JP2000234167A - Molybdenum sputtering target material and its production - Google Patents

Molybdenum sputtering target material and its production

Info

Publication number
JP2000234167A
JP2000234167A JP3300699A JP3300699A JP2000234167A JP 2000234167 A JP2000234167 A JP 2000234167A JP 3300699 A JP3300699 A JP 3300699A JP 3300699 A JP3300699 A JP 3300699A JP 2000234167 A JP2000234167 A JP 2000234167A
Authority
JP
Japan
Prior art keywords
sputtering target
target material
recrystallized
plate
present
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3300699A
Other languages
Japanese (ja)
Other versions
JP3079378B1 (en
Inventor
Mitsuru Tsuchiya
満 土屋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Tungsten Co Ltd
Original Assignee
Tokyo Tungsten Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Tungsten Co Ltd filed Critical Tokyo Tungsten Co Ltd
Priority to JP11033006A priority Critical patent/JP3079378B1/en
Application granted granted Critical
Publication of JP3079378B1 publication Critical patent/JP3079378B1/en
Publication of JP2000234167A publication Critical patent/JP2000234167A/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To provide a Mo sputtering target material of high quality in which the problems that particles are largely generated and arcing occurs according to conditions at the time of sputtering are solved and to provide a method for producing it. SOLUTION: This Mo sputtering target material is composed of a recrystallized Mo sheet with random crystal orientation obtd. by subjecting an Mo rolling stock to heat treatment, and in which the average of the recrystallized grain size is <=100 μm. For producing the Mo sputtering target material, an Mo stock is subjected to rolling at >=70% rolling radio to obtain an Mo sheet having 99.5% relative density, which is subjected to heat treatment at 1,100 to 1,200 deg.C and is recrystallized to obtain a sputtering target material composed of a Mo sheet having a structure of uniform grains of <=100 μm.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、液晶ディスプレイ
に代表されるフラットディスプレイの透明導電膜や半導
体装置の電極形成に用いられるモリブデン(Mo)から
実質的になるスパッターリングターゲット材に関するも
のである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a sputtering target material substantially composed of molybdenum (Mo) used for forming a transparent conductive film of a flat display represented by a liquid crystal display and an electrode of a semiconductor device.

【0002】[0002]

【従来の技術】近年、液晶ディスプレイに代表されるフ
ラットディスプレイの生産が急激に拡大している。これ
に伴って、例えば、ディスプレイに用いられる透明導電
膜や電界トランシスター類のゲート、ソース、及びドレ
インに供する金属配線膜などの需要も急激に増大してお
り、その特性上における高速化も要求されている。
2. Description of the Related Art In recent years, the production of flat displays represented by liquid crystal displays has been rapidly expanding. Along with this, for example, the demand for transparent conductive films used in displays and metal wiring films used for gates, sources, and drains of electric field transistors has been rapidly increasing, and higher speeds due to their characteristics have also been required. Have been.

【0003】このようなフラットパネルディスプレイに
使用されるスパッターリングターゲット材として、IT
O(In2 3 :SnO2 ),Al,Cr,Ta,W,
Mo等が挙げられる。
As a sputtering target material used for such a flat panel display, IT
O (In 2 O 3 : SnO 2 ), Al, Cr, Ta, W,
Mo and the like.

【0004】これらのスパッターリングターゲット材の
中で、Moの需要が増加しつつある。
[0004] Among these sputtering target materials, the demand for Mo is increasing.

【0005】現在、ターゲット用のMo板は、一般的に
は、圧延材を使用している。Mo圧延材の組織は繊維状
になっており、スパッター面から見ると、球を一方向に
押しつぶして延ばしていったものが集まった様な状態
で、薄い層状のようになっている。そのため、Mo圧延
材は、組織的には,大きいものと小さいものが集まった
ようになっている。
At present, generally, a rolled material is used as a target Mo plate. The structure of the Mo rolled material is in a fibrous form, and when viewed from the sputter surface, the spheres are crushed in one direction and extended to form a thin layer. For this reason, Mo-rolled materials are organized such that large and small Mo are organized.

【0006】[0006]

【発明が解決しようとする課題】前述した従来のMoタ
ーゲット材を、高速で成膜するスパッター条件で行う
と、パーティクルが発生し、成膜上に異物が付着した
り、装置内のあるところに堆積したものがターゲット上
に付着し、それによりアーキングが生じ基板を損傷させ
たりして操業できなくなる。そのため、歩留低下や生産
コストがかさむことになる。
When the above-mentioned conventional Mo target material is sputtered under a sputtering condition for forming a film at a high speed, particles are generated, foreign matter adheres on the film, or somewhere in the apparatus. The deposits adhere to the target, causing arcing and damaging the substrate, rendering it inoperable. As a result, the yield decreases and the production cost increases.

【0007】また、圧延材は、焼結品に比べ結晶方位が
揃う傾向にある。結晶方位によりMo粒子の飛ぶ方向が
異なるため膜厚分布がばらつき、その結果シー卜抵抗が
ばらついたりする可能性がある。
[0007] Rolled materials tend to have a uniform crystal orientation as compared to sintered products. Since the direction in which the Mo particles fly depends on the crystal orientation, the film thickness distribution varies, and as a result, the sheet resistance may vary.

【0008】一方,均一な粒子を有する板状のMoを得
るためには、Mo圧粉体を水素炉中で焼結したり、キャ
ンニングHIPにより作る方法もあるが、パーテクルや
アーキングの発生にはターゲットの密度(鬆)も関係し
ており、密度は高ければ高いほどよい(鬆は少なくな
る)。
On the other hand, in order to obtain plate-like Mo having uniform particles, there are methods of sintering the Mo compact in a hydrogen furnace or making it by a canning HIP. Is related to the density (porosity) of the target, and the higher the density, the better (there is less pores).

【0009】しかし、上記の方法では相対密度は良くて
も99.0%迄しか上がらないし、また、キャンニング
HIPにより造った物は、含有ガス量が多くなるため、
スパッター後のシート抵抗値が高くなる。それと圧延材
に比べ大きさに制限がある。
However, in the above-mentioned method, the relative density can be increased only up to 99.0% at best, and the gas produced by the canning HIP has a large gas content.
The sheet resistance after the sputter increases. In addition, there is a limit on the size compared to the rolled material.

【0010】そこで,本発明の技術的課題は、スパッタ
ー時の条件によリパーティクルが多量に発生したり、ア
ーキングが起きるという問題を解消した品質の良いMo
スパッタリングターゲット材とその製造方法とを提供す
ることにある。
Therefore, a technical problem of the present invention is to provide a high-quality Mo which has solved the problem that a large amount of particles are generated or arcing occurs depending on the conditions at the time of sputtering.
An object of the present invention is to provide a sputtering target material and a method for manufacturing the same.

【0011】[0011]

【課題を解決するための手段】本発明者は、上記課題を
解決するために、Mo材の圧延時の条件と再結晶させる
温度条件をコントロールして、含有ガス量100ppm
以下で、相対密度が99.5%以上で、結晶粒子が10
0μm以下の均−の粒子を有するMo板を作製すること
ができ、本発明をなすに至ったものである。
Means for Solving the Problems In order to solve the above-mentioned problems, the present inventor has controlled the conditions at the time of rolling the Mo material and the temperature conditions for recrystallization to achieve a gas content of 100 ppm.
Below, when the relative density is 99.5% or more,
An Mo plate having a uniform particle size of 0 μm or less can be produced, and the present invention has been accomplished.

【0012】本発明によれば、Mo圧延材を熱処理する
事により得られるランダムな結晶方位を備えた再結晶M
o板であって、再結晶粒径の平均が100μm以下であ
ることを特徴とするMoスパッターリングターゲット材
が得られる。
According to the present invention, a recrystallized M having a random crystal orientation obtained by heat-treating a Mo-rolled material.
An Mo sputtering target material is obtained which is an o-plate and has an average recrystallized grain size of 100 μm or less.

【0013】また、本発明によれば、前記Moスパッタ
ーリングターゲット材において,99.5%以上の相対
密度を備えていることを特徴とするMoスパッターリン
グターゲット材が得られる。
According to the present invention, there is provided a Mo sputtering target material characterized in that the Mo sputtering target material has a relative density of 99.5% or more.

【0014】また、本発明によれば,前記Moスパッタ
ーリングターゲット材において、含有ガス量が100p
pm以下であることを特徴とするMoスパッターリング
ターゲット材が得られる。
According to the present invention, the Mo sputtering target material has a gas content of 100 p
pm or less is obtained.

【0015】さらに、本発明によれば、Mo素材から圧
延加工率70%以上の圧延加工を施して相対密度が9
9.5%のMo板を得、1100℃〜1200℃で熱処
理し、再結晶させて100μm以下の均粒な組織を有す
るMo板からなるスパッターリングターゲット材を得る
ことを特徴とするMoスパッターリングターゲット材の
製造方法が得られる。
Further, according to the present invention, the Mo material is subjected to rolling at a rolling reduction ratio of 70% or more, so that the relative density is 9%.
Mo sputtering obtained by obtaining a 9.5% Mo plate, heat-treating at 1100 ° C. to 1200 ° C., and recrystallizing to obtain a sputtering target material made of a Mo plate having a uniform grain structure of 100 μm or less. A method for manufacturing the target material is obtained.

【0016】要するに、本発明においては、スパッター
用ターゲットの粒子は均粒で微細な方がよいため、圧延
加工率70%以上で作ったMo板(相対密度≧99.5
%)を1100℃〜1200℃で熱処理し、再結晶させ
100μm以下の均粒な組織としたMo板をスパッター
用のMo板として用いるものであり、再結晶材の結晶方
位はランダムである。
In short, in the present invention, since it is better that the particles of the sputtering target be uniform and fine, a Mo plate (relative density ≧ 99.5) made at a rolling reduction ratio of 70% or more is preferred.
%) Is heat-treated at 1100 ° C. to 1200 ° C. and recrystallized to use a Mo plate having a uniform structure of 100 μm or less as a Mo plate for sputtering, and the crystal orientation of the recrystallized material is random.

【0017】[0017]

【発明の実施の形態】以下、本発明の実施の形態につい
て図面を参照して説明する。
Embodiments of the present invention will be described below with reference to the drawings.

【0018】まず、水素中で焼結したMoインゴットを
用い、1300℃以下の加熱温度で加工中に再結晶しな
いように圧延しMo板を得た。このときの板の加工率
(板厚減少率)は82%で、相対密度は、99.9%で
あった。この板を二分し、一方を1100℃〜1200
℃の炉中で30分熱処理して再結晶させた。このときの
再結晶させたMo板(本発明材)のA面、B面、及びC
面の金属組織を示す拡大顕微鏡写真を図1乃至図3に示
す。また、比較のために、再結晶させなかったもののA
面、B面、及びC面の金属組織を示す拡大顕微鏡写真を
図4乃至6に示す。
First, using a Mo ingot sintered in hydrogen, a Mo plate was rolled at a heating temperature of 1300 ° C. or less so as not to recrystallize during processing. At this time, the working ratio of the plate (the reduction ratio of the plate thickness) was 82%, and the relative density was 99.9%. This plate is bisected, and one is from 1100 ° C. to 1200
It was recrystallized by heat treatment in a furnace at 30 ° C. for 30 minutes. A-plane, B-plane and C-plane of the recrystallized Mo plate (material of the present invention) at this time
1 to 3 show enlarged micrographs showing the metal structure of the surface. For comparison, A was not recrystallized.
FIGS. 4 to 6 show enlarged micrographs showing the metal structures on the side, the B side, and the C side.

【0019】図4乃至6に示すように、圧延だけもの
は、繊維組織になっている。これに対して、本発明の実
施の形態による再結晶処理したものは均一な粒径で平均
粒径が約70μmであつた。含有ガス量は両方とも酸素
30ppm、窒素<10ppm、炭素20ppmであ
り、合計100ppm以下であつた。
As shown in FIGS. 4 to 6, only the rolled product has a fiber structure. On the other hand, the recrystallized product according to the embodiment of the present invention had a uniform particle size and an average particle size of about 70 μm. Both contained 30 ppm of oxygen, <10 ppm of nitrogen, and 20 ppm of carbon, and the total gas content was 100 ppm or less.

【0020】上記の2種類のMo板を用い、切削や研磨
などの2次加工を行いスパッター用のターゲットとし、
スパッターリング特性を比較し調べたところ、図7に示
すような結果となった。
Using the above two types of Mo plates, secondary processing such as cutting and polishing is performed to form a sputtering target.
When the sputter ring characteristics were compared and examined, the results were as shown in FIG.

【0021】図7から、曲線1に示す本発明の実施の形
態による再結晶Mo材(本発明材)をスパッターリング
ターゲットに使用すれば、曲線2に示される従来のMo
材(従来材)を用いた場合に比べ、その成膜に発生する
異物数(パーティクル)Npが処理枚数NHの増加に拘
わらず格段に減少しており、パーティクルの発生頻度が
従来品に比べ低下した。
From FIG. 7, when the recrystallized Mo material (material of the present invention) according to the embodiment of the present invention shown in the curve 1 is used for the sputtering target, the conventional Mo material shown in the curve 2 can be obtained.
Compared to the case of using the material (conventional material), the number of foreign particles (particles) Np generated in the film formation is remarkably reduced irrespective of the increase in the number of processed NH, and the frequency of generation of particles is lower than that of the conventional product. did.

【0022】さらに、前記と同様の方法で作った本発明
材及び従来材からなるターゲットを各々10枚用い、ス
パッターリング特性を比較しアーキングの発生度合を調
べた。その結果、本発明材は、アーキング発生度合は、
10枚中0枚であった。これに対して、従来材は、10
枚中3枚であった。このことから、本発明材がより品質
の良いことが分かる。
Further, using 10 targets each made of the material of the present invention and the conventional material produced by the same method as described above, the spattering characteristics were compared and the degree of occurrence of arcing was examined. As a result, the material of the present invention has a degree of arcing,
0 out of 10 sheets. On the other hand, the conventional material is 10
Three out of three sheets. This shows that the material of the present invention has better quality.

【0023】尚、上記アーキングの発生度合数の評価
は、加工材が高価なものであるために、10枚のみの評
価を行ったが、本発明の目的を達成するには、十分な結
果が得られた。
In the evaluation of the number of occurrences of the arcing, only ten sheets were evaluated because the processed material was expensive. However, sufficient results were not obtained to achieve the object of the present invention. Obtained.

【0024】[0024]

【発明の効果】以上説明したように、本発明によれば、
通常のMo板製造工程や設備を用いてMo板の圧延条件
と再結晶温度を選定することで、均−な粒径のMoター
ゲットが得られ、それによりスパッター時のパーティク
ルやアーキングの発生が減少し、フラットディスプレイ
の製品歩留を顕著に向上し得るMoスパッターリングタ
ーゲット材とその製造方法とを提供することができる。
As described above, according to the present invention,
By selecting the rolling conditions and recrystallization temperature of the Mo plate using ordinary Mo plate manufacturing processes and equipment, a Mo target having a uniform particle size can be obtained, thereby reducing the generation of particles and arcing during sputtering. In addition, it is possible to provide a Mo sputtering target material capable of significantly improving the product yield of a flat display and a method for manufacturing the same.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施の形態によるMoスパッターリン
グターゲット材のA面の金属組織を示す顕微鏡写真であ
る。
FIG. 1 is a photomicrograph showing a metal structure on an A-side of a Mo sputtering target material according to an embodiment of the present invention.

【図2】図1で示されたMoスパッターリングターゲッ
ト材のB面の金属組織を示す顕微鏡写真である。
FIG. 2 is a micrograph showing a metal structure on a B surface of the Mo sputtering target material shown in FIG. 1;

【図3】図1及び図2に示されたMoスパッターリング
ターゲット材のC面の金属組織を示す顕微鏡写真であ
る。
FIG. 3 is a photomicrograph showing a metal structure on a C-plane of the Mo sputtering target material shown in FIGS. 1 and 2;

【図4】従来技術によるMoスパッターリングターゲッ
ト材のA面の金属組織を示す顕微鏡写真である。
FIG. 4 is a photomicrograph showing a metal structure on a surface A of a conventional Mo sputtering target material.

【図5】図4に示されたMoスパッターリングターゲッ
ト材のB面の金属組織を示す顕微鏡写真である。
FIG. 5 is a micrograph showing a metallographic structure on a B surface of the Mo sputtering target material shown in FIG. 4;

【図6】図4及び図5に示されたMoスパッターリング
ターゲット材のC面の金属組織を示す顕微鏡写真であ
る。
FIG. 6 is a micrograph showing a metal structure on a C-plane of the Mo sputtering target material shown in FIGS. 4 and 5;

【図7】本発明の実施の形態によるスパッターリングタ
ーゲット材のスパッターリング特性を示す図であり、併
せて従来例の特性も記載されている。
FIG. 7 is a diagram showing the sputtering characteristics of a sputtering target material according to an embodiment of the present invention, and also shows the characteristics of a conventional example.

─────────────────────────────────────────────────────
────────────────────────────────────────────────── ───

【手続補正書】[Procedure amendment]

【提出日】平成12年4月5日(2000.4.5)[Submission date] April 5, 2000 (200.4.5)

【手続補正1】[Procedure amendment 1]

【補正対象書類名】明細書[Document name to be amended] Statement

【補正対象項目名】請求項1[Correction target item name] Claim 1

【補正方法】変更[Correction method] Change

【補正内容】[Correction contents]

【手続補正2】[Procedure amendment 2]

【補正対象書類名】明細書[Document name to be amended] Statement

【補正対象項目名】0012[Correction target item name] 0012

【補正方法】変更[Correction method] Change

【補正内容】[Correction contents]

【0012】本発明によれば、水素中での焼結によって
得られたMoインゴットを1300℃以下の温度で圧延
することで作製したMo圧延材を熱処理する事により得
られるランダムな結晶方位を備えた再結晶Mo板であっ
て、再結晶粒径の平均が100μm以下であることを特
徴とするMoスパッターリングターゲット材が得られ
る。そこで,本発明の技術的課題は、スパッター時の条
件によリパーティクルが多量に発生したり、アーキング
が起きるという問題を解消した品質の良いMoスパッタ
リングターゲット材とその製造方法とを提供することに
ある。
According to the present invention, by sintering in hydrogen
Rolling the obtained Mo ingot at a temperature of 1300 ° C or less
A recrystallized Mo plate having a random crystal orientation obtained by heat-treating the Mo-rolled material produced by the above method, wherein the average recrystallized grain size is 100 μm or less. Wood is obtained. Therefore, a technical problem of the present invention is to provide a high-quality Mo sputtering target material which solves the problem that a large amount of particles are generated or arcing occurs depending on conditions at the time of sputtering, and a method of manufacturing the same. is there.

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 Mo圧延材を熱処理する事により得られ
るランダムな結晶方位を備えた再結晶Mo板であって、
再結晶粒径の平均が100μm以下であることを特徴と
するMoスパッターリングターゲット材。
1. A recrystallized Mo plate having a random crystal orientation obtained by heat-treating a Mo-rolled material,
A Mo sputtering target material having an average recrystallized grain size of 100 μm or less.
【請求項2】 請求項1記載のMoスパッターリングタ
ーゲット材において,99.5%以上の相対密度を備え
ていることを特徴とするMoスパッターリングターゲッ
ト材。
2. The Mo sputtering target material according to claim 1, wherein the Mo sputtering target material has a relative density of 99.5% or more.
【請求項3】 請求項2記載のMoスパッターリングタ
ーゲット材において、含有ガス量が100ppm以下で
あることを特徴とするMoスパッターリングターゲット
材。
3. The Mo sputtering target material according to claim 2, wherein the content of gas is 100 ppm or less.
【請求項4】 Mo素材から圧延加工率70%以上の圧
延加工を施して相対密度が99.5%のMo板を得、1
100℃〜1200℃で熱処理し、再結晶させて100
μm以下の均粒な組織を有するMo板からなるスパッタ
ーリングターゲット材を得ることを特徴とするMoスパ
ッターリングターゲット材の製造方法。
4. A Mo plate having a relative density of 99.5% is obtained by subjecting a Mo material to rolling at a rolling ratio of 70% or more.
Heat-treated at 100 ° C to 1200 ° C and recrystallized to 100
A method for producing a Mo sputtering target material, comprising obtaining a sputtering target material made of a Mo plate having a uniform grain structure of μm or less.
JP11033006A 1999-02-10 1999-02-10 Mo sputtering target material and method of manufacturing the same Expired - Lifetime JP3079378B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11033006A JP3079378B1 (en) 1999-02-10 1999-02-10 Mo sputtering target material and method of manufacturing the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11033006A JP3079378B1 (en) 1999-02-10 1999-02-10 Mo sputtering target material and method of manufacturing the same

Publications (2)

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WO2007059546A2 (en) * 2005-11-23 2007-05-31 Plansee Metall Gmbh Method for producing a tubular target
CN100335671C (en) * 2003-10-02 2007-09-05 W.C.贺利氏两合有限公司 Method for extrusion cold forming molybdic through back flowing
WO2008084863A1 (en) * 2007-01-12 2008-07-17 Nippon Steel Materials Co., Ltd. Process for producing molybdenum-based sputtering target plate
US7452488B2 (en) * 2006-10-31 2008-11-18 H.C. Starck Inc. Tin oxide-based sputtering target, low resistivity, transparent conductive film, method for producing such film and composition for use therein
KR100966682B1 (en) * 2001-02-20 2010-06-29 에이치. 씨. 스타아크 아이앤씨 Refractory metal plates with uniform texture and methods of making the same
JP2011132563A (en) * 2009-12-22 2011-07-07 Toshiba Corp Mo SPUTTERING TARGET AND MANUFACTURING METHOD THEREFOR
WO2011111373A1 (en) * 2010-03-11 2011-09-15 株式会社 東芝 Sputtering target, method for producing same and method for producing semiconductor device
WO2012144407A1 (en) * 2011-04-18 2012-10-26 株式会社東芝 HIGH PURITY Ni SPUTTERING TARGET AND METHOD FOR MANUFACTURING SAME
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CN114150279A (en) * 2021-12-09 2022-03-08 株洲硬质合金集团有限公司 Heat treatment method for molybdenum-niobium alloy rolling target material

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KR100966682B1 (en) * 2001-02-20 2010-06-29 에이치. 씨. 스타아크 아이앤씨 Refractory metal plates with uniform texture and methods of making the same
CN100335671C (en) * 2003-10-02 2007-09-05 W.C.贺利氏两合有限公司 Method for extrusion cold forming molybdic through back flowing
WO2007059546A2 (en) * 2005-11-23 2007-05-31 Plansee Metall Gmbh Method for producing a tubular target
WO2007059546A3 (en) * 2005-11-23 2007-11-01 Plansee Metall Gmbh Method for producing a tubular target
US7452488B2 (en) * 2006-10-31 2008-11-18 H.C. Starck Inc. Tin oxide-based sputtering target, low resistivity, transparent conductive film, method for producing such film and composition for use therein
WO2008084863A1 (en) * 2007-01-12 2008-07-17 Nippon Steel Materials Co., Ltd. Process for producing molybdenum-based sputtering target plate
JP5426173B2 (en) * 2007-01-12 2014-02-26 新日鉄住金マテリアルズ株式会社 Mo-based sputtering target plate and manufacturing method thereof
JP2011132563A (en) * 2009-12-22 2011-07-07 Toshiba Corp Mo SPUTTERING TARGET AND MANUFACTURING METHOD THEREFOR
JPWO2011111373A1 (en) * 2010-03-11 2013-06-27 株式会社東芝 Sputtering target, manufacturing method thereof, and manufacturing method of semiconductor element
CN102791905A (en) * 2010-03-11 2012-11-21 株式会社东芝 Sputtering target, method for producing same and method for producing semiconductor device
WO2011111373A1 (en) * 2010-03-11 2011-09-15 株式会社 東芝 Sputtering target, method for producing same and method for producing semiconductor device
JP5718896B2 (en) * 2010-03-11 2015-05-13 株式会社東芝 Sputtering target, manufacturing method thereof, and manufacturing method of semiconductor element
US9382613B2 (en) 2010-03-11 2016-07-05 Kabushiki Kaisha Toshiba Sputtering target, manufacturing method thereof, and manufacturing method of semiconductor element
USRE47788E1 (en) 2010-03-11 2019-12-31 Kabushiki Kaisha Toshiba Sputtering target, manufacturing method thereof, and manufacturing method of semiconductor element
WO2012144407A1 (en) * 2011-04-18 2012-10-26 株式会社東芝 HIGH PURITY Ni SPUTTERING TARGET AND METHOD FOR MANUFACTURING SAME
CN103459657A (en) * 2011-04-18 2013-12-18 株式会社东芝 High purity Ni sputtering target and method for manufacturing same
JP5951599B2 (en) * 2011-04-18 2016-07-13 株式会社東芝 High purity Ni sputtering target and method for producing the same
KR20150124391A (en) 2014-04-28 2015-11-05 가부시끼가이샤 아라이도 마테리아루 Material for sputtering target
JP2015221937A (en) * 2014-04-28 2015-12-10 株式会社アライドマテリアル Material for sputtering target
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JP7394249B1 (en) * 2023-05-15 2023-12-07 株式会社アルバック Molybdenum target and its manufacturing method

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