JP2000155006A - Sensor for crack depth measuring instrument by direct current potential difference method - Google Patents

Sensor for crack depth measuring instrument by direct current potential difference method

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Publication number
JP2000155006A
JP2000155006A JP10332653A JP33265398A JP2000155006A JP 2000155006 A JP2000155006 A JP 2000155006A JP 10332653 A JP10332653 A JP 10332653A JP 33265398 A JP33265398 A JP 33265398A JP 2000155006 A JP2000155006 A JP 2000155006A
Authority
JP
Japan
Prior art keywords
terminals
crack
potential difference
sensor
pair
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10332653A
Other languages
Japanese (ja)
Inventor
Masumi Saka
真澄 坂
Mitsuhiro Mikami
光弘 三上
Mitsumasa Toyokawa
光正 豊川
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Individual
Original Assignee
Individual
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Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to JP10332653A priority Critical patent/JP2000155006A/en
Publication of JP2000155006A publication Critical patent/JP2000155006A/en
Pending legal-status Critical Current

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  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Abstract

PROBLEM TO BE SOLVED: To improve the operability and to carry out accurate measurement with as little error as possible, in a sensor for a crack depth measuring instrument by a direct current potential difference method for, when a three- dimensional fatigue crack or the like is formed on an object to be inspected, nondestructively measuring its depth. SOLUTION: This sensor is formed of a probe part 9 provided with a one- dimensional proximity terminal formed by arranging four terminals, that is, a pair of current input-output terminals 11 and a pair of potential difference measuring terminals 12 on one straight line on the tip end of a holding part 8. The probe part 9 is provided with marks for positioning 15, by which it can be confirmed that the one-dimensional proximity terminal is orthogonally straddling a crack and that the center between one-dimensional proximity terminals corresponds to the intermediate position of the crack length, and is installed with a light for illumination.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、導電性のある被検査物
に直流電流を流し、被検査物表面上の電位差を計測する
ことにより、材料を非破壊評価する手法である電位差法
に関し、特に被検査物に3次元疲労亀裂などが生じた際
の深さを非破壊的に測定するための直流電位差法による
亀裂深さ測定器用センサについて、その操作性を高め、
出来るだけ誤差のない正確な測定ができるようにするも
のである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a potential difference method for non-destructively evaluating a material by applying a direct current to a conductive test object and measuring a potential difference on the surface of the test object. In particular, the operability of a sensor for a crack depth measuring instrument by the DC potential difference method for non-destructively measuring the depth when a three-dimensional fatigue crack or the like has occurred in the inspection object has been improved.
It is intended to enable accurate measurement with as little error as possible.

【0002】[0002]

【従来の技術】本発明者の一人である坂らは、電位差法
による非破壊検査法の研究を進め提案してきた(特開平
2−245649号、特公平5−11575号、特開平
7−72022号)。当該電位差法には、交流を用いる
ものと、直流を用いるものとがあり、それぞれ交流電位
差法、直流電位差法とよばれている。周波数の高い交流
では電流の多くが表面にそって流れる(表皮効果)のに
対し、直流では、電流が被検査物の表面だけでなく、板
厚内部にも流れるので、直流電位差法は、計測面上につ
き出た表面欠陥はもとより、埋没欠陥、裏面欠陥によっ
ても流れ場が乱され評価への適用も行い易く、守備範囲
が広い。そのうえ、直流は、交流の場合と異なり誘導起
電力が発生しない。従って誘導起電力の排除等の問題が
生じない取り扱い易さがある。
2. Description of the Related Art Saka et al., One of the present inventors, have advanced and proposed research on a nondestructive inspection method using a potential difference method (Japanese Patent Application Laid-Open No. 2-245649, Japanese Patent Publication No. 5-11575, Japanese Patent Application Laid-Open No. 7-72022). issue). The potential difference method includes an AC method and a DC method, which are called an AC potential difference method and a DC potential difference method, respectively. In the case of high-frequency alternating current, most of the current flows along the surface (skin effect), whereas in direct current, the current flows not only on the surface of the test object but also inside the plate thickness. The flow field is disturbed not only by the surface defects protruding on the surface but also by the buried defects and the back surface defects, so that it is easy to apply to the evaluation, and the defense range is wide. In addition, DC does not generate induced electromotive force unlike AC. Therefore, there is an easy handling that does not cause a problem such as elimination of the induced electromotive force.

【0003】しかし、直流電位差法においては、電流が
被検査物の板厚内部にも流れるという特徴に起因して、
従来、被検査物表面上におおきな電位差変化がでにく
く、感度が高くないという欠点があった。これに対し、
近年、電位差計測端子を亀裂近傍に配置し、電流入出力
端子と電位差計測端子を近接させた端子、すなわち近接
端子を用い表面亀裂を評価する手法を提案し、電位差計
測端子から離れて電流を入出力する従来法に比べ大幅な
計測感度の向上(直流電位差法の高感度化)を実現し
た。ここに直流電位差法の高感度化とは、より小さな電
流で、より小さな亀裂まで評価できるようになったこと
を意味する。
[0003] However, in the DC potential difference method, due to the characteristic that the current also flows inside the plate thickness of the inspection object,
Heretofore, there has been a defect that a large change in potential difference is difficult to occur on the surface of the inspection object and the sensitivity is not high. In contrast,
In recent years, a method has been proposed in which a potential difference measuring terminal is placed near a crack, and a terminal where the current input / output terminal and the potential difference measuring terminal are close to each other, that is, a method of evaluating a surface crack using a proximity terminal, is used to input a current away from the potential difference measuring terminal. A significant improvement in measurement sensitivity (higher sensitivity of the DC potential difference method) compared to the conventional method of outputting is realized. Here, increasing the sensitivity of the DC potential difference method means that a smaller current can be evaluated with a smaller current.

【0003】[0003]

【発明が解決しようとする課題】極めて高感度な亀裂の
計測と評価の実現のために、上記のように電位差計測端
子を近接端子にするとすれば、その電流入出力と電位差
計測のための端子を一つの小さなセンサに納めることが
可能となり、その結果、計測にあたっては、当該センサ
を被検査物表面に正しく押し付けるだけで亀裂の深さま
で正確に測定できる。そこで本発明者は、このような知
見に基づき、計測操作が簡単で、且つ計測値が可及的に
正確なものになる直流電位差法による亀裂深さ測定器用
センサの研究開発をすることとなった。
If the potential difference measuring terminal is a close terminal as described above in order to realize the measurement and evaluation of a crack with extremely high sensitivity, a terminal for measuring the current input / output and the potential difference is used. Can be stored in one small sensor. As a result, in the measurement, the depth of the crack can be accurately measured only by correctly pressing the sensor against the surface of the inspection object. Therefore, based on such knowledge, the present inventor will conduct research and development of a sensor for a crack depth measuring instrument by the DC potential difference method that makes the measurement operation simple and the measurement value is as accurate as possible. Was.

【0004】先ず、図9に示すように、当該近接端子を
用いた直流電位差法による亀裂深さ測定は次のような条
件下でおこなわれる必要がある。以下、材料の表面に出
来た亀裂は、同図に示したように半だ円板状の垂直亀裂
とし、これを近接端子を用いてその亀裂の深さを測定す
る方法について説明する。
First, as shown in FIG. 9, the measurement of the crack depth by the DC potential difference method using the adjacent terminals needs to be performed under the following conditions. Hereinafter, a method for measuring the depth of a crack formed on a surface of a material as a semi-elliptical vertical crack as shown in FIG.

【0005】図9において、aは亀裂半長、bは亀裂深
さ、tは板厚である。一方、近接端子は、図8に一例を
示す様に亀裂深さ測定器用センサの先端部において、所
定の近接間隔をもって一直線上の外側に配設された一対
の電流入出力端子11,11と同一直線状の内側に配設
された一対の電位差計測端子12,12との4本の端子
が配設してある。尚、以下ではこのような場合を取り上
げて説明するが、一対の電流入出力端子11,11を内
側に配設し、一対の電位差計測端子12,12を外側に
配設した場合も同様である。この近接端子を図9に示す
ような構成関係を保ちながら、押付け接触して電流入出
力端子11,11から直流電流を流し、電位差計測端子
12,12により2点間で電位差Vを計測する。つま
り、材料表面上で亀裂長さの中間位置を通り、亀裂面に
垂直な線上における亀裂からの距離がS1 なる2点間で
電流入出力を行い、亀裂からの距離がS2 なる2点間で
電位差Vを計測する。尚、近接端子は、例えばS1 =
1.5mm,S2 =1mm(ProbeA)のもの、ま
たは/およびS1 =3mm,S2 =2.5mm(Pro
beB)の近接端子等を用意し、これを用いて測定す
る。このような近接端子を用いて、亀裂を跨いだ電位差
を計測すると同時に、亀裂のない同被検査物表面上で参
照としての電位差を計測し、両者の比から亀裂深さを評
価するのである。
In FIG. 9, a is a half length of a crack, b is a crack depth, and t is a plate thickness. On the other hand, the proximity terminals are the same as a pair of current input / output terminals 11 and 11, which are arranged on a straight line outside at a predetermined proximity at the tip of the sensor for the crack depth measuring instrument as shown in FIG. Four terminals including a pair of potential difference measuring terminals 12 and 12 disposed inside the straight line are provided. In the following, such a case will be described, but the same applies to the case where the pair of current input / output terminals 11 and 11 are disposed inside and the pair of potential difference measuring terminals 12 and 12 are disposed outside. . While maintaining the configuration as shown in FIG. 9, the proximity terminals are pressed and contacted, a DC current flows from the current input / output terminals 11, 11, and the potential difference V is measured between the two points by the potential difference measuring terminals 12, 12. That is, current input / output is performed between two points having a distance S1 from the crack on a line passing through the middle position of the crack length and perpendicular to the crack surface on the material surface, and performing a current input and output between two points having a distance S2 from the crack. The potential difference V is measured. The proximity terminal is, for example, S1 =
1.5 mm, S2 = 1 mm (Probe A) or / and S1 = 3 mm, S2 = 2.5 mm (Prob
BeB) A proximity terminal or the like is prepared, and measurement is performed using this. Using such a proximity terminal, the potential difference across the crack is measured, and at the same time, the potential difference as a reference is measured on the surface of the inspection object without cracks, and the crack depth is evaluated from the ratio between the two.

【0006】近接端子を用いた直流電位差法が上記のよ
うな構成関係を正しく維持した条件下で計測したときに
初めて精度の良い亀裂深さの数値を得ることができるも
のである。従って、亀裂深さ測定器用センサを亀裂に押
し当てる際には、その位置決めの仕方が非常に重要なも
のとなり、的確な位置決めによってはじめて高精度な測
定結果を得ることができることになる。その結果、本発
明に係る亀裂深さ測定器用センサには、的確な位置決め
が容易にできる位置決め用印を表示することが要請され
ている。
An accurate numerical value of the crack depth can be obtained only when the DC potential difference method using the proximity terminal is measured under the condition that the above-mentioned structural relationship is correctly maintained. Therefore, when the sensor for the crack depth measuring device is pressed against the crack, the positioning method is very important, and a high-precision measurement result can be obtained only by accurate positioning. As a result, the sensor for a crack depth measuring instrument according to the present invention is required to display a positioning mark capable of easily performing accurate positioning.

【0007】また、本発明に係る亀裂深さ測定器用セン
サは、その正しい位置決めが出来るように探り針部に、
照明用ライトを取り付け、亀裂と一次元近接端子と位置
決め用印の部分を明るく照らして、視覚的に亀裂や押付
け位置を容易に認識できるようにすること、といった要
請がある。
Further, the sensor for a crack depth measuring instrument according to the present invention is provided on a probe portion so that the correct positioning can be performed.
There is a demand for mounting a lighting light and brightly illuminating a crack, a one-dimensional proximity terminal, and a positioning mark so that the crack and the pressed position can be easily visually recognized.

【0008】更に、被検査物表面が必ずしも平滑な計測
面だけではなく、凹凸のある計測面の場合もある。近接
端子に付勢力を持たせ、このような多様な計測面の形状
に対応して端子が確実に接触出来るようにしたい、とい
った要請がある。
Further, the surface of the object to be inspected is not necessarily a smooth measurement surface, but may be a measurement surface having irregularities. There is a demand for providing a biasing force to the proximity terminal so that the terminal can surely come into contact with such various shapes of the measurement surface.

【0009】更にまた、上記のように多様な計測面への
端子の接触を確実にするため、所定の荷重が加わった
時、初めて計測のための電流が流れ、計測作業がスター
トするようにしたい、との要請もある。
Furthermore, in order to ensure the contact of the terminals with various measurement surfaces as described above, it is desired that a current for measurement flows for the first time when a predetermined load is applied, and that the measurement operation be started. There is also a request.

【0010】近接端子の間隔(Probe間隔)を調整
できるようにして、可及的に高感度なセンサにしたい、
との要請もある。
It is desired to make the sensor as sensitive as possible by adjusting the distance between adjacent terminals (Probe distance).
There is also a request.

【0011】本発明は、このような要請に基づく技術課
題を解消し、その操作性を高め、出来るだけ誤差のない
正確な測定ができる直流電位差法による亀裂深さ測定器
用センサを具現化し、直流電位差法の盛んな活用が容易
に行なわれるようにせんとするものである。
The present invention solves the technical problem based on such a demand, improves the operability thereof, and embodies a sensor for a crack depth measuring instrument by a DC potential difference method capable of performing accurate measurement with as little error as possible. It is intended to facilitate the active use of the potentiometric method.

【0012】[0012]

【課題を解決するための手段】本発明は、上記の技術課
題を解決するための手段を次のように構成する。
According to the present invention, means for solving the above technical problems are constituted as follows.

【0013】特許を受けようとする第1発明は、握持部
の先端部に一対の電流入出力端子と一対の電位差計測端
子の4本の端子が1直線上に配設してなる一次元近接端
子を備えた探り針部を設けてなる亀裂深さ測定器用セン
サにおいて、前記探り針部に、一次元近接端子が亀裂と
直交するように跨いでいること、及び一次元近接端子の
端子間中心が亀裂長さの中間位置と一致することを確認
できる位置決め用印を設けるようにしたことを特徴とす
る直流電位差法による亀裂深さ測定器用センサである。
The first invention to be patented is a one-dimensional one in which four terminals, a pair of current input / output terminals and a pair of potential difference measurement terminals, are arranged on a straight line at the tip of the grip portion. In the crack depth measuring device sensor provided with a probe portion having a proximity terminal, a one-dimensional proximity terminal straddles the probe portion so as to be orthogonal to the crack, and between the terminals of the one-dimensional proximity terminal. A sensor for a crack depth measuring instrument by a DC potential difference method, wherein a positioning mark for confirming that a center coincides with an intermediate position of a crack length is provided.

【0014】本発明の近接端子を用いた直流電位差法
は、亀裂と一次元近接端子とが、所定の構成関係を正し
く維持した条件下で計測したときに初めて精度の良い亀
裂深さの数値を得ることができるものである点に着目
し、亀裂深さ測定器用センサに、的確な位置決め用印を
設けたものである。その的確な位置決め用印とは、第1
に、端子間の中心と、亀裂長さの中間位置が一致するよ
うにすること、第2に、一次元近接端子が、亀裂と直交
するように跨ぐ位置にくること、の二要件を満たす位置
決めが容易にできるような目印や表示でなければならな
い。
In the DC potential difference method using the proximity terminal according to the present invention, the crack and the one-dimensional proximity terminal can obtain an accurate numerical value of the crack depth only when the measurement is performed under the condition that the predetermined configuration relation is correctly maintained. Focusing on the fact that it can be obtained, the crack depth measuring instrument sensor is provided with an accurate positioning mark. The precise positioning mark is the first
Second, the center between the terminals and the middle position of the crack length coincide with each other, and second, the one-dimensional proximity terminal comes to a position straddling so as to be orthogonal to the crack. Must be easily visible and easily accessible.

【0015】特許を受けようとする第2発明は、握持部
の先端部に一対の電流入出力端子と一対の電位差計測端
子の4本の端子が1直線上に配設してなる一次元近接端
子を備えた探り針部を設けてなる亀裂深さ測定器用セン
サにおいて、前記探り針部に、一次元近接端子が亀裂と
直交するように跨いでいること、及び一次元近接端子の
端子間中心が亀裂長さの中間位置と一致することを確認
できる位置決め用印を設けるとともに、前記探り針部に
は、照明用ライトを取り付け、亀裂と一次元近接端子と
位置決め用印の部分を照明できるようにしたことを特徴
とする直流電位差法による亀裂深さ測定器用センサであ
る。
[0015] A second invention to be patented is a one-dimensional one in which four terminals, a pair of current input / output terminals and a pair of potential difference measuring terminals, are arranged on a straight line at the tip of the grip portion. In the crack depth measuring device sensor provided with a probe portion having a proximity terminal, a one-dimensional proximity terminal straddles the probe portion so as to be orthogonal to the crack, and between the terminals of the one-dimensional proximity terminal. In addition to providing a positioning mark for confirming that the center coincides with the middle position of the crack length, an illumination light is attached to the probe, so that the crack, the one-dimensional proximity terminal, and the positioning mark can be illuminated. This is a sensor for a crack depth measuring device by a DC potential difference method.

【0016】当該第2発明は、亀裂深さ測定器用センサ
に的確な位置決め用印と亀裂と一次元近接端子と位置決
め用印の部分を照明できる照明用ライトを取り付け、位
置決めを更に容易にできるようにしたものである。
According to the second aspect of the present invention, a positioning mark, a crack, a one-dimensional proximity terminal, and an illuminating light capable of illuminating a portion of the positioning mark are attached to the crack depth measuring sensor so that positioning can be further facilitated. Things.

【0017】特許を受けようとする第3発明は、位置決
め用印が、一対の電流入出力端子と一対の電位差計測端
子の4本の端子が1直線上に配設してなる一次元近接端
子の配列方向ラインを示す表示と、亀裂方向ラインを示
す表示と、亀裂方向ラインに沿って一次元近接端子の配
列方向ラインからの距離を示す目盛り表示であることを
特徴とする請求項1若しくは請求項2に記載する直流電
位差法による亀裂深さ測定器用センサである。
According to a third aspect of the present invention, a positioning mark is a one-dimensional proximity terminal in which four terminals of a pair of current input / output terminals and a pair of potential difference measuring terminals are arranged on one straight line. 2. A display showing an arrangement direction line, a display showing a crack direction line, and a scale display showing a distance from the arrangement direction line of the one-dimensional proximity terminal along the crack direction line. 2 is a sensor for a crack depth measuring instrument according to the DC potential difference method described in 2.

【0018】特許を受けようとする第4発明は、握持部
の先端部に一対の電流入出力端子と一対の電位差計測端
子の4本の端子が1直線上に配設してなる一次元近接端
子を備えた探り針部を設けてなる亀裂深さ測定器用セン
サにおいて、前記探り針部の少なくとも一次元近接端子
の端子間隔部分を透明体および/または空間部となして
対象亀裂を視覚によって確認できるようにし、当該透明
体の部分および/または空間部近傍に位置決め用印を表
示したことを特徴とする請求項1または請求項2に記載
の直流電位差法による亀裂深さ測定器用センサである。
According to a fourth aspect of the present invention, a one-dimensional structure is provided in which four terminals, a pair of current input / output terminals and a pair of potential difference measuring terminals, are arranged on a straight line at the tip of the grip portion. In a crack depth measuring instrument sensor provided with a probe portion provided with a proximity terminal, at least a one-dimensional proximity terminal of the probe portion is formed as a transparent body and / or a space portion to visually identify a target crack. 3. A sensor for a crack depth measuring instrument according to the DC potential difference method according to claim 1 or 2, wherein a positioning mark is displayed near the transparent body and / or the space portion so that the crack can be confirmed.

【0019】特許を受けようとする第5発明は、握持部
の先端部に一対の電流入出力端子と一対の電位差計測端
子の4本の端子が1直線上に配設してなる一次元近接端
子を備えた探り針部を設けてなる亀裂深さ測定器用セン
サにおいて、前記探り針部に、配設されている一次元近
接端子の配列方向ラインの中間位置において直交するラ
イン上に照明用レンズを一対、前記一次元近接端子の配
列方向ラインを跨がるように配設し、内蔵されている照
射光源からの光線が照明用レンズを通して焦点を合わせ
たスポット光が、前記一次元近接端子の配列方向ライン
を基準にして跨いだ対称位置に2点のスポット光として
照射出来るようにし、これを位置決め用印としたことを
特徴とする直流電位差法による亀裂深さ測定器用センサ
である。
According to a fifth aspect of the present invention, a one-dimensional structure is provided in which four terminals, a pair of current input / output terminals and a pair of potential difference measuring terminals, are arranged on a straight line at the tip of the grip portion. A crack depth measuring instrument sensor provided with a probe having a proximity terminal, wherein the probe has an illumination line on a line orthogonal to an intermediate position of an arrangement direction line of the one-dimensional proximity terminals provided. A pair of lenses are disposed so as to straddle the arrangement direction line of the one-dimensional proximity terminal, and a spot light in which light from a built-in irradiation light source is focused through an illumination lens is the one-dimensional proximity terminal. A symmetric position straddling the arrangement direction line as a reference, and irradiating the same as two spot lights, and using the spot light as a positioning mark, this is a sensor for a crack depth measuring instrument by a DC potential difference method.

【0020】第5発明は、2点のスポット光を亀裂に合
わせるだけで、一次元近接端子が所定の正しい位置にな
るようにしたものである。
According to a fifth aspect of the present invention, the one-dimensional proximity terminal is set at a predetermined correct position only by adjusting two spot lights to the crack.

【0021】特許を受けようとする第6発明は、握持部
の先端部に一対の電流入出力端子と一対の電位差計測端
子の4本の端子が1直線上に配設してなる一次元近接端
子を備えた探り針部を設けてなる亀裂深さ測定器用セン
サにおいて、前記一次元近接端子に板状バネ部材を設
け、当該板状バネ部材に荷重を加えたり荷重を減らした
りすることにより一次元近接端子の間隔を狭くしたり、
広くするなどの調整ができる端子間調整機構を設けたこ
とを特徴とする直流電位差法による亀裂深さ測定器用セ
ンサである。
According to a sixth aspect of the present invention, a one-dimensional structure is provided in which four terminals, a pair of current input / output terminals and a pair of potential difference measuring terminals, are arranged on a straight line at the tip of the grip portion. In a sensor for a crack depth measuring instrument provided with a probe having a proximity terminal, a plate-shaped spring member is provided on the one-dimensional proximity terminal, and a load is applied to the plate-shaped spring member or the load is reduced. To reduce the distance between one-dimensional proximity terminals,
A sensor for a crack depth measuring instrument based on a DC potential difference method, comprising an inter-terminal adjustment mechanism capable of performing adjustment such as widening.

【0022】特許を受けようとする第7発明は、握持部
の先端部に一対の電流入出力端子と一対の電位差計測端
子の4本の端子が1直線上に配設してなる一次元近接端
子を備えた探り針部を設けてなる亀裂深さ測定器用セン
サにおいて、握持部に探り針部の押し当て釦部を設ける
とともに、一次元近接端子に所定以上の押圧力が負荷さ
れたとき測定用の電流が流されるようにしたことを特徴
とする直流電位差法による亀裂深さ測定器用センサであ
る。
According to a seventh aspect of the present invention, a one-dimensional one-dimensional structure is provided in which four terminals, a pair of current input / output terminals and a pair of potential difference measuring terminals, are arranged on a straight line at the tip of the gripping portion. In the sensor for a crack depth measuring instrument provided with a probe having a proximity terminal, a pressing button of the probe is provided on the grip portion, and a predetermined pressing force is applied to the one-dimensional proximity terminal. A sensor for a crack depth measuring instrument based on a DC potential difference method, wherein a current for measurement is caused to flow.

【0023】[0023]

【実施例】以下本発明を図示実施例に基づいて詳細に説
明する。種々の構造物の健全性評価に破壊力学を適用す
る際、実在する亀裂の寸法・形状などを非破壊評価する
ことが肝要である。直流電位差法は亀裂非破壊評価の有
効な手段として注目されてきている。直流電位差法にお
いては2つの電流入出力端子と2つの電位差計測端子の
合計4つの端子が用いられる。しかし、直流電位差法
は、被検査物表面上に大きな電位差がでにくく、言い換
えれば感度が高くないという欠点があった。近接端子
は、当該直流電位差法の欠点を解消し高感度化を図るも
のとして提案された。近接端子の形態をとることによ
り、2つの電流入出力端子と2つの電位差計測端子の合
計4つの端子を一つの小さなセンサに納めることが可能
となり、計測にあたっては、同センサを被検査物の表面
に押付けるだけで良くなり、その三次元亀裂測定の測定
評価法が簡便なものになった。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below in detail based on illustrated embodiments. When applying fracture mechanics to the evaluation of the soundness of various structures, it is important to nondestructively evaluate the dimensions and shapes of existing cracks. The DC potential difference method has been attracting attention as an effective tool for non-destructive evaluation of cracks. In the DC potential difference method, a total of four terminals of two current input / output terminals and two potential difference measurement terminals are used. However, the DC potential difference method has a disadvantage that a large potential difference is hardly generated on the surface of the inspection object, in other words, the sensitivity is not high. Proximity terminals have been proposed to eliminate the drawbacks of the DC potential difference method and to increase the sensitivity. By taking the form of the proximity terminal, it is possible to accommodate a total of four terminals, two current input / output terminals and two potential difference measurement terminals, in one small sensor. The three-dimensional crack measurement has been simplified by simply pressing it.

【0024】そのため、当該直流電位差法による三次元
亀裂を測定するための装置も新たに開発されるようにな
った。図7は、この直流電位差法による三次元亀裂測定
装置の全機器構成例を示す斜視図である。図示の三次元
亀裂測定装置は、近接端子を具備した亀裂深さ測定器用
センサ1、直流安定化電源2、デジタルマルチメータ
3、GP−IBアダプター4、パーソナルコンピュータ
5、およびキャリアケース6からなっている。
Therefore, a device for measuring a three-dimensional crack by the DC potential difference method has been newly developed. FIG. 7 is a perspective view showing an example of the entire configuration of the three-dimensional crack measuring apparatus using the DC potential difference method. The illustrated three-dimensional crack measuring device includes a sensor 1 for a crack depth measuring instrument having a proximity terminal, a stabilized DC power supply 2, a digital multimeter 3, a GP-IB adapter 4, a personal computer 5, and a carrier case 6. I have.

【0025】亀裂深さ測定器用センサ1に具備された近
接端子の配列状態は、図8に示したように、4本の端子
が一直線上に配置された一次元近接端子となっている。
当該近接端子による半だ円表面亀裂の計測方法を示した
のが図9である。図示実施例においては、S1 =1.5
mm,S2 =1mm(ProbeA)の近接端子と、S
1 =3mm,S2 =2.5mm(ProbeB)の近接
端子の2種類のセンサを用いた。センサの直流入出力端
子に1Aの直流電流を供給した。センサの電位差計測端
子により計測した電位差はデジタルマルチメータに取り
込んだ後、A/D変換し、GP−IBアダプタを介して
パーソナルコンピュータに転送した。当該パーソナルコ
ンピュータには、較正関係式により三次元表面亀裂の深
さを計算するソフトウェアを組み込んでいる。
As shown in FIG. 8, the arrangement of the proximity terminals provided in the crack depth measuring device sensor 1 is a one-dimensional proximity terminal in which four terminals are arranged in a straight line.
FIG. 9 shows a method of measuring a semi-elliptical surface crack by the proximity terminal. In the illustrated embodiment, S1 = 1.5
mm, S2 = 1 mm (Probe A)
Two types of sensors having proximity terminals of 1 = 3 mm and S2 = 2.5 mm (Probe B) were used. A DC current of 1 A was supplied to the DC input / output terminal of the sensor. The potential difference measured by the potential difference measuring terminal of the sensor was taken into a digital multimeter, A / D converted, and transferred to a personal computer via a GP-IB adapter. The personal computer incorporates software for calculating the depth of a three-dimensional surface crack using a calibration relational expression.

【0026】本発明は、上記のような直流電位差法によ
る三次元亀裂測定装置における亀裂深さ測定器用センサ
である。当該亀裂深さ測定器用センサの開発により、直
流電位差法による三次元亀裂の測定、特に困難とされて
いた三次元亀裂の深さを簡単に非破壊的に測定評価する
ことが出来るようになった。そのため亀裂深さ測定器用
センサの実用性が飛躍的に高まることになった。
The present invention is a sensor for a crack depth measuring instrument in a three-dimensional crack measuring device according to the DC potential difference method as described above. With the development of the sensor for the crack depth measuring device, it has become possible to easily and non-destructively measure and evaluate the depth of a three-dimensional crack, which has been considered difficult particularly, by the DC potential difference method. . Therefore, the practicality of the sensor for the crack depth measuring device has been dramatically improved.

【0027】<実施例1>図1は、本発明に係る亀裂深
さ測定器用センサの第1実施例を示す斜視図であり、図
2は、図1に示した第1実施例に係る亀裂深さ測定器用
センサの側面図であり、図3は、図1に示した第1実施
例に係る亀裂深さ測定器用センサの平面図(イ)と正面
図(ロ)である。
<Embodiment 1> FIG. 1 is a perspective view showing a first embodiment of a sensor for a crack depth measuring instrument according to the present invention, and FIG. 2 is a perspective view showing a crack according to the first embodiment shown in FIG. FIG. 3 is a side view of the sensor for a depth measuring instrument, and FIG. 3 is a plan view (a) and a front view (b) of the sensor for a crack depth measuring instrument according to the first embodiment shown in FIG.

【0028】亀裂深さ測定器用センサは、角柱型の握持
部8とその先端部に設けた探り針部9とからなる。当該
探り針部9は二股に別れて、その中間部には、透明体が
挿入されており、そこには一次元近接端子10が備えら
れている。当該一次元近接端子10とは、一対の電流入
出力端子11,11と一対の電位差計測端子12,12
の4本の端子が1直線上に配設してなるものである。
尚、以下において、一対の電流入出力端子11,11を
内側に配設し、一対の電位差計測端子12,12を外側
に配設した場合も同様である。
The sensor for the crack depth measuring instrument comprises a prismatic grip portion 8 and a probe 9 provided at the tip thereof. The probe 9 is bifurcated, and a transparent body is inserted in the middle of the probe, and a one-dimensional proximity terminal 10 is provided therein. The one-dimensional proximity terminal 10 includes a pair of current input / output terminals 11 and 11 and a pair of potential difference measurement terminals 12 and 12.
Are arranged on one straight line.
In the following, the same applies to the case where the pair of current input / output terminals 11 and 11 are provided inside and the pair of potential difference measuring terminals 12 and 12 are provided outside.

【0029】前記探り針部9の少なくとも一次元近接端
子10の端子間隔部分を透明体13および/または空間
部13aとなして亀裂14を視覚によって確認できるよ
うにする。透明体13の部分には位置決め用印15を表
示してある。当該位置決め用印15は、一次元近接端子
10が亀裂14と直交するように跨いでいること、及び
一次元近接端子10の端子間中心が亀裂長さの中間位置
と一致することを確認できるものである。具体的な位置
決め用印15は、一対の電流入出力端子11,11と一
対の電位差計測端子12,12の4本の端子が1直線上
に配設してなる一次元近接端子10の配列方向ラインを
示す表示16と、亀裂方向ラインを示す表示17と、亀
裂方向ラインに沿って一次元近接端子10の配列方向ラ
インからの距離を示す目盛り表示18である。尚、図中
7は、照明用ライトであり、これは亀裂14と一次元近
接端子10と位置決め用印15の部分を照明できるよう
にしたものである。また、図中19は、握持部に設けた
押し当て釦部で、当該押し当て釦部を押圧すると、一次
元近接端子10に押圧力が負荷され被検査対象物との接
触が確実となり、しかも押圧力が所定以上になったと
き、測定用の電流が流れはじめるように構成しても良
い。
The terminal space of at least the one-dimensional proximity terminal 10 of the probe 9 is formed as a transparent body 13 and / or a space 13a so that the crack 14 can be visually confirmed. A positioning mark 15 is displayed on the transparent body 13. The positioning mark 15 can confirm that the one-dimensional proximity terminal 10 straddles so as to be orthogonal to the crack 14 and that the center between the terminals of the one-dimensional proximity terminal 10 matches the middle position of the crack length. is there. A specific positioning mark 15 is a line in the arrangement direction of the one-dimensional proximity terminal 10 in which four terminals of a pair of current input / output terminals 11 and 11 and a pair of potential difference measurement terminals 12 and 12 are arranged on one straight line. , A display 17 indicating a crack direction line, and a scale display 18 indicating a distance from the arrangement direction line of the one-dimensional proximity terminals 10 along the crack direction line. In the drawing, reference numeral 7 denotes an illumination light, which can illuminate the crack 14, the one-dimensional proximity terminal 10, and the positioning mark 15. In addition, 19 in the figure is a pressing button portion provided on the grip portion, and when the pressing button portion is pressed, a pressing force is applied to the one-dimensional proximity terminal 10 and contact with the inspection object becomes reliable, In addition, the configuration may be such that the current for measurement starts to flow when the pressing force exceeds a predetermined value.

【0030】また、一次元近接端子10に板状バネ部材
20を連設し、当該板状バネ部材20に荷重を加えたり
荷重を減らしたりすることにより一次元近接端子10の
間隔を狭くしたり、広くするなどの調整ができるように
した端子間調整機構21を設けてある。
Further, a plate-like spring member 20 is connected to the one-dimensional proximity terminal 10, and the distance between the one-dimensional proximity terminals 10 can be reduced by applying a load to the plate-like spring member 20 or reducing the load. In addition, an inter-terminal adjustment mechanism 21 is provided so as to enable adjustment such as widening.

【0031】<実施例2>図4は、本発明に係る亀裂深
さ測定器用センサの第2実施例を示す平面図(イ)と正
面図(ロ)である。この実施例は、第1実施例と同じよ
うに角柱型の握持部8とその先端部に設けた探り針部9
とからなり、基本的構成が同じである。また、一次元近
接端子10の端子間隔部分に透明体13の部分と亀裂に
対応する空間部13aとを形成してある。従って、亀裂
14の部分を視覚によって確認でき易く構成されてい
る。また、位置決め用印15の表示が異なっている。本
実施例の具体的な位置決め用印15は、一対の電流入出
力端子11,11と一対の電位差計測端子12,12の
4本の端子が1直線上に配設してなる一次元近接端子1
0の配列方向ラインを示す表示16と、空間部13aに
沿って亀裂方向ラインを示す2本の表示17と、当該亀
裂方向ライン表示17に沿って一次元近接端子10の配
列方向ラインからの距離を示す目盛り表示18が設けら
れている。本実施例の場合には、位置決め用印15が充
実して表示されているので、照明用ライト7がなくても
良い。
<Embodiment 2> FIG. 4 is a plan view (a) and a front view (b) showing a second embodiment of the sensor for a crack depth measuring instrument according to the present invention. This embodiment is similar to the first embodiment in that it has a prism-shaped gripping portion 8 and a probe 9 provided at the tip thereof.
And the basic configuration is the same. Further, a portion of the transparent body 13 and a space 13a corresponding to the crack are formed in the terminal interval portion of the one-dimensional proximity terminal 10. Therefore, the crack 14 can be easily visually confirmed. Also, the display of the positioning mark 15 is different. A specific positioning mark 15 of the present embodiment is a one-dimensional proximity terminal 1 in which four terminals of a pair of current input / output terminals 11 and a pair of potential difference measuring terminals 12 and 12 are arranged on one straight line.
A display 16 indicating an array direction line of 0, two displays 17 indicating a crack direction line along the space 13a, and a distance from the array direction line of the one-dimensional proximity terminal 10 along the crack direction line display 17 Is provided. In the case of the present embodiment, since the positioning marks 15 are displayed in a rich manner, the illumination light 7 may not be provided.

【0032】<実施例3>図5は、本発明に係る亀裂深
さ測定器用センサの第3実施例を示す平面図(イ)とそ
の正面図(ロ)であり、図6は、図5に示した亀裂深さ
測定器用センサの第3実施例を示す側面図(イ)と、そ
の正面図(ロ)である。この実施例は、円柱型の握持部
8とその先端部に設けた探り針部9とからなる。当該探
り針部9の先端には、一対の電流入出力端子11,11
と一対の電位差計測端子12,12の4本の端子が1直
線上に配設してなる一次元近接端子10を備えている。
当該一次元近接端子10の配列方向ラインの中間位置に
おいて直交するライン上に照明用レンズ23,23を一
対、前記一次元近接端子の配列方向ラインを跨がるよう
に配設している。そのうえで内蔵されている照射光源か
らの光線が照明用レンズ23,23を通して焦点を合わ
せたスポット光22,22が、前記一次元近接端子10
の配列方向ラインを基準にして跨いだ対称位置に2点の
スポット光22,22として照射出来るようにし、これ
を位置決め用印とした。
<Embodiment 3> FIG. 5 is a plan view (a) and a front view (b) showing a third embodiment of a sensor for a crack depth measuring instrument according to the present invention, and FIG. FIG. 6A is a side view showing a third embodiment of the sensor for a crack depth measuring instrument shown in FIG. This embodiment comprises a cylindrical grip portion 8 and a probe 9 provided at the tip thereof. A pair of current input / output terminals 11 and 11 are provided at the tip of the probe 9.
And a one-dimensional proximity terminal 10 in which four terminals of a pair of potential difference measuring terminals 12 and 12 are arranged on one straight line.
A pair of illumination lenses 23 are arranged on a line orthogonal to the line in the arrangement direction of the one-dimensional proximity terminals 10 so as to straddle the arrangement direction line of the one-dimensional proximity terminals. Then, the spot light 22, 22 in which the light from the built-in irradiation light source is focused through the illumination lenses 23, 23, is transmitted to the one-dimensional proximity terminal 10.
Are illuminated as two spot lights 22 at a symmetrical position straddling the arrangement direction line as a reference, and this is used as a positioning mark.

【0033】[0033]

【発明の効果】本願発明は、被検査物に3次元疲労亀裂
などが生じた際の深さを非破壊的に測定するための直流
電位差法による亀裂深さ測定器用センサについて、簡単
に的確な位置決めができたり、確実な接触ができるよう
にしてその操作性を高め、誤差のない正確な測定ができ
るようにするものである。具体的には、各発明について
が次のような効果がある。
According to the present invention, a sensor for a crack depth measuring instrument by the DC potential difference method for non-destructively measuring the depth when a three-dimensional fatigue crack or the like occurs in an object to be inspected is provided. The operability is improved by enabling positioning and reliable contact, thereby enabling accurate measurement without error. Specifically, each invention has the following effects.

【0034】第1発明は、亀裂深さ測定器用センサにお
いて、前記探り針部に、一次元近接端子が亀裂と直交す
るように跨いでいること、及び一次元近接端子の端子間
中心が亀裂長さの中間位置と一致することを確認できる
位置決め用印を設けるようにすることにより、被検査物
に亀裂深さ測定器用センサを押付ける際、正しく位置決
めすることが容易にできるので、亀裂深さを高精度に測
定でき、誤差がすくなくなる。
According to a first aspect of the present invention, in the sensor for a crack depth measuring instrument, a one-dimensional proximity terminal straddles the probe so as to be orthogonal to the crack, and the center between the terminals of the one-dimensional proximity terminal is a crack length. By providing a positioning mark that can confirm that the crack depth coincides with the middle position, it is easy to correctly position when pressing the crack depth measurement sensor on the inspection object, so that the crack depth can be easily adjusted. Measurement can be performed with high accuracy and errors are reduced.

【0035】第2発明は、亀裂深さ測定器用センサに位
置決め用印と照明用ライトを設け、亀裂と位置決め用印
を照明により浮き上がらせ、位置決め操作を一層行い易
くさせるものである。
According to a second aspect of the present invention, a positioning mark and an illuminating light are provided on a sensor for a crack depth measuring instrument, and the crack and the positioning mark are raised by illumination to make the positioning operation easier.

【0036】第3発明は、亀裂深さ測定器用センサの位
置決め用印として、必要な要件を備えた具体的表示を特
定した。位置決め用印に従って亀裂深さ測定器用センサ
の適切な位置決めを簡単に行うことが出来る。
According to the third aspect of the present invention, a specific display having necessary requirements is specified as a positioning mark of a sensor for a crack depth measuring instrument. Appropriate positioning of the crack depth measuring sensor can be easily performed according to the positioning marks.

【0037】第4発明は、一次元近接端子の端子間隔部
分を透明体および/または空間部となして対象亀裂を視
覚によって確認できるようにするとともに、透明体の部
分および/または空間部近傍に位置決め用印を表示した
ので、簡単に高精度な位置決めを行うことが出来る。
According to a fourth aspect of the present invention, the terminal gap portion of the one-dimensional proximity terminal is formed as a transparent body and / or a space so that the target crack can be visually confirmed, and at the vicinity of the transparent body and / or the space. Since the positioning mark is displayed, high-precision positioning can be easily performed.

【0038】第5発明は、スポット光が、前記一次元近
接端子の配列方向ラインを基準にして跨いだ対称位置に
2点のスポット光として照射出来るようにし、これを位
置決め用印となし、2点のスポット光を亀裂に合わせる
だけで、一次元近接端子が所定の正しい位置に設定でき
るものである。
According to a fifth aspect of the present invention, the spot light can be radiated as two spot lights to a symmetrical position straddling the arrangement direction line of the one-dimensional proximity terminals as a reference, and this is not used as a positioning mark. The one-dimensional proximity terminal can be set at a predetermined correct position only by adjusting the spot light to the crack.

【0040】第6発明は、一次元近接端子の間隔を狭く
したり、広くするなどの調整ができるようにした端子間
調整機構を設け、一台で多様な探り針部に変更できるよ
うにした。
According to the sixth aspect of the present invention, an inter-terminal adjustment mechanism is provided which can adjust the distance between the one-dimensional proximity terminals to be narrower or wider, so that a single probe can be changed to various probe needles. .

【0041】第7発明は、握持部に探り針部の押し当て
釦部を設けるとともに、一次元近接端子に所定以上の押
圧力が負荷されたとき測定用の電流が流されるようにし
たので、被検査物表面に凹凸があっても押し当て釦部を
押して計測面の形状に対応して端子が確実に接触出来る
ようにし、更にまた、所定の荷重が加わった時、初めて
計測のための電流が流れるようにして、電気の無駄がな
いようにした。
According to the seventh aspect of the present invention, the holding button is provided with a contact button for the probe, and a current for measurement is applied when a predetermined pressing force is applied to the one-dimensional proximity terminal. , Even if the surface of the test object has irregularities, press the pressing button part to ensure that the terminals can be in contact with the shape of the measurement surface, and when a predetermined load is applied, The current was made to flow so that there was no waste of electricity.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明に係る亀裂深さ測定器用センサの一実
施例を示す斜視図である。
FIG. 1 is a perspective view showing an embodiment of a sensor for a crack depth measuring instrument according to the present invention.

【図2】 図1に示した実施例に係る亀裂深さ測定器用
センサの側面図である。
FIG. 2 is a side view of the sensor for a crack depth measuring instrument according to the embodiment shown in FIG.

【図3】 図1に示した実施例に係る亀裂深さ測定器用
センサの平面図(イ)と正面図(ロ)である。
FIG. 3 is a plan view (a) and a front view (b) of the sensor for a crack depth measuring instrument according to the embodiment shown in FIG.

【図4】 本発明に係る亀裂深さ測定器用センサの他実
施例を示す平面図(イ)と正面図(ロ)である。
FIG. 4 is a plan view (a) and a front view (b) showing another embodiment of the sensor for a crack depth measuring instrument according to the present invention.

【図5】 本発明に係る亀裂深さ測定器用センサの他実
施例を示す平面図(イ)とその正面図(ロ)である。
FIG. 5 is a plan view (a) and a front view (b) showing another embodiment of the sensor for a crack depth measuring instrument according to the present invention.

【図6】 図5に示した実施例に係る亀裂深さ測定器用
センサの他実施例を示す側面図(イ)とその正面図
(ロ)である。
6 is a side view (a) and a front view (b) showing another embodiment of the crack depth measuring device sensor according to the embodiment shown in FIG.

【図7】 直流電位差法による三次元亀裂測定装置の全
機器構成例を示す斜視図である。
FIG. 7 is a perspective view showing an example of the overall configuration of a three-dimensional crack measuring apparatus using a DC potential difference method.

【図8】 亀裂深さ測定器用センサの一次元近接端子の
配列状態例を示す要部拡大概略図である。
FIG. 8 is an enlarged schematic view of a main part showing an example of an arrangement state of one-dimensional proximity terminals of a sensor for a crack depth measuring instrument.

【図9】 近接端子による半だ円表面亀裂の計測方法を
示す説明図である。
FIG. 9 is an explanatory diagram showing a method for measuring a semi-elliptical surface crack by a proximity terminal.

【符号の説明】[Explanation of symbols]

1…亀裂深さ測定器用センサ 2…直流安定化電源 3…デジタルマルチメータ 4…DP−IBアダプター 5…パーソナルコンピュータ 6…キャリアケース 7…照明用ライト 8…握持部 9…探り針部 10…一次元近接端子 11…電流入出力端子 12…電位差計測端子 13…空間部 14…亀裂 15…位置決め用印 16…配列方向ラインを示す表示 17 亀裂方向ラインを示す表示 18…目盛り表示 19…押し当て釦部 20…板状バネ部材 21…端子間調整機構 22…スポット光 23…照明用レンズ DESCRIPTION OF SYMBOLS 1 ... Sensor for crack depth measuring device 2 ... DC stabilized power supply 3 ... Digital multimeter 4 ... DP-IB adapter 5 ... Personal computer 6 ... Carrier case 7 ... Lighting light 8 ... Grip section 9 ... Styling section 10 ... One-dimensional proximity terminal 11 ... Current input / output terminal 12 ... Potential difference measurement terminal 13 ... Space 14 ... Crack 15 ... Positioning mark 16 ... Display indicating the arrangement direction line 17 Display indicating the crack direction line 18 ... Scale display 19 ... Press button Part 20: plate-shaped spring member 21: inter-terminal adjustment mechanism 22: spot light 23: illumination lens

───────────────────────────────────────────────────── フロントページの続き (72)発明者 三上 光弘 宮城県岩沼市松ケ丘一丁目4−11 (72)発明者 豊川 光正 宮城県仙台市太白区郡山字石塚7番6号 有限会社豊洋電子精機内 Fターム(参考) 2F063 AA15 BB02 BD07 BD20 CA40 DA02 EA20 EB18 EB23 EB30 FA10 ZA01 2G060 AA20 AE01 AE40 AF02 AF09 AG04 AG11 EA01 EB03 EB05 EB06 GA01 HA01 HC10 2G061 BA20 CA01 CB01 CC11 EA10 EB03  ──────────────────────────────────────────────────続 き Continuing from the front page (72) Mitsuhiro Mikami, 1-4-11 Matsugaoka, Iwanuma City, Miyagi Prefecture (72) Mitsumasa Toyokawa 7-6 Ishizuka, Koriyama, Kakuyama, Sendai-shi, Miyagi Pref. F term in the machine (reference) 2F063 AA15 BB02 BD07 BD20 CA40 DA02 EA20 EB18 EB23 EB30 FA10 ZA01 2G060 AA20 AE01 AE40 AF02 AF09 AG04 AG11 EA01 EB03 EB05 EB06 GA01 HA01 HC10 2G061 BA20 CA01 CB01 CB01 CC10

Claims (7)

【特許請求の範囲】[Claims] 【請求項1】 握持部の先端部に一対の電流入出力端子
と一対の電位差計測端子の4本の端子が1直線上に配設
してなる一次元近接端子を備えた探り針部を設けてなる
亀裂深さ測定器用センサにおいて、前記探り針部に、一
次元近接端子が亀裂と直交するように跨いでいること、
及び一次元近接端子の端子間中心が亀裂長さの中間位置
と一致することを確認できる位置決め用印を設けるよう
にしたことを特徴とする直流電位差法による亀裂深さ測
定器用センサ。
1. A probe having a one-dimensional proximity terminal in which four terminals, a pair of current input / output terminals and a pair of potential difference measurement terminals, are arranged on a straight line at a tip end of a grip portion. In the crack depth measuring device sensor provided, a one-dimensional proximity terminal straddles the probe so as to be orthogonal to the crack,
And a positioning mark for confirming that the center between the terminals of the one-dimensional proximity terminal coincides with the middle position of the crack length. A sensor for a crack depth measuring instrument by a DC potential difference method.
【請求項2】 握持部の先端部に一対の電流入出力端子
と一対の電位差計測端子の4本の端子が1直線上に配設
してなる一次元近接端子を備えた探り針部を設けてなる
亀裂深さ測定器用センサにおいて、前記探り針部に、一
次元近接端子が亀裂と直交するように跨いでいること、
及び一次元近接端子の端子間中心が亀裂長さの中間位置
と一致することを確認できる位置決め用印を設けるとと
もに、前記探り針部には、照明用ライトを取り付け、亀
裂と一次元近接端子と位置決め用印の部分を照明できる
ようにしたことを特徴とする直流電位差法による亀裂深
さ測定器用センサ。
2. A probe having a one-dimensional proximity terminal having four terminals, a pair of current input / output terminals and a pair of potential difference measuring terminals, arranged on a straight line at a tip of a grip portion. In the crack depth measuring device sensor provided, a one-dimensional proximity terminal straddles the probe so as to be orthogonal to the crack,
In addition to providing a positioning mark for confirming that the center between the terminals of the one-dimensional proximity terminal coincides with the middle position of the crack length, an illumination light is attached to the probe, and the crack and the one-dimensional proximity terminal are positioned. A sensor for a crack depth measuring instrument based on a DC potential difference method, wherein a mark portion can be illuminated.
【請求項3】 位置決め用印が、一対の電流入出力端子
と一対の電位差計測端子の4本の端子が1直線上に配設
してなる一次元近接端子の配列方向ラインを示す表示
と、亀裂方向ラインを示す表示と、亀裂方向ラインに沿
って一次元近接端子の配列方向ラインからの距離を示す
目盛り表示であることを特徴とする請求項1若しくは請
求項2に記載する直流電位差法による亀裂深さ測定器用
センサ。
3. A display in which a positioning mark indicates an arrangement direction line of a one-dimensional proximity terminal in which four terminals of a pair of current input / output terminals and a pair of potential difference measurement terminals are arranged on a straight line. 3. A crack according to the DC potential difference method according to claim 1 or 2, wherein the indication indicates a direction line and a scale indication indicating a distance from the arrangement direction line of the one-dimensional proximity terminals along the crack direction line. Sensor for depth measuring instrument.
【請求項4】 握持部の先端部に一対の電流入出力端子
と一対の電位差計測端子の4本の端子が1直線上に配設
してなる一次元近接端子を備えた探り針部を設けてなる
亀裂深さ測定器用センサにおいて、前記探り針部の少な
くとも一次元近接端子の端子間隔部分を透明体および/
または空間部となして対象亀裂を視覚によって確認でき
るようになし、当該透明体の部分および/または空間部
近傍に位置決め用印を表示したことを特徴とする請求項
1または請求項2に記載の直流電位差法による亀裂深さ
測定器用センサ。
4. A probe portion provided with a one-dimensional proximity terminal in which four terminals, a pair of current input / output terminals and a pair of potential difference measuring terminals, are arranged on a straight line at the tip of the grip portion. In the sensor for a crack depth measuring instrument provided, at least the one-dimensional proximity terminal of the probe portion has a transparent body and / or
3. The direct current according to claim 1, wherein the target crack is visually recognized as a space, and a positioning mark is displayed near the transparent body and / or the space. Sensor for crack depth measuring device by potentiometric method.
【請求項5】 握持部の先端部に一対の電流入出力端子
と一対の電位差計測端子の4本の端子が1直線上に配設
してなる一次元近接端子を備えた探り針部を設けてなる
亀裂深さ測定器用センサにおいて、前記探り針部に、配
設されている一次元近接端子の配列方向ラインの中間位
置において直交するライン上に照明用レンズを一対、前
記一次元近接端子の配列方向ラインを跨がるように配設
し、内蔵されている照射光源からの光線が照明用レンズ
を通して焦点を合わせたスポット光が、前記一次元近接
端子の配列方向ラインを基準にして跨いだ対称位置に2
点のスポット光として照射出来るようにし、これを位置
決め用印としたことを特徴とする直流電位差法による亀
裂深さ測定器用センサ。
5. A probe having a one-dimensional proximity terminal in which four terminals, a pair of current input / output terminals and a pair of potential difference measurement terminals, are arranged on a straight line at a tip end of a grip portion. In the crack depth measuring instrument sensor provided, a pair of illumination lenses are arranged on a line orthogonal to an intermediate position of an arrangement direction line of the one-dimensional proximity terminals provided on the probe, and the one-dimensional proximity terminal is provided. Arranged so as to straddle the arrangement direction line, the spot light in which the light from the built-in irradiation light source is focused through the illumination lens, straddles with reference to the arrangement direction line of the one-dimensional proximity terminal. 2 at symmetrical position
A sensor for a crack depth measuring instrument by a DC potential difference method, which can be radiated as a spot light of a point and used as a positioning mark.
【請求項6】 握持部の先端部に一対の電流入出力端子
と一対の電位差計測端子の4本の端子が1直線上に配設
してなる一次元近接端子を備えた探り針部を設けてなる
亀裂深さ測定器用センサにおいて、前記一次元近接端子
に板状バネ部材を設け、当該板状バネ部材に荷重を加え
たり荷重を減らしたりすることにより一次元近接端子の
間隔を狭くしたり、広くするなどの調整ができるように
した端子間調整機構を設けたことを特徴とする直流電位
差法による亀裂深さ測定器用センサ。
6. A probe having a one-dimensional proximity terminal in which four terminals, a pair of current input / output terminals and a pair of potential difference measuring terminals, are arranged on a straight line at the tip of the grip portion. In the crack depth measuring device sensor provided, a plate-like spring member is provided on the one-dimensional proximity terminal, and a distance between the one-dimensional proximity terminals is reduced by applying a load to the plate-like spring member or reducing the load. A sensor for a crack depth measuring instrument by a DC potential difference method, comprising an inter-terminal adjusting mechanism capable of adjusting the width and width of the crack.
【請求項7】 握持部とその先端部に一対の電流入出力
端子と一対の電位差計測端子の4本の端子が1直線上に
配設してなる一次元近接端子を備えた探り針部を設けて
なる亀裂深さ測定器用センサにおいて、握持部に探り針
部の押し当て釦部を設けるとともに、一次元近接端子に
所定以上の押圧力が負荷されたとき測定用の電流が流さ
れるようにしたことを特徴とする直流電位差法による亀
裂深さ測定器用センサ。
7. A probe portion provided with a one-dimensional proximity terminal in which four terminals of a pair of current input / output terminals and a pair of potential difference measuring terminals are arranged on a straight line at a grip portion and a tip portion thereof. In the sensor for a crack depth measuring instrument provided with, a pressing button portion of the probe portion is provided in the gripping portion, and a current for measurement flows when a predetermined or more pressing force is applied to the one-dimensional proximity terminal. A sensor for a crack depth measuring instrument by a DC potential difference method, characterized in that:
JP10332653A 1998-11-24 1998-11-24 Sensor for crack depth measuring instrument by direct current potential difference method Pending JP2000155006A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10332653A JP2000155006A (en) 1998-11-24 1998-11-24 Sensor for crack depth measuring instrument by direct current potential difference method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10332653A JP2000155006A (en) 1998-11-24 1998-11-24 Sensor for crack depth measuring instrument by direct current potential difference method

Publications (1)

Publication Number Publication Date
JP2000155006A true JP2000155006A (en) 2000-06-06

Family

ID=18257375

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10332653A Pending JP2000155006A (en) 1998-11-24 1998-11-24 Sensor for crack depth measuring instrument by direct current potential difference method

Country Status (1)

Country Link
JP (1) JP2000155006A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006300879A (en) * 2005-04-25 2006-11-02 Magnegraph:Kk Device for measuring object
JP2006308324A (en) * 2005-04-26 2006-11-09 Tokyo Electric Power Co Inc:The Technique for crack depth measuring of deep crack using potential difference method and crack depth measuring instrument
KR102425134B1 (en) * 2022-03-15 2022-07-29 주식회사 선진곤도라 Safety inspection device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006300879A (en) * 2005-04-25 2006-11-02 Magnegraph:Kk Device for measuring object
JP4712428B2 (en) * 2005-04-25 2011-06-29 日本高圧電気株式会社 Device for measuring objects
JP2006308324A (en) * 2005-04-26 2006-11-09 Tokyo Electric Power Co Inc:The Technique for crack depth measuring of deep crack using potential difference method and crack depth measuring instrument
KR102425134B1 (en) * 2022-03-15 2022-07-29 주식회사 선진곤도라 Safety inspection device

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