JP2000131343A - Clamp tester for leakage-current measurement - Google Patents

Clamp tester for leakage-current measurement

Info

Publication number
JP2000131343A
JP2000131343A JP10308655A JP30865598A JP2000131343A JP 2000131343 A JP2000131343 A JP 2000131343A JP 10308655 A JP10308655 A JP 10308655A JP 30865598 A JP30865598 A JP 30865598A JP 2000131343 A JP2000131343 A JP 2000131343A
Authority
JP
Japan
Prior art keywords
current
coils
coil
circuit
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10308655A
Other languages
Japanese (ja)
Other versions
JP3441984B2 (en
Inventor
Toshio Nakazawa
俊夫 中沢
Yasuo Ishida
康夫 石田
Naomichi Senda
直道 千田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa M&C Corp
Original Assignee
Yokogawa M&C Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa M&C Corp filed Critical Yokogawa M&C Corp
Priority to JP30865598A priority Critical patent/JP3441984B2/en
Publication of JP2000131343A publication Critical patent/JP2000131343A/en
Application granted granted Critical
Publication of JP3441984B2 publication Critical patent/JP3441984B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Measurement Of Current Or Voltage (AREA)

Abstract

PROBLEM TO BE SOLVED: To obtain a clamp tester which prevents the effects of an external current without using an amplitude adjusting circuit, a phase-adjusting circuit, an addition circuit or the like and which reduces a residual current by a method, wherein a preset resistance is connected to a plurality of arbitrary coils in every circuit, so as to add their outputs and the outputs of every circuit are added, subtracted or converted into a current or a voltage. SOLUTION: When a current to be measured exists inside a core 1a and a core 1b, currents whose phases are all identical flow to a coil 2a, a coil 2b and a coil 2c and a coil 2d. Their added output appears at an output terminal 10. A preset resistance 9 is adjusted, in such a way that the output becomes a prescribed value with reference to the prescribed current to be measured. When there is a current at the outside, in-phase currents is identical flow ideally to the coils 2a, 2b, and 2c, 2d, and currents whose phase is opposite flow to the coil 2a, 2b and 2c, 2d. Although their added output ought to be zero, in general, the amplitudes of their respective outputs become different. Then, the imbalance of the outputs is adjusted, by using a preset resistance 3a and a preset resistance 3b, and the outputs are adjusted so as to become zero.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、回路を遮断するこ
となく活線の状態で回路の漏洩電流を測定するリークク
ランプテスタに関し、特に残留電流の影響と外部電流に
よる磁界の影響を低減するためのコイルの巻線方式およ
び電流検出回路の改善に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a leak clamp tester for measuring a leakage current of a circuit in a live state without interrupting the circuit, and in particular, to reduce the influence of a residual current and the influence of a magnetic field due to an external current. And improvement of the current detection circuit.

【0002】[0002]

【従来の技術】まず図4を参照してクランプテスタの原
理について説明する。コイル2をN2回巻回した円環状
のコア内に被測定電流Iの流れる電線を配置したとき、
電流Iによってコイル2にφの磁束が鎖交したとする。
2. Description of the Related Art First, the principle of a clamp tester will be described with reference to FIG. When an electric wire through which the current I to be measured flows is arranged in an annular core in which the coil 2 is wound N 2 times,
It is assumed that the magnetic flux of φ is linked to the coil 2 by the current I.

【0003】電流Iとコイル2との相互インダクタンス
Mは、 M=N2(φ/I) で定義される。コイル2に誘導される起電力eは、 e=−MdI/dt である。電流iは次の通りである。 i=e/Z=−(M/Z)dI/dt ここに、Zはコイル2のインピーダンス
The mutual inductance M between the current I and the coil 2 is defined by M = N 2 (φ / I). The electromotive force e induced in the coil 2 is e = −MdI / dt. The current i is as follows. i = e / Z =-(M / Z) dI / dt where Z is the impedance of the coil 2.

【0004】ここで、コイル2の直流抵抗をR、インダ
クタンスをL、電流IはI=Asinωtであるとす
る。Z=R+jωLであるが、ωL≫RであればRは無
視できるので電流iは、次式のようになる。 i≒−(M/jωL)dI/dt=−(M/jωL)Aωcosωt =−(M/jL)Acosωt
Here, it is assumed that the DC resistance of the coil 2 is R, the inductance is L, and the current I is I = Asinωt. Although Z = R + jωL, if ωL≫R, R can be neglected, and the current i becomes as follows. i ≒ − (M / jωL) dI / dt = − (M / jωL) Aωcosωt = − (M / jL) Acosωt

【0005】M,Lはどちらもμ0μsに比例するので、
iはコア1のμ0μsにはよらずIに比例した量となり、
これにより被測定電流Iを測定することができる。これ
がクランプテスタで電流を検出できる原理である。
Since M and L are both proportional to μ 0 μs ,
i is an amount proportional to I irrespective of μ 0 μs of the core 1, and
As a result, the measured current I can be measured. This is the principle that a clamp tester can detect current.

【0006】図5はリーククランプテスタの原理図であ
る。電流が逆方向に流れる一対の電線(他端に負荷LD
が接続されている)L1,L2をクランプテスタで同時に
クランプし、上記原理でコア1と鎖交する電流量を測定
する。一対の電線L1,L2に流れる電流(I1,I2)の
量が同じであれば、コア1と鎖交する電流は0になる
が、線路のどこかに漏れ電流があった場合にはその漏れ
電流量irが検出できる。
FIG. 5 is a principle diagram of a leak clamp tester. A pair of wires through which current flows in the opposite direction
There the the connected) L 1, L 2 and simultaneously clamped by the clamp tester, to measure the core 1 and the chain interlinked that the current amount in the above principle. If the amount of current (I 1 , I 2 ) flowing in the pair of electric wires L 1 and L 2 is the same, the current interlinking with the core 1 becomes 0, but when there is a leakage current somewhere in the line Can detect the leakage current amount ir.

【0007】このようなクランプテスタでは以下のよう
な特性が要求される。 (1) クランプテスタで電線をクランプした際にその一対
の電線が、常にクランプに対して同一の位置にくるとは
限らない。クランプのコア内の電流の位置が異なると、
本来なら打ち消しあって検出されないはずの電流が検出
されてしまうことがある。これを残留電流と呼ぶが、リ
ーククランブテスタではこのような残留電流が少ないこ
とが重要である。
[0007] Such a clamp tester is required to have the following characteristics. (1) When a wire is clamped by a clamp tester, the pair of wires is not always at the same position with respect to the clamp. If the position of the current in the core of the clamp is different,
In some cases, a current that would otherwise be canceled and not detected is detected. This is called a residual current, and it is important that such a residual current is small in a leak crumb tester.

【0008】(2) 外部磁界の影響 リーククランプテスタの高性能機種では検出しなければ
ならない電流量が1mA程度と非常に小さいため、外部
に大きな電流(例えば100A程度の大電流)が流れて
いる場合にはその電流の影響を受けて、クランプのコア
と鎖交する電流がゼロであるにも関わらず電流値が検出
されることがある。このため、徴小電流を検出するリー
ククランプにおいては外部電流の影響を除去することが
重要である。
(2) Influence of external magnetic field In a high-performance leak clamp tester, the amount of current that must be detected is very small, about 1 mA, so a large current (for example, a large current of about 100 A) flows outside. In some cases, under the influence of the current, the current value may be detected even though the current interlinking with the core of the clamp is zero. Therefore, it is important to eliminate the influence of the external current in the leak clamp for detecting the small current.

【0009】 上記(1) ,(2) はどちらもクランプの磁
気回路の非対称性に関連するので、非対称性を何らかの
形で補正する必要がある。例えば、特開平9−2693
37号「分割型漏れ電流測定器」には上記(1) に着目し
て残留電流の誤差を改善する技術が開示されている。
Since both (1) and (2) relate to the asymmetry of the magnetic circuit of the clamp, it is necessary to correct the asymmetry in some way. For example, Japanese Patent Application Laid-Open No. 9-2693
No. 37, "Divided Leakage Current Measuring Apparatus" discloses a technique for improving the residual current error by focusing on the above (1).

【0010】この電流測定器は、図6に示すように、一
対のコア20A,20Bの端面を対向させて円環状と
し、その端面近傍にそれぞれコイル(A,B,C,D)
を配設し、端面近傍の各コイル対の直列接続出力をそれ
ぞれアンプ21,23で増幅すると共に位相調整手段2
2,24により位相調整し、その2つの位相調整出力を
加算器25で加算する。加算器25の出力は計器26で
表示される。
In this current measuring device, as shown in FIG. 6, a pair of cores 20A and 20B are formed in an annular shape with their end faces facing each other, and coils (A, B, C and D) are respectively provided near the end faces.
And amplifiers 21 and 23 amplify the series connection output of each coil pair near the end face, respectively.
The two phase adjustment outputs are added by the adder 25. The output of the adder 25 is displayed on a meter 26.

【0011】なお、各位相調整手段とアンプはそれぞれ
位相、ゲインが調整可能になっており、この調整により
コア分割面の磁気的結合バランスがとれた状態と同様の
状態を得ることができ、残留電流を小さくすることがで
きる。
Each of the phase adjusting means and the amplifier can adjust the phase and the gain, respectively. By this adjustment, a state similar to a state where the magnetic coupling of the core division surface is balanced can be obtained. The current can be reduced.

【0012】[0012]

【発明が解決しようとする課題】しかしながら、このよ
うな電流測定器においては次のような課題があった。
However, such a current measuring device has the following problems.

【0013】2組のコイルから電流を検出し、その電流
に対して1対の利得調整手段と1対の位相調整手段およ
び加算回路を必要としている。また、リーククランプテ
スタでは、実際に線路に流れている電流を検出するため
に、微少電流のみならず、大電流を測定するレンジを持
つことが多いので、ダイナミックレンジを確保するため
には上記の各回路のほかに別の大電流用の回路も必要に
なり、回路規模が大きくなるという間題点がある。この
ような回路規模の大きさがリーククランプテスタの小型
化と低価格化の障害になっていた。
A current is detected from two sets of coils, and a pair of gain adjusting means, a pair of phase adjusting means and an adding circuit are required for the current. In addition, a leak clamp tester often has a range for measuring not only a very small current but also a large current in order to detect a current actually flowing in a line. In addition to each circuit, another circuit for a large current is required, and there is a problem that the circuit scale becomes large. Such a large circuit scale has been an obstacle to downsizing and cost reduction of the leak clamp tester.

【0014】本発明の目的は、上記の課題を解決するも
ので、従来のような振幅調整回路や位相調整回路および
加算回路を用いないで、外部電流の影響を防止し、残留
電流を小さくすることのできる漏洩電流測定用クランプ
テスタを実現することにある。
SUMMARY OF THE INVENTION An object of the present invention is to solve the above-mentioned problems and to reduce the residual current by preventing the influence of an external current without using a conventional amplitude adjustment circuit, phase adjustment circuit, and addition circuit. It is an object of the present invention to realize a leak current measuring clamp tester capable of measuring a leakage current.

【0015】[0015]

【課題を解決するための手段】このような目的を達成す
るために、請求項1の発明では、分離可能な環状のコア
と、前記各コアにそれぞれ巻回した少なくとも2個以上
のコイルと、これらのコイルの任意の2つ以上にその出
力が加算されるように直列または並列に接続した半固定
抵抗を備えた2つ以上の独立した回路と、この各回路の
出力を加算または減算または電流・電圧変換して被測定
電流に対応した電圧を得ることのできる手段を具備し、
前記半固定抵抗を調整することにより残留電流または外
部電流による測定値の誤差を調整できるようにしたこと
を特徴とする。
In order to achieve the above object, according to the first aspect of the present invention, an annular core which can be separated, at least two or more coils wound around each of the cores, Two or more independent circuits with semi-fixed resistors connected in series or in parallel such that the output is added to any two or more of these coils, and the output of each circuit is added or subtracted or the current Means for converting the voltage to obtain a voltage corresponding to the current to be measured;
By adjusting the semi-fixed resistor, an error in a measured value due to a residual current or an external current can be adjusted.

【0016】半固定抵抗の調整により各コイル出力のア
ンバランスが調整され、残留電流または外部電流による
測定値の誤差を調整することができる。
By adjusting the semi-fixed resistor, the unbalance of the output of each coil is adjusted, and the error of the measured value due to the residual current or the external current can be adjusted.

【0017】また、請求項2のように、被測定電流の大
きさに対応して抵抗を切り替えることにより加算または
減算を行う手段に入力される信号の振幅を制限する。こ
れにより同一の回路での大電流測定を可能にする。この
場合、請求項3のように、電流レンジに応じて前記抵抗
の値を切り替えるのが望ましい。
Further, the amplitude of the signal input to the means for performing addition or subtraction is limited by switching the resistance according to the magnitude of the current to be measured. This enables a large current measurement in the same circuit. In this case, it is desirable to switch the value of the resistor according to the current range.

【0018】[0018]

【発明の実施の形態】以下図面を用いて本発明を詳しく
説明する。図1は本発明に係るクランプテスタの一実施
例を示す構成図である。コア1a、lbにはそれぞれ2
組の巻線(以下巻線をコイルという)2a,2bと2
c、2dが施されている。コイル2a、2bの端子は間
に半固定抵抗3aを挟んでこの2つのコイルによる検出
電流が加算されるように直列に接続されている。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below in detail with reference to the drawings. FIG. 1 is a configuration diagram showing one embodiment of a clamp tester according to the present invention. Each of the cores 1a and lb has 2
A pair of windings (hereinafter, windings are referred to as coils) 2a, 2b and 2
c and 2d are given. The terminals of the coils 2a and 2b are connected in series with a semi-fixed resistor 3a interposed therebetween so that currents detected by the two coils are added.

【0019】他方のコア1bにあるコイル2c,2dと
半固定抵抗3bも同様に接続されている。コイル2bと
コイル2dの半固定抵抗に接続されていない方の端子は
それぞれ半固定抵抗7bと固定抵抗7aを介して加算器
8の構成要素である演算増幅器8aの反転入力に接続さ
れている。
The coils 2c and 2d in the other core 1b and the semi-fixed resistor 3b are similarly connected. The terminals of the coils 2b and 2d that are not connected to the semi-fixed resistors are connected to the inverting input of the operational amplifier 8a, which is a component of the adder 8, via the semi-fixed resistors 7b and 7a, respectively.

【0020】また、該コイルの出力は半固定抵抗4b、
4aを介して、また固定抵抗5b,5aとスイッチ6
a,6bとを介して、それぞれ図示のようにゼロ電位に
接続されている。半固定抵抗9は加算器8の全体のゲイ
ンを決めるための帰還抵抗である。加算器8の出力は出
力端子10に導かれている。
The output of the coil is a semi-fixed resistor 4b,
4a, the fixed resistors 5b and 5a and the switch 6
a and 6b are connected to zero potential as shown in the figure. The semi-fixed resistor 9 is a feedback resistor for determining the overall gain of the adder 8. The output of the adder 8 is guided to an output terminal 10.

【0021】このような構成における動作を次に説明す
る。漏洩電流等の微小電流を測定する際にはスイッチ6
a,6bを開いておき、加算器8の入力が短絡しないよ
うにする。
The operation in such a configuration will now be described. When measuring minute current such as leakage current, switch 6
a, 6b are opened so that the input of the adder 8 is not short-circuited.

【0022】以下、外部電流による影響を低滅する方式
について述べる。被測定電流がコア1a,1bの内部
(空間部分)にあれば、コイル2a,2b,2c,2d
にはすべて同相の電流が流れるので、それらの加算出力
が出力端子10に現れる。規定の被測定電流に対して出
力が規定の値になるように半固定抵抗9を調整する。
Hereinafter, a method for reducing the influence of the external current will be described. If the current to be measured is inside the cores 1a and 1b (space portion), the coils 2a, 2b, 2c and 2d
, All the in-phase currents flow, and their summed output appears at the output terminal 10. The semi-fixed resistor 9 is adjusted so that the output becomes a specified value for a specified measured current.

【0023】外部に電流があった場合、理想的には4つ
のコイルには同一振幅の電流出力が現れ、コイル2aと
2dは同相、コイル2d,2cも同相、コイル2aと2
bは逆相、コイル2cと2dにも逆相の電流が流れるの
で、加算器出力はゼロになるはずである。
When there is a current outside, ideally, current outputs of the same amplitude appear in the four coils, the coils 2a and 2d are in phase, the coils 2d and 2c are also in phase, and the coils 2a and 2c are in phase.
Since b is a negative-phase current and a negative-phase current also flows through the coils 2c and 2d, the output of the adder should be zero.

【0024】しかし、一般的には嵌合部11a,11b
の非対称などによりそれぞれの出力の振幅は異なる。そ
こで、半固定抵抗3a,3bを用いてそれぞれの出力の
アンバランスを調整して、出力がゼロになるように調整
する。さらにここで調整しきれないアンバランスは半固
定抵抗4a,4bおよび加算器の入力抵抗7bで調整す
る。一般的に、上記のようにして外部電流による影響を
低滅すれば、残留電流誤差も少なくなる。
However, generally, the fitting portions 11a, 11b
The amplitude of each output differs due to the asymmetry of the output. Therefore, the imbalance of the respective outputs is adjusted using the semi-fixed resistors 3a and 3b, so that the outputs become zero. Further, the unbalance that cannot be adjusted here is adjusted by the semi-fixed resistors 4a and 4b and the input resistor 7b of the adder. Generally, when the influence of the external current is reduced as described above, the residual current error is reduced.

【0025】また、大電流を測定する場合には短絡抵抗
5a,5bに接続されたスイッチ6a,6bを閉じるこ
とにより、加算器8に入力される信号振幅が制限され同
一回路で大電流の測定も可能となる。なお、ここでは短
絡抵抗5a,5bと6a,6bはそれぞ1回路しか図示
していないが必要な電流レンジに応じて複数の組合わせ
を持つように構成してもよい。そして、電流測定レンジ
の切替えに連動して抵抗値が切替えられるようにすると
便利である。
When measuring a large current, the switches 6a and 6b connected to the short-circuit resistors 5a and 5b are closed to limit the amplitude of the signal input to the adder 8 and to measure the large current in the same circuit. Is also possible. Although only one circuit is shown for each of the short-circuit resistors 5a and 5b and 6a and 6b, a plurality of combinations may be provided according to a required current range. It is convenient if the resistance value can be switched in conjunction with the switching of the current measurement range.

【0026】図2は本発明の他の実施例を示す構成図で
ある。図1と異なるところは、コイルの接続方式にあ
る。本実施例では、コイル2aと2bを抵抗3を介して
直列接続し、コイル2aと2bの他端から電流が出力さ
れるようにしている。なお、半固定抵抗3の摺動接点は
接地され、コイル出力のアンバランスが調整できるよう
になっている。このような構成によっても、図1の場合
と同様に外部電流の影響を防ぎ、残留電流を除去でき
る。
FIG. 2 is a block diagram showing another embodiment of the present invention. The difference from FIG. 1 lies in the coil connection method. In this embodiment, the coils 2a and 2b are connected in series via the resistor 3, so that current is output from the other ends of the coils 2a and 2b. The sliding contact of the semi-fixed resistor 3 is grounded so that the unbalance of the coil output can be adjusted. With such a configuration, the effect of the external current can be prevented and the residual current can be removed as in the case of FIG.

【0027】図3は他の接続方式の実施例図である。コ
イル2a,2dを半固定抵抗3aを介して接続し、他方
のコイル2b,2cも同様に半固定抵抗3bを介してそ
れぞれ接続する。半固定抵抗3a,3bの摺動接点は半
固定抵抗3cを介して接続されている。なお、半固定抵
抗3cの摺動接点は接地されている。そして、コイル2
a,2dの共通接続点と、コイル2b,2cの共通接続
点からの各出力電流が加算器側に入力される。
FIG. 3 is an embodiment diagram of another connection method. The coils 2a and 2d are connected via a semi-fixed resistor 3a, and the other coils 2b and 2c are similarly connected via a semi-fixed resistor 3b. The sliding contacts of the semi-fixed resistors 3a and 3b are connected via a semi-fixed resistor 3c. The sliding contact of the semi-fixed resistor 3c is grounded. And coil 2
Output currents from the common connection point of a and 2d and the common connection point of coils 2b and 2c are input to the adder side.

【0028】このような構成によっても図1の場合と同
様に外部電流の影響を防ぐと共に残留電流を除去するこ
とができる。
With such a configuration, the effect of the external current can be prevented and the residual current can be removed as in the case of FIG.

【0029】なお、以上の説明は、本発明の説明および
例示を目的として特定の好適な実施例を示したに過ぎな
い。したがって本発明は、上記実施例に限定されること
なく、その本質から逸脱しない範囲で更に多くの変更、
変形をも含むものである。
The foregoing description has been directed to specific preferred embodiments for the purpose of describing and illustrating the invention. Therefore, the present invention is not limited to the above-described embodiment, and includes many more modifications without departing from the spirit thereof.
This includes deformation.

【0030】[0030]

【発明の効果】以上説明したように本発明によれば次の
ような効果がある。 (1) 従来例に設けられたような振幅調整回路と位相調整
回路および加算回路が不要で、1つの加算回路と若干の
抵抗および半固定抵抗のみで外部電流の影響と残留電流
を除去できる。 (2) また、請求項2のように構成すれば、大電流を測定
するレンジにおいても、同一回路で検出可能になるた
め、回路規模を大幅に縮小できる。 (3) 高性能な漏洩電流用クランプテスタの小型化と低価
格化が可能になる。
As described above, according to the present invention, the following effects can be obtained. (1) The amplitude adjustment circuit, the phase adjustment circuit, and the addition circuit as provided in the conventional example are unnecessary, and the influence of the external current and the residual current can be removed only by one addition circuit, a small resistor and a semi-fixed resistor. (2) Further, according to the configuration of claim 2, even in a range where a large current is measured, detection can be performed by the same circuit, so that the circuit scale can be significantly reduced. (3) The high-performance leakage current clamp tester can be reduced in size and cost.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明に係るクランプテスタの一実施例を示す
構成図である。
FIG. 1 is a configuration diagram showing one embodiment of a clamp tester according to the present invention.

【図2】本発明の他の実施例を示す構成図である。FIG. 2 is a configuration diagram showing another embodiment of the present invention.

【図3】本発明の更に他の実施例を示す構成図である。FIG. 3 is a configuration diagram showing still another embodiment of the present invention.

【図4】クランプテスタの原理を説明する図である。FIG. 4 is a diagram illustrating the principle of a clamp tester.

【図5】リーククランプテスタの原理構成図である。FIG. 5 is a principle configuration diagram of a leak clamp tester.

【図6】従来のクランプテスタの一例を示す構成図であ
る。
FIG. 6 is a configuration diagram showing an example of a conventional clamp tester.

【符号の説明】[Explanation of symbols]

1,1a,1b コア 2,2a,2b,2c,2d コイル 3,3a,3b,3c 半固定抵抗 4a,4b 半固定抵抗 5a,5b,7a 固定抵抗 6a,6b スイッチ 8 加算器 8a 演算増幅器 9 半固定抵抗 10 出力端子 1, 1a, 1b core 2, 2a, 2b, 2c, 2d coil 3, 3a, 3b, 3c semi-fixed resistor 4a, 4b semi-fixed resistor 5a, 5b, 7a fixed resistor 6a, 6b switch 8 adder 8a operational amplifier 9 Semi-fixed resistor 10 Output terminal

───────────────────────────────────────────────────── フロントページの続き (72)発明者 千田 直道 東京都武蔵野市中町1丁目19番18号 横河 エムアンドシー株式会社内 Fターム(参考) 2G014 AA16 AB33 AC19 2G025 AA03 AA14 AB14 2G035 AA01 AB07 AC13 AD10 AD12 AD18 AD19 AD22  ──────────────────────────────────────────────────続 き Continued on the front page (72) Inventor Naomichi Senda 1-19-18 Nakamachi, Musashino-shi, Tokyo Yokogawa M & C Co., Ltd. F-term (reference) 2G014 AA16 AB33 AC19 2G025 AA03 AA14 AB14 2G035 AA01 AB07 AC13 AD10 AD12 AD18 AD19 AD22

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】分離可能な環状のコアと、前記各コアにそ
れぞれ巻回した少なくとも2個以上のコイルと、これら
のコイルの任意の2つ以上にその出力が加算されるよう
に直列または並列に接続した半固定抵抗を備えた2つ以
上の独立した回路と、この各回路の出力を加算または減
算または電流・電圧変換して被測定電流に対応した電圧
を得ることのできる手段を具備し、 前記半固定抵抗を調整することにより残留電流または外
部電流による測定値の誤差を調整できるようにしたこと
を特徴とする漏洩電流測定用クランプテスタ。
1. A separable annular core, at least two or more coils wound around each of said cores, and a serial or parallel coil such that the output is added to any two or more of these coils. And two or more independent circuits each having a semi-fixed resistor connected thereto, and means for adding or subtracting the output of each circuit or performing current / voltage conversion to obtain a voltage corresponding to the current to be measured. A clamp tester for measuring a leakage current, wherein an error in a measured value due to a residual current or an external current can be adjusted by adjusting the semi-fixed resistance.
【請求項2】分離可能な環状のコアと、前記各コアにそ
れぞれ巻回した少なくとも2個以上のコイルと、これら
のコイルの出力端とゼロ電位との間にそれぞれ開閉手段
を介して接続された抵抗と、該抵抗に生じた電圧を加算
または減算して被測定電流に対応した電圧を得ることの
できる手段を具備し、 被測定電流の大きさに応じて前記開閉手段を制御して前
記抵抗の接続非接続の切替え、または抵抗値の切り替え
を行うようにしたことを特徴とする漏洩電流測定用クラ
ンプテスタ。
2. A separable ring-shaped core, at least two or more coils wound around each of said cores, respectively connected between output terminals of these coils and zero potential via switching means. And a means for adding or subtracting a voltage generated in the resistor to obtain a voltage corresponding to the current to be measured, and controlling the switching means according to the magnitude of the current to be measured. A clamp tester for measuring a leakage current, wherein switching of connection / disconnection of a resistor or switching of a resistance value is performed.
【請求項3】前記抵抗の切替えを被測定電流のレンジの
切替えと連動させるように構成したことを特徴とする請
求項2記載の漏洩電流測定用クランプテスタ。
3. The leak current measuring clamp tester according to claim 2, wherein the switching of the resistance is linked with the switching of the range of the current to be measured.
JP30865598A 1998-10-29 1998-10-29 Leakage current measurement clamp tester Expired - Lifetime JP3441984B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP30865598A JP3441984B2 (en) 1998-10-29 1998-10-29 Leakage current measurement clamp tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP30865598A JP3441984B2 (en) 1998-10-29 1998-10-29 Leakage current measurement clamp tester

Publications (2)

Publication Number Publication Date
JP2000131343A true JP2000131343A (en) 2000-05-12
JP3441984B2 JP3441984B2 (en) 2003-09-02

Family

ID=17983699

Family Applications (1)

Application Number Title Priority Date Filing Date
JP30865598A Expired - Lifetime JP3441984B2 (en) 1998-10-29 1998-10-29 Leakage current measurement clamp tester

Country Status (1)

Country Link
JP (1) JP3441984B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012141151A (en) * 2010-12-28 2012-07-26 Hioki Ee Corp Sensor for current detection
JP2012194151A (en) * 2011-03-18 2012-10-11 Hioki Ee Corp Current detection device
JP2015222182A (en) * 2014-05-22 2015-12-10 日置電機株式会社 Current sensor and measurement device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012141151A (en) * 2010-12-28 2012-07-26 Hioki Ee Corp Sensor for current detection
JP2012194151A (en) * 2011-03-18 2012-10-11 Hioki Ee Corp Current detection device
JP2015222182A (en) * 2014-05-22 2015-12-10 日置電機株式会社 Current sensor and measurement device

Also Published As

Publication number Publication date
JP3441984B2 (en) 2003-09-02

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