JP2000205850A - Semiconductor element positioning device - Google Patents

Semiconductor element positioning device

Info

Publication number
JP2000205850A
JP2000205850A JP11010231A JP1023199A JP2000205850A JP 2000205850 A JP2000205850 A JP 2000205850A JP 11010231 A JP11010231 A JP 11010231A JP 1023199 A JP1023199 A JP 1023199A JP 2000205850 A JP2000205850 A JP 2000205850A
Authority
JP
Japan
Prior art keywords
semiconductor element
positioning
claws
pair
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11010231A
Other languages
Japanese (ja)
Other versions
JP4203568B2 (en
Inventor
Akashi Kumachi
証 熊地
Keizo Takeuchi
桂三 竹内
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dowa Holdings Co Ltd
Original Assignee
Dowa Mining Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dowa Mining Co Ltd filed Critical Dowa Mining Co Ltd
Priority to JP01023199A priority Critical patent/JP4203568B2/en
Publication of JP2000205850A publication Critical patent/JP2000205850A/en
Application granted granted Critical
Publication of JP4203568B2 publication Critical patent/JP4203568B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Die Bonding (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a device which can accurately position a semiconductor element without damaging by allowing an angular deviation though a simple constitution device. SOLUTION: A positioning device positions a semiconductor element (b) which is formed in a square shape in a top view to a prescribed position. The device is provided with a holding base 20 which holds an appropriate member (a) for placing the element (b) and a pair of pawls 18 and 19 which are constituted in such a way that the pawls 18 and 19 are brought closer to each other and separated from each other above the member (a) held by the base 20. On the front face of each pawl 18 and 19, recessed corners matching the pair of corner sections on the diagonal line of the element (b) placed on the member (a) are formed and straight line sections are respectively formed on both sides of the recessed corner section.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は,LED(ligh
t emitting diode;発光ダイオード)
チップ等の半導体素子を検査装置のステージや基板など
といった適当な部材に載置した状態で所定の位置に位置
決めする装置に関する。
The present invention relates to an LED (light)
emitting diode (light emitting diode)
The present invention relates to an apparatus for positioning a semiconductor element such as a chip at a predetermined position while being mounted on an appropriate member such as a stage or a substrate of an inspection apparatus.

【0002】[0002]

【従来の技術】例えばLEDチップ等の半導体素子は,
出荷前に半導体素子表面の端子に針状のプローブを押し
当てて通電し発光させ,光度や出力を測定する検査が行
われる。またこれら半導体素子をAgペースト等によっ
てリードフレームや基板などにダイボンドして,様々な
電子部品が製造される。このような検査やダイボンドを
行う場合には,通電や検査の正確さを維持するために,
検査装置のステージや基板などといった適当な部材に対
して半導体素子を高い精度で位置決めする必要がある。
2. Description of the Related Art Semiconductor devices such as LED chips, for example,
Before shipment, a needle-shaped probe is pressed against a terminal on the surface of the semiconductor element to conduct electricity to emit light, and an inspection for measuring luminous intensity and output is performed. Various electronic components are manufactured by die bonding these semiconductor elements to a lead frame, a substrate, or the like using an Ag paste or the like. When performing such inspections and die bonding, in order to maintain the current and the accuracy of the inspection,
It is necessary to position the semiconductor element with respect to an appropriate member such as a stage or a substrate of an inspection device with high accuracy.

【0003】従来このような半導体素子の位置決めは,
次の(1)〜(3)のようにして行われている。 (1)画像処理を用いた位置決め 即ち半導体素子を検査装置において位置決めする場合を
例にして説明すると,先ず作業者が位置決めステージ上
に位置と角度を合わせながら半導体素子を載置し,載置
された半導体素子をCCDカメラで撮影して位置を確認
し,画像処理によって位置ずれを補正する。そして,真
空吸着治具(コレット)で半導体素子を保持し,検査ス
テージへ半導体素子を搬送する。検査ステージでは,プ
ローブを半導体素子表面の端子に押し当てて通電発光さ
せ,光度や出力等を測定して検査する。検査を終了した
半導体素子をアンロード側の吸着コレットで次のステー
ジなどへ搬送する。
Conventionally, such positioning of a semiconductor element has been performed by:
This is performed as in the following (1) to (3). (1) Positioning Using Image Processing To describe an example in which a semiconductor element is positioned in an inspection apparatus, first, an operator places a semiconductor element on a positioning stage while adjusting the position and angle, and places the semiconductor element on the positioning stage. The position of the semiconductor device is checked by photographing the semiconductor device with a CCD camera, and the position shift is corrected by image processing. Then, the semiconductor element is held by a vacuum suction jig (collet), and the semiconductor element is transported to an inspection stage. In the inspection stage, the probe is pressed against the terminal on the surface of the semiconductor element to emit electricity, and the luminous intensity and the output are measured and inspected. After the inspection, the semiconductor element is transferred to the next stage or the like by the suction collet on the unloading side.

【0004】(2)図9に示す爪を用いた位置決め 即ち図9に示すように,検査ステージや基板などの部材
a上に半導体素子bを載置し,半導体素子bの対角線上
に位置する一対の角部b’,b’を,対向して配置され
た爪50,50によって両側から挟んで位置決めを行う
方法である。
(2) Positioning using nails shown in FIG. 9 That is, as shown in FIG. 9, a semiconductor element b is placed on a member a such as an inspection stage or a substrate, and is positioned on a diagonal line of the semiconductor element b. In this method, a pair of corners b ', b' is sandwiched from both sides by claws 50, 50 arranged opposite to each other for positioning.

【0005】(3)図10に示す爪を用いた位置決め 即ち図10に示すように,半導体素子bの背部にコーナ
ー状の押さえ60を配置し,2本の爪61,62で半導
体素子bを押さえ60に押しつけて位置決めを行う方法
である。
(3) Positioning using nails shown in FIG. 10 That is, as shown in FIG. 10, a corner-shaped holder 60 is arranged on the back of the semiconductor element b, and the semiconductor element b is held by two nails 61 and 62. This is a method of positioning by pressing against the presser 60.

【0006】[0006]

【発明が解決しようとする課題】しかしながらこれら
(1)〜(3)の位置決めは次のような問題があった。
即ち(1)の位置決めは,コレットで半導体素子を保持
する際や搬送中に機械誤差などによるずれが生じやす
い。またこの位置決めは,操作が複雑で搬送後は位置ず
れの補正ができない。また画像処理を用いているので,
画像処理装置自体が持つ精度や吸着するコレットの精度
に起因する位置ズレが発生する。更に画像処理をする際
に,背景と半導体素子の色の差がほとんど無くて半導体
素子の形状を精度良く認識するのは困難であり,電極も
丸形状のため,半導体素子の角度ずれを特定できない。
However, the positioning of these (1) to (3) has the following problems.
That is, in the positioning of (1), a shift due to a mechanical error or the like easily occurs when the semiconductor element is held by the collet or during transport. In addition, this positioning is complicated in operation, and it is not possible to correct the displacement after the transfer. Also, since image processing is used,
Position shift occurs due to the accuracy of the image processing apparatus itself and the accuracy of the collet to be sucked. Further, when performing image processing, it is difficult to accurately recognize the shape of the semiconductor element because there is almost no difference in color between the background and the semiconductor element, and since the electrodes are round, it is not possible to specify the angle shift of the semiconductor element. .

【0007】(2)の位置決めは,角度ずれを生じてい
る場合に位置決めすることが困難であり,半導体素子を
載置する際に角度ずれが生じないように正確な操作が要
求される。また(2)の位置決めと(3)の位置決め
は,いずれも角度のずれた半導体素子を押した場合に半
導体素子に損傷を与える心配がある。これは,爪同士や
爪と押さえとの間の挟みこみによるもので,爪の方が硬
いため半導体素子を押しすぎてしまうことに起因する。
またこれらの位置決めによると,爪の形状が固定されて
いるため,半導体素子の大きさが変更になった場合に対
応ができない。
In the positioning of (2), it is difficult to perform positioning when there is an angle shift, and an accurate operation is required so that the angle shift does not occur when the semiconductor element is mounted. In both of the positioning of (2) and the positioning of (3), there is a concern that the semiconductor element may be damaged when the semiconductor element whose angle is shifted is pushed. This is caused by pinching between the nails or between the nail and the presser, and is caused by pushing the semiconductor element too much because the nail is harder.
Further, according to these positionings, since the shape of the nail is fixed, it is impossible to cope with a change in the size of the semiconductor element.

【0008】本発明の目的は,簡単な構成でありながら
半導体素子を正確に位置決めすることができ,しかも角
度ずれを許容して破損無く半導体素子を位置決めできる
装置を提供することにある。
An object of the present invention is to provide a device which can accurately position a semiconductor element while having a simple structure, and can position the semiconductor element without damage by allowing an angle shift.

【0009】[0009]

【課題を解決するための手段】本発明者らはこの目的を
達成すべく,上記問題点(1)〜(3)について次のよ
うな検討を行った。即ち,画像処理などによって間接的
に位置を確認してから半導体素子を取りに行く方法は止
め,半導体素子をどのような位置に置いても所定の位置
に位置決めできる手段を検討した。また,実際にLED
チップを押して位置決めし,爪の先端の形状を種々変え
てLEDチップがどのような動きをするのかを模擬的に
検討した。その際,半導体素子の挙動上の不具合,半導
体素子の大きさの変更への対応,高さのバラツキへの対
応,製作コストなどを考慮し,爪の形状をなるべくシン
プルな形状にするよう努めた。また,基本的にCADで
絵を描いてのシュミレーションにより検討を行った。
Means for Solving the Problems In order to achieve this object, the present inventors have conducted the following studies on the above problems (1) to (3). That is, the method of indirectly confirming the position by image processing or the like and then picking up the semiconductor element is stopped, and means for positioning the semiconductor element at a predetermined position regardless of the position are examined. In addition, actually LED
The chip was positioned by pressing it, and the shape of the tip of the nail was changed in various ways to simulate the behavior of the LED chip. At that time, we tried to make the shape of the nail as simple as possible in consideration of the malfunction of the semiconductor element, the change in the size of the semiconductor element, the variation in height, the manufacturing cost, etc. . In addition, the study was basically conducted by simulation of drawing a picture by CAD.

【0010】しかして請求項1の発明にあっては,平面
視で方形に形成された半導体素子を所定の位置に位置決
めする,半導体素子の位置決め装置であって,半導体素
子を載置させるための適当な部材を保持する保持台と,
この保持台に保持された部材の上方において相対的に近
接・離隔移動自在に構成された一対の爪を備え,各爪の
前面には,部材に載置された半導体素子の対角線上に位
置する一対の角部に一致する凹角と,この凹角を挟んで
両側に配置された直線部がそれぞれ形成されていること
を特徴としている。
According to a first aspect of the present invention, there is provided a semiconductor device positioning device for positioning a semiconductor element formed in a rectangular shape in a plan view at a predetermined position. A holder for holding appropriate members,
A pair of claws are provided so as to be relatively movable toward and away from each other above the members held by the holding table, and are located on the front surface of each of the claws on a diagonal line of the semiconductor element mounted on the member. The present invention is characterized in that a reentrant angle corresponding to a pair of corners and straight portions disposed on both sides of the reentrant angle are formed.

【0011】この請求項1の位置決め装置において,先
ず保持台により,例えば検査装置のステージや基板など
といった適当な部材を保持する。そして,この保持台に
保持された部材の上に半導体素子を載置する。この場
合,予め爪同士を離隔移動させておく。
In the positioning device according to the first aspect, first, an appropriate member such as a stage or a substrate of an inspection device is held by the holding table. Then, the semiconductor element is mounted on the member held by the holding table. In this case, the claws are moved apart in advance.

【0012】次に,爪同士を近接移動させる。すると,
半導体素子が爪の前面で押されることにより適宜回転し
て,半導体素子の対角線上に位置する一対の角部が爪の
前面に形成された凹角にそれぞれ一致し,更に凹角を挟
んで両側に配置された直線部が半導体素子の側面にそれ
ぞれ密着し,こうして,半導体素子は部材上において所
定の位置に位置決めされることとなる。
Next, the claws are moved close to each other. Then
The semiconductor element is appropriately rotated by being pushed on the front surface of the nail, and a pair of corners located on a diagonal line of the semiconductor element respectively correspond to the concave angles formed on the front surface of the nail, and further disposed on both sides of the concave angle. The straight portions thus formed adhere to the side surfaces of the semiconductor element, and the semiconductor element is positioned at a predetermined position on the member.

【0013】この請求項1の位置決め装置において,請
求項2に記載したように,前記直線部の長さが,平面視
において前記半導体素子の外周によって示される方形の
一片の長さよりも長いことが好ましい。そうすれば爪前
面の直線部を半導体素子の側面の全長に渡って密着させ
て押すことができ,半導体素子を破損させる心配が少な
く,また部材上に載置された半導体素子の位置決めを広
く補正でき,正確に位置決めできるようになる。
[0013] In the positioning device of the first aspect, as described in the second aspect, the length of the linear portion is longer than a length of a rectangular piece indicated by the outer periphery of the semiconductor element in a plan view. preferable. By doing so, the straight portion on the front surface of the nail can be pressed in close contact with the entire length of the side surface of the semiconductor element, reducing the risk of damage to the semiconductor element and widely correcting the positioning of the semiconductor element placed on the member. Can be accurately positioned.

【0014】また請求項3に記載したように,前記一対
の爪の間で半導体素子を位置決めした際に,爪同士の相
対的な近接移動を終了させるストッパーを設けても良
い。そうすれば爪同士の間での押しすぎを防止でき,半
導体素子の破損をより確実に防ぐことができるようにな
る。
According to a third aspect of the present invention, when the semiconductor element is positioned between the pair of claws, a stopper for terminating the relative movement of the claws may be provided. By doing so, it is possible to prevent excessive pushing between the claws, and it is possible to more reliably prevent damage to the semiconductor element.

【0015】また請求項4に記載したように,部材の上
に載置される半導体素子は例えばLEDチップなどであ
り,その形状は平面視で300〜500μm角の微少な
方形をなしている。
Further, as described in claim 4, the semiconductor element mounted on the member is, for example, an LED chip or the like, and has a small rectangular shape of 300 to 500 μm square in plan view.

【0016】[0016]

【発明の実施の形態】以下,本発明の好ましい実施の形
態を図面を用いて説明する。図1は本発明の実施の形態
にかかる位置決め装置1の正面図であり,図2は同じ位
置決め装置1の平面図である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Preferred embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a front view of a positioning device 1 according to an embodiment of the present invention, and FIG. 2 is a plan view of the same positioning device 1.

【0017】支持プレート10の上面には一対のガイド
11,11が設けられており,このガイド11,11に
沿ってスライド移動自在な一対のフレーム12,13が
設けられている。これらフレーム12,13には,上方
において互いに内側に折れ曲がるように形成された鈎型
の支柱15,16がそれぞれ固定されている。また,こ
れら支柱15,16の先端には,爪18と爪19が取り
付けられており,これら爪18と爪19が互いに向かい
合うように配置されている。
A pair of guides 11, 11 are provided on the upper surface of the support plate 10, and a pair of frames 12, 13 slidable along the guides 11, 11 are provided. Hook-shaped columns 15, 16 formed so as to bend inwardly from each other are fixed to the frames 12, 13, respectively. In addition, claws 18 and claws 19 are attached to the tips of the struts 15 and 16, and the claws 18 and claws 19 are arranged so as to face each other.

【0018】支持プレート10の上面に設けられた一対
のガイド11,11の間には,例えば検査装置のステー
ジや基板などといった適当な部材aを保持するための保
持台20が設けられている。この保持台20に部材aを
保持した際には,爪18と爪19が部材aの上方に位置
するようになっている。
Between the pair of guides 11 provided on the upper surface of the support plate 10, there is provided a holding table 20 for holding an appropriate member a such as, for example, a stage or a substrate of an inspection apparatus. When the member a is held on the holding base 20, the claw 18 and the claw 19 are positioned above the member a.

【0019】支持プレート10の中央上方には軸受け2
3,24によって回転自在に支持された回転軸25が設
けられている。この回転軸25の一端には,ダンパ27
を備えたモータ28の駆動軸29がカップリング30を
介して接続され,モータ28の稼働により,回転軸25
は正逆回転するようになっている。モータ28はサーボ
モータで構成され,その回転量を制御することが可能で
ある。
The bearing 2 is located above the center of the support plate 10.
A rotation shaft 25 rotatably supported by 3, 24 is provided. A damper 27 is provided at one end of the rotating shaft 25.
A drive shaft 29 of a motor 28 having a rotation shaft 25 is connected via a coupling 30, and the rotation of the rotation shaft 25
Rotates forward and backward. The motor 28 is composed of a servo motor, and can control the amount of rotation.

【0020】回転軸25の周面には,互いに逆向きなネ
ジ部35,36が形成されており,回転軸25は,ネジ
部35において支柱15を貫通し,ネジ部36において
支柱16を貫通している。支柱15にはネジ部35に螺
合するボールナット38が固定されており,支柱16に
はネジ部36に螺合するボールナット39が固定されて
いる。これにより,モータ28の正逆回転稼働によって
支柱15と支柱16がガイド11に沿って互いに逆方向
に移動して,支柱15,16先端の爪18と爪19が互
いに近づいたり,離れたりするようになっている。な
お,保持台20には回転軸25を貫通させるのに十分な
孔(図示せず)が形成されている。
On the peripheral surface of the rotating shaft 25, screw portions 35 and 36 which are opposite to each other are formed, and the rotating shaft 25 penetrates the support post 15 at the screw portion 35 and the support post 16 at the screw portion 36. are doing. A ball nut 38 screwed to the screw portion 35 is fixed to the support 15, and a ball nut 39 screwed to the screw portion 36 is fixed to the support 16. Thus, the support 15 and the support 16 are moved in the opposite directions along the guide 11 by the forward and reverse rotation operation of the motor 28, and the claws 18 and 19 at the tips of the supports 15 and 16 approach and separate from each other. It has become. The holding base 20 has a hole (not shown) sufficient to allow the rotation shaft 25 to pass therethrough.

【0021】後に説明するように,保持台20に保持さ
れた部材aには半導体素子bが載置されるが,この半導
体素子bは,例えばLEDチップなどであり,その形状
は平面視で300〜500μm角の微少な方形をなして
いる。
As will be described later, a semiconductor element b is mounted on the member a held by the holding table 20. The semiconductor element b is, for example, an LED chip and has a shape of 300 mm in plan view. It is in the form of a small square of about 500 μm square.

【0022】図3は爪18の先端を拡大して示した斜視
図である。爪18の先端はほぼ上半分を削り取った形状
をなし,爪18の前面(爪19と向き合う内側面)の中
央には,凹角40が形成されている。この凹角40の角
度は,平面視で方形をなす半導体素子bの隅角部に等し
く90゜である。またこの凹角40を挟んで両側には直
線部41,41がそれぞれ形成されている。これら直線
部41,41の長さは,平面視において半導体素子bの
外周によって示される方形の一片の長さ(300〜50
0μm)よりも十分に長くなっている。
FIG. 3 is an enlarged perspective view of the tip of the claw 18. The tip of the claw 18 has a shape obtained by removing substantially the upper half thereof, and a concave angle 40 is formed at the center of the front surface of the claw 18 (the inner surface facing the claw 19). The angle of the reentrant angle 40 is equal to the corner of the semiconductor element b which is rectangular in plan view, and is 90 °. Straight portions 41, 41 are formed on both sides of the reentrant angle 40, respectively. The length of each of the straight portions 41 is equal to the length of a square (300 to 50) indicated by the outer periphery of the semiconductor element b in plan view.
0 μm).

【0023】図4は爪19の先端を拡大して示した斜視
図であり,図5は爪19の先端を下側から見た状態で拡
大して示した斜視図である。爪19の先端はほぼ下半分
を削り取った形状をなし,爪19の前面(爪18と向き
合う内側面)の中央には,凹角45が形成されている。
この凹角45の角度も,平面視で方形をなす半導体素子
bの隅角部に等しく90゜である。凹角45を挟んで両
側に形成された直線部46,46の長さは,平面視にお
いて半導体素子bの外周によって示される方形の一片の
長さ(300〜500μm)よりも十分に長い。
FIG. 4 is an enlarged perspective view of the tip of the nail 19, and FIG. 5 is an enlarged perspective view of the tip of the nail 19 as viewed from below. The tip of the claw 19 has a shape in which the lower half is cut off, and a concave angle 45 is formed at the center of the front surface of the claw 19 (the inner side surface facing the claw 18).
The angle of the reentrant angle 45 is also equal to the corner of the semiconductor element b which is rectangular in plan view, and is 90 °. The length of the straight portions 46, 46 formed on both sides of the reentrant angle 45 is sufficiently longer than the length of one square (300 to 500 μm) indicated by the outer periphery of the semiconductor element b in plan view.

【0024】図5に示されるように,爪19の下面に
は,凹角45の中心より前方に少し離れた位置から形成
された一対のストッパー面47,47が設けられてい
る。これらストッパー面47,47の互いになす角度も
90゜であり,後に説明するように,爪18と爪19を
互いに近づけた際には,これらストッパー面47,47
が爪18の前面において凹角40の両側に形成された直
線部41,41にそれぞれ当接して,爪18と爪19の
移動を停止させるようになっている。
As shown in FIG. 5, on the lower surface of the claw 19, a pair of stopper surfaces 47, 47 formed from a position slightly forward of the center of the reentrant angle 45 are provided. The angle between these stopper surfaces 47, 47 is also 90 °, and as will be described later, when the claws 18 and 19 are brought closer to each other, the stopper surfaces 47, 47
Abut on the straight portions 41, 41 formed on both sides of the reentrant angle 40 on the front surface of the claw 18, respectively, to stop the movement of the claw 18 and the claw 19.

【0025】さて以上のように構成された位置決め装置
1において,先ず保持台20により,例えば検査装置の
ステージや基板などといった適当な部材aを保持する。
そして,この保持台20に保持された部材aの上に半導
体素子bを載置する。なお,このように半導体素子bを
載置する場合は,予めモータ28の稼働によって支柱1
5と支柱16を移動させて,支柱15,16先端の爪1
8と爪19を互いに離しておことにより,図6に示すよ
うに,爪18の前面と爪19の前面との間に十分なスペ
ースを形成しておき,その形成されたスペースにおいて
部材aの上に半導体素子bを載置する。
In the positioning device 1 constructed as described above, first, the holding member 20 holds an appropriate member a such as a stage or a substrate of an inspection device.
Then, the semiconductor element b is placed on the member a held by the holding table 20. When the semiconductor element b is mounted as described above, the support 1 is previously operated by operating the motor 28.
5 and the support 16 are moved, and the claw 1 at the end of the support 15, 16 is moved.
By separating the claws 8 and the claws 19 from each other, a sufficient space is formed between the front surface of the claws 18 and the front surface of the claws 19, as shown in FIG. The semiconductor element b is mounted thereon.

【0026】次に,モータ28の稼働によって支柱15
と支柱16を移動させて,支柱15,16先端の爪18
と爪19を互いに近付けていく。この場合,先に図3で
説明したように爪18の先端はほぼ上半分を削り取った
形状をなし,また先に図4で説明したように爪19の先
端はほぼ下半分を削り取った形状をなしているので,爪
18の先端と爪19の先端はぶつかることが無く,爪1
8の先端が爪19の先端の下側に進入するように移動し
ていく。そして,このように爪18と爪19を互いに近
付けていく途中で,半導体素子bは爪18や爪19の前
面で押されることにより部材a上において適宜回転し,
半導体素子bは部材a上の所定の位置(例えば部材aの
中心)に次第に位置決めされていく。
Next, the operation of the motor 28 causes the support 15 to move.
And the support 16 are moved, and the claws 18 at the tips of the supports 15 and 16 are moved.
And the claws 19 approach each other. In this case, as shown in FIG. 3, the tip of the claw 18 has a shape in which almost the upper half has been cut off, and as shown in FIG. 4, the tip of the claw 19 has a shape in which the lower half has been cut out. Since the tip of the nail 18 does not collide with the tip of the nail 19, the nail 1
8 moves so that the tip of 8 enters under the tip of the nail 19. While the claws 18 and the claws 19 are approaching each other, the semiconductor element b is appropriately rotated on the member a by being pushed on the front surface of the claws 18 and the claws 19,
The semiconductor element b is gradually positioned at a predetermined position on the member a (for example, at the center of the member a).

【0027】この場合,先に説明したように,爪18前
面の直線部41,41や爪19前面の直線部46,46
の長さは,平面視において半導体素子bの外周によって
示される方形の一片の長さ(300〜500μm)より
も十分に長いので,半導体素子bの側面を全長に渡って
押すことができ,半導体素子bを破損させる心配が少な
い。また部材a上に載置された半導体素子bの位置ずれ
を広く許容でき,正確な位置決めが可能である。
In this case, as described above, the linear portions 41, 41 on the front surface of the claw 18 and the linear portions 46, 46 on the front surface of the claw 19, as described above.
Is sufficiently longer than the length of a rectangular piece (300 to 500 μm) indicated by the outer periphery of the semiconductor element b in plan view, so that the side surface of the semiconductor element b can be pushed over the entire length, There is little fear of damaging the element b. In addition, the position shift of the semiconductor element b mounted on the member a can be widely tolerated, and accurate positioning can be performed.

【0028】そして,図7に示すように,爪18の前面
と爪19の前面との間で半導体素子bを両側から挟むこ
とにより,位置決めが終了する。このように位置決めが
終了した際には,半導体素子bの対角線上に位置する一
対の角部が,爪18の前面に形成された凹角40と爪1
9の前面に形成された凹角45にそれぞれ一致し,爪1
8前面の直線部41,41と爪19前面の直線部46,
46が半導体素子bの側面にそれぞれ密着して,半導体
素子bの側面全体を四方から包み込むことができる。
Then, as shown in FIG. 7, the positioning is completed by sandwiching the semiconductor element b from both sides between the front surface of the nail 18 and the front surface of the nail 19. When the positioning is completed in this manner, a pair of corners located on a diagonal line of the semiconductor element b is formed with the concave corner 40 formed on the front surface of the nail 18 and the nail 1.
9 correspond to the concave angles 45 formed on the front surface of the
8, the straight portions 41, 41 on the front and the straight portions 46 on the front of the claw 19,
46 are in close contact with the side surfaces of the semiconductor element b, respectively, and can wrap the entire side surface of the semiconductor element b from all sides.

【0029】また,このように位置決めが終了した際に
は,先に図5等で説明した爪19の下面に設けられたス
トッパー面47,47が爪18前面の直線部41,41
にそれぞれ当接して,爪18と爪19の移動を停止させ
るので,爪18,19同士の間での押しすぎを防止で
き,半導体素子bの破損をより確実に防ぐことが可能で
ある。
When the positioning is completed as described above, the stopper surfaces 47, 47 provided on the lower surface of the claw 19 described above with reference to FIG.
To stop the movement of the claws 18 and 19, it is possible to prevent the claws 18 and 19 from being excessively pushed, and to more reliably prevent the semiconductor element b from being damaged.

【0030】次に,モータ28の稼働によって支柱15
と支柱16を移動させ,図8に示すように,爪18と爪
19を再び離す。こうして,部材a上において所定の位
置に位置決めされ前述の吸着機構により吸着された半導
体素子bに対し,例えばプローバを接触させることによ
り,検査等を行う。
Next, the operation of the motor 28 causes the support 15 to move.
Then, the support 16 is moved, and the claws 18 and 19 are separated again as shown in FIG. In this way, for example, inspection is performed by bringing a prober into contact with the semiconductor element b positioned at a predetermined position on the member a and suctioned by the suction mechanism described above.

【0031】以上,本発明の好ましい実施の形態の一例
を説明したが,本発明はここで説明した形態に限定され
ない。例えば本発明の位置決め装置は,LEDチップに
限らず他の半導体素子bの位置決めにも適用できる。ま
た半導体素子bの大きさの変更に対しては,モータ28
の稼働量をパルス数で制御して,適当な時期に爪18,
19の移動を停止し,半導体素子bを破損しないように
設定することが可能である。また,爪18,19の高さ
や爪18,19の移動速度を適宜変更することにより,
半導体素子bの高さのバラツキにも対応でき,位置決め
の際の半導体素子bの倒れも防止できる。なお,モータ
28はACサーボモーターを使用することでパルス数を
細かく設定でき,爪18,19の移動ピッチ(回転軸2
5の1回転当たりで何mm進むか)は,なるべく細かい
ものを選定すると良い。そうすれば,チップサイズの任
意の大きさに対して最も適したパルス数を設定すること
により,半導体素子bの押しすぎを回避できる。また本
発明は検査装置のステージ上においての位置決めの他,
例えば基板上に半導体素子bをダイボンドする際の位置
決めなどにも適用できる。
Although the preferred embodiment of the present invention has been described above, the present invention is not limited to the above-described embodiment. For example, the positioning device of the present invention can be applied not only to the LED chip but also to the positioning of another semiconductor element b. Further, when the size of the semiconductor element b is changed, the motor 28
The amount of operation is controlled by the number of pulses, and the nails 18 and
It is possible to stop the movement of 19 and set so as not to damage the semiconductor element b. Also, by appropriately changing the height of the claws 18 and 19 and the moving speed of the claws 18 and 19,
The height variation of the semiconductor element b can be coped with, and the semiconductor element b can be prevented from falling down at the time of positioning. The number of pulses can be finely set by using an AC servomotor for the motor 28, and the movement pitch of the claws 18 and 19 (rotation axis 2
(How many millimeters advance per rotation of 5) should be selected as fine as possible. Then, by setting the number of pulses most suitable for an arbitrary chip size, it is possible to avoid excessive pressing of the semiconductor element b. In addition to the present invention, in addition to positioning on the stage of the inspection apparatus,
For example, the present invention can also be applied to positioning when a semiconductor element b is die-bonded on a substrate.

【0032】[0032]

【実施例】本発明の位置決め装置を実際に製作して,L
EDチップの光度,出力を測定する検査装置の検査ステ
ージにおいてLEDチップを位置決めした。必要位置決
め精度は,ニードル(プローブ)とチップ中心のずれが
±25μmまでであったところ,実施例では爪の移動は
2μm単位で調整可能であり,更に繰返し精度は±0.
023μmで再現可能であり,必要位置決め精度を十分
に満足できた。また,角度ずれに対しても問題なく位置
決めできた。更に,LEDチップの品種が変更しても,
現在の6種類のサイズに問題なく対応できた。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A positioning device of the present invention is actually manufactured and
The LED chip was positioned on the inspection stage of the inspection device for measuring the luminous intensity and output of the ED chip. The required positioning accuracy is such that the displacement between the needle (probe) and the center of the tip is up to ± 25 μm.
It was reproducible at 023 μm, and the required positioning accuracy was sufficiently satisfied. In addition, positioning was able to be performed without any problem even for angular deviation. Furthermore, even if the type of LED chip changes,
It was able to cope with the current six sizes without any problems.

【0033】[0033]

【発明の効果】請求項1〜4の発明によれば,検査装置
のステージや基板などといった適当な部材に対して半導
体素子を高い精度で位置決めすることが可能である。ま
た装置構成も簡単でありながら角度ずれを許容して破損
無く半導体素子を位置決めできる。
According to the first to fourth aspects of the present invention, it is possible to position a semiconductor element with high accuracy with respect to an appropriate member such as a stage or a substrate of an inspection apparatus. In addition, the semiconductor device can be positioned without damage by permitting an angle shift while the device configuration is simple.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施の形態にかかる位置決め装置の正
面図である。
FIG. 1 is a front view of a positioning device according to an embodiment of the present invention.

【図2】本発明の実施の形態にかかる位置決め装置の平
面図である。
FIG. 2 is a plan view of the positioning device according to the embodiment of the present invention.

【図3】爪の先端を拡大して示した斜視図である。FIG. 3 is an enlarged perspective view showing a tip of a nail.

【図4】爪の先端を拡大して示した斜視図である。FIG. 4 is an enlarged perspective view showing a tip of a nail.

【図5】爪の先端を下側から見た状態で拡大して示した
斜視図である。
FIG. 5 is an enlarged perspective view showing the tip of the nail as viewed from below.

【図6】爪の間に形成されたスペースにおいて部材の上
に半導体素子を載置した状態の説明図である。
FIG. 6 is an explanatory diagram of a state where a semiconductor element is mounted on a member in a space formed between claws.

【図7】爪の間で半導体素子を両側から挟むことによ
り,位置決めが終了した状態の説明図である。
FIG. 7 is an explanatory diagram of a state where positioning is completed by sandwiching a semiconductor element between claws from both sides.

【図8】位置決め終了後,爪同士を再び離した状態の説
明図である。
FIG. 8 is an explanatory diagram of a state in which claws are separated from each other after positioning is completed.

【図9】従来技術の説明図である。FIG. 9 is an explanatory diagram of a conventional technique.

【図10】他の従来技術の説明図である。FIG. 10 is an explanatory diagram of another conventional technique.

【符号の説明】[Explanation of symbols]

a 部材 b 半導体素子 1 位置決め装置 10 支持プレート 11 ガイド11 12,13 フレーム 15,16 支柱 18,19 爪 20 保持台20 23,24 軸受け 25 回転軸 27 ダンパ 28 モータ 29 駆動軸 30 カップリング 35,36 ネジ部 38,39 ボールナット 40 凹角 41 直線部 45 凹角 46 直線部 47 ストッパー面 Reference Signs List a member b semiconductor element 1 positioning device 10 support plate 11 guide 11 12, 13 frame 15, 16 support column 18, 19 claw 20 holding table 20 23, 24 bearing 25 rotation axis 27 damper 28 motor 29 drive shaft 30 coupling 35, 36 Screw part 38, 39 Ball nut 40 Concave angle 41 Linear part 45 Concave angle 46 Linear part 47 Stopper surface

───────────────────────────────────────────────────── フロントページの続き Fターム(参考) 2F069 AA12 BB13 CC06 DD12 DD25 GG01 JJ04 MM01 MM17 MM31 PP02 5F047 CA08 FA17  ──────────────────────────────────────────────────続 き Continued on the front page F term (reference) 2F069 AA12 BB13 CC06 DD12 DD25 GG01 JJ04 MM01 MM17 MM31 PP02 5F047 CA08 FA17

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 平面視で方形に形成された半導体素子を
所定の位置に位置決めする装置であって,半導体素子を
載置させるための適当な部材を保持する保持台と,この
保持台に保持された部材の上方において相対的に近接・
離隔移動自在に構成された一対の爪を備え,各爪の前面
には,部材に載置された半導体素子の対角線上に位置す
る一対の角部に一致する凹角と,この凹角を挟んで両側
に配置された直線部がそれぞれ形成されていることを特
徴とする,半導体素子の位置決め装置。
An apparatus for positioning a semiconductor element formed in a rectangular shape in a plan view at a predetermined position, comprising: a holding table for holding an appropriate member for mounting the semiconductor element; and a holding table for holding the member. Relatively close above the
A pair of pawls configured to be movable apart from each other is provided. On the front surface of each pawl, a concave angle corresponding to a pair of corners located on a diagonal line of the semiconductor element mounted on the member, and both sides sandwiching the concave angle A linear device arranged on a semiconductor device is formed.
【請求項2】 前記直線部の長さが,平面視において前
記半導体素子の外周によって示される方形の一片の長さ
よりも長いことを特徴とする,請求項1に記載の半導体
素子の位置決め装置。
2. The semiconductor device positioning device according to claim 1, wherein the length of the linear portion is longer than a length of a rectangular piece indicated by an outer periphery of the semiconductor device in plan view.
【請求項3】 前記一対の爪の間で半導体素子を位置決
めした際に,爪同士の相対的な近接移動を終了させるス
トッパーを設けたことを特徴とする,請求項1又は2に
記載の半導体素子の位置決め装置。
3. The semiconductor device according to claim 1, further comprising a stopper for terminating relative movement between the claws when the semiconductor element is positioned between the pair of claws. Device positioning device.
【請求項4】 前記半導体素子はLEDチップであるこ
とを特徴とする,請求項1,2又は3のいずれかに記載
の半導体素子の位置決め装置。
4. The apparatus according to claim 1, wherein the semiconductor element is an LED chip.
JP01023199A 1999-01-19 1999-01-19 Semiconductor device positioning device Expired - Lifetime JP4203568B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP01023199A JP4203568B2 (en) 1999-01-19 1999-01-19 Semiconductor device positioning device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP01023199A JP4203568B2 (en) 1999-01-19 1999-01-19 Semiconductor device positioning device

Publications (2)

Publication Number Publication Date
JP2000205850A true JP2000205850A (en) 2000-07-28
JP4203568B2 JP4203568B2 (en) 2009-01-07

Family

ID=11744528

Family Applications (1)

Application Number Title Priority Date Filing Date
JP01023199A Expired - Lifetime JP4203568B2 (en) 1999-01-19 1999-01-19 Semiconductor device positioning device

Country Status (1)

Country Link
JP (1) JP4203568B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20160129445A (en) * 2015-04-30 2016-11-09 미노스 주식회사 an align apparatus of object

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20160129445A (en) * 2015-04-30 2016-11-09 미노스 주식회사 an align apparatus of object
KR101694776B1 (en) 2015-04-30 2017-01-10 미노스 주식회사 an align apparatus of object

Also Published As

Publication number Publication date
JP4203568B2 (en) 2009-01-07

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