularly to an apparatus having a function of independently debugging.

2. Description of the Related Art Conventionally, various measurement processing apparatuses are known. For example, let various devices of the vehicle perform various operations,
The equipment is tested, and in such a test, a measurement processing device that measures and checks the state of the equipment is used.

Here, such a measurement processing device causes various operations to be performed on an actual device, and measures the situation at that time. Further, it calculates a maximum value or the like in a predetermined period, and outputs the calculation result. Therefore, it is necessary to debug the measurement processing device so that its operation is performed correctly.

For this debugging work, a debugging device prepared separately is usually used. This debugging device stores pseudo sensor data and data of a calculation result corresponding to a measurement result of an actual device, and supplies a pseudo signal based on the pseudo data to a measurement device to be debugged. The measurement processing device acquires the received pseudo signal as measurement data, and outputs data of the calculation result to the debug device. Then, the debugging device compares the data of the operation result sent from the measurement processing device with the data of the operation result stored in advance, thereby debugging the measurement processing device.

[0004]

As described above, in the conventional measurement processing device, debugging is performed by using a separately provided debugging device. Therefore, there is a problem that it is necessary to perform connection with the debug device and to prepare appropriate pseudo data in the debug device, which is troublesome. In particular, after debugging the measuring device alone, it is necessary to debug the actual device to which the actual sensor device or the like is attached, and there is a problem that it takes time to connect the debugging device.

An object of the present invention is to provide a measurement processing device having a debugging function by itself.

[0006]

According to the present invention, an output from a sensor is taken in accordance with an input control signal, a predetermined operation is performed, and a measurement result is output to the measurement unit. An input database for recording data on control signals and outputs from the sensors, a pseudo signal generating means for generating a pseudo signal based on the data recorded in the input database and supplying the pseudo signal to the measurement unit, An output database for storing data, and a comparing unit for comparing the result of the arithmetic operation performed by the measurement unit based on the pseudo signal with the result stored in the output database, and debugging the measurement unit. It is characterized by being able to.

As described above, the measurement processing apparatus according to the present invention can store data for debugging, and can perform debugging by using the data. Therefore, the trouble of connecting another debugging device can be saved.

It is preferable that the actual data acquired by the measuring unit is stored in an input database and can be used as data for generating pseudo data for debugging. With such a configuration, data for debugging can be easily collected.

Embodiments of the present invention (hereinafter referred to as embodiments) will be described below with reference to the drawings.

FIG. 1 is a block diagram showing the overall configuration of the present embodiment. The machine controller 10 is a controller that controls the operation of a device to be measured. Also,
The sensor 12 detects the state of the device to be measured, and one or more sensors 12 are provided according to the measurement items. The measurement processing device 20 has a measurement processing unit 22. The measurement processing unit 22 is configured by a computer and performs various data processing. A measurement input board 24 is connected to the measurement processing unit 22. The measurement input board 24 supplies a sensor input signal from the sensor 12 to the measurement processing device 20. The measurement processing unit 22 includes a control input signal database 30, a sensor signal database 3,
2. Three databases of the output signal database 34 are connected. In the control input signal database 30,
A control input signal supplied from the machine controller 10 is stored. Further, the sensor signal acquired from the sensor 12 is stored in the sensor signal database 32. When a plurality of sensors 12 are provided, they are stored separately. The output signal database 34 stores the determination result of the result obtained by the arithmetic processing in the measurement processing unit 22.

With such a measurement processing device,
The operation when performing normal measurement will be described with reference to FIG. First, a control input signal from the machine controller 10 is fetched (S11). Then, the control input signals are sequentially written in the control input signal database 30 (S
12). In the control input signal database 30, data indicating whether or not there is a measurement instruction every predetermined time is recorded.

When a measurement instruction is issued, a sensor input signal is fetched via the measurement input board 24 (S
13), and writes this in the sensor signal database 32 (S14). In the sensor signal database 32, a value indicating a sensor output is recorded at predetermined time intervals.

Then, an arithmetic operation such as taking the maximum value within a predetermined time is performed on the sensor signal, and the result is determined (S15). Then, the judgment result is sent to the machine controller 1
0 (S16), and the output signal is written to the output signal database 34. The determination result is recorded in the output signal database 34 every predetermined time.

Next, the operation for debugging will be described with reference to FIG. First, a measurement instruction is checked by reading data from the control input signal database 30 (S21). If there is a measurement instruction, a sensor signal is read from the sensor signal database 32 (S22). Then, an operation determination process is performed, and the determination result is compared with the determination result stored in the output signal database 34 (S23). Here, the data of the output signal database 34 used for comparison at the time of debugging is data that is known to be correct. That is, in the measurement processing device that has been debugged, the data of each database generated by performing the above-described normal measurement may be used, or may be manually created.
The data is free from errors in the relationship between the measured data and the determination result.

As described above, the measurement processing unit 22 of the present embodiment
Means (i) "measurement calculation processing function" for performing the original measurement,
It has (ii) a "database management function" for managing a database, and (iii) a "debug control function" for passing a pseudo signal to a measurement processor based on information in the database.

Next, the specific configuration of each database is shown in FIG.
It will be described based on. Each database 30, 32, 34
Are the pattern masters 30a, 32a and 34a, respectively.
And the order masters 30b, 32b, 34b. The pattern masters 30a, 32a, and 34a record patterns of signal changes. That is, one pattern data is recorded corresponding to the p-key corresponding to the address. Also, the order masters 30b, 32
In b and 34b, the order of which pattern has been executed is recorded in the pattern master. That is, the p-key for specifying the pattern data and its duration are sequentially recorded. Therefore, if the pattern is the same, only one pattern master is stored in the pattern masters 30a, 32a, and 34a, and the p-key storing the pattern is stored in the order masters 30b, 32b, and 34b. Just need. Therefore, if there are many identical patterns in the sensor outputs to be obtained, such a configuration can greatly reduce the required total storage capacity.

The process of collecting debug data in the database having such a configuration will be described with reference to FIG. First, data from a sensor is sampled based on a control signal (S31). Then, it is determined whether or not the sampled signal has changed (S
32). If there is no signal change, the process returns to S31, and if there is a change, it is compared with the data of the pattern master (S33). If they do not match, they are registered as new patterns (S34). On the other hand, if they match, the number of appearances of this pattern is counted up (S3
5). It should be noted that the pattern is one for a certain period
It is also preferable to use one.

When the processing in S34 or S35 is completed, the elapsed time of the pattern is obtained (S3).
6), and register this in the sequence master (S37).

Thus, as shown in FIG. 6, the pattern data and the number of appearances are recorded in the pattern master for each p-key. Also, the order master has tk
The p-key and the duration are recorded for each key. In this way, data collection in each database is performed. Here, as shown in the figure, a high-frequency pattern having a large number of appearances is a signal during normal operation. Such a high-frequency pattern is more important, and it is preferable to focus on debugging. On the other hand, a low frequency pattern with a very small number of applications is a signal at the time of abnormal operation. Such infrequent patterns are less important and can simplify debugging. In this way, by counting the number of appearances,
The frequency, meaning and importance of the signal pattern can be analyzed, and work can be weighted during debugging.

Next, the pseudo signal output control in the debugging operation will be described with reference to FIG. First, based on a pseudo signal output command, data is read from the control signal database 30, and when there is a measurement instruction, data is read from the order master of the sensor signal database 32 (S41). Next, pattern data is read from the pattern master 32a of the sensor signal database 32 (S4).
2). Then, pseudo data for the time recorded in the order master is output from the pattern master (S43). Then, it is determined whether or not the data has been completed (S44). If the data has not been completed, the process returns to S41 and the process is repeated. If the data has been completed, this process ends.

A comparison process of output data at the time of a debugging process will be described with reference to FIG. First, when there is a calculation result, the corresponding data is read from the output signal database 34.
The sequence data is read from the pattern master 34a (S51), and then the pattern data is read from the pattern master 34a (S52).
Then, the read data is compared with the result of the arithmetic processing (S53). Then, it is determined whether or not the data has been completed (S54). If the data has not been completed, the process returns to S51 to repeat the processing. If the data has been completed, this processing is completed. Thus, the debugging process is performed.

As shown in FIG. 9, a measurement output board 52 is provided instead of the measurement input board 24 so that signals from the control input signal database 30 and the sensor signal database 32 can be supplied to an external measurement processing device. By doing so, the measurement debug device of the present invention can be used as a debug device of another measurement processing device.

That is, the measurement processing section 22 of the measurement processing device 20 outputs a control signal and a sensor sensor signal to an external normal measurement processing device 50 via the measurement output board 52. Then, based on these signals, the output data generated by the external measurement processing device 50 is received, and the content of the output data is checked, so that the measurement processing device 50 can be debugged.

By providing databases of various patterns, various operations can be confirmed. Further, the operation can be confirmed even without an actual sensor or the like.

Since the database and the system are independent, a database constructed by another system can be diverted to another system.

By outputting the pseudo signal in a pattern different from the normal time axis, it is difficult to confirm the pseudo signal in the normal operation.
You can also check fast steps.

At the time of normal operation, the database processing section is always operating and the operation history is recorded. Therefore, if any abnormality occurs, the cause of the abnormality can be investigated based on the data.

[0027]

As described above, according to the present invention,
Debugging data can be stored, and debugging can be performed using this data. Therefore, the trouble of connecting another debugging device can be saved. In addition, by using the actual data acquired by the measuring unit as data for generating pseudo data for debugging, data for debugging can be easily collected.

[Brief description of the drawings]

FIG. 1 is a block diagram showing an overall configuration.

FIG. 2 is a flowchart illustrating an operation of a measurement process.

FIG. 3 is a flowchart showing a debugging operation.

FIG. 4 is a diagram showing a configuration of a database.

FIG. 5 is a flowchart showing an operation of collecting debug data.

FIG. 6 is a diagram showing data of a pattern master and an order master.

FIG. 7 is a flowchart showing pseudo signal output control.

FIG. 8 is a flowchart illustrating an output comparison process.

FIG. 9 is a block diagram showing another configuration example.

[Explanation of symbols]

10 machine controller, 12 sensors, 20 measurement processing devices, 22 measurement processing units, 24 measurement input boards,
30 control input signal database, 32 sensor signal database, 34 output signal database.

Claims (2)

[Claims] 1. A measuring unit for receiving an output from a sensor in accordance with an input control signal, performing a predetermined calculation, and outputting a calculation result, and a control signal supplied to the measuring unit and an output from the sensor. An input database that records data of the input database; a pseudo signal generating means that generates a pseudo signal based on the data recorded in the input database and supplies the pseudo signal to a measurement unit; and an output database that stores data about a calculation result. The result of the calculation performed by the measurement unit based on the pseudo signal,
And a comparing means for comparing the result stored in the output database with a measurement processing device capable of debugging the measurement unit. 2. The measurement processing apparatus according to claim 1, wherein the actual data acquired by the measurement unit is stored in an input database and can be used as data for generating pseudo data for debugging.