JP2000002730A - 測定ポ―ト定温化装置 - Google Patents

測定ポ―ト定温化装置

Info

Publication number
JP2000002730A
JP2000002730A JP11114389A JP11438999A JP2000002730A JP 2000002730 A JP2000002730 A JP 2000002730A JP 11114389 A JP11114389 A JP 11114389A JP 11438999 A JP11438999 A JP 11438999A JP 2000002730 A JP2000002730 A JP 2000002730A
Authority
JP
Japan
Prior art keywords
temperature
measurement port
port
temperature control
heat
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11114389A
Other languages
English (en)
Japanese (ja)
Other versions
JP2000002730A5 (enExample
Inventor
Anderson Wendell
ウェンデル・アンダーソン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of JP2000002730A publication Critical patent/JP2000002730A/ja
Publication of JP2000002730A5 publication Critical patent/JP2000002730A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D23/00—Control of temperature
    • G05D23/19—Control of temperature characterised by the use of electric means
    • G05D23/20—Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature
    • G05D23/24—Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature the sensing element having a resistance varying with temperature, e.g. a thermistor
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D23/00—Control of temperature
    • G05D23/19—Control of temperature characterised by the use of electric means
    • G05D23/1902—Control of temperature characterised by the use of electric means characterised by the use of a variable reference value
    • G05D23/1904—Control of temperature characterised by the use of electric means characterised by the use of a variable reference value variable in time
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
JP11114389A 1998-04-22 1999-04-22 測定ポ―ト定温化装置 Pending JP2000002730A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/064,810 US6408215B1 (en) 1998-04-22 1998-04-22 Isothermal port for microwave network analyzer and method
US064,810 1998-04-22

Publications (2)

Publication Number Publication Date
JP2000002730A true JP2000002730A (ja) 2000-01-07
JP2000002730A5 JP2000002730A5 (enExample) 2006-01-26

Family

ID=22058406

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11114389A Pending JP2000002730A (ja) 1998-04-22 1999-04-22 測定ポ―ト定温化装置

Country Status (2)

Country Link
US (1) US6408215B1 (enExample)
JP (1) JP2000002730A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7768837B2 (en) 2006-11-23 2010-08-03 Samsung Electronics Co., Ltd. Flash memory device with write driver and bit line detecting driving circuits
JP2016138776A (ja) * 2015-01-27 2016-08-04 国立研究開発法人産業技術総合研究所 基準源モジュール、電気・電子機器、遠隔校正方法
CN110174568A (zh) * 2019-05-15 2019-08-27 广西电网有限责任公司电力科学研究院 一种电能质量监测装置多业务的校准系统及其校准方法

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6876991B1 (en) 1999-11-08 2005-04-05 Collaborative Decision Platforms, Llc. System, method and computer program product for a collaborative decision platform
CN105334473B (zh) * 2015-10-29 2018-03-16 江苏海明医疗器械有限公司 一种医用电子直线加速器用开关电源检测系统
CN109188336B (zh) * 2018-08-30 2021-08-03 中国电力科学研究院有限公司 现场校验设备用多功能联合接线盒电流检测开关结构
CN109085400B (zh) * 2018-08-30 2021-09-28 中国电力科学研究院有限公司 电能计量用多功能联合接线盒用电流检测开关结构
CN109085396B (zh) * 2018-08-30 2021-09-17 中国电力科学研究院有限公司 带有换表工装的电能计量用多功能联合接线盒
CN109085401B (zh) * 2018-08-30 2021-08-03 中国电力科学研究院有限公司 带有测试工装的电能计量用多功能联合接线盒
CN109085397B (zh) * 2018-08-30 2021-08-06 中国电力科学研究院有限公司 电能计量用多功能联合接线盒用测试工装结构
CN109085398B (zh) * 2018-08-30 2021-08-03 中国电力科学研究院有限公司 带有换表工装的电能计量用多功能联合接线盒
CN109085399B (zh) * 2018-08-30 2021-09-28 中国电力科学研究院有限公司 电能计量用多功能联合接线盒用电压检测开关结构

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4534941A (en) * 1981-12-04 1985-08-13 Beckman Instruments, Inc. Analytical instrument thermoelectric temperature regulator
US4518700A (en) * 1981-12-04 1985-05-21 Beckman Instruments, Inc. Method and apparatus for regulating the temperature of an analytical instrument reactor
US4704872A (en) * 1986-11-25 1987-11-10 The United States Of America As Represented By The Secretary Of The Air Force Thermally controlled T/R module test apparatus
US4959614A (en) * 1989-08-03 1990-09-25 The United States Of America As Represented By The Secretary Of The Navy Apparatus for determining microwave characteristics of superconductive materials using a resonant cavity and calibration waveguides
US5028988A (en) * 1989-12-27 1991-07-02 Ncr Corporation Method and apparatus for low temperature integrated circuit chip testing and operation
US5097829A (en) * 1990-03-19 1992-03-24 Tony Quisenberry Temperature controlled cooling system
US5754766A (en) * 1991-04-17 1998-05-19 Shaw; Venson M. Integrated circuit system for direct document execution
US5268636A (en) * 1992-03-10 1993-12-07 The United States Of America As Represented By The Secretary Of Commerce MMIC package and interconnect test fixture
EP0656123B1 (en) * 1992-08-21 1996-10-16 E.I. Du Pont De Nemours And Company Apparatus for characterizing high temperature superconducting thin film
US5505046A (en) * 1994-01-12 1996-04-09 Marlow Industrie, Inc. Control system for thermoelectric refrigerator
US5419780A (en) * 1994-04-29 1995-05-30 Ast Research, Inc. Method and apparatus for recovering power from semiconductor circuit using thermoelectric device
JP2986381B2 (ja) * 1994-08-16 1999-12-06 インターナショナル・ビジネス・マシーンズ・コーポレイション 電子チップ温度制御装置及び方法
JP3212818B2 (ja) * 1994-12-28 2001-09-25 シャープ株式会社 電子冷却装置
US5648038A (en) * 1995-09-20 1997-07-15 Lambda Technologies Systems and methods for monitoring material properties using microwave energy
US5712448A (en) * 1996-02-07 1998-01-27 California Institute Of Technology Cooling device featuring thermoelectric and diamond materials for temperature control of heat-dissipating devices
US5854559A (en) * 1996-11-20 1998-12-29 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Method and apparatus for testing microwave devices and circuits in a controlled environment

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7768837B2 (en) 2006-11-23 2010-08-03 Samsung Electronics Co., Ltd. Flash memory device with write driver and bit line detecting driving circuits
JP2016138776A (ja) * 2015-01-27 2016-08-04 国立研究開発法人産業技術総合研究所 基準源モジュール、電気・電子機器、遠隔校正方法
CN110174568A (zh) * 2019-05-15 2019-08-27 广西电网有限责任公司电力科学研究院 一种电能质量监测装置多业务的校准系统及其校准方法

Also Published As

Publication number Publication date
US6408215B1 (en) 2002-06-18

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