JP2000100892A - 基板検査装置 - Google Patents

基板検査装置

Info

Publication number
JP2000100892A
JP2000100892A JP26453498A JP26453498A JP2000100892A JP 2000100892 A JP2000100892 A JP 2000100892A JP 26453498 A JP26453498 A JP 26453498A JP 26453498 A JP26453498 A JP 26453498A JP 2000100892 A JP2000100892 A JP 2000100892A
Authority
JP
Japan
Prior art keywords
substrate
opening
inspection
blocking plate
plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP26453498A
Other languages
English (en)
Japanese (ja)
Other versions
JP2000100892A5 (enExample
Inventor
Shuya Jogasaki
修哉 城ヶ崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Priority to JP26453498A priority Critical patent/JP2000100892A/ja
Publication of JP2000100892A publication Critical patent/JP2000100892A/ja
Publication of JP2000100892A5 publication Critical patent/JP2000100892A5/ja
Pending legal-status Critical Current

Links

Landscapes

  • Liquid Crystal (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP26453498A 1998-09-18 1998-09-18 基板検査装置 Pending JP2000100892A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26453498A JP2000100892A (ja) 1998-09-18 1998-09-18 基板検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26453498A JP2000100892A (ja) 1998-09-18 1998-09-18 基板検査装置

Publications (2)

Publication Number Publication Date
JP2000100892A true JP2000100892A (ja) 2000-04-07
JP2000100892A5 JP2000100892A5 (enExample) 2005-11-04

Family

ID=17404608

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26453498A Pending JP2000100892A (ja) 1998-09-18 1998-09-18 基板検査装置

Country Status (1)

Country Link
JP (1) JP2000100892A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100526946C (zh) * 2006-07-03 2009-08-12 元太科技工业股份有限公司 防止产生粉尘的无电能环保式玻璃基板载运装置
WO2017187803A1 (ja) * 2016-04-26 2017-11-02 日本電産サンキョー株式会社 処理装置
WO2019054345A1 (ja) * 2017-09-14 2019-03-21 日本電産サンキョー株式会社 検査装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100526946C (zh) * 2006-07-03 2009-08-12 元太科技工业股份有限公司 防止产生粉尘的无电能环保式玻璃基板载运装置
WO2017187803A1 (ja) * 2016-04-26 2017-11-02 日本電産サンキョー株式会社 処理装置
WO2019054345A1 (ja) * 2017-09-14 2019-03-21 日本電産サンキョー株式会社 検査装置
CN111065903A (zh) * 2017-09-14 2020-04-24 日本电产三协株式会社 检查装置

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