JP2000100948A - Wiring layout method and device of semiconductor integrated circuit - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit wiring layout method and a device, where functional blocks can be easily relocated so as to enhance a semiconductor integrated circuit in wiring capacitance without deteriorating the semiconductor integrated circuit in wiring density. SOLUTION: Pre-functional blocks are previously stored in the library of a wiring layout device. A pre-functional block 22b has the same functions with a pre-functional block 22a, and the pre-functional block 22a is so designed as to be larger in drive capacity but smaller in wiring capacity than the pre- functional block 22b. The pre-functional block 22b smaller in drive capacity than the pre-functional block 22a is formed taking the type, direction, shape, and size of a base into consideration so as to be arranged without fail at a site where the pre-functional block 22b is arranged.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wiring layout method and a wiring layout apparatus for designing a schematic wiring layout of a semiconductor integrated circuit, and more particularly to a wiring layout method for improving a wiring capacity without deteriorating a wiring congestion degree. The present invention relates to a wiring layout method and a wiring layout apparatus for a semiconductor integrated circuit that can easily realize replacement of a functional block.

[0002]

2. Description of the Related Art Recently, in a semiconductor integrated circuit, a demand for a wiring layout method for designing a schematic wiring layout of cells to be connected has been increased with an increase in circuit density. FIG. 7 is a block diagram showing a conventional wiring layout apparatus, and FIG. 8 is a flowchart showing a conventional wiring layout method. As shown in FIG. 7, the wiring layout device of the semiconductor integrated circuit has a control device 41, and the control device 41 is connected to a shortest path search device 42, a graph creation device 43, a rearrangement device 44, and a slack calculation device 45. Have been. In addition, the relocation device 44 is connected to a library 46 that stores spare function blocks.

[0003] A wiring layout method using the wiring layout apparatus configured as described above will be described below. The control device 41 instructs the graph creation device 43 to create a grid graph. Lattice graphs are known in the art (“New Placement and Global routi
ng algorithms for Standard Cell layout ”, 27th DA
C, pp. 642-645). The graph creating device 43 creates a grid graph from the base size (step 51), and calculates the wiring capacity of each branch based on the possible wiring area of the arranged functional block and the net already formed between the functional blocks. And determine the cost of the branches. Then, after the graph creation is completed, the graph creation device 43 notifies the control device 41 of the end.

Next, the control device 41 selects one unwired net (step 52), and selects the shortest route search device 42.
Is instructed to search for the shortest route. The shortest path search device 42 uses Dijkstra's algorithm to find a path on the grid graph that minimizes the total cost of the branches (step 5).
3) The result is transmitted to the control device 41. Note that the Dijkstra method for finding a path that minimizes the total cost of branches is known (exercise graph theory, Corona).

After that, the control device 41 transmits the route obtained by the shortest route search device 42 to the graph creating device 43. Thereby, the graph creating device 43 updates the graph (step 54). In this way, the processing of searching for the shortest path of this net and updating the graph is repeated until there is no unwired net.

Thereafter, the control device 41 checks whether there is a branch exceeding the wiring capacity (step 55), and terminates the processing if there is no branch exceeding the wiring capacity (step 5).
9). On the other hand, if there is a branch exceeding the wiring capacity as a result of this investigation, the slack calculator 45 is caused to calculate a slack value. The slack calculator 45 calculates the slack value of each net by the zero slack method (step 56), and returns the result to the controller 41. One of the methods for calculating the slack value, the zero slack method, is known (“Circuit
Placement for Predictable Performance ”, ICCAD90,
PP.88-91).

After that, the control device 41 requests the relocation device 44 to replace the functional blocks and increase the relocation process to increase the wiring capacity. The rearrangement device 44 is a spare function block that increases the wiring capacity without making the slack value negative based on the slack value of the net and the capacity of the branches of the grid graph. After searching the library 46 for a spare functional block that is logically equivalent to the functional block that needs to be replaced), the functional block is replaced with the detected spare functional block, and relocation around the functional block is performed ( Step 57), and notifies the controller 41 of the completion.

Thereafter, the control device 41 tears off the nets connected to the functional blocks that need to be replaced, the replaced spare functional blocks and the rearranged functional blocks (step 58), and sends the graph to the graph creating device 43. Request update processing. The graph creating device 43 performs a graph updating process, and reports the completion to the control device 41.
In this way, the above processing is performed until there is no branch exceeding the wiring capacity.

When designing a gate array, the direction and type of the base of the gate array are set in advance. FIG. 9 is a schematic diagram showing a base of a gate array. As shown in FIG. 9, the base 60 is divided into a plurality of cell formation areas 61, and each cell formation area 61 has various base types A and B and various base orientations 1, 2, 3 and 4. are doing. In FIG. 9, each cell formation region 61
The direction and type of the base are shown in order.

FIG. 10A and FIG. 11A show
FIGS. 10B and 11 are schematic diagrams showing the shapes, types, and directions of functional blocks that need to be replaced, respectively.
(B) is a schematic diagram showing the shape, type, and direction of each of the spare function blocks to be replaced. As shown in FIG. 10A, a functional block 62a in which a plurality of cell formation regions 61 are combined has various shapes, and the type and direction of a base on which the block 62a can be arranged are predetermined. I have.

As shown in FIGS. 10 (a) and 10 (b), the shape of the spare function block 62b to be replaced is
If the shape of the function block 62a that needs to be replaced is different from the shape of the function block 62a that needs to be replaced, another function block that has already been placed may hinder the replacement of the spare function block 62b. Therefore, all the function blocks cannot be arranged unless other surrounding function blocks are rearranged. 11A and FIG.
As shown in (b), the shape of the spare function block 62d to be replaced depends on the function block 6 that needs to be replaced.
Although the shape is the same as that of 2c, but the types and directions of the bases are different from each other, the functional block 62c cannot be replaced with the spare functional block 62d. Therefore, similarly to the case where the shapes are different from each other, even when the types and directions of the bases are different from each other, all the functional blocks cannot be arranged unless the other surrounding functional blocks are rearranged.

The case where the shape of the spare functional block to be replaced is different from the shape of the functional block that needs to be replaced will be further described. FIG. 12 is a schematic diagram showing a base of a gate array divided into various functional blocks, and FIG. 13 is a schematic diagram showing a base of the gate array after rearrangement of the functional blocks. As shown in FIG.
0 denotes a plurality of functional blocks 71, 72, 73, 75, 76, 77, 78 in which a plurality of cell forming regions 61 are combined.
And 79, and the functional block 71 is connected to the functional block 77 by a net 63a, and the functional block 72 and the functional block 73 are connected by two nets 64a and 65a.

In the various functional blocks arranged as described above, at the time of schematic wiring layout design, a functional block 73 which is arranged in a place where the wiring is congested and has a margin for delay is stored in the library 46 in advance. When it is desired to secure the wiring capacity by replacing the spare functional block 74 with the spare functional block 74, the shapes of the functional block 73 and the spare functional block 74 are different. The spare function block 74 cannot be arranged as it is. Therefore, as shown in FIG. 13, in order to replace the function block 73 with the spare function block 74, the function block 71 already arranged around the previously arranged function block 73 is rearranged, and the function block 71 and the function block 71 are replaced. The block 77 is connected to the net 63b,
The function block 72 and the function block 74 are connected by two nets 64b and 65b.

[0014]

However, when a schematic wiring layout is designed by the method shown in FIG. 8, the following problems occur. That is, when the cell usage rate is high, it is extremely difficult to rearrange the functional blocks in a favorable state, and the unallocated functional blocks often remain. Further, as shown in FIG. 13, even if all the functional blocks can be rearranged, this rearrangement processing causes the net 63 after the block replacement to be performed.
The wiring lengths of b, 64b, and 65b are longer than the wiring lengths of the nets 63a, 64a, and 65a before block replacement, and the degree of wiring congestion deteriorates. Therefore, the processing for securing the wiring capacity results in a reduction in the wiring capacity.

Furthermore, even if an attempt is made to replace a functional block that needs to be replaced among a plurality of functional blocks with a spare functional block stored in a library in order to improve the wiring capacity, the delay of the functional block is large, and In some cases, it is impossible to replace the spare functional block with a low driving capability, and only the wiring extending in the vertical or horizontal direction is crowded.

As a conventional technique, various methods for efficiently laying out wirings and the like of a semiconductor integrated circuit have been proposed (JP-A-63-14465, JP-A-5-206271, JP-A-6-163
692 and JP-A-9-74139).

However, even with these conventional methods, it is not possible to design a wiring layout for improving the wiring capacity without deteriorating the wiring congestion.

The present invention has been made in view of such a problem, and it is possible to easily realize replacement of a functional block for improving a wiring capacity without deteriorating a wiring congestion degree of a semiconductor integrated circuit. An object of the present invention is to provide a wiring layout method and a wiring layout device for a semiconductor integrated circuit that can be performed.

[0019]

A wiring layout method for a semiconductor integrated circuit according to the present invention has a plurality of first spare function blocks having different functions and is logically equivalent to each of the first spare function blocks. Creating a second spare function block having a smaller driving capability than the first spare function block and being designed so as to be replaced for each of the first spare function blocks. Extracting a function block that needs to be replaced among the plurality of function blocks, and the function block that is logically equivalent to the function block that needs to be replaced and has a smaller driving capability than the function block, The spare function block designed to be replaced at the position where the spare function block is located is replaced with the plurality of first spare function blocks and the second spare function block. And having a step of selecting from Bei functional block, and a step of replacing the replacement must be a functional block within the selected spare functional blocks.

Another wiring layout method for a semiconductor integrated circuit according to the present invention has a first wiring extending in a first direction and a second wiring extending in a second direction orthogonal to the first direction and having different functions. A plurality of third auxiliary function blocks;
The third wiring and the number of wirings extending in the second direction, which are logically equivalent to each of the third preliminary function blocks and have the same driving capability, and have fewer wirings extending in the first direction than the first wiring. Forming fourth spare function blocks each having a larger number of fourth interconnects than the second interconnects and being designed so as to be interchangeable with respect to each of the third spare function blocks; and a semiconductor integrated circuit. Extracting a functional block that needs to be replaced from a plurality of functional blocks included in the above, and increasing the wiring capacity by having a logically equivalent and equivalent driving capability to the functional block that needs to be replaced and having the same drive capability. Selecting a spare function block from the plurality of third spare function blocks and the fourth spare function block; and replacing the function block requiring replacement with the selected spare function block. And having a step of changing come, the.

The functional blocks that need to be replaced can have wiring capacities smaller than required wiring capacities.

In the wiring layout apparatus for a semiconductor integrated circuit according to the present invention, it is necessary to replace a library storing the first spare function block and the second spare function block among a plurality of function blocks of the semiconductor integrated circuit. Is extracted, and a spare function block to be replaced is selected from the plurality of first and second spare function blocks stored in the library based on the function block that needs to be replaced. A replacement device for replacing a certain function block with the selected spare function block.

The selected spare function block is logically equivalent to the function block requiring replacement and has a smaller driving capability than the function block, and is replaced at a position where the function block is disposed. It is preferably designed so that

Further, the library further stores the third spare function block and the fourth spare function block, and the replacement device performs the library operation based on the function block that needs to be replaced. It is preferable that a spare function block to be replaced is selected from the plurality of third and fourth function blocks stored in the storage device, and the function block that needs to be replaced is replaced with the selected spare function block.

In this case, the selected spare function block is logically equivalent to the function block requiring replacement, has the same drive capability, and increases the wiring capacitance. preferable.

In the conventional wiring layout method, no special consideration is given to a preliminarily prepared spare function block, and the function block that needs to be replaced and the preliminarily created spare function block are classified into the base type, direction, and shape. And sizes etc. were sometimes different. Therefore, the spare function block cannot be easily arranged at the position where the function block requiring replacement is arranged, and it is necessary to rearrange the function blocks around the function block requiring replacement. Wiring may be congested.

On the other hand, in the first invention of the present invention, a plurality of first spare function blocks having mutually different functions, the first spare function blocks are logically equivalent to each of the first spare function blocks, and the first spare function blocks. Since a second spare function block having a smaller driving capability than the function block and designed to be replaced with each of the first spare function blocks is created, a plurality of function blocks of the semiconductor integrated circuit are provided. Among them, the spare function block that can be arranged at the position where the function block that needs replacement is arranged can be easily selected from the first and second spare function blocks created in advance.

Therefore, when replacing a function block that needs to be replaced with a spare function block created in advance, it is not necessary to rearrange other function blocks around the function block, so that the wiring is congested after the block replacement. Can be prevented. In addition, the spare function block created in advance has a reduced driving capability as compared with the function block that needs to be replaced, but has a larger wiring capacity. Therefore, by replacing the function block with the spare function block, the entire semiconductor integrated circuit is replaced. Can be increased, whereby the wiring property can be improved.

Further, in the second invention of the present invention, a plurality of third spare function blocks having different functions from each other and a fourth spare function block which is logically equivalent to the third spare function block and has the same driving capability. Create a spare function block. Each of these third spare function blocks has a first wire extending in a first direction and a second wire extending in a second direction orthogonal to the first direction, and each of the fourth spare function blocks has the first wire. A third wiring extending in a direction less than the first wiring, and a fourth wiring extending in the second direction having a greater number of wirings than the second wiring.
The spare function blocks are each designed to be replaced with each other. Therefore, as for these third and fourth spare functional blocks, it is difficult to replace the extracted functional block with a functional block having a lower driving capability as a result of extracting the functional blocks that need to be replaced. This can be used when only wirings extending in one direction or the second direction are congested.

That is, when only the wirings in the extracted functional blocks extending in the first direction are congested and there is room in the wirings extending in the second direction, the same function as this functional block and substantially the same A spare function block having a driving capability can be selected from the third spare function block, and when the extracted function block is only crowded with wires extending in the second direction and there is room for wires extending in the first direction. Is
A spare function block having the same function as this function block and substantially the same driving capability can be selected from the fourth spare function block. Therefore, it is possible to increase the wiring capacity in the first direction or the second direction without lowering the driving ability due to the replacement of the block.

[0031]

DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, a wiring layout method and a wiring layout apparatus for a semiconductor integrated circuit according to an embodiment of the present invention will be specifically described with reference to the accompanying drawings.
FIG. 1 is a block diagram showing a wiring layout apparatus for a semiconductor integrated circuit according to an embodiment of the present invention, and FIG. 2 is a flowchart showing a processing method thereof. FIG. 3 is a schematic diagram showing a base of the gate array divided into various functional blocks, and FIG. 4 is a schematic diagram showing a base of the gate array after the blocks are replaced by the wiring layout method according to the present embodiment. FIG. As shown in FIG. 1, the wiring layout device according to the present embodiment includes a control device 5, and the control device 5 includes a shortest path search device 6, a graph creation device 7, a block replacement device 8, and a slack calculation device 9. It is connected. In addition, the block replacement device 8 is connected to a library 10 that stores spare function blocks.

As shown in FIG. 3, the base 20 has a plurality of functional blocks 31, 32, 33, 35, 36, 37, 38 and 39 in which a plurality of cell forming regions 21 are combined.
Are divided into functional blocks 31 and 3
7 are connected by a net 23a, and the functional blocks 32 and 33 are
4a and 25a. Note that each cell formation region 21 has various types of bases A and B and various base orientations 1, 2, 3, and 4. In FIGS. The orientation and type of the base are shown in order.

A wiring layout method for designing the underlying wiring layout shown in FIG. 3 using the wiring layout apparatus configured as described above will be described below. First, a spare function block stored in the library 10 is created. When creating a spare function block in the library 10, a plurality of spare function blocks having the same function as each other and having different driving capabilities are prepared. In general, the larger the driving capability of a functional block, the larger its block size. Therefore, a spare functional block having the same function as each other and different driving capabilities from each other is created by the following method.

FIGS. 5 and 6 are schematic diagrams showing a plurality of spare function blocks having the same function. As shown in FIG. 5, the spare function blocks 22a, 22b and 22c in which a plurality of cell formation areas 21 are combined have different shapes from each other. , Various orientations 1, 2, 3 and 4. In FIG. 5, the orientation and type of the base are sequentially shown in each cell formation region 21.

The spare function block 2 configured as described above
2a, 22b and 22c all have the same function, but have a spare function block (first spare function block) 22a.
Has a larger driving capacity than the spare function block (second spare function block) 22b and a smaller wiring capacity. The spare function block 22b is a spare function block (second
The drive capability is larger than the spare function block 22c, and the wiring capacity is smaller. Therefore, the spare function block 22
The auxiliary function blocks 22b and 22c having a smaller driving capacity than the auxiliary function blocks 22a and 22a can be arranged at the positions where the auxiliary function blocks 22a are arranged.
Create in consideration of shape and size. Further, the auxiliary function block 2 having a smaller driving capability than the auxiliary function block 22b.
2c is created in consideration of the type, direction, shape and size of the base so that it can be always arranged at the position where the spare function block 22b is arranged.

Also, two or more types of spare function blocks having different wiring capacities for each direction are created. That is, as shown in FIGS. 6A and 6B, the spare function block 22d (third spare function block) and the spare function block (fourth spare function block) 22 in which the cell formation areas 21 are combined.
"e" has the same function and substantially the same driving capability as each other, and also has the same type, direction, shape and size of the base. However, in the spare function block 22d shown in FIG. 6A, five wirings (first wirings) 26 extending in the vertical direction (first direction) are formed, and the horizontal direction ( Wiring (second direction)
One wiring 27 is formed. On the other hand, in the spare function block 22e shown in FIG. 6B, two wires (third wires) 26 extending in the vertical direction are formed, and five wires (fourth wires) 27 extending in the horizontal direction are formed. Is formed.
As described above, the spare function block 22e is formed so that the number of wires extending in the vertical direction is small and the number of wires extending in the horizontal direction is large as compared with the number of the spare function blocks 22d.

After creating the library 10 storing such various preparatory function blocks, the control device 5 instructs the graph creating device 7 to create a grid graph. The graph creating device 7 creates a grid graph from the base size (Step 11), and calculates the wiring capacity of each branch based on the possible wiring area of the arranged functional block and the net already formed between the functional blocks. And determine the cost of the branches. Then, after the graph creation is completed, the graph creation device 7 notifies the control device 5 of the completion.

Next, the control device 5 sets the unwired net to 1
This is selected (step 12), and the shortest route search device 6 is instructed to search for the shortest route. Shortest route search device 6
Uses Dijkstra's algorithm to find a path on the grid graph that minimizes the total cost of the branches (step 13),
The result is transmitted to the control device 5. Then, the control device 5
Transmits the route obtained by the shortest route searching device 6 to the graph creating device 7. Thereby, the graph creation device 7
Updates the graph (step 14). In this way, the processing of searching for the shortest path of this net and updating the graph is repeated until there is no unwired net.

Thereafter, the control device 5 checks whether there is a branch exceeding the wiring capacity (step 15), and if there is no branch exceeding the wiring capacity, terminates the processing (step 1).
9). On the other hand, if there is a branch exceeding the wiring capacity as a result of this investigation, the slack calculator 9 is caused to calculate a slack value. The slack calculating device 9 calculates the slack value of each net by the zero slack method (step 16), and returns the result to the control device 5.

Thereafter, the control device 5 requests the block replacement device 9 to perform block replacement for increasing the wiring capacity. In FIG. 3, when a functional block 33 having a branch exceeding the wiring capacitance or a branch having a wiring capacitance close to 0 is selected as a functional block requiring replacement,
The block replacement device 9 is logically equivalent (same function) as the function block 33, and searches for a spare function block that increases the wiring capacity from a plurality of spare function blocks stored in the library 10. Then, for example, when the spare function blocks 22b and 22c shown in FIG. 5 are detected, the block replacement device 9 searches the spare function blocks for which the slack value does not become negative even when the function blocks 33 are replaced. . As a result, the spare function block 22b is detected from the library 10. In this way, after the spare function block 22b is searched from the spare function blocks stored in the library 10 based on the slack value of the net of the function block 33 and the capacity of the branch of the lattice graph, the function block 33 Replacement with the spare function block 22b is performed (step 1).
7) Inform the controller 5 of completion.

After that, the control device 5 tears off the nets connected to the function block 33 having the overflowing wiring and the replaced spare function block 22b to the graph creation device (step 18). To update the graph. The graph creating device 7 performs a graph updating process, and reports completion to the control device 5. In this way, the above processing is performed until there are no branches exceeding the wiring capacity.

In the conventional wiring layout apparatus, no special consideration is given to the spare functional blocks stored in the library, and the functional blocks that need to be replaced and the spare functional blocks stored in the library are:
The type, direction, shape, size, etc. of the base may be different. Therefore, a spare function block cannot be easily arranged at a position where a function block requiring replacement is arranged.

On the other hand, in the present embodiment, a plurality of spare function blocks having the same function as each other and having different driving capabilities are created in advance and stored in the library. Thereby, the block replacement device 8 easily selects, from the library, the spare function block 22b having the base type, direction, shape, and size that can be arranged at the position where the function block 33 requiring replacement is arranged. can do. Therefore, as shown in FIG. 4, when the function block 33 is replaced with the spare function block 22b in order to secure the wiring capacity, it is not necessary to rearrange the other function blocks around the function block 33. Compared with the previous nets 23a, 24a and 25a, the wiring length of the nets 23b, 24b and 25b after the block replacement is not extended, and the deterioration of the wiring congestion can be prevented. In addition, since the spare function block 22b has a larger wiring capacity than the functional block 33, the entire wiring capacity can be increased by replacing the block, thereby improving the wiring property.

In step 15, a functional block having a branch exceeding the wiring capacity is extracted.
As a result of the measurement of the slack value, it is difficult to replace the extracted functional block with a spare functional block having a lower driving capability because of a large delay, and only the wiring extending in the vertical or horizontal direction is congested. If there is, the spare function block 22d shown in FIG.
The spare function block 22e shown in (b) can be used.

That is, in step 17, a spare function block having the same function and substantially the same driving capability as the function block that needs to be replaced and having the same base type, direction, shape and size is stored in the library. 1
A search is made by the block replacement device 9 from among the spare function blocks stored in “0”. As a result, when the spare function blocks 22d and 22e are detected from the spare function blocks stored in the library 10, for the function blocks having only a shortage of the wiring capacity in the vertical direction,
A spare functional block 22d having a large number of wires extending in the vertical direction can be replaced with a spare functional block 22d having a large number of wires extending in the horizontal direction. it can. Therefore, the vertical or horizontal wiring capacitance can be increased without increasing the delay due to the block replacement.

[0046]

As described above in detail, according to the method of the present invention, the functions and functions of the preliminarily-prepared spare function blocks can be easily replaced by the spare function blocks. Since the drive capability and the like are designed, the wiring capacity can be improved without deteriorating the wiring congestion of the semiconductor integrated circuit after replacing the functional blocks requiring replacement with the selected spare functional blocks. .

[Brief description of the drawings]

FIG. 1 is a block diagram showing a wiring layout device for a semiconductor integrated circuit according to an embodiment of the present invention.

FIG. 2 is a flowchart illustrating a wiring layout method for a semiconductor integrated circuit according to an embodiment of the present invention.

FIG. 3 is a schematic diagram showing a base of a gate array divided into various functional blocks.

FIG. 4 is a schematic diagram illustrating a base of a gate array after blocks are replaced by a wiring layout method according to the present embodiment.

FIG. 5 is a schematic diagram showing a plurality of spare function blocks having the same function.

FIG. 6 is a schematic diagram showing a plurality of spare function blocks having the same function.

FIG. 7 is a block diagram showing a conventional wiring layout device.

FIG. 8 is a flowchart showing a conventional wiring layout method.

FIG. 9 is a schematic diagram showing a base of a gate array.

10A is a schematic diagram showing the shape, type, and direction of a functional block that needs to be replaced, and FIG. 10B is a schematic diagram showing the shape, type, and direction of a spare functional block to be replaced.

11A is a schematic diagram illustrating the shape, type, and direction of a functional block that needs to be replaced, and FIG. 11B is a schematic diagram illustrating the shape, type, and direction of a spare functional block to be replaced.

FIG. 12 is a schematic diagram showing a base of a gate array divided into various functional blocks.

FIG. 13 is a schematic diagram showing a base of a gate array after rearrangement of functional blocks.

[Explanation of symbols]

5, 41; control device 6, 42; shortest route search device 7, 43; graph creation device 8, block replacement device 9, 45; slack calculation device 10, 46; library 20, 60; base 21, 61; 22a, 22b, 22c, 22d, 22e, 62b, 6
2d, 74; spare function blocks 23a, 23b, 24a, 24b, 25a, 25b, 6
3a, 63b, 64a, 64b, 65a, 65b; Nets 26, 27; Wirings 31, 32, 33, 35, 36, 37, 38, 39, 6
2a, 62c, 71, 72, 73, 75, 76, 77,
78, 79; functional block 44; relocation device

Claims (7)

[Claims] 1. A plurality of first spare function blocks having different functions from each other, and each of the first spare function blocks being logically equivalent to each of the first spare function blocks and having a smaller driving capability than the first spare function blocks. A step of creating a second spare function block designed to be replaced with respect to the first spare function block; and a step of extracting a function block that needs to be replaced from a plurality of function blocks of the semiconductor integrated circuit. And a spare function block that is logically equivalent to the function block that needs to be replaced, has a smaller driving capability than the function block, and is designed to be replaced at a position where the function block is arranged. Selecting from the plurality of first spare function blocks and second spare function blocks; and selecting the function blocks requiring replacement. Replacing a lock with the selected spare function block. A wiring layout method for a semiconductor integrated circuit, comprising: A first wiring extending in a first direction and the first wiring;
A plurality of third auxiliary function blocks having second wirings extending in a second direction orthogonal to the direction and having different functions, and having a driving capability which is logically equivalent to each of the third auxiliary function blocks and is equivalent to each other; A third wiring having a smaller number of wirings extending in the first direction than the first wiring and a fourth wiring having a larger number of wirings extending in the second direction than the second wiring; Creating a fourth spare function block, each of which is designed to be mutually replaced with respect to the block, and extracting a function block that needs to be replaced among a plurality of function blocks of the semiconductor integrated circuit; The spare function blocks that are logically equivalent to the function blocks that need to be replaced, have the same driving capability, and increase the wiring capacity are replaced by the plurality of third spare function blocks and the fourth spare function. Process and the wiring layout method of a semiconductor integrated circuit, characterized in that and a step of replacing the replacement must be a functional block within the selected spare functional blocks selected from the lock. 3. The wiring layout of a semiconductor integrated circuit according to claim 1, wherein the functional block requiring replacement has a wiring capacitance smaller than a required wiring capacitance. Method. 4. A plurality of first spare function blocks having functions different from each other, and each of said first spare function blocks having a logically equivalent drive capacity smaller than said first spare function blocks and having a smaller driving capability than said first spare function blocks. A library for storing a second spare function block designed to be replaced with respect to the first spare function block, and a function block that needs to be replaced among a plurality of function blocks of the semiconductor integrated circuit, A spare function block to be replaced is selected from the plurality of first and second spare function blocks stored in the library based on the function block requiring replacement, and the function block requiring replacement is selected. And a replacement device for replacing with a spare functional block. apparatus. 5. The position where the selected spare function block is logically equivalent to the function block requiring replacement and has a smaller driving capability than the function block and the function block is arranged. 5. The wiring layout apparatus for a semiconductor integrated circuit according to claim 4, wherein the wiring layout apparatus is designed to be replaced with: 6. The library further comprises a first wiring extending in a first direction and a second wiring extending in a second direction orthogonal to the first direction, and a plurality of third wirings having different functions.
A spare functional block, a third interconnect logically equivalent to each of the third spare functional blocks, having the same driving capability, and extending in the first direction with a smaller number of interconnects than the first interconnect; And a fourth spare function block having a fourth wire having a larger number of wires extending in the direction than the second wire, and a fourth spare function block respectively designed to be replaced with each of the third spare function blocks. The replacement device selects a spare function block to be replaced from a plurality of third and fourth function blocks stored in the library based on the function block that requires replacement, and replaces the function block that requires replacement with the selected function block. 5. The method according to claim 4, wherein the selected spare function block is replaced.
3. A wiring layout device for a semiconductor integrated circuit according to claim 1. 7. The selected spare function block is logically equivalent to the function block requiring replacement, has the same drive capability, and increases wiring capacity. The wiring layout device for a semiconductor integrated circuit according to claim 6.