JP2000143337A - Dielectric ceramic composition and thick film capacitor produced by using the composition - Google Patents

Dielectric ceramic composition and thick film capacitor produced by using the composition

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Publication number
JP2000143337A
JP2000143337A JP10314339A JP31433998A JP2000143337A JP 2000143337 A JP2000143337 A JP 2000143337A JP 10314339 A JP10314339 A JP 10314339A JP 31433998 A JP31433998 A JP 31433998A JP 2000143337 A JP2000143337 A JP 2000143337A
Authority
JP
Japan
Prior art keywords
dielectric
composition
thick film
main component
mgo
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10314339A
Other languages
Japanese (ja)
Other versions
JP3389947B2 (en
Inventor
Yasuhiro Shiyatou
康弘 社藤
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Mitsubishi Materials Corp
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Mitsubishi Materials Corp
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Filing date
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Priority to JP31433998A priority Critical patent/JP3389947B2/en
Publication of JP2000143337A publication Critical patent/JP2000143337A/en
Application granted granted Critical
Publication of JP3389947B2 publication Critical patent/JP3389947B2/en
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Expired - Fee Related legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To provide a dielectric ceramic composition having high dielectric constant and low dielectric loss and producible in a short time by baking at a temperature as low as <=900 deg.C. SOLUTION: The objective ceramic composition is composed mainly of a component expressed by compositional formula of xPb(Mg1/3Nb2/3)O3.yPb(Fe1/2 Nb1/2)O3.zPbTiO3 ((x), (y) and (z) are each a molar ratio; x+y+z=1; 0.80<=x<=0.92; 0.02<=y<=0.19; 0.005<=z<=0.06). The composition further contains 0.5-5.0 mol% of MgO based on the main component and 3-10 wt.% of a flux expressed by the compositional formula of a (PbO).b(ZnO).c (BiO3/2)1-n(GeO2)n} ((a), (b) and (c) are each a molar ratio; a+b+c=1; 0.30<=a<=0.80; 0.15<=c<=0.50; 0<n<=0.75) based on the sum of the main component and MgO.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、電子部品に使用さ
れる高誘電率の誘電体磁器組成物に関する。更にこの組
成物を用いた厚膜コンデンサに関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a dielectric ceramic composition having a high dielectric constant used for electronic parts. Further, the present invention relates to a thick film capacitor using the composition.

【0002】[0002]

【従来の技術】小型化や高信頼性が望まれる電子機器に
おいては、実装密度の高いハイブリッドIC化が進めら
れており、従来の積層チップコンデンサに代って、厚膜
コンデンサに対する要望が高まっている。また厚膜抵抗
と厚膜コンデンサを組合わせたCRチップ電子部品の需
要も高まっている。厚膜コンデンサはセラミック基板上
の下部電極に誘電体の厚膜を形成し、その上に上部電極
を形成して作られる。ハイブリッドICやCRチップに
使用される厚膜コンデンサ用の誘電体材料が厚膜抵抗用
の抵抗ペーストを焼成する850℃程度の温度でかつ短
時間に焼成できれば、この厚膜抵抗を製造しているベル
ト炉を使用して高い効率で生産することができる。
2. Description of the Related Art In electronic equipment for which miniaturization and high reliability are desired, a hybrid IC having a high mounting density is being promoted, and a demand for a thick film capacitor is increasing instead of a conventional multilayer chip capacitor. I have. Also, the demand for CR chip electronic components combining a thick film resistor and a thick film capacitor is increasing. Thick film capacitors are made by forming a dielectric thick film on a lower electrode on a ceramic substrate and forming an upper electrode thereon. If a dielectric material for a thick film capacitor used for a hybrid IC or a CR chip can be fired at a temperature of about 850 ° C. for firing a resistor paste for a thick film resistor in a short time, the thick film resistor is manufactured. It can be produced with high efficiency using a belt furnace.

【0003】しかし、これまで積層チップコンデンサに
用いられているチタン酸バリウム(BaTiO3)系や
鉛リラクサ系の誘電体材料を焼成するためには、100
0℃以上の高い焼成温度で数時間保持しなければならな
ず、またこの誘電体材料を低温かつ短時間で焼成する
と、誘電体材料が未焼成(未焼結)になり、いずれも厚
膜コンデンサ用誘電体材料に適さない。従来、厚膜コン
デンサ用誘電体材料に適するものとして、PbTiO3
−Pb(Mg1/3Nb2/3)O3−PbZrO3系にMnO
2を添加した誘電体磁器組成物が開示されている(特開
平5−314816)。この誘電体磁器組成物は誘電率
を損なわず、大気中、中性雰囲気中或いは還元雰囲気中
にて800〜1000℃で、短時間焼成が可能でかつ誘
電損失が小さい特長がある。
However, in order to sinter barium titanate (BaTiO 3 ) or lead relaxer-based dielectric materials used in multilayer chip capacitors, a 100
It must be kept at a high firing temperature of 0 ° C. or more for several hours, and when this dielectric material is fired at a low temperature and in a short time, the dielectric material becomes unfired (unsintered), and in any case, a thick film Not suitable for dielectric material for capacitors. Conventionally, as a material suitable for a dielectric material for a thick film capacitor, PbTiO 3
-Pb (Mg 1/3 Nb 2/3 ) O 3 -PbZrO 3 system with MnO
2 discloses a dielectric porcelain composition (JP-A-5-314816). This dielectric porcelain composition does not impair the dielectric constant, is characterized in that it can be fired in air, a neutral atmosphere, or a reducing atmosphere at 800 to 1000 ° C. for a short time and has a small dielectric loss.

【0004】[0004]

【発明が解決しようとする課題】しかし、上記特開平5
−314816号公報に示される誘電体磁器組成物は、
その実施例で明らかなように誘電率が200〜465程
度であってそれ程高くなく、誘電損失が0.5〜0.9
5%程度であってそれ程小さくない。このため更に誘電
特性の優れた誘電体磁器組成物が望まれていた。本発明
の目的は、誘電率が大きくて誘電損失が小さく、900
℃以下の低温度で短時間の焼成が可能な誘電体磁器組成
物を提供することにある。本発明の別の目的は、この誘
電体磁器組成物を用いた厚膜コンデンサを提供すること
にある。
However, the above-mentioned Japanese Patent Application Laid-Open
The dielectric porcelain composition disclosed in -314816 is
As is clear from the example, the dielectric constant is about 200 to 465, not so high, and the dielectric loss is 0.5 to 0.9.
About 5%, not so small. Therefore, a dielectric porcelain composition having more excellent dielectric properties has been desired. An object of the present invention is to provide a dielectric material having a large dielectric constant and a small dielectric loss,
An object of the present invention is to provide a dielectric porcelain composition that can be fired at a low temperature of not more than ℃ for a short time. Another object of the present invention is to provide a thick film capacitor using the dielectric ceramic composition.

【0005】[0005]

【課題を解決するための手段】請求項1に係る発明は、
Pb(Mg1/3Nb2/3)O3、Pb(Fe1/2Nb1/2
3及びPbTiO3の3成分からなり下記式(1)で表
される組成物の主成分と、MgOと、PbO、ZnO、
Bi23及びGeO2の4成分からなりBi23をBi
3/2に換算することにより下記(2)で表されるフラ
ックスとを含む誘電体磁器組成物であって、MgOを主
成分に対して0.5〜5.0モル%含み、フラックスを
主成分とMgOの合計に対して3〜10重量%含むこと
を特徴とする誘電体磁器組成物である。 xPb(Mg1/3Nb2/3)O3・yPb(Fe1/2Nb1/2)O3・zPbTiO3 ……(1) (式中、x、y、zはモル比でx+y+z=1、0.8
0≦x≦0.92、0.02≦y≦0.19、0.00
5≦z≦0.06) a(PbO)・b(ZnO)・c{(BiO3/21-n(GeO2n}……(2) (式中、a、b、cはモル比でa+b+c=1、0.3
0≦a≦0.80、0.15≦c≦0.50、0<n≦
0.75) 上記特定組成の主成分に対して、特定割合のMgOと特
定組成のフラックスとを添加した組成にすることによ
り、低温焼成が可能となり、高誘電率で誘電損失の小さ
い磁器組成物を実現することができる。
The invention according to claim 1 is
Pb (Mg 1/3 Nb 2/3 ) O 3 , Pb (Fe 1/2 Nb 1/2 )
A main component of a composition composed of three components of O 3 and PbTiO 3 and represented by the following formula (1), MgO, PbO, ZnO,
Bi 2 O 3 and Bi 2 O 3 consists of four components of GeO 2 Bi
A dielectric porcelain composition containing a flux represented by the following formula (2) when converted to O 3/2 , comprising 0.5 to 5.0 mol% of MgO based on the main component, and A dielectric porcelain composition characterized by containing 3 to 10% by weight based on the total of the main component and MgO. xPb (Mg 1/3 Nb 2/3 ) O 3 .yPb (Fe 1/2 Nb 1/2 ) O 3 .zPbTiO 3 (1) (where x, y and z are x + y + z = 1, 0.8
0 ≦ x ≦ 0.92, 0.02 ≦ y ≦ 0.19, 0.00
5 ≦ z ≦ 0.06) a (PbO) · b (ZnO) · c {(BiO 3/2 ) 1-n (GeO 2 ) n } (2) (where a, b, and c are A + b + c = 1, 0.3 in molar ratio
0 ≦ a ≦ 0.80, 0.15 ≦ c ≦ 0.50, 0 <n ≦
0.75) By using a composition in which a specific ratio of MgO and a specific composition of flux are added to the above-mentioned main component of the specific composition, low-temperature firing becomes possible, and a ceramic composition having a high dielectric constant and a small dielectric loss. Can be realized.

【0006】請求項2に係る発明は、図2に示すように
セラミック基板11上に設けられた下部電極12と、こ
の下部電極12上に設けられた請求項1記載の誘電体磁
器組成物からなる誘電体層13と、この誘電体層13上
に設けられた上部電極14とを備えた厚膜コンデンサで
ある。
According to a second aspect of the present invention, as shown in FIG. 2, a lower electrode 12 provided on a ceramic substrate 11 and a dielectric ceramic composition according to the first aspect provided on the lower electrode 12 are provided. This is a thick film capacitor including a dielectric layer 13 and an upper electrode 14 provided on the dielectric layer 13.

【0007】[0007]

【発明の実施の形態】本発明の誘電体磁器組成物の前記
式(1)で表される主成分組成は、図1に示すように3
成分系組成図において、A〜Eの各点で囲まれた斜線の
範囲内にあるものである。即ち、図1におけるA,B,
C,D及びEの各点の組成(u,v,w)はPb(Mg
1/3Nb2/3)O3をuモル%、Pb(Fe1/2Nb1/2
3をvモル%、PbTiO3をwモル%としたとき、A
(80,14,6)、B(92,2,6)、C(92,
7,0.5)、D(81,19,0.5)及びE(8
0,19,1)である。
BEST MODE FOR CARRYING OUT THE INVENTION The main component composition of the dielectric ceramic composition of the present invention represented by the above formula (1) is 3 as shown in FIG.
In the component system composition diagram, the components are within the range of hatched lines surrounded by points A to E. That is, A, B,
The composition (u, v, w) of each point of C, D and E is Pb (Mg
1/3 Nb 2/3 ) O 3 in umol%, Pb (Fe 1/2 Nb 1/2 )
When O 3 is v mol% and PbTiO 3 is w mol%, A
(80, 14, 6), B (92, 2, 6), C (92,
7,0.5), D (81,19,0.5) and E (8
0, 19, 1).

【0008】主成分の式(1)のxPb(Mg1/3Nb
2/3)O3・yPb(Fe1/2Nb1/2)O3・zPbTiO3
において、xが0.80未満であると誘電損失が大きく
なり、xが0.92を超えると焼成温度が高くなる。こ
のためxの範囲は0.80≦x≦0.92に決められ
る。好ましくは0.83≦x≦0.91である。またy
が0.02未満であると焼成温度が高くなり、yが0.
19を超えると比抵抗が小さくなる。このためyの範囲
は0.02≦y≦0.19に決められる。好ましくは
0.07≦y≦0.16である。更にzが0.005未
満であると誘電率が小さくなり、zが0.06を超える
と誘電損失が大きくなる。このためzの範囲は0.00
5≦z≦0.06に決められる。好ましくは0.005
≦x≦0.04である。本発明の主成分に対してMgO
が0.5〜5.0モル%含まれる。MgOが0.5モル
%未満であると誘電率の向上にほとんど寄与することが
なく、5.0モル%を超えると誘電率が低くなる。好ま
しくは1.0〜3.0モル%である。
XPb (Mg 1/3 Nb) of the formula (1) of the main component
2/3 ) O 3 .yPb (Fe 1/2 Nb 1/2 ) O 3 .zPbTiO 3
In x, when x is less than 0.80, the dielectric loss increases, and when x exceeds 0.92, the firing temperature increases. Therefore, the range of x is determined to be 0.80 ≦ x ≦ 0.92. Preferably, 0.83 ≦ x ≦ 0.91. Also y
Is less than 0.02, the firing temperature becomes high, and
When it exceeds 19, the specific resistance becomes small. Therefore, the range of y is determined to be 0.02 ≦ y ≦ 0.19. Preferably, 0.07 ≦ y ≦ 0.16. Further, when z is less than 0.005, the dielectric constant decreases, and when z exceeds 0.06, the dielectric loss increases. Therefore, the range of z is 0.00
It is determined that 5 ≦ z ≦ 0.06. Preferably 0.005
≤ x ≤ 0.04. MgO to the main component of the present invention
Is contained in an amount of 0.5 to 5.0 mol%. If MgO is less than 0.5 mol%, it hardly contributes to the improvement of the dielectric constant, and if it exceeds 5.0 mol%, the dielectric constant becomes low. Preferably it is 1.0 to 3.0 mol%.

【0009】本発明の主成分とMgOの合計に対して、
PbO、ZnO、Bi23及びGeO2の4成分からな
るフラックス(融剤)が3〜10重量%、好ましくは4
〜7重量%含まれる。フラックスの添加量が3重量%未
満であると低温度で短時間の焼成が困難となり、10重
量%を超えると誘電率が低下する不具合を生じる。また
フラックスの前記式(2)のa(PbO)・b(Zn
O)・c{(BiO3/21-n(GeO2n}において、
aが0.30未満であると低温度で短時間の焼成が困難
となり、0.80を超えると誘電損失が大きくなる。c
が0.15未満であると低温度で短時間の焼成が困難と
なり、0.50を超えると結晶粒が大きくなる。またn
が0であると、GeO2成分が含まれなくなり、低温度
の焼成がより一層困難になり、0.75を超えると誘電
率が低くなる。bに関してはa+b+c=1と上記aの
範囲と上記cの範囲から決められる範囲において任意で
ある。
With respect to the total of the main component of the present invention and MgO,
PbO, ZnO, Bi 2 O 3 and flux consisting of four components of GeO 2 (flux) from 3 to 10 wt%, preferably 4
-7% by weight. If the added amount of the flux is less than 3% by weight, it is difficult to bake at a low temperature for a short time, and if it is more than 10% by weight, the dielectric constant is disadvantageously lowered. The flux a (PbO) · b (Zn) in the above equation (2)
O) · c {(BiO 3/2 ) 1-n (GeO 2 ) n }
If a is less than 0.30, it becomes difficult to perform baking at a low temperature for a short time, and if it exceeds 0.80, the dielectric loss increases. c
If it is less than 0.15, it will be difficult to fire at a low temperature for a short time, and if it exceeds 0.50, the crystal grains will be large. And n
Is 0, the GeO 2 component is not contained, and low-temperature baking becomes more difficult. If it exceeds 0.75, the dielectric constant becomes low. b is arbitrary in the range of a + b + c = 1, which is determined from the range of a and the range of c.

【0010】このような本発明の誘導体磁器組成物を製
造するには、例えば一酸化鉛(PbO)、酸化マグネシ
ウム(MgO)、五酸化ニオブ(Nb25)、酸化第二
鉄(Fe23)、酸化チタニウム(TiO2)、或いは
これらの複合酸化物等の粉末を所定の割合になるように
秤量し、純水を加えて湿式ボールミル等により十分に混
合する。次にこの混合物を乾燥した後、必要に応じて7
00〜900℃の範囲で数時間仮焼する。得られた仮焼
物を湿式ボールミル等で粉砕し、この仮焼粉を乾燥す
る。一方、一酸化鉛(PbO)、酸化亜鉛(ZnO)、
酸化ホウ素(B23)及び酸化ゲルマニウム(Ge
2)を所定の割合になるように秤量し、湿式ボールミ
ル等により十分に混合してフラックスを調製する。この
フラックスを上記仮焼粉に所定量加え混合する。
In order to manufacture such a derivative ceramic composition of the present invention, for example, lead monoxide (PbO), magnesium oxide (MgO), niobium pentoxide (Nb 2 O 5 ), ferric oxide (Fe 2) Powders such as O 3 ), titanium oxide (TiO 2 ), or a composite oxide thereof are weighed so as to have a predetermined ratio, and pure water is added thereto and sufficiently mixed by a wet ball mill or the like. The mixture is then dried and, if necessary,
It is calcined for several hours in the range of 00 to 900 ° C. The obtained calcined product is pulverized by a wet ball mill or the like, and the calcined powder is dried. On the other hand, lead monoxide (PbO), zinc oxide (ZnO),
Boron oxide (B 2 O 3 ) and germanium oxide (Ge
O 2 ) is weighed so as to have a predetermined ratio, and sufficiently mixed by a wet ball mill or the like to prepare a flux. A predetermined amount of the flux is added to the calcined powder and mixed.

【0011】この誘電体材料から厚膜コンデンサを作る
場合には、上記フラックスを添加した混合物を乾燥して
粉砕し、誘電体粉末を作る。この誘電体粉末に有機ビヒ
クルを加えて混練し、誘電体ペーストを調製する。図2
に示すように、アルミナ基板のような絶縁性セラミック
基板11の上にCu、Ag、Ag−Pdのいずれかの金
属粉末とガラス粉末と有機ビヒクルを含む電極ペースト
をスクリーン印刷し乾燥した後、焼成して下部電極12
を形成する。この下部電極12の上に上記誘電体ペース
トをスクリーン印刷し乾燥した後、焼成して誘電体層1
3を形成する。次にこの誘電体層13の上にCu、A
g、Ag−Pdのいずれかの金属粉末とガラス粉末と有
機ビヒクルを含む電極ペーストをスクリーン印刷し乾燥
した後、焼成して下部電極14を形成する。なお、この
誘電体材料からセラミックコンデンサを作ることも可能
である。この誘電体材料から円板状又は円筒状のセラミ
ックコンデンサを作る場合には、上記フラックスを添加
した混合物にポリビニルブチラール(PVB)を主成分
とする有機バインダを加えて造粒し、これを円板状又は
円筒状にプレス成形した後、焼成する。またこの誘電体
材料から積層セラミックコンデンサを作る場合には、上
記フラックスを添加した混合物にポリビニルブチラール
を主成分とする有機バインダを加えてセラミックグリー
ンシートを作製し、このグリーンシートと電極とを交互
に多数枚積層した後、焼成する。本発明の誘導体磁器組
成物は、いずれの形態のコンデンサを作る場合にも、そ
の焼成は700〜900℃の温度範囲で5〜15分間行
う。
When a thick film capacitor is made from this dielectric material, the mixture to which the flux has been added is dried and pulverized to produce a dielectric powder. An organic vehicle is added to the dielectric powder and kneaded to prepare a dielectric paste. FIG.
As shown in FIG. 5, an electrode paste containing a metal powder of any of Cu, Ag, and Ag-Pd, a glass powder, and an organic vehicle is screen-printed and dried on an insulating ceramic substrate 11 such as an alumina substrate. And lower electrode 12
To form The dielectric paste is screen-printed on the lower electrode 12, dried and fired to form the dielectric layer 1.
Form 3 Next, on this dielectric layer 13, Cu, A
g, an electrode paste containing a metal powder of Ag-Pd, a glass powder, and an organic vehicle is screen-printed, dried, and fired to form the lower electrode 14. Note that a ceramic capacitor can be made from this dielectric material. When a disc-shaped or cylindrical ceramic capacitor is made from this dielectric material, an organic binder containing polyvinyl butyral (PVB) as a main component is added to the mixture to which the above flux is added, and the mixture is granulated. After press-forming into a shape or a cylinder, baking is performed. When a multilayer ceramic capacitor is made from this dielectric material, a ceramic green sheet is prepared by adding an organic binder containing polyvinyl butyral as a main component to the mixture to which the above flux has been added, and the green sheet and the electrodes are alternately formed. After laminating a large number of pieces, baking is performed. Regardless of the type of the capacitor, the firing of the dielectric ceramic composition of the present invention is performed in a temperature range of 700 to 900 ° C. for 5 to 15 minutes.

【0012】[0012]

【実施例】次に本発明の実施例を比較例とともに説明す
る。この例では、電気特性を容易に調べるために厚膜コ
ンデンサの形態でなく、円板状のセラミックコンデンサ
を作製した。出発原料としてPbO、MgNb26、F
eNbO4及びTiO2の主成分とMgOを使用し、これ
らを表1に示す配合比となるように秤量し、ボールミル
中で純水とともに23時間湿式混合した。次いでこの混
合物を脱水し乾燥した後、750℃で2時間仮焼した。
この仮焼物を再びボールミルにより純水とともに23時
間湿式混合した後、脱水し乾燥した。次にPbO、Bi
23、ZnO及びGeO2をを表1に示す配合比となる
ように秤量し、乳鉢を用いて十分に混合した後、600
℃で4時間仮焼した。この仮焼物を再度乳鉢を用いて十
分に粉砕してフラックスを得た。
Next, examples of the present invention will be described together with comparative examples. In this example, a disk-shaped ceramic capacitor was manufactured instead of a thick-film capacitor in order to easily examine electrical characteristics. PbO, MgNb 2 O 6 , F
The main components of eNbO 4 and TiO 2 and MgO were used, weighed so as to have the compounding ratio shown in Table 1, and wet-mixed with pure water in a ball mill for 23 hours. Next, the mixture was dehydrated and dried, and then calcined at 750 ° C. for 2 hours.
The calcined product was again wet-mixed with pure water by a ball mill for 23 hours, then dehydrated and dried. Next, PbO, Bi
2 O 3 , ZnO and GeO 2 were weighed so as to have the compounding ratios shown in Table 1 and thoroughly mixed using a mortar.
Calcination was performed at ℃ for 4 hours. The calcined product was sufficiently pulverized again using a mortar to obtain a flux.

【0013】上記主成分とMgOを含む乾燥物に上記フ
ラックスを表1に示す割合で加えて混合した。この混合
物に溶剤のエタノールを加え、ボールミルで23時間混
合した後、乾燥して粉末化した。この乾燥粉末に有機バ
インダとしてポリビニルブチラールを加え、120℃で
1時間乾燥した後、2トン/cm2の圧力で加圧成形し
て円板状の成形体を作製した。この成形体を大気中10
0℃/時間の割合で昇温し、700〜900℃程度の温
度範囲で10分間保持して焼成した。このようにして得
られた直径12mm、厚さ0.8mmの円板状の磁器素
体の上面及び下面にAgペーストをそれぞれ塗布して7
50℃で焼付けて上部電極及び下部電極を形成し、円板
状のセラミックコンデンサを得た。このセラミックコン
デンサの電気特性を調べた。その結果を表2に示す。な
お、電気特性の誘電率及び誘電損失(tanδ)はYH
PデジタルLCRメータモデル4274Aを用い、測定
周波数1kHz、測定電圧1.0Vrms、温度25℃に
て測定した。また上記磁器素体の密度も示した。
The above flux was added to a dried product containing the above main component and MgO at a ratio shown in Table 1 and mixed. Ethanol as a solvent was added to this mixture, and the mixture was mixed by a ball mill for 23 hours, and then dried and powdered. Polyvinyl butyral as an organic binder was added to the dried powder, dried at 120 ° C. for 1 hour, and then molded under pressure at a pressure of 2 ton / cm 2 to produce a disk-shaped molded body. This molded body is placed in the atmosphere 10
The temperature was raised at a rate of 0 ° C./hour, and calcined at a temperature range of about 700 to 900 ° C. for 10 minutes. Ag paste was applied to the upper and lower surfaces of the disc-shaped porcelain body having a diameter of 12 mm and a thickness of 0.8 mm obtained in this way, and
By baking at 50 ° C., an upper electrode and a lower electrode were formed to obtain a disc-shaped ceramic capacitor. The electrical characteristics of this ceramic capacitor were examined. Table 2 shows the results. The dielectric constant and the dielectric loss (tan δ) of the electric characteristics are YH
The measurement was performed using a P digital LCR meter model 4274A at a measurement frequency of 1 kHz, a measurement voltage of 1.0 Vrms, and a temperature of 25 ° C. The density of the porcelain body is also shown.

【0014】[0014]

【表1】 [Table 1]

【0015】なお、表1において、※1は主成分に対す
る添加量を、※2は主成分とMgOとの合計に対する添
加量をそれぞれ示す。
In Table 1, * 1 indicates the amount added to the main component, and * 2 indicates the amount added to the total of the main component and MgO.

【0016】[0016]

【表2】 [Table 2]

【0017】表1及び表2より明らかなように、主成分
組成比、MgOの添加量、フラックス組成比及びフラッ
クス添加量が本発明の範囲内の実施例1〜17では、8
50〜900℃の低い温度で焼成した誘電体磁器組成物
の密度はいずれも大きいことが判る。またこれらの誘電
体磁器組成物から得られるセラミックコンデンサは誘電
率(比誘電率)が大きく、誘電損失(tanδ)が小さ
いことが判る。これに対して、主成分組成比、MgOの
添加量、フラックス組成比及びフラックス添加量が本発
明の範囲外の比較例1〜14では、実施例1〜17と比
べて良好な結果が得られなかった。
As is clear from Tables 1 and 2, the composition ratio of the main component, the added amount of MgO, the composition ratio of the flux and the added amount of the flux were 8% in Examples 1 to 17 within the scope of the present invention.
It can be seen that the density of each of the dielectric ceramic compositions fired at a low temperature of 50 to 900 ° C. is large. Further, it can be seen that the ceramic capacitors obtained from these dielectric ceramic compositions have a large dielectric constant (relative dielectric constant) and a small dielectric loss (tan δ). On the other hand, in Comparative Examples 1 to 14 in which the main component composition ratio, the added amount of MgO, the flux composition ratio and the added amount of flux were out of the range of the present invention, better results were obtained as compared with Examples 1 to 17. Did not.

【0018】[0018]

【発明の効果】以上述べたように、本発明の誘電体磁器
組成物は誘電率が大きくかつ誘電損失が小さいため、セ
ラミックコンデンサの誘電体材料として極めて有用であ
る。また本発明の誘電体磁器組成物は低温度かつ短時間
で焼成し、高密度になるため、ハイブリッドICに使用
される厚膜コンデンサに適したものとなる。このため、
ハイブリッドIC回路の厚膜抵抗を製造するベルト炉の
製造ラインで厚膜コンデンサを作製できるため、厚膜コ
ンデンサを高い効率でしかも厚膜抵抗とともに生産する
ことができる。
As described above, the dielectric ceramic composition of the present invention has a large dielectric constant and a small dielectric loss, and is therefore extremely useful as a dielectric material for a ceramic capacitor. Further, the dielectric ceramic composition of the present invention is fired at a low temperature and in a short time, and has a high density, so that it is suitable for a thick film capacitor used for a hybrid IC. For this reason,
Since a thick film capacitor can be manufactured in a belt furnace manufacturing line for manufacturing a thick film resistor of a hybrid IC circuit, a thick film capacitor can be produced with high efficiency and with a thick film resistor.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の誘電体磁器組成物の組成範囲を示すP
b(Mg1/3Nb2/3)O3・Pb(Fe1/2Nb1/2
3・PbTiO3三成分系組成図。
FIG. 1 shows the composition range of a dielectric ceramic composition of the present invention.
b (Mg 1/3 Nb 2/3 ) O 3 .Pb (Fe 1/2 Nb 1/2 )
O 3 · PbTiO 3 ternary composition diagram.

【図2】(a)本発明の厚膜コンデンサの上面図。 (b)図2(a)のA−A線断面図。FIG. 2 (a) is a top view of the thick film capacitor of the present invention. FIG. 2B is a sectional view taken along line AA of FIG.

【符号の説明】[Explanation of symbols]

11 セラミック基板 12 下部電極 13 誘電体層 14 上部電極 Reference Signs List 11 ceramic substrate 12 lower electrode 13 dielectric layer 14 upper electrode

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) H01G 4/12 415 H01G 4/06 102 Fターム(参考) 4G031 AA03 AA10 AA11 AA21 AA32 BA09 5E001 AB03 AC09 AC10 AE00 AE03 AE04 AH01 AH09 AJ02 AZ00 5E082 AB03 BC30 BC40 EE04 EE23 EE26 EE35 FG22 FG26 FG27 FG46 FG54 KK01 LL02 MM22 MM24 PP03 5G303 AA01 AB05 AB15 BA03 CA01 CB13 CB17 CB21 CB25 CB35 CC08 ──────────────────────────────────────────────────続 き Continued on the front page (51) Int.Cl. 7 Identification symbol FI Theme coat ゛ (Reference) H01G 4/12 415 H01G 4/06 102 F term (Reference) 4G031 AA03 AA10 AA11 AA21 AA32 BA09 5E001 AB03 AC09 AC10 AE00 AE03 AE04 AH01 AH09 AJ02 AZ00 5E082 AB03 BC30 BC40 EE04 EE23 EE26 EE35 FG22 FG26 FG27 FG46 FG54 KK01 LL02 MM22 MM24 PP03 5G303 AA01 AB05 AB15 BA03 CA01 CB13 CB17 CB21 CB25 CB25 CC

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 Pb(Mg1/3Nb2/3)O3、Pb(F
1/2Nb1/2)O3及びPbTiO3の3成分からなり下
記式(1)で表される組成物の主成分と、MgOと、P
bO、ZnO、Bi23及びGeO2の4成分からなり
Bi23をBiO3/2に換算することにより下記(2)
で表されるフラックスとを含む誘電体磁器組成物であっ
て、 MgOを前記主成分に対して0.5〜5.0モル%含
み、 前記フラックスを前記主成分と前記MgOの合計に対し
て3〜10重量%含むことを特徴とする誘電体磁器組成
物。 xPb(Mg1/3Nb2/3)O3・yPb(Fe1/2Nb1/2)O3・zPbTiO3 ……(1) (式中、x、y、zはモル比でx+y+z=1、0.8
0≦x≦0.92、0.02≦y≦0.19、0.00
5≦z≦0.06) a(PbO)・b(ZnO)・c{(BiO3/21-n(GeO2n}……(2) (式中、a、b、cはモル比でa+b+c=1、0.3
0≦a≦0.80、0.15≦c≦0.50、0<n≦
0.75)
1. Pb (Mg 1/3 Nb 2/3 ) O 3 , Pb (F
e 1/2 Nb 1/2 ) O 3 and PbTiO 3 , a main component of a composition represented by the following formula (1), MgO, P
It is composed of four components of bO, ZnO, Bi 2 O 3 and GeO 2 , and converts Bi 2 O 3 into BiO 3/2 to obtain the following (2)
A dielectric ceramic composition comprising: a flux represented by the following formula: wherein MgO is contained in an amount of 0.5 to 5.0 mol% with respect to the main component, and the flux is contained with respect to a total of the main component and the MgO. A dielectric porcelain composition comprising 3 to 10% by weight. xPb (Mg 1/3 Nb 2/3 ) O 3 .yPb (Fe 1/2 Nb 1/2 ) O 3 .zPbTiO 3 (1) (where x, y and z are x + y + z = 1, 0.8
0 ≦ x ≦ 0.92, 0.02 ≦ y ≦ 0.19, 0.00
5 ≦ z ≦ 0.06) a (PbO) · b (ZnO) · c {(BiO 3/2 ) 1-n (GeO 2 ) n } (2) (where a, b, and c are A + b + c = 1, 0.3 in molar ratio
0 ≦ a ≦ 0.80, 0.15 ≦ c ≦ 0.50, 0 <n ≦
0.75)
【請求項2】 セラミック基板(11)上に設けられた下部
電極(12)と、前記下部電極(12)上に設けられた請求項1
記載の誘電体磁器組成物からなる誘電体層(13)と、前記
誘電体層(13)上に設けられた上部電極(14)とを備えた厚
膜コンデンサ。
2. A lower electrode (12) provided on a ceramic substrate (11), and a lower electrode (12) provided on the lower electrode (12).
A thick film capacitor comprising: a dielectric layer (13) made of the dielectric ceramic composition described above; and an upper electrode (14) provided on the dielectric layer (13).
JP31433998A 1998-11-05 1998-11-05 Dielectric ceramic composition and thick film capacitor using the same Expired - Fee Related JP3389947B2 (en)

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Country Link
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023235980A1 (en) * 2022-06-10 2023-12-14 Uti Limited Partnership Solid solution compositions and uses thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023235980A1 (en) * 2022-06-10 2023-12-14 Uti Limited Partnership Solid solution compositions and uses thereof

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Publication number Publication date
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