JP2000223610A - Circuit board for millimeter wave semiconductor - Google Patents

Circuit board for millimeter wave semiconductor

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Publication number
JP2000223610A
JP2000223610A JP2696399A JP2696399A JP2000223610A JP 2000223610 A JP2000223610 A JP 2000223610A JP 2696399 A JP2696399 A JP 2696399A JP 2696399 A JP2696399 A JP 2696399A JP 2000223610 A JP2000223610 A JP 2000223610A
Authority
JP
Japan
Prior art keywords
wave band
millimeter
circuit board
pattern
band semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2696399A
Other languages
Japanese (ja)
Inventor
Koki Kitaoka
幸喜 北岡
Noriko Kakimoto
典子 柿本
Yoshihisa Amano
義久 天野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP2696399A priority Critical patent/JP2000223610A/en
Publication of JP2000223610A publication Critical patent/JP2000223610A/en
Pending legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To raise the resonance frequency generated within space to the frequency free of influence on a used frequency band, by forming a plurality of potential ranges earth in circular form, by the via holes consisting of the conductive material for connecting the potential pattern at a millimeter wave element mounting face with the earth potential pattern on the rear. SOLUTION: Circuit patterns 7a (pattern for input and output) and 7b (pattern for earth potential) for mounting a millimeter wave semiconductor element are made at one side of a circuit board. The diameter of a via hole 9 is 100 μm, and the pitch is 400-500 μm, and it is connected to the earth potential pattern on the rear of the circuit board. The dimension of a via hole row A1 is 0.91 mm, and the dimension of a via hole row A2 is 0.69 mm, and the dimension of a via hole row B is 2.2 mm, and a potential region 10 is divided into four places of in rectangular rings by via hole rows 9. Then, a millimeter wave semiconductor element consisting of GaAs of 2 mm×3 mm where a metallic bump electrode consisting of gold is bonded by thermocompression onto the bonding pad at the circuit formation face.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、フリップチップボ
ンディング法によりミリ波帯半導体素子を実装する誘電
体の回路基板であるミリ波帯半導体用回路基板に関する
ものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a circuit board for a millimeter-wave band semiconductor, which is a dielectric circuit board on which a millimeter-wave band semiconductor element is mounted by a flip chip bonding method.

【0002】[0002]

【従来の技術】近年、情報処理装置の速度向上や、画像
処理装置の高解像度化等に伴い、30〜300GHzの
ミリ波帯での大容量・高速無線通信が注目されている。
このようなミリ波帯用無線機器を構成するためには、高
性能なミリ波帯半導体装置が不可欠である。ミリ波帯半
導体装置は、回路パターンを形成した誘電体回路基板に
ミリ波帯半導体素子を搭載することにより得られる。
2. Description of the Related Art In recent years, large-capacity, high-speed wireless communication in the millimeter wave band of 30 to 300 GHz has been attracting attention as the speed of information processing apparatuses has been improved and the resolution of image processing apparatuses has been increased.
In order to configure such a millimeter wave band wireless device, a high performance millimeter wave band semiconductor device is indispensable. A millimeter wave band semiconductor device is obtained by mounting a millimeter wave band semiconductor element on a dielectric circuit board on which a circuit pattern is formed.

【0003】しかしながら、従来より半導体装置の製造
で広く用いられているワイヤボンド法により、ミリ波帯
半導体素子を誘電体回路基板に電気的に接続した場合、
信号端子と回路基板とを結ぶ金属ワイヤのインダクタン
スの影響を受け、信号が大きく減衰し、所望の特性を得
られないという問題がある。したがって、接続部分のイ
ンダクタンスが小さいフリップチップボンディング法が
ミリ波帯半導体装置の実装方法として用いられる。
However, when a millimeter-wave band semiconductor element is electrically connected to a dielectric circuit board by a wire bonding method widely used in the manufacture of semiconductor devices,
There is a problem that the signal is greatly attenuated due to the influence of the inductance of the metal wire connecting the signal terminal and the circuit board, and desired characteristics cannot be obtained. Therefore, a flip-chip bonding method having a small inductance at a connection portion is used as a mounting method of a millimeter-wave band semiconductor device.

【0004】フリップチップボンディング法を用いた従
来のミリ波帯半導体装置の実装構造を図6及び図7を用
いて説明する。図6は、誘電体回路基板の一方の面に形
成され、フリップチップボンディング法によりミリ波帯
半導体素子を搭載するための回路パターンの模式図であ
り、図7は、図6の回路パターンにミリ波帯半導体素子
を搭載した場合の誘電体回路基板のA−A’断面の模式
図である。
A mounting structure of a conventional millimeter-wave band semiconductor device using a flip chip bonding method will be described with reference to FIGS. FIG. 6 is a schematic diagram of a circuit pattern formed on one surface of a dielectric circuit board for mounting a millimeter-wave band semiconductor element by a flip chip bonding method. FIG. 7 is a circuit diagram of the circuit pattern of FIG. It is a schematic diagram of the AA 'section of a dielectric circuit board when a wave band semiconductor element is mounted.

【0005】GaAs等の材料からなるミリ波帯半導体
素子1(図6の1はミリ波半導体素子の外形を示す)
は、ウェハプロセス技術により回路形成面2にミリ波帯
デバイスの回路が形成されており、更に信号入出力用端
子として、ボンディングパッド3が設けられ、その表面
には接続抵抗低減を目的に、金メッキ等が施され、更に
ボンディングパッド上に、金等にからなる金属突起電極
4(図6の4は金属突起電極の平面方向の外形を示す)
が形成されている。
[0005] Millimeter-wave band semiconductor device 1 made of a material such as GaAs (1 in FIG. 6 shows the outer shape of the millimeter-wave semiconductor device).
Has a circuit of a millimeter-wave band device formed on a circuit forming surface 2 by a wafer process technology, further provided with a bonding pad 3 as a signal input / output terminal, and a gold plating on the surface thereof for the purpose of reducing connection resistance. And the like, and on the bonding pad, a metal bump electrode 4 made of gold or the like (4 in FIG. 6 shows the external shape of the metal bump electrode in the plane direction).
Are formed.

【0006】一方、セラミック等の誘電体材料からなる
回路基板5のミリ波半導体素子搭載面6には、導電性材
料からなる回路パターン7が形成され、その表面には接
続抵抗低減を目的に、金メッキ等が施されている。該回
路パターンは、信号入出力用パターン7aと接地電位用
パターン7bとに大別される。また、前記回路基板5の
ミリ波半導体素子搭載面6の裏面には、接地電位パター
ン8が形成されている。表面の接地電位用パターン7b
と、裏面の接地電位パターン8は、例えばタングステン
ペースト等の導電性材料が充填されたビアホール9によ
って接続されている。また、上記ビアホール9は、接地
電位用回路パターン7bの外周部に配置され、ミリ波帯
半導体素子1の外周部に環状に接地された電位域10を
形成している。
On the other hand, a circuit pattern 7 made of a conductive material is formed on a millimeter-wave semiconductor element mounting surface 6 of a circuit board 5 made of a dielectric material such as a ceramic. Gold plating is applied. The circuit pattern is roughly divided into a signal input / output pattern 7a and a ground potential pattern 7b. A ground potential pattern 8 is formed on the back surface of the millimeter-wave semiconductor element mounting surface 6 of the circuit board 5. Surface ground potential pattern 7b
And the ground potential pattern 8 on the back surface are connected by via holes 9 filled with a conductive material such as tungsten paste. The via hole 9 is disposed on the outer peripheral portion of the ground potential circuit pattern 7b, and forms a potential region 10 which is annularly grounded on the outer peripheral portion of the millimeter wave band semiconductor element 1.

【0007】ミリ波帯半導体素子1の回路形成面2と、
誘電体回路基板5の回路パターン7とが対向するように
して、熱圧着により金属突起電極4は、回路パターン7
の表面に接合される。
A circuit forming surface 2 of the millimeter-wave band semiconductor device 1;
The metal projecting electrode 4 is thermocompression-bonded so that the circuit pattern 7 of the dielectric circuit
Bonded to the surface.

【0008】この後、外部環境の保護のために、ミリ波
帯半導体素子1は気密封止され(図示せず)、更に必要
に応じてミリ波帯電波受信用アンテナが取り付けられ
(図示せず)、ミリ波帯半導体装置が得られる。
Thereafter, in order to protect the external environment, the millimeter-wave band semiconductor element 1 is hermetically sealed (not shown), and if necessary, an antenna for receiving a millimeter-wave charged wave is attached (not shown). ), A millimeter-wave band semiconductor device is obtained.

【0009】[0009]

【発明が解決しようとする課題】しかしながら、従来の
構造の誘電体回路基板5にフリップチップボンディング
法によりミリ波帯半導体素子1を実装した場合、接地電
位用回路パターン7bの外周部に配置されてかつ、裏面
の接地電位パターン8と接続されたビアホール9により
ミリ波帯半導体素子1の外周部に環状に接地された電位
域10が形成される。
However, when the millimeter-wave band semiconductor element 1 is mounted on the dielectric circuit board 5 having the conventional structure by the flip-chip bonding method, the semiconductor element 1 is arranged on the outer peripheral portion of the ground potential circuit pattern 7b. In addition, a via region 9 connected to the ground potential pattern 8 on the back surface forms an annularly grounded potential region 10 on the outer peripheral portion of the millimeter wave band semiconductor device 1.

【0010】この結果、ミリ波帯半導体素子1の回路形
成面2から放射されるミリ波帯電磁波の実効波長がこの
環状に接地された電位域10より短い場合、使用周波数
帯や回路パターン7の設計値によっては、環状に接地さ
れた電位域10内で使用周波数帯域以下の周波数で共振
を起こし、ミリ波帯半導体素子1の特性に悪影響を与え
ることがあった。
As a result, when the effective wavelength of the millimeter wave band electromagnetic wave radiated from the circuit forming surface 2 of the millimeter wave band semiconductor device 1 is shorter than the annularly grounded potential region 10, if the effective frequency band or the circuit pattern 7 Depending on the design value, resonance may occur at a frequency lower than the operating frequency band within the annularly grounded potential region 10, which may adversely affect the characteristics of the millimeter-wave band semiconductor device 1.

【0011】[0011]

【課題を解決する為の手段】本発明は上記課題の解決を
目的としてなされたものであって、請求項1記載の発明
は、ミリ波帯半導体素子が実装される誘電体の回路基板
であって、ミリ波帯半導体素子が実装される面の接地電
位パターンと当該面の裏側面の接地電位パターンとを少
なくとも接続する導線性材料からなるビアホールによっ
て、環状に接地された電位域を複数形成することを特徴
とするミリ波帯半導体用回路基板である。
SUMMARY OF THE INVENTION The present invention has been made for the purpose of solving the above-mentioned problems, and the invention according to claim 1 is a dielectric circuit board on which a millimeter-wave band semiconductor device is mounted. Then, a plurality of annularly grounded potential regions are formed by via holes made of a conductive material that connect at least the ground potential pattern on the surface on which the millimeter-wave band semiconductor element is mounted and the ground potential pattern on the back surface of the surface. A circuit board for a millimeter-wave band semiconductor, characterized in that:

【0012】また、請求項2記載の発明は、前記請求項
1記載のミリ波帯半導体用回路基板において、前記環状
に接地された電位域を略矩形形状とし、当該矩形の短辺
の長さを実効波長の2分の1以下にすることを特徴とす
るミリ波帯半導体用回路基板である。
According to a second aspect of the present invention, in the millimeter wave band semiconductor circuit board according to the first aspect, the annularly grounded potential region has a substantially rectangular shape, and the length of the short side of the rectangle Is set to 以下 or less of the effective wavelength.

【0013】[0013]

【発明の実施の形態】以下、図をもとに本発明について
詳細に説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described in detail with reference to the drawings.

【0014】図1はビアホールにより誘電体部分を矩形
の環状に接地された電位域が分割された本発明のミリ波
帯半導体用回路基板の内、一例として60GHz帯での
特性検討を行った回路基板の表面回路パターンを示す概
略図である。図8はビアホールにより誘電体部分を矩形
の環状に接地された電位域の分割がない、従来のミリ波
帯半導体用回路基板の表面回路パターンの概略図であ
る。
FIG. 1 is a circuit diagram of an example of a millimeter-wave band semiconductor circuit board of the present invention in which a potential region in which a dielectric portion is grounded in a rectangular ring by a via hole is divided into 60-GHz bands. It is the schematic which shows the surface circuit pattern of a board | substrate. FIG. 8 is a schematic diagram of a surface circuit pattern of a conventional millimeter-wave band semiconductor circuit board in which there is no division of a potential region in which a dielectric portion is grounded in a rectangular ring shape by a via hole.

【0015】今回使用した誘電体回路基板は、一例とし
て材質がアルミナセラミックス、板厚が150μmであ
り、その比誘電率は約8.9である。また、この基板材
料を例えば60GHzの周波数で使用した場合の実効波
長は約2mmである。
The dielectric circuit board used this time is made of, for example, alumina ceramic, 150 μm in thickness, and has a relative dielectric constant of about 8.9. When this substrate material is used at a frequency of, for example, 60 GHz, the effective wavelength is about 2 mm.

【0016】従来の技術で説明した図7に記載の前記回
路基板の一方の面には、ミリ波帯半導体素子搭載用回路
パターン7a、7bが形成されている。回路パターン7
aはミリ波帯信号入出力用のパターンであり、回路パタ
ーン7bは接地電位用パターンである。ビアホール9の
直径は100μm、ビアホールのピッチは400乃至4
50μmであり、ビアホールにはタングステンペースト
が充填され、回路基板裏面の接地電位パターン(図示せ
ず)と接続されている。
A circuit pattern 7a, 7b for mounting a millimeter wave band semiconductor element is formed on one surface of the circuit board shown in FIG. 7 described in the prior art. Circuit pattern 7
a is a pattern for millimeter wave band signal input / output, and the circuit pattern 7b is a pattern for ground potential. The diameter of the via hole 9 is 100 μm, and the pitch of the via hole is 400 to 4
The via hole is filled with a tungsten paste, and is connected to a ground potential pattern (not shown) on the back surface of the circuit board.

【0017】図8の従来のミリ波帯半導体素子搭載用回
路パターンの概略図において、ビアホール列Aの寸法は
3.2mm、ビアホール列Bの寸法は2.2mmである
ことから、ビアホール9によって1ヶ所の矩形環状に接
地された電位域10が形成され、その寸法は3.2mm
×2.2mmである。
In the schematic diagram of the conventional millimeter wave band semiconductor element mounting circuit pattern shown in FIG. 8, the dimension of the via hole row A is 3.2 mm and the dimension of the via hole row B is 2.2 mm. A ground potential region 10 is formed in a rectangular ring shape at three places, and its size is 3.2 mm.
× 2.2 mm.

【0018】一方、図1の本発明のミリ波帯半導体素子
用回路基板の概略図において、ビアホール列A1の寸法
は0.91mm、ビアホール列A2の寸法は0.69m
m、ビアホール列Bの寸法は2.2mmであり、ビアホ
ール9によって4ヶ所の矩形環状に接地された電位域1
0が分割形成され、その寸法はそれぞれ0.91mm×
2.2mm(2ヶ所)、0.69mm×2.2mm(2
ヶ所)となる。
On the other hand, in the schematic diagram of the circuit board for a millimeter wave band semiconductor device of the present invention shown in FIG. 1, the dimension of the via hole row A1 is 0.91 mm, and the dimension of the via hole row A2 is 0.69 m.
m, the dimension of the via hole row B is 2.2 mm, and the potential region 1 is grounded into four rectangular rings by the via holes 9.
0 are formed separately, and their dimensions are 0.91 mm x
2.2 mm (2 places), 0.69 mm x 2.2 mm (2
Places).

【0019】前記2種類の回路基板に、図6、図7に記
載したものと同様に、回路形成面2のボンディングパッ
ド3上に、金からなる金属突起電極4を形成した2mm
×3mmのGaAsからなるミリ波帯半導体素子1をフ
リップチップボンディング法により熱圧着し作製した試
料の入出力特性を測定した。
6 and 7, a metal bump electrode 4 made of gold is formed on the bonding pad 3 on the circuit forming surface 2 in the same manner as that shown in FIGS.
The input / output characteristics of a sample manufactured by thermocompression bonding of a millimeter-wave band semiconductor device 1 made of GaAs of 3 mm by flip chip bonding were measured.

【0020】その結果、図8の従来のミリ波帯半導体用
回路基板では、約55GHz付近で共振による特性劣化
が確認され、60GHz帯での使用が困難である結果が
得られた。他方、図1の本発明のミリ波帯半導体用回路
基板では、同様の共振は63GHzで発生しており、6
0GHz帯での使用が十分可能であることが確認され
た。
As a result, in the conventional circuit board for millimeter wave band semiconductor shown in FIG. 8, characteristic deterioration due to resonance was confirmed at about 55 GHz, and it was difficult to use in the 60 GHz band. On the other hand, in the millimeter-wave band semiconductor circuit board of the present invention shown in FIG. 1, the same resonance occurs at 63 GHz.
It was confirmed that use in the 0 GHz band was sufficiently possible.

【0021】前記結果のみにとどまらず、本発明におけ
る他の一連の検討検討から、上記共振の発生周波数は、
ビアホール9によって形成される矩形環状に接地された
電位域10内で発生することが判明した。更に、矩形環
状に接地された電位域10の幾何学的寸法の内、短辺の
寸法が実効波長の2分の1以下となるように、複数に分
割形成することにより、使用周波数帯域内での共振の発
生を回避できることが明確となった。
Not only from the above results, but also from a series of other studies in the present invention, the frequency of occurrence of the resonance is
It has been found to occur in a potential region 10 grounded in a rectangular ring formed by the via hole 9. Furthermore, of the geometrical dimensions of the potential region 10 grounded in a rectangular ring, the short side is divided into a plurality of parts so that the dimension of the short side is equal to or less than half the effective wavelength. It has become clear that the occurrence of resonance can be avoided.

【0022】また、前記の矩形環状に接地された電位域
10は、その幾何学的な要件及び複数に分割する条件を
満たせば、その形状、分割方法は図1に特定されるもの
でない。
The shape and division method of the potential region 10 grounded in the form of a rectangular ring are not limited to those shown in FIG.

【0023】図2に3分割された矩形環状接地電位を有
する他のミリ波帯半導体素子搭載部の回路パターンを、
図3に2分割された矩形環状接地電位を有する他のミリ
波帯半導体素子搭載部の回路パターンを、図4に9分割
された矩形環状接地電位を有する他のミリ波帯半導体素
子搭載部の回路パターンを、図5に2分割された矩形環
状接地電位を有し、かつ接地電位パターンの一部が分断
された他のミリ波帯半導体素子搭載部の回路パターン
を、それぞれ示す。
FIG. 2 shows a circuit pattern of another millimeter-wave band semiconductor element mounting portion having a rectangular annular ground potential divided into three parts.
FIG. 3 shows a circuit pattern of another millimeter-wave band semiconductor element mounting portion having a rectangular annular ground potential divided into two parts, and FIG. 4 shows a circuit pattern of another millimeter wave band semiconductor element mounting part having a rectangular annular ground potential divided into nine parts. FIG. 5 shows a circuit pattern of another millimeter-wave band semiconductor element mounting portion having a rectangular annular ground potential and a part of the ground potential pattern divided into two circuit patterns.

【0024】また、図5のパターン分断部分に示すよう
にビアホールの一端が接地され、他端が開放された構造
であっても、同様の効果を発揮する。
The same effect can be obtained even in a structure in which one end of the via hole is grounded and the other end is open as shown in the pattern division part of FIG.

【0025】なお、本発明では矩形環状接地電位域を複
数設けたこと、つまり従来の矩形環状接地電位域を分割
したことが特徴であって、それ以外の部分については従
来と同様であるので、ここでは説明を割愛する。
It should be noted that the present invention is characterized in that a plurality of rectangular ring-shaped ground potential areas are provided, that is, the conventional rectangular ring-shaped ground potential area is divided, and the other parts are the same as the conventional one. The description is omitted here.

【0026】[0026]

【発明の効果】請求項1または2記載の発明によると、
ミリ波帯半導体素子が実装される面の接地電位パターン
と当該面の裏側面の接地電位パターンとを少なくとも接
続する導線性材料からなるビアホールによって形成され
る環状に接地された電位域の空間内で生じる共振の周波
数を使用周波数帯に影響のない周波数域まで上げること
が可能となるため、実装するミリ波帯半導体素子の特性
を劣化させることのないミリ波帯半導体装置を構成する
ことができる。
According to the first or second aspect of the present invention,
Within the space of the annularly grounded potential region formed by a via hole made of a conductive material that connects at least the ground potential pattern on the surface on which the millimeter-wave band semiconductor element is mounted and the ground potential pattern on the back surface of the surface. Since the frequency of the generated resonance can be increased to a frequency range that does not affect the operating frequency band, a millimeter-wave band semiconductor device that does not deteriorate the characteristics of the mounted millimeter-wave band semiconductor element can be configured.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明のミリ波帯半導体用回路基板のミリ波帯
半導体素子搭載部の回路パターンである。
FIG. 1 is a circuit pattern of a millimeter wave band semiconductor element mounting portion of a circuit board for a millimeter wave band semiconductor according to the present invention.

【図2】本発明の他のミリ波帯半導体用回路基板のミリ
波帯半導体素子搭載部の回路パターンである。
FIG. 2 is a circuit pattern of a millimeter wave band semiconductor element mounting portion of another millimeter wave band semiconductor circuit board of the present invention.

【図3】本発明の他のミリ波帯半導体用回路基板のミリ
波帯半導体素子搭載部の回路パターンである。
FIG. 3 is a circuit pattern of a millimeter wave band semiconductor element mounting portion of another circuit board for a millimeter wave band semiconductor according to the present invention.

【図4】本発明の他のミリ波帯半導体用回路基板のミリ
波帯半導体素子搭載部の回路パターンである。
FIG. 4 is a circuit pattern of a millimeter wave band semiconductor element mounting portion of another millimeter wave band semiconductor circuit board of the present invention.

【図5】本発明の他のミリ波帯半導体用回路基板のミリ
波帯半導体素子搭載部の回路パターンである。
FIG. 5 is a circuit pattern of a millimeter wave band semiconductor element mounting portion of another millimeter wave band semiconductor circuit board of the present invention.

【図6】フリップチップボンディング法によりミリ波帯
半導体素子を搭載するための回路パターンの模式図であ
る。
FIG. 6 is a schematic diagram of a circuit pattern for mounting a millimeter-wave band semiconductor device by a flip chip bonding method.

【図7】図6の回路パターンにミリ波帯半導体素子を搭
載した場合の誘電体回路基板のA−A’断面の模式図で
ある。
7 is a schematic view of a cross section taken along the line AA ′ of the dielectric circuit board when a millimeter-wave band semiconductor element is mounted on the circuit pattern of FIG. 6;

【図8】従来のミリ波帯半導体用回路基板のミリ波帯半
導体素子搭載部の回路パターンである。
FIG. 8 is a circuit pattern of a millimeter wave band semiconductor element mounting portion of a conventional circuit board for a millimeter wave band semiconductor.

【符号の説明】[Explanation of symbols]

1 ミリ波帯半導体素子 2 ミリ波帯回路形成面 3 ボンディングパッド 4 金属突起電極 5 誘電体回路基板 6 ミリ波帯半導体素子搭載面 7 回路パターン 7a 信号入出力用パターン 7b 接地電位パターン(ミリ波帯半導体素子搭載面
側) 8 接地電位パターン(ミリ波帯半導体素子搭載面の
反対面側) 9 ビアホール 10 矩形環状に接地された電位域
DESCRIPTION OF SYMBOLS 1 Millimeter wave band semiconductor element 2 Millimeter wave band circuit formation surface 3 Bonding pad 4 Metal bump electrode 5 Dielectric circuit board 6 Millimeter wave band semiconductor element mounting surface 7 Circuit pattern 7a Signal input / output pattern 7b Ground potential pattern (millimeter wave band 8 Ground potential pattern (opposite side of millimeter wave band semiconductor device mounting surface) 9 Via hole 10 Potential region grounded in a rectangular ring

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 ミリ波帯半導体素子が実装される誘電体
の回路基板であって、 ミリ波帯半導体素子が実装される面の接地電位パターン
と当該面の裏側面の接地電位パターンとを少なくとも接
続する導線性材料からなるビアホールによって、環状に
接地された電位域を複数形成することを特徴とするミリ
波帯半導体用回路基板。
1. A dielectric circuit board on which a millimeter-wave band semiconductor device is mounted, wherein at least a ground potential pattern on a surface on which the millimeter wave band semiconductor device is mounted and a ground potential pattern on a back surface of the surface are provided. A circuit board for a millimeter-wave band semiconductor, wherein a plurality of potential regions grounded annularly are formed by via holes made of a conductive material to be connected.
【請求項2】 前記請求項1記載のミリ波帯半導体用回
路基板において、 前記環状に接地された電位域を略矩形形状とし、当該矩
形の短辺の長さを実効波長の2分の1以下にすることを
特徴とするミリ波帯半導体用回路基板。
2. The circuit board for a millimeter-wave band semiconductor according to claim 1, wherein the annularly grounded potential region has a substantially rectangular shape, and a length of a short side of the rectangle is を of an effective wavelength. A circuit board for a millimeter-wave band semiconductor, characterized in that:
JP2696399A 1999-02-04 1999-02-04 Circuit board for millimeter wave semiconductor Pending JP2000223610A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2696399A JP2000223610A (en) 1999-02-04 1999-02-04 Circuit board for millimeter wave semiconductor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2696399A JP2000223610A (en) 1999-02-04 1999-02-04 Circuit board for millimeter wave semiconductor

Publications (1)

Publication Number Publication Date
JP2000223610A true JP2000223610A (en) 2000-08-11

Family

ID=12207823

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2696399A Pending JP2000223610A (en) 1999-02-04 1999-02-04 Circuit board for millimeter wave semiconductor

Country Status (1)

Country Link
JP (1) JP2000223610A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105041791A (en) * 2015-07-14 2015-11-11 苏州柏德纳科技有限公司 Connecting piece

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105041791A (en) * 2015-07-14 2015-11-11 苏州柏德纳科技有限公司 Connecting piece

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