JP2000172420A - Pressure-sensitive resistance film digitizer circuit constant estimating method - Google Patents

Pressure-sensitive resistance film digitizer circuit constant estimating method

Info

Publication number
JP2000172420A
JP2000172420A JP6871599A JP6871599A JP2000172420A JP 2000172420 A JP2000172420 A JP 2000172420A JP 6871599 A JP6871599 A JP 6871599A JP 6871599 A JP6871599 A JP 6871599A JP 2000172420 A JP2000172420 A JP 2000172420A
Authority
JP
Japan
Prior art keywords
film
resistive film
digitizer
circuit
resistance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6871599A
Other languages
Japanese (ja)
Other versions
JP3519977B2 (en
Inventor
Makoto Kanekawa
誠 金川
Mitsuru Katayanagi
満 片柳
Shinsuke Moriai
真介 盛合
Takashi Baba
隆 馬場
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Original Assignee
Sanyo Electric Co Ltd
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Filing date
Publication date
Application filed by Sanyo Electric Co Ltd filed Critical Sanyo Electric Co Ltd
Priority to JP06871599A priority Critical patent/JP3519977B2/en
Publication of JP2000172420A publication Critical patent/JP2000172420A/en
Application granted granted Critical
Publication of JP3519977B2 publication Critical patent/JP3519977B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To provide the method for finding an index indicating dynamic characteristics of a pressure-sensitive resistance film digitizer in two-layered structure. SOLUTION: The pressure-sensitive resistance film digitizer in two-layered structure is regarded as an equivalent circuit of a main resistor 204a, a 2nd resistor 202, and inter-film capacitors 211 and 212 between the main and 2nd resistor; and step response is observed by applying a ground-level potential (0 V) to one terminal 206 and a step input to the other terminal 205 through the resistance and compared with the logically calculated value to estimate the circuit constant.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、抵抗膜感圧式デジ
タイザの評価方法に関し、特に抵抗膜感圧式デジタイザ
の回路定数を推定する方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of evaluating a resistive digitizer, and more particularly to a method of estimating a circuit constant of a resistive digitizer.

【0002】[0002]

【従来の技術】図1に示す様に、抵抗膜感圧式デジタイ
ザ100は、ガラスやフィルムにより形成されるベース
101と、ベース101の上層に設けられる導電膜10
2と、導電膜102の上層に設けられる絶縁膜103
と、絶縁膜103の上層に設けられる座標検出に係わる
主抵抗膜104と、主抵抗膜104の両端に配した電極
105、106とを積層形成して構成する場合があり、
この構成は電気的特性や光学的特性(透光性)に優れて
いる。
2. Description of the Related Art As shown in FIG. 1, a resistive film pressure-sensitive digitizer 100 includes a base 101 made of glass or a film, and a conductive film 10 provided on the base 101.
2 and an insulating film 103 provided over the conductive film 102
And a main resistance film 104 provided on an upper layer of the insulating film 103 and related to coordinate detection, and electrodes 105 and 106 disposed at both ends of the main resistance film 104.
This configuration is excellent in electrical characteristics and optical characteristics (light transmission).

【0003】一般に抵抗膜感圧式デジタイザの特性を表
す指標としては、抵抗膜のリニアリティや電極間抵抗
値、抵抗膜間絶縁抵抗値、抵抗膜間容量値等がある。現
在市販されている抵抗膜感圧式デジタイザは、ペン荷重
を長い時間かけ、測定値が十分安定したところを検出す
る所謂静的な特性の測定方法を用いて動作確認を行い、
その測定結果を公表している。従って、デジタイザを用
いたシステム設計を行う場合、前記静的特性の測定方法
で測定した公表値を参考にし乍ら設計を行っている。
In general, indexes indicating the characteristics of a resistive film digitizer include a linearity of a resistive film, a resistance value between electrodes, an insulation resistance value between resistive films, a capacitance value between resistive films, and the like. The resistance film pressure-sensitive digitizers currently on the market use a so-called static characteristic measurement method that detects the place where the measured value is sufficiently stable by applying a pen load for a long time, and confirms the operation.
The measurement results are published. Therefore, when designing a system using a digitizer, the design is performed with reference to the published values measured by the method for measuring static characteristics.

【0004】デジタイザのサンプリング速度等、高速動
作を必要としないシステム設計を行った場合には前述静
的特性の測定方法のみで動作確認されたデジタイザを使
用しても十分対応できるが、デジタイザのサンプリング
速度や動作速度を速くする必要がある場合には、2層構
造のデジタイザ100では、第1の抵抗膜である主抵抗
膜104と第2の抵抗膜である導電膜102と間のコン
デンサ成分が影響し、デジタイザを高速で動作させた場
合に、入力に対する出力の応答性が遅く正確な座標値が
得られないものが存在する。
When a system design that does not require high-speed operation, such as the digitizer sampling speed, is designed, a digitizer whose operation has been confirmed only by the above-described static characteristic measurement method can be sufficiently used. When it is necessary to increase the speed or operation speed, in the digitizer 100 having the two-layer structure, the capacitor component between the main resistance film 104 as the first resistance film and the conductive film 102 as the second resistance film is reduced. In some cases, when the digitizer is operated at high speed, the response of the output to the input is slow and an accurate coordinate value cannot be obtained.

【0005】従って、デジタイザを用いたシステム設計
を行う場合には、当該デジタイザが高速動作にも対応で
きるデジタイザか否かを知る必要がある。よって、ペン
荷重を一瞬しか与えない場合等、高速動作した時の応答
速度等を検出する、所謂動的な特性を表す指標が必要と
なる。
Therefore, when designing a system using a digitizer, it is necessary to know whether or not the digitizer is a digitizer that can cope with high-speed operation. Therefore, in the case where the pen load is applied only for a moment, for example, an index representing a so-called dynamic characteristic for detecting a response speed at the time of high-speed operation is required.

【0006】[0006]

【発明が解決しようとする課題】本発明は、2層構造の
抵抗膜感圧式デジタイザの動的な特性を表す指標を求め
る方法を提供することを目的とする。
SUMMARY OF THE INVENTION It is an object of the present invention to provide a method for obtaining an index representing dynamic characteristics of a two-layer resistive pressure-sensitive digitizer.

【0007】[0007]

【課題を解決するための手段】本発明では、請求項1
は、主抵抗膜の下に絶縁膜を介して第2抵抗膜を有する
2層構造抵抗膜感圧式デジタイザの回路定数推定方法に
於いて、前記2層構造抵抗膜感圧式デジタイザに等価回
路をあてはめ、該等価回路に基づき2層構造抵抗膜感圧
式デジタイザの回路定数を推定することを特徴とする。
According to the present invention, claim 1 is provided.
In the method for estimating the circuit constant of a two-layer resistive film pressure-sensitive digitizer having a second resistive film with an insulating film below a main resistive film, an equivalent circuit is applied to the two-layer resistive film pressure-sensitive digitizer. The circuit constant of the two-layer resistive film pressure-sensitive digitizer is estimated based on the equivalent circuit.

【0008】請求項2は、主抵抗膜の下に絶縁膜を介し
て第2抵抗膜を有する2層構造抵抗膜感圧式デジタイザ
の回路定数推定方法に於いて、前記抵抗膜の両端に配設
される2電極間を2端子回路素子とみなし、前記第2抵
抗膜に相当する抵抗素子と、前記主抵抗膜と前記第2抵
抗膜との膜間容量に相当するコンデンサ素子とを直列接
続し、これと並列に、前記主抵抗膜に相当する抵抗素子
を並列接続した前記2層構造抵抗膜感圧式デジタイザの
等価回路を構成し、該等価回路に基づき2層構造抵抗膜
感圧式デジタイザの回路定数を推定することを特徴とす
る。
According to a second aspect of the present invention, in a method of estimating a circuit constant of a two-layer resistive film pressure-sensitive digitizer having a second resistive film via an insulating film below a main resistive film, the resistive film is disposed at both ends of the resistive film. The two-terminal circuit element is regarded as a two-terminal circuit element, and a resistance element corresponding to the second resistance film and a capacitor element corresponding to an inter-film capacitance between the main resistance film and the second resistance film are connected in series. , An equivalent circuit of the two-layer resistive film pressure-sensitive digitizer in which a resistance element corresponding to the main resistive film is connected in parallel, and a circuit of the two-layer resistive film pressure-sensitive digitizer based on the equivalent circuit. It is characterized by estimating a constant.

【0009】請求項3は、請求項2に於いて、前記電極
にステップ入力を行い、出力されるステップ応答を測定
した値と、計算によるステップ応答の値とを比較し、前
記等価回路の膜間容量値及び第2抵抗膜の抵抗値を推定
することを特徴とする。
According to a third aspect of the present invention, in the second aspect, a step input is performed to the electrode, a value obtained by measuring a step response to be output is compared with a calculated step response value, and the film of the equivalent circuit is compared. The method is characterized in that an inter-capacitance value and a resistance value of the second resistance film are estimated.

【0010】請求項4は、請求項2に於いて、前記被測
定用2層構造抵抗膜感圧式デジタイザと基準となる前記
等価回路とを対向させてホイートストンブリッジを構成
し、前記等価回路の回路定数を調節することにより、均
衡点を検出し、前記等価回路の膜間容量値及び第2抵抗
膜の抵抗値を推定することを特徴とする。
According to a fourth aspect of the present invention, in the second aspect, the Wheatstone bridge is formed by opposing the two-layer resistive film pressure-sensitive digitizer to be measured and the equivalent circuit as a reference, and the circuit of the equivalent circuit is formed. By adjusting the constant, the equilibrium point is detected, and the inter-film capacitance value of the equivalent circuit and the resistance value of the second resistance film are estimated.

【0011】[0011]

【発明の実施の形態】図2は、図1に示す2層構造の抵
抗膜感圧式デジタイザの電極105及び106間を2端
子回路素子とみなし、等価回路で示したものである。
FIG. 2 shows an equivalent circuit of the two-layer resistive pressure-sensitive digitizer shown in FIG. 1 between the electrodes 105 and 106 as a two-terminal circuit element.

【0012】図2に於いて、204は、図1の第1の抵
抗膜である主抵抗膜104に相当する主抵抗R1を表
し、202は、図1の第2の抵抗膜である導電膜102
に相当する第2抵抗R2を表し、205及び206は、
図1の主抵抗膜104の両端に配した電極105、10
6に相当する。抵抗が主抵抗膜104(主抵抗R1(2
04))のみのときは純抵抗として扱って差し支えない
が、2層構造の場合は、膜間容量を通して、導電膜10
2(第2の抵抗R2(202))に交流電流が流れる経
路ができると推測されるので、主抵抗膜104(主抵抗
R1(204))と導電膜102(第2の抵抗R2(2
02))との間にはコンデンサC1(211)及びC2
(212)が発生する。尚、2層構造の抵抗膜感圧式デ
ジタイザを厳密に表現する場合、限りなく小容量のコン
デンサを無数に並べ、抵抗膜も限りなく小さな抵抗素子
を無数に並べる分布定数回路とする必要があるが、デジ
タイザとして通常の電極操作を行う場合には、図1の簡
単な集中回路定数で構成された等価回路で精度よく表す
ことができる。
In FIG. 2, reference numeral 204 denotes a main resistance R1 corresponding to the main resistance film 104 as the first resistance film in FIG. 1, and reference numeral 202 denotes a conductive film as the second resistance film in FIG. 102
And a second resistor R2 corresponding to
The electrodes 105, 10 arranged at both ends of the main resistance film 104 in FIG.
Equivalent to 6. When the resistance is the main resistance film 104 (the main resistance R1 (2
04)) may be treated as pure resistance, but in the case of a two-layer structure, the conductive film 10
2 (second resistor R2 (202)), it is assumed that there is a path through which an alternating current flows. Therefore, the main resistance film 104 (main resistor R1 (204)) and the conductive film 102 (second resistor R2 (2)
02)) and capacitors C1 (211) and C2
(212) occurs. When a resistive digitizer with a two-layer structure is strictly expressed, it is necessary to arrange a countless number of small-capacity capacitors and countless resistive films as a distributed constant circuit. When a normal electrode operation is performed as a digitizer, it can be accurately represented by an equivalent circuit composed of simple lumped circuit constants in FIG.

【0013】この様なデジタイザを使用して座標検出を
行う場合には、電極205及び電極206に電位差が印
加され、電極205及び206間に電位差を印加した状
態と、無印加の状態とを交互に繰り返す。
When coordinate detection is performed using such a digitizer, a potential difference is applied to the electrodes 205 and 206, and a state in which a potential difference is applied between the electrodes 205 and 206 and a state in which no voltage is applied are alternated. Repeat.

【0014】次に、2層構造の抵抗膜感圧式デジタイザ
がどの程度の集中回路定数に相当するかを推定する方法
について説明する。
Next, a method for estimating the lumped circuit constant of a two-layer resistive film pressure-sensitive digitizer will be described.

【0015】まず、第1の方法としては、2層構造の抵
抗膜感圧式デジタイザのステップ応答を観測し、論理的
に計算した値と比較することで回路定数を推定する方法
である。
First, the first method is a method of observing the step response of a resistive digitizer having a two-layer structure and estimating a circuit constant by comparing the step response with a logically calculated value.

【0016】ステップ応答は図3に示す様に、2層構造
の抵抗膜感圧式デジタイザ100の一方の電極105に
抵抗r(303)を直列に接続し、入力端子301から
ステップ入力を印加し、他方の電極106はグランドレ
ベル電位(0V)を印加する。ステップ応答を観測する
場合は、端子302からの出力をステップ応答として観
測する、尚、抵抗r(303)は、通常1KΩ程度が適
当である。
As shown in FIG. 3, a resistor r (303) is connected in series to one electrode 105 of the resistive digitizer 100 having a two-layer structure, and a step input is applied from an input terminal 301 as shown in FIG. The other electrode 106 applies a ground level potential (0 V). When a step response is observed, the output from the terminal 302 is observed as a step response. The resistance r (303) is usually appropriate to be about 1 KΩ.

【0017】一方、図2に示す回路に於けるステップ応
答を計算すると、
On the other hand, when the step response in the circuit shown in FIG. 2 is calculated,

【0018】[0018]

【数1】 となる。(Equation 1) Becomes

【0019】よって、図3により観測したステップ応答
と、前記(1)式の計算により求められるステップ応答
の結果とを比較すれば、図2に於ける、第2の抵抗R2
(202)及びコンデンサC(211、212)の近似
値を推定することができる。
Therefore, comparing the step response observed in FIG. 3 with the result of the step response obtained by the calculation of the above equation (1), the second resistor R2 in FIG.
(202) and the approximate value of the capacitor C (211 and 212) can be estimated.

【0020】第2の方法としては、2層構造の抵抗膜感
圧式デジタイザと等価回路を対向させてホイートストン
ブリッジ構成することにより回路定数を推定する方法で
ある。
The second method is a method of estimating circuit constants by forming a Wheatstone bridge by opposing an equivalent circuit to a two-layer resistive film pressure-sensitive digitizer.

【0021】図4にホイートストンブリッジ構成の一例
を示す。
FIG. 4 shows an example of a Wheatstone bridge configuration.

【0022】測定試料である2層構造の抵抗膜感圧式デ
ジタイザ100の一方の電極106は端子409に接続
され、他方の電極105は抵抗408の端子Aと接続さ
れている。405は抵抗膜感圧式デジタイザ100の等
価回路であり、主抵抗401、第2抵抗膜402、主抵
抗401と第2抵抗膜(R4)402との膜間容量(コ
ンデンサC4)403から成り、一端が端子409に接
続され、他方の一端が抵抗408の端子Bと接続されて
いる。
One electrode 106 of the resistive digitizer 100 having a two-layer structure as a measurement sample is connected to a terminal 409, and the other electrode 105 is connected to a terminal A of a resistor 408. Reference numeral 405 denotes an equivalent circuit of the resistive film pressure-sensitive digitizer 100, which includes a main resistance 401, a second resistance film 402, and an inter-film capacitance (capacitor C4) 403 between the main resistance 401 and the second resistance film (R4) 402. Is connected to the terminal 409, and the other end is connected to the terminal B of the resistor 408.

【0023】[0023]

【数2】 尚、膜間容量は、簡略化のため同じものであるとみなし
1つにまとめている。406乃至408は、ホイートス
トンブリッジを構成するための抵抗群であり、約1KΩ
程度の抵抗により形成されている。尚、抵抗406及び
407は端子410に接続されている。
(Equation 2) The inter-film capacitances are regarded as the same for simplicity and are combined into one. Reference numerals 406 to 408 denote a group of resistors for constituting a Wheatstone bridge.
It is formed by the degree of resistance. The resistors 406 and 407 are connected to the terminal 410.

【0024】端子409にはグランドレベル電位(0
V)を印加し、端子410には、交流波形或いはステッ
プ状波形(連続矩形波)を印加する。この状態で、コン
デンサC4(403)及び第2抵抗膜R4(402)の
値を調整し、抵抗408の両端(A−B間)の電位差が
0となる値を検出することにより、2層構造の抵抗膜感
圧式デジタイザ100の第2の抵抗R2(202)及び
コンデンサC(211、212)の近似値を推定するこ
とができる。
The terminal 409 has a ground level potential (0
V), and an AC waveform or a step-like waveform (continuous rectangular wave) is applied to the terminal 410. In this state, the values of the capacitor C4 (403) and the second resistance film R4 (402) are adjusted, and a value at which the potential difference between both ends (between A and B) of the resistor 408 becomes 0 is detected. The approximate value of the second resistor R2 (202) and the capacitors C (211 and 212) of the resistive film pressure-sensitive digitizer 100 can be estimated.

【0025】[0025]

【発明の効果】本発明を用いると、2層構造の抵抗膜感
圧式デジタイザの動的な特性を検出することができる。
According to the present invention, the dynamic characteristics of a two-layer resistive pressure-sensitive digitizer can be detected.

【0026】また、抵抗膜感圧式デジタイザとしての使
用状態を想定した場合、簡単な集中定数等価で表現で
き、回路シミュレーション等への応用に有効である。
Further, assuming a state of use as a resistive film pressure-sensitive digitizer, it can be expressed by a simple lumped parameter equivalent, which is effective for application to circuit simulation and the like.

【0027】また、2層構造の抵抗膜感圧式デジタイザ
の動的特性を2つのパラメータにより表現可能となり、
2層構造の抵抗膜感圧式デジタイザ製造時の品質管理が
簡単になる。
Also, the dynamic characteristics of a two-layer resistive film pressure-sensitive digitizer can be expressed by two parameters.
The quality control at the time of manufacturing a two-layer resistive pressure-sensitive digitizer is simplified.

【図面の簡単な説明】[Brief description of the drawings]

【図1】2層構造の抵抗膜感圧式デジタイザの構造の一
実施の形態を示す模式図である。
FIG. 1 is a schematic diagram showing an embodiment of a structure of a two-layer resistive film pressure-sensitive digitizer.

【図2】2層構造の抵抗膜感圧式デジタイザの等価回路
の構成の一実施の形態を示す模式図である。
FIG. 2 is a schematic diagram showing an embodiment of a configuration of an equivalent circuit of a two-layer resistive film pressure-sensitive digitizer.

【図3】本発明の第1の定数推定方法の回路の一実施の
形態を示す模式図である。
FIG. 3 is a schematic diagram showing an embodiment of a circuit of a first constant estimation method according to the present invention.

【図4】本発明の第2の定数推定方法の回路の一実施の
形態を示す模式図である。
FIG. 4 is a schematic diagram showing an embodiment of a circuit of a second constant estimation method according to the present invention.

【符号の説明】[Explanation of symbols]

100 2層構造の抵抗膜感圧式デジタイザ 101 ベース 102 導電膜 103 絶縁膜 104 主抵抗膜 105、106 電極 202 第2抵抗R2 204 主抵抗R1 205、206 電極 211 膜間容量コンデンサC1 212 膜間容量コンデンサC2 303 抵抗r 405 2層構造の抵抗膜感圧式デジタイザの
等価回路 401 等価回路の主抵抗 402 等価回路の第2抵抗R4 403 等価回路の膜間容量コンデンサC4
REFERENCE SIGNS LIST 100 resistive film digitizer of two-layer structure 101 base 102 conductive film 103 insulating film 104 main resistive film 105, 106 electrode 202 second resistor R2 204 main resistor R1 205, 206 electrode 211 inter-film capacitor C1 212 inter-film capacitor C2 303 Resistance r 405 Equivalent circuit of resistive film pressure-sensitive digitizer with two-layer structure 401 Main resistance of equivalent circuit 402 Second resistance R4 of equivalent circuit 403 Inter-film capacitance capacitor C4 of equivalent circuit

フロントページの続き (72)発明者 盛合 真介 大阪府守口市京阪本通2丁目5番5号 三 洋電機株式会社内 (72)発明者 馬場 隆 大阪府守口市京阪本通2丁目5番5号 三 洋電機株式会社内 Fターム(参考) 5B068 AA04 BB06 CC12 Continued on the front page (72) Inventor Shinsuke Morai 2-5-2-5 Keihanhondori, Moriguchi-shi, Osaka Inside Sanyo Electric Co., Ltd. (72) Inventor Takashi Baba 2-5-5-1 Keihanhondori, Moriguchi-shi, Osaka F-term (reference) in Sanyo Electric Co., Ltd. 5B068 AA04 BB06 CC12

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 主抵抗膜の下に絶縁膜を介して第2抵抗
膜を有する2層構造抵抗膜感圧式デジタイザの回路定数
推定方法に於いて、 前記2層構造抵抗膜感圧式デジタイザに等価回路をあて
はめ、該等価回路に基づき2層構造抵抗膜感圧式デジタ
イザの回路定数を推定することを特徴とする抵抗膜感圧
式デジタイザ回路定数推定方法。
1. A method of estimating a circuit constant of a two-layer resistive film pressure-sensitive digitizer having a second resistive film below an main resistive film via an insulating film, the method being equivalent to the two-layer resistive film pressure-sensitive digitizer. A method for estimating a circuit constant of a resistive digitizer of a resistive film type, characterized by applying a circuit and estimating a circuit constant of a two-layer resistive digitizer based on the equivalent circuit.
【請求項2】 主抵抗膜の下に絶縁膜を介して第2抵抗
膜を有する2層構造抵抗膜感圧式デジタイザの回路定数
推定方法に於いて、 前記抵抗膜の両端に配設される2電極間を2端子回路素
子とみなし、前記第2抵抗膜に相当する抵抗素子と、前
記主抵抗膜と前記第2抵抗膜との膜間容量に相当するコ
ンデンサ素子とを直列接続し、これと並列に、前記主抵
抗膜に相当する抵抗素子を並列接続した前記2層構造抵
抗膜感圧式デジタイザの等価回路を構成し、該等価回路
に基づき2層構造抵抗膜感圧式デジタイザの回路定数を
推定することを特徴とする抵抗膜感圧式デジタイザ回路
定数推定方法。
2. A method for estimating a circuit constant of a two-layer resistive film pressure-sensitive digitizer having a second resistive film via an insulating film below a main resistive film. Considering the space between the electrodes as a two-terminal circuit element, a resistance element corresponding to the second resistance film and a capacitor element corresponding to an inter-film capacitance between the main resistance film and the second resistance film are connected in series. An equivalent circuit of the two-layer resistive film pressure-sensitive digitizer in which resistance elements corresponding to the main resistive film are connected in parallel, and a circuit constant of the two-layer resistive film pressure-sensitive digitizer is estimated based on the equivalent circuit. And a method for estimating a resistive film pressure-sensitive digitizer circuit constant.
【請求項3】 請求項2に於いて、 前記電極にステップ入力を行い、出力されるステップ応
答を測定した値と、計算によるステップ応答の値とを比
較し、前記等価回路の膜間容量値及び第2抵抗膜の抵抗
値を推定することを特徴とする抵抗膜感圧式デジタイザ
回路定数推定方法。
3. The inter-film capacitance value of the equivalent circuit according to claim 2, wherein a step input is performed to the electrode, and a value obtained by measuring a step response to be output is compared with a calculated step response value. And estimating a resistance value of the second resistive film.
【請求項4】 請求項2に於いて、 前記被測定用2層構造抵抗膜感圧式デジタイザと基準と
なる前記等価回路とを対向させてホイートストンブリッ
ジを構成し、前記等価回路の回路定数を調節することに
より、均衡点を検出し、前記等価回路の膜間容量値及び
第2抵抗膜の抵抗値を推定することを特徴とする抵抗膜
感圧式デジタイザ回路定数推定方法。
4. The Wheatstone bridge according to claim 2, wherein the two-layer resistive film pressure-sensitive digitizer to be measured and the reference equivalent circuit are opposed to each other to adjust a circuit constant of the equivalent circuit. A resistive film digitizer circuit constant estimating method, wherein an equilibrium point is detected, and an inter-film capacitance value of the equivalent circuit and a resistance value of the second resistive film are estimated.
JP06871599A 1998-09-29 1999-03-15 Estimation method of resistive film pressure sensitive digitizer circuit constant Expired - Fee Related JP3519977B2 (en)

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JP27554798 1998-09-29
JP10-275547 1998-09-29
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8795884B2 (en) 2008-05-07 2014-08-05 Hitachi Maxell, Ltd. Nonaqueous secondary battery and electronic device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8795884B2 (en) 2008-05-07 2014-08-05 Hitachi Maxell, Ltd. Nonaqueous secondary battery and electronic device

Also Published As

Publication number Publication date
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