JP2000055887A - Method and apparatus for fluorescent magnetic particle inspection - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a method and an apparatus, for fluorescent magnetic particle inspection, in which the operability of the flaw detection is enhanced. SOLUTION: The image of a flaw detection region which is imaged by a flaw detection part mounted on a running carriage 51 which can be run along the longitudinal direction of a material C to be inspected is threshold-processed, and a flaw map is created. In this case, while a reflection means 12 which is installed at the flaw detection part is being operated so as to follow the running operation of the running carriage 51, the flaw detection region is imaged, and a static flaw detection image is obtained. The reflection means 12 is stopped, and an end-edge-position detection image which is used to detect the end edge position of the flaw detection region in the material C to be inspected is imaged.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and apparatus for detecting a fluorescent magnetic particle. More specifically, the present invention relates to a fluorescent magnetic particle flaw detecting method and a fluorescent magnetic particle flaw detecting apparatus with improved flaw detection efficiency.

[0002]

2. Description of the Related Art Conventionally, a fluorescent magnetic particle flaw detection method has been known as one of the methods for flaw detection of a surface flaw of a material to be inspected such as a steel material. When the inspection target material is magnetized after the fluorescent magnetic powder is adhered to the surface of the inspection target material by showering, mist, immersion, or the like, if there is a surface flaw, the magnetic powder collects at the flaw portion due to leakage magnetic flux generated from the surface flaw. Then, when the material to be inspected is irradiated with, for example, ultraviolet light in this state, the damaged portion where the magnetic powder is collected emits strong light. That is, the light emission state (magnetic powder pattern) on the surface of the inspection target material differs depending on the presence or absence of the surface flaw. The fluorescent magnetic particle flaw detection method utilizes this development.

Further, there is also known an automatic flaw detection apparatus which takes an image of the light emission state of the surface of a material to be inspected, performs threshold processing on the taken image, and automatically detects a surface flaw. For example, Japanese Unexamined Patent Publication No. Hei 6-207926 discloses that, as shown in FIG. 9, a long inspection material w having fluorescent magnetic powder attached to its surface is relatively moved in the longitudinal direction, and the surface of the inspection material w Is divided into a plurality of blocks, and an imaging device a for irradiating the surface of the inspection object w with ultraviolet light is provided. In a fluorescent magnetic powder type automatic flaw detection device d that captures an area as a still image by cooperation of a scanning mirror that follows the relative movement and detects a flaw existing on the surface based on the still captured image, The present invention has proposed a fluorescent magnetic powder-type automatic flaw detector d, which has an edge detecting means provided with a position detecting light source e for detecting both edges in the width direction of the material to be inspected w.

However, in the fluorescent magnetic powder type automatic flaw detector f proposed in the above publication, an edge detection area for detecting both ends of the material to be inspected w by the edge detection means in one screen, and a surface flaw are detected. Since there is a flaw detection area for flaw detection, there are the following problems.

(1) The flaw detection area of the image picked up by the ultraviolet irradiation means b in the image picked up by the image pickup device a becomes a still image due to the action of the scanning mirror, but is irradiated to the position detecting light source e. The edge detection area that has flowed at the same speed as the moving speed due to the action of the scanning mirror. Therefore, the edge detection area moves even though the predetermined amount of light is not accumulated in the imaging device used in the imaging device a, for example, the CCD imaging tube. Therefore, a light source with high illuminance must be used as the position detection light source e.

(2) Since the position detection light source e must be installed in consideration of the flow of light, setting the irradiation position is complicated.

(3) When flaw detection is performed in both directions,
Since the flaw detection area is affected by the movement of the edge detection area, the position detection light source e is used for each of the forward path and the return path.
It is necessary to provide. Therefore, the size and cost of the fluorescent powder type automatic flaw detector d are increased.

(4) Since the imaging device a is arranged so as to face the side surface of the inspection target material w mounted on the support base in a rhombic shape, the flaw detection is performed on the top of the inspection target material w in the longitudinal direction. , The vertex position cannot be detected. If the position detection light source e is disposed opposite to the top for the detection of the apex and illuminated obliquely, the longitudinal width of the flaw detection area becomes very narrow, so that the flaw detection efficiency is significantly reduced. become.

Incidentally, a method of irradiating the background of the material to be inspected w and detecting the edge position using the shadow of the material is also conceivable. A light source is required, which causes another problem of increasing the size and cost of the flaw detection equipment.

[0010]

SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned problems in the prior art, and a fluorescent magnetic particle flaw detecting method and a fluorescent magnetic particle flaw detecting apparatus which solve the above problems and improve operability. It is intended to provide.

[0011]

According to a first aspect of the present invention, there is provided a fluorescent magnetic particle flaw detection method in which a flaw detection area is imaged while traveling along a longitudinal direction of a material to be inspected, and the obtained image is subjected to threshold processing. Magnetic particle inspection method for creating a flaw map by capturing a stationary flaw detection image of a flaw detection area, and capturing an edge position detection image for detecting an edge position of the flaw detection area of the inspection target material. It is characterized by being staggered in time.

A second embodiment of the fluorescent magnetic particle flaw detection method of the present invention is as follows.
A fluorescent magnetic particle flaw detection method in which the flaw detection area is imaged while traveling along the longitudinal direction of the material to be inspected, and then the obtained image is subjected to threshold processing to create a flaw map. It is characterized in that the timing of imaging is shifted from the timing of capturing a top detection image for detecting the top of the flaw detection region of the material to be inspected.

A first embodiment of the fluorescent magnetic particle flaw detection method of the present invention is as follows.
More specifically, a fluorescent magnetic particle flaw detection is performed by thresholding an image of a flaw detection area captured by a flaw detection unit mounted on a traveling vehicle and capable of traveling along the longitudinal direction of the inspection material to create a flaw map. A method for obtaining a stationary flaw detection image by imaging a flaw detection area while operating a reflecting means provided in a flaw detection unit so as to follow the traveling of a traveling vehicle, and stopping the reflecting means to be inspected. Capturing an edge position detection image for detecting the edge position of the flaw detection region of the material.

A second embodiment of the fluorescent magnetic particle flaw detection method of the present invention is as follows.
More specifically, a fluorescent magnetic particle flaw detection is performed by thresholding an image of a flaw detection area captured by a flaw detection unit mounted on a traveling vehicle and capable of traveling along the longitudinal direction of the inspection material to create a flaw map. A method for obtaining a stationary flaw detection image by imaging a flaw detection area while operating a reflecting means provided in a flaw detection unit so as to follow the traveling of a traveling vehicle, and stopping the reflecting means to be inspected. Capturing a top detection image for detecting the top of the flaw detection region of the material.

A fluorescent particle inspection apparatus according to the present invention is provided with a flaw detector for capturing a stationary flaw detection image of a flaw detection area of a material to be inspected, an edge position detection image of a flaw detection area of the material to be inspected, and the flaw detector. A traveling unit that is capable of traveling along the longitudinal direction of the inspection target material, a flaw detection image processing unit that performs image processing on the flaw detection image, and an edge position detection image processing that performs image processing on the edge position detection image And a control unit that controls at least the imaging timing of the flaw detection image and the edge position detection image.

In the fluorescent particle inspection apparatus according to the present invention, the inspection unit includes an ultraviolet irradiation unit, an edge detection light irradiation unit, and a reflection unit operable to follow the traveling of the traveling unit. Or, the flaw detection unit has an ultraviolet irradiation unit, a top detection light irradiation unit, and a reflection unit that is operable following the traveling of the traveling unit. Or be done.

[0017]

According to the present invention, the flaw detection image does not include a bright line for detecting an edge position or a bright line for detecting a top portion, so that the flaw detection accuracy is improved. In addition, since the flaw detection image and the edge detection image or the top detection image are separately captured, the illuminance of the edge detection light irradiation unit or the top detection light irradiation unit can be suppressed to be low. The life of the light source of the means is extended. Further, since the flaw detection image and the edge detection image or the top detection image are separately captured, setting of the irradiation position of the edge position detection light irradiation unit or the top position detection light irradiation unit becomes easy.

[0018]

DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described based on embodiments with reference to the accompanying drawings, but the present invention is not limited to only such embodiments.

Embodiment 1 FIG. 1 is a block diagram of a fluorescent magnetic particle flaw detection device (hereinafter simply referred to as a flaw detection device) A1 applied to a fluorescent magnetic particle flaw detection method (hereinafter simply referred to as a flaw detection method) according to a first embodiment of the present invention. In the flaw detection method according to the first embodiment, a square steel material (a material to be inspected) is divided into a required number of blocks for flaw detection.

The flaw detector 1A includes a first flaw detector 10 for picking up an image of one of the upper side surfaces (hereinafter, referred to as a first side surface) C1 of a square steel member C placed on a test table B in a diamond shape, and The other (hereinafter, referred to as a second side face) C2 is imaged by the second flaw detector 20, the first image processor 30 processes an image captured by the first flaw detector 10, and the second flaw detector 20 captures an image. The main part includes a second image processing unit 40 that processes the processed image, a traveling unit 50 that moves along the longitudinal direction of the rectangular steel material C, and a control unit 60.

The first flaw detector 10 includes a black light (ultraviolet irradiation means) 11, a scanning mirror (reflection means) 12, an edge position detection light (edge position detection light irradiation means) 13, and a CC.
A D camera (imaging means) 14 is provided. The scanning mirror 12 operates so as to follow the traveling of the traveling unit 50. That is, the operation is adjusted so that a still image of the flaw detection area D can be captured. The irradiation direction of the edge position detection light 13 is adjusted so as to irradiate in a slit shape in the width direction of the rectangular steel material C, that is, the emission line of the edge position detection light 13 is set to be in the width direction of the square steel material C. The irradiation direction is adjusted (see FIG. 3), and the irradiation is performed at a predetermined time so as not to hinder the imaging of the flaw detection image by the CCD camera 14. For example, the irradiation time is adjusted by a shutter. Note that, instead of the shutter, irradiation may be performed by a stroboscopic method.

The black light 11 and the scanning mirror 1
2. Edge position detection light 13 and CCD camera 14
Can be conventionally known.

As shown in FIG. 2, the first image processing section 30 comprises a flaw detection image processing means 31 for processing an image of a flaw detection area D (hereinafter referred to as a flaw detection image) picked up by the CCD camera 14, and a CCD camera. And an edge position detection image processing unit 32 that performs image processing on the edge position detection image captured by the image processing unit 14.

The second flaw detector 20 is provided with a black light 21, a scanning mirror 22, an edge position detecting light 23, and a CCD camera 24, like the first flaw detector 10. Similarly, the second image processing unit 40 includes a flaw detection image processing unit 41 that performs image processing on the flaw detection image, and an edge position detection image processing unit 42 that performs image processing on the edge position detection image. You. Note that, for simplicity of drawing, reference numerals relating to the components related to the second flaw detection unit 20 and the second image processing unit 40 are shown in () in FIG. 2.

The traveling portion 50 is, specifically, a traveling vehicle 51 traveling on a pair of rails R disposed above the rectangular steel material C. The traveling trolley 51 includes a box-shaped trolley main body 52 and a traveling device 53 having traveling wheels 54 and 55 disposed above the trolley main body 52 as main components. The specific configurations of the bogie main body 52 and the traveling device 53 can be, for example, those proposed in Japanese Patent Application Laid-Open No. Hei 6-207926.

At the lower part of the bogie main body 52, the upper part of the rectangular steel material C is accommodated so as not to hinder the traveling of the traveling bogie 51. Above the upper part of the rectangular steel material C, the first flaw detector 10 and The black lights 11 and 12 of the second flaw detector 20
1, scanning mirrors 12, 22 and position detecting lights 13, 2
3 and CCD cameras 14 and 24 are arranged in a predetermined positional relationship corresponding to the first side surface C1 and the second side surface C2, respectively. In this case, the scanning mirrors 12, 22
As described above, the apparatus operates following the traveling of the traveling vehicle 51 so that the CCD cameras 14 and 24 can capture a still image of the flaw detection area D even while the traveling vehicle 51 is traveling.

The control unit 60 is, specifically, a control microcomputer 6
1, black light 11, 21 and scanning mirror 1
2, 22, edge position detection lights 13, 23 and CCD
It controls the cameras 14 and 24, the traveling carriage 51, the first image processing unit 30, the second image processing unit 40, and the like, and outputs a flaw detection result.

Next, according to the time chart shown in FIG.
The flaw detection of the square steel material side surfaces C1 and C2 by the flaw detection apparatus A1 having such a configuration will be described.

(1) The traveling of the traveling vehicle 51 is started, and accordingly, the black lights 11, 21 and the scanning mirror 12,
22 is also turned on.

(2) When the scanning mirrors 12 and 22 are turned on, the scanning mirrors 12 and 22 perform an operation of following the traveling of the traveling vehicle 51. This following operation is performed by the black light 1
A stationary flaw detection image of the flaw detection area D irradiated with 1, 21 can be taken.

(3) After a predetermined time has passed since the scanning mirrors 12 and 22 were turned on, the CCD cameras 14 and 24 are turned on to capture a still image of the flaw detection area D. The captured image is transmitted to the first image processing unit 30 and the second image processing unit 4.
0 is sent to the flaw detection image processing means 31 and 41. In addition,
The predetermined time is appropriately set according to the traveling speed of the traveling vehicle 51.

(4) The scanning mirrors 12 and 22 are turned off after a lapse of a predetermined time after the imaging of the still image of the flaw detection area D by the CCD cameras 14 and 24 ends. As a result, the scanning mirrors 12, 22 return to the initial positions. The turning off of the scanning mirrors 12 and 22 may be performed simultaneously with the end of the imaging of the flaw detection area. The predetermined time is appropriately set according to the traveling speed of the traveling vehicle 51.

(5) After a predetermined time has elapsed since the scanning mirrors 12 and 22 were turned off, the edge position detecting lights 13 and 23 are turned on. The irradiation position of the edge position detection lights 13 and 23 is, for example, the center of the flaw detection area D (see FIG. 3).

(6) After a predetermined time has passed since the edge position detecting lights 13 and 23 were turned on, the CCD cameras 14 and 24
Is turned on to capture an image of the location irradiated by the edge position detection lights 13 and 23. That is, an edge detection image is captured. The captured edge detection image is sent to the edge position detection image processing means 32 and 42 of the first image processing unit 30 and the second image processing unit 40. The predetermined time is appropriately set according to the traveling speed of the traveling vehicle 51.

(7) The edge position detection lights 13 and 23 are turned off after a lapse of a predetermined time from the completion of the imaging of the edge detection image by the CCD cameras 14 and 24. This allows
The flaw detection of the first block is completed. The predetermined time is appropriately set according to the traveling speed of the traveling vehicle 51.

(8) The scanning mirrors 11 and 21 are turned on after a predetermined time has passed since the edge position detection lights 13 and 23 were turned off. Thereby, the flaw detection of the second block is started. The predetermined time is appropriately set according to the traveling speed of the traveling vehicle 51.

Next, image processing in the first image processing section 30 will be described. This image processing is the same in the second image processing unit 40.

The flaw detection image (analog image) sent to the flaw detection image processing means 31 is converted into a digital image (hereinafter referred to as a digital flaw detection image) by an A / D converter.
Noise is removed by the spatial filter. On the other hand, the edge detection image (analog image) sent to the edge position detection image processing means 32 is converted into a digital image (hereinafter, referred to as a digital position detection image) by an A / D converter, and then converted to a conventional method. And the edge position of the rectangular steel material C is specified. By the specified edge position of the square steel material C,
The portion outside the range of the rectangular steel material C is removed from the digital flaw detection image. Next, the digital flaw detection image from which a portion outside the range is removed is subjected to threshold processing by a conventional method, and a flaw is detected.
The positions of the detected flaws are mapped and sent to the control unit 60. That is, a scratch map is created and the control unit 60
Sent to The control unit 60 sends this flaw map to, for example, a surface flaw processing unit (not shown).

Hereinafter, repair of surface flaws is performed based on this flaw map.

As described above, according to the first embodiment,
The following effects can be obtained.

(1) Since the flaw detection image and the edge position detection image are separately captured, there are no bright lines of the edge position detection lights 13 and 23 in the flaw detection image. Therefore, the flaw detection area D
Flaw detection can be performed in the entire area, and the flaw detection accuracy is improved.

(2) Since the flaw detection image and the edge position detection image are separately captured, the edge position detection lights 13 and 23 are used.
Setting becomes simple. Further, even when flaw detection is performed in both the reciprocating directions, only one edge position detection light 13 or 23 is required for one side surface, so that the configuration of the flaw detection apparatus A is simplified, and the cost of the flaw detection apparatus A1 is reduced accordingly.

(3) Since the imaging of the edge position detection image is performed while the scanning mirrors 12 and 22 are stopped, the image of the bright line in the edge position detection image does not flow. for that reason,
The edge position detecting lights 13 and 23 may have lower illuminance, and the life of the edge position detecting lights 13 and 23 is extended.

Embodiment 2 FIG. 5 is a block diagram showing a flaw detector A2 used in a flaw detection method according to a second embodiment of the present invention. Embodiment 2
Is a modification of the first embodiment, in which the top of a square steel material C placed in a diamond shape on an inspection table B is detected. That is, a top flaw detector 70 is provided instead of the first flaw detector 10 and the second flaw detector 20 in the first embodiment.

The basic configuration of the flaw detector A2 is the same as that of the flaw detector A1 of the first embodiment. That is, similarly to the first flaw detection unit 10 of the first embodiment, the top flaw detection unit 70 includes a black light 71, a scanning mirror 72, a top position detection light (top position detection light irradiation unit) 73, a CCD camera 74, and a CCD camera 74. And is provided with
Similarly, the image processing unit 80 includes a flaw detection image processing unit 81 that performs image processing on the flaw detection image and a top position detection image processing unit 82 that performs image processing on the top position detection image (see FIG. 6). ). However, the top position detection light 7
3 is a first side surface C1 for detecting the top of the rectangular steel material C.
The irradiation angle is adjusted so as to draw an oblique bright line on the second side surface C2 (see FIG. 7).

Next, according to the time chart shown in FIG.
Square steel C by the flaw detector A2 having such a configuration.
The flaw detection at the top will be described.

(1) The traveling of the traveling vehicle 51 is started, and at the same time, the black light 71 and the scanning mirror 72 are turned on.

(2) When the scanning mirror 72 is turned on, the scanning mirror 72 performs an operation of following the traveling of the traveling vehicle 51. The following operation is performed so that a still image of the flaw detection area irradiated with the black light 71 can be captured.

(3) After a predetermined time has passed since the scanning mirror 72 was turned on, the CCD camera 74 is turned on to capture a still image of the flaw detection area D. The captured image is sent to the flaw detection image processing means 81 of the image processing unit 80. The predetermined time is appropriately set according to the traveling speed of the traveling vehicle 51.

(4) Flaw detection area D by CCD camera 74
The scanning mirror 72 is turned off after a lapse of a predetermined time from the end of the imaging of the still image. Thereby, the scanning mirror 72
Returns to the initial position. The predetermined time is appropriately set according to the traveling speed of the traveling vehicle 51.

(5) After a predetermined time has elapsed since the scanning mirror 72 was turned off, the top position detecting light 73 is turned on.
The irradiation position of the top position detection light 73 is, for example, a position at which the top is irradiated is the tip of the flaw detection area D (see FIG. 7). The predetermined time is appropriately set according to the traveling speed of the traveling vehicle 51.

(6) After a predetermined time has elapsed since the top position detection light 73 was turned on, the CCD camera 74 is turned on to capture an image of the location irradiated by the top position detection light 73. That is, a top detection image is captured. The captured top detection image is sent to the top position detection image processing unit 82 of the image processing unit 80. The predetermined time is appropriately set according to the traveling speed of the traveling vehicle 51.

(7) The top position detection light 73 is turned off after a lapse of a predetermined time from the end of the imaging of the top detection image by the CCD camera 74. Thereby, the flaw detection of the first block is completed.

(8) The scanning mirror 72 is turned on after a predetermined time has elapsed since the top position detection light 73 was turned off.
Thereby, the flaw detection of the second block is started. In addition,
The predetermined time is appropriately set according to the traveling speed of the traveling vehicle 51.

Next, only the differences between the image processing performed by the image processing section 80 and the first embodiment will be described.

Based on the top detection image converted into a digital image by the A / D converter (hereinafter referred to as a digital top detection image), the edge positions of the first side surface C1 and the second side surface C2 and the emission line An inclination is calculated. Next, based on the edge positions of the first side surface C1 and the second side surface C2 and the inclination of the bright line, the intersection position of the bright line on the first side C1 side and the bright line on the second side C2 side is calculated, and the position is defined as the vertex. I do. Thereby, the top is detected. Then
A flaw map near the top is created based on the top and sent to the control unit 60. The control unit 60 sends this flaw map to, for example, a surface flaw processing unit (not shown).

Hereinafter, repair of surface flaws near the top is performed based on the flaw map.

As described above, according to the second embodiment,
Embodiment 1 in which surface flaws near the top can be detected
Some effects that cannot be obtained are also obtained.

As described above, the present invention has been described based on the embodiments. However, the present invention is not limited to only such embodiments, and various modifications are possible. For example, the first embodiment and the second embodiment may be combined to detect flaws on the side surface and the top at the same time. In this case, it is preferable that each image is taken at a different time. In the embodiment, the material to be inspected is a square steel material. However, the shape of the material to be inspected is not limited to a square shape, and may be various shapes, for example, a round shape.

[0060]

As described above, according to the present invention, the following excellent effects can be obtained.

(1) Since the flaw detection image and the edge or top position detection image are separately captured, there is no bright line from the light source of the edge or top position detection light irradiation means in the flaw detection image. Therefore, flaw detection can be performed on the entire flaw detection area, and flaw detection accuracy is improved.

(2) Since the flaw detection image and the edge or top position detection image are separately captured, setting of the edge or top position detection light irradiation means is simplified. Further, even when flaw detection is performed in both the reciprocating directions, only one edge or top position detection light irradiating means is required for one side, so that the configuration of the flaw detection apparatus is simplified, and the cost of the flaw detection apparatus is reduced accordingly.

(3) The edge or top position detection image is picked up with the reflection means stopped, so that the edge or top position detection image does not flow. Therefore, the illuminance of the edge or top position detection light may be low, and the life of the light source of the edge or top position detection light is extended.

[Brief description of the drawings]

FIG. 1 is a block diagram of a fluorescent magnetic particle flaw detector according to Embodiment 1 of the present invention.

FIG. 2 is a schematic diagram of the fluorescent magnetic particle flaw detector of the embodiment.

3A and 3B are explanatory diagrams of a flaw detection procedure in the embodiment, wherein FIG. 3A is a schematic diagram of a flaw detection image, and FIG. 3B is a schematic diagram of an edge detection image.

FIG. 4 is a time chart in the embodiment.

FIG. 5 is a block diagram of a fluorescent magnetic particle inspection apparatus according to Embodiment 2 of the present invention.

FIG. 6 is a schematic diagram of the fluorescent magnetic particle flaw detector of the embodiment.

7A and 7B are explanatory diagrams of a flaw detection procedure in the embodiment, wherein FIG. 7A is a schematic diagram of a flaw detection image, and FIG. 7B is a schematic diagram of a top detection image.

FIG. 8 is a time chart in the embodiment.

FIG. 9 is a perspective view of a fluorescent magnetic particle flaw detector proposed in Japanese Patent Application Laid-Open No. 6-207926.

[Explanation of symbols]

DESCRIPTION OF SYMBOLS 10 1st flaw detection part 11 Black light (ultraviolet irradiation means) 12 Scanning mirror (reflection means) 13 Edge position detection light (edge position detection light irradiation means) 14 CCD camera 20 2nd flaw detection part 21 Black light (ultraviolet irradiation means) 22) scanning mirror (reflection means) 23 edge position detection light (edge position detection light irradiation means) 24 CCD camera 30 first image processing unit 31 flaw detection image processing means 32 edge position detection image processing means 40 second image processing Unit 41 flaw detection image processing means 42 edge position detection image processing means 50 traveling unit 51 traveling vehicle 60 control unit 61 control microcomputer 70 top flaw detection unit 80 image processing unit A fluorescent magnetic particle flaw detection device B inspection table C square steel material D flaw detection area

Claims (7)

[Claims] 1. A fluorescent magnetic particle flaw detection method in which a flaw detection area is imaged while traveling along a longitudinal direction of an inspection material, and a flaw map is created by thresholding the obtained image. A fluorescent magnetic particle flaw detection method, characterized in that the timing of capturing a stationary flaw detection image and the timing of capturing an edge position detection image for detecting the edge position of a flaw detection region of a material to be inspected are shifted. 2. A fluorescent magnetic particle flaw detection method in which a flaw detection area is imaged while traveling along the longitudinal direction of a material to be inspected, and then a flaw map is created by thresholding the obtained image. A fluorescent magnetic particle flaw detection method, characterized in that the timing of capturing a stationary flaw detection image and the timing of capturing a top detection image for detecting the top of a flaw detection region of a material to be inspected are shifted. 3. Fluorescent magnetic particle flaw detection in which a flaw map is created by performing threshold processing on an image of a flaw detection area imaged by a flaw detection unit mounted on a traveling vehicle and capable of running along the longitudinal direction of a material to be inspected. A method of obtaining a stationary flaw detection image by imaging a flaw detection area while operating a reflecting means provided in a flaw detection unit following a traveling of a traveling vehicle, and stopping the reflecting means to be inspected. Capturing an edge position detection image for detecting the edge position of the flaw detection region of the material. 4. A fluorescent magnetic particle flaw detection apparatus for processing a flaw detection map by threshold processing an image of a flaw detection area imaged by a flaw detection unit mounted on a traveling vehicle, which is capable of traveling along the longitudinal direction of the material to be inspected. A method of obtaining a stationary flaw detection image by imaging a flaw detection area while operating a reflecting means provided in a flaw detection unit following a traveling of a traveling vehicle, and stopping the reflecting means to be inspected. Picking up a top detection image for detecting the top of the flaw detection region of the material. 5. A flaw detector for capturing a stationary flaw detection image of a flaw detection area of a material to be inspected and an edge position detection image of a flaw detection area of the material to be inspected, and a longitudinal direction of the material to be inspected on which the flaw detector is mounted. A traveling unit that can travel along the direction, a flaw detection image processing unit that performs image processing on the flaw detection image, and an edge position detection image processing unit that performs image processing on the edge position detection image,
A fluorescent magnetic particle flaw detection device, comprising: a control unit for controlling at least a timing of capturing the flaw detection image and the edge position detection image. 6. The flaw detection unit includes an ultraviolet irradiation unit, an edge detection light irradiation unit, and a reflection unit operable to follow the traveling of the traveling unit. A fluorescent magnetic particle flaw detector according to claim 5. 7. The flaw detection unit includes an ultraviolet irradiation unit, a top detection light irradiation unit, and a reflection unit operable to follow the traveling of the traveling unit. Item 6. A fluorescent magnetic particle flaw detector according to Item 5.