JP2000002666A - Multiple reflection measuring apparatus - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a multiple reflection measuring apparatus by which a multiple reflection can be measured quantitatively. SOLUTION: A holding part 3 which holds a light transmission member 2 having a light transmission layer 20 is provided. An inspection light source 4 which makes inspection light B incident on the light transmission member 2 at an angle of incidence α tilted with respect to the normal line S of the light transmission layer 20 on the light transmission member 2 held by the holding part 3 is provided. A light receiving member 5 by which a main reflected image K2 based on the reflection of the inspection light B at the light transmission member 2 and a ghost image H2 as a subreflected image are received is provided in such a way that the degree of the multiple reflection of the light transmission member 2 can be judged on the basis of the interval ΔM between the main reflected image K2 and the ghost image H2 a the subreflected image.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a multiple image measuring apparatus for measuring the degree of multiple image reflection on a light transmitting member having a light transmitting property, such as a rear-view mirror or an electrochromic display device.

[0002]

2. Description of the Related Art In a rear view mirror, double images may occur. For example, as shown in FIGS. 11A and 11B, when the building 200 and the like are viewed with the rear-view mirror 100, the main reflection image K2
In addition, a ghost image H2 which is a sub-reflection image may appear. Conventionally, the degree of double reflection has been determined by a sensory test with the naked eye of an examiner facing the rearview mirror 100.

[0003] Japanese Patent Application Laid-Open No. 7-128242 discloses that
An LED element functioning as a light source, a transparent glass to be inspected, and an image sensor are arranged in series, and visible light emitted from the LED element is passed through the transparent glass in the thickness direction thereof. A technique is known in which an image of an LED element is captured by an image sensor through a very small area, and the presence or absence of distortion of the transparent glass is determined based on the captured image.

[0004]

SUMMARY OF THE INVENTION It is an object of the present invention to provide a multiplex reflection measuring apparatus of a type utilizing reflection of detection light at a light transmitting member, which is different from the above-mentioned publication system.

[0005]

SUMMARY OF THE INVENTION A multiple reflection measuring apparatus according to the present invention comprises a holding portion for holding a light transmitting member having a light transmitting layer and a light reflecting layer laminated thereon, and a light transmitting member held by the holding portion. An inspection light source that causes inspection light to enter the light transmitting member from the light transmitting layer side at an angle of incidence that is inclined with respect to the normal line of the light transmitting layer, and a light transmitting member that is based on the distance between the main reflection image and the sub reflection image. A light receiving member is provided for receiving a main reflection image and a sub reflection image based on the reflection of the detection light by the light transmitting member so that the degree of multiple reflection can be determined.

[0006]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A holding section holds a light transmitting member. It is preferable that the holding unit holds the light transmitting member in a state of being inclined at a predetermined inclination angle. The inclination angle can be appropriately selected, and can be about 20 to 70 degrees, for example, 45 degrees with respect to the horizontal direction. The light transmitting member has a light transmitting layer. As the light transmitting layer, generally,
An inorganic or organic transparent glass plate can be employed. The light transmitting member may have a light transmitting layer but may have no light reflecting layer. Alternatively, the light transmitting member may have a configuration in which a light transmitting layer and a light reflecting layer are stacked. Typical light transmitting members include a mirror having a structure in which a light reflecting layer such as an aluminum vapor-deposited film is laminated on the back surface of the light transmitting layer, and a main body of a display element (for example, an electrochromic element).

The inspection light source causes the inspection light to enter the light transmitting member at an angle of incidence that is inclined with respect to the normal to the light transmitting layer of the light transmitting member held by the holding unit. As the inspection light source, one that emits light having good directivity is preferable, and a laser element that emits light having extremely good directivity is preferable. The light is preferably visible light. The color of light is not particularly limited, and may be red, blue, green, yellow, or the like.

The light receiving member receives a main reflection image and a sub reflection image (also called a ghost image) based on the reflection of the detection light by the light transmitting member. As the light receiving member, a screen having a light receiving surface, a light receiving element such as a CCD element capable of converting an imaging mode into an electric signal can be adopted. Further, according to the present invention, the degree of multiple reflection on the light transmitting member can be determined based on the distance between the main reflection image and the sub reflection image received by the light receiving member.

The distance between the main reflection image and the sub reflection image may be measured by a worker on a scale or the like based on the naked eye, or may be measured based on an electric signal from a light receiving element such as a CCD element. May be.

[0010]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A first embodiment will be described below with reference to FIGS. (First Embodiment) According to the present embodiment, the base 1 is provided with the holding portion 3 for holding the light transmitting member 2. The holding surface 3a of the holding portion 3 has θ (substantially 4 with respect to the horizontal direction).
(5 degrees). A first guide 10 extends in the holding section 3 in the horizontal direction, that is, along the directions of arrows X1 and X2. The light transmitting member 2 installed on the holding unit 3 using the first guide 10 moves along the first guide 10 with an arrow X
It can move relative to the holding unit 3 in the X and X directions.

The base 1 is provided with a second guide 11 extending in the horizontal direction. The second guide 11 is the first guide 1
It is arranged in a direction orthogonal to 0. A semiconductor laser element 4 functioning as an inspection light source is provided on the second guide 11 so as to be movable in a horizontal direction, that is, in directions of arrows Y1 and Y2. The semiconductor laser element 4 has a holding surface 3 a of the holding section 3.
It is arranged above. Semiconductor laser device 4 (output:
4 mW) irradiates visible laser light (wavelength: 670 nm, spot diameter: 0.5 mm, red) having high directivity and low diffusion as detection light.

A light receiving member 5, which is a screen arranged in a vertical plane, is arranged at a distance L from the base 1. In this embodiment, when the drive source 6 is driven, at least one of the base 1 and the light receiving member 5 moves along the third guide 60, and the distance L between the base 1 and the light receiving member 5 is adjusted. Therefore, the drive source 6 functions as a distance varying unit that varies the distance between the semiconductor laser element 4 and the light receiving member 5. As the drive source 6, a motor mechanism or a cylinder mechanism can be adopted.

At the time of measurement, as shown in FIG. 1, a light transmitting member 2 which is an object to be measured is held by a holding portion 3. The light transmitting member 2 is arranged to be inclined θ (substantially 45 degrees) with respect to the horizontal direction. The light transmitting member 2 is formed by laminating a light reflecting layer 23 such as an aluminum vapor-deposited film on the back surface of a light transmitting layer 20 which is a glass plate having a certain thickness. The reflectivity of the light reflecting layer 23 is considerably higher than the reflectivity of the surface 20a of the light transmitting layer 20.

The semiconductor laser element 4 is set at a desired position, and a laser beam B is emitted downward from the semiconductor laser element 4 substantially in the vertical direction. The laser beam B is incident on the light transmitting member 2 from the light transmitting layer 20 side at an incident angle α inclined with respect to the normal S of the light transmitting layer 20 of the light transmitting member 2. As a result, as shown in FIG. 3, the laser beam B is reflected by the light reflecting layer 23 having a high reflectance in the light transmitting member 2, and becomes the main reflected light K1 having a high light intensity. Further, a part of the laser light B is reflected on the surface 20a of the light transmitting layer 20 having a low reflectance in the light transmitting member 2, and becomes the ghost light H1 as the sub-reflected light having a low light intensity.

As a result, as shown in FIG.
In, a spot-shaped main reflection image K2 is formed based on the main reflected light K1, and a minute spot-shaped ghost image H2 is formed as a sub-reflected image based on the ghost light H1.
When the distance ΔM between the main reflection image K2 and the ghost image H2 in the light receiving member 5 is small, the degree of double reflection of the light transmitting member 2 is small. When the interval ΔM is large, the degree of double reflection of the light transmitting member 2 is large. According to the present embodiment, the degree of double reflection on the light transmitting member 2 can be quantitatively measured by measuring the interval ΔM.

According to this embodiment, in order to change the measuring point of the light transmitting member 2, the arrow X is moved along the first guide 10.
The light transmissive member 2 is relatively moved in parallel in the 1, X2 direction, or the semiconductor laser element 4 is moved in the second guide 11 along the horizontal direction, that is, in the directions of the arrows Y1, Y2. By doing so, the number of measurement points on the light transmitting member 2 can be increased, which is effective for quality assurance against double reflection.

By the way, when the parallelism between the front surface 20a and the back surface 20c of the light transmitting layer 20 of the light transmitting member 2 is low, when the distance L between the base 1 and the light receiving member 5 changes, the value of ΔM described above is obtained. Tend to change. Therefore, when grasping the parallelism between the front surface 20a and the back surface 20c of the light transmitting layer 20 of the light transmitting member 2, first, the semiconductor laser element 4 irradiates the laser light B, and the main reflection image K2 and the ghost image H2 A first measuring step of measuring the interval ΔM (1) between the two. Thereafter, a step of driving the drive source 6 to increase or decrease the distance L between the base 1 and the light receiving member 5 to change the distance L is performed. At this time, the semiconductor laser element 4 and the light transmitting member 2 are kept in that position. Thereafter, again, the main reflection image K2 and the ghost image H2
A second measuring step of measuring the interval ΔM (2) between

Then, ΔM (1) in the first measurement step
Is equal to or close to the value of ΔM (2) in the second measurement step, it can be determined that the parallelism between the front surface 20a and the back surface 20c of the light transmitting layer 20 of the light transmitting member 2 is high. . When the value of ΔM (1) in the first measurement step is significantly different from the value of ΔM (2) in the second measurement step, the surface 2 of the light transmitting layer 20 of the light transmitting member 2
It can be determined that the parallelism between 0a and the back surface 20c is low. Therefore, the device of this embodiment can be understood as a parallelism measuring device that measures the parallelism between the front surface 20a and the back surface 20c of the light transmitting layer 20.

(Second Embodiment) FIG. 5 shows a second embodiment. The second embodiment has basically the same configuration as the first embodiment, and basically has the same operation and effect. In this embodiment, the light transmitting member 2B has the light transmitting layer 20 which is a glass plate, but does not have the light reflecting layer. The laser beam B is emitted from the back surface 20c of the light transmitting layer 20 of the light transmitting member 2B.
, And becomes main reflected light K1 having a high light intensity. Further, a part of the laser light B is reflected on the surface 20a of the light transmitting layer 20 of the light transmitting member 2B, and becomes the ghost light H1 having low light intensity.

(Third Embodiment) FIG. 6 shows the basic concept of the third embodiment. The third embodiment has basically the same configuration as the first embodiment, and basically has the same operation and effect. In this example, a plurality of semiconductor laser elements 4 are provided on a first guide 10 provided on the base 1 so as to be located above the holding surface 3a of the holding section 3. That is, a plurality of semiconductor laser elements 4 are arranged side by side along the inclined holding surface 3a.

According to this embodiment, the laser beams BA and B as the inspection light emitted from the plurality of semiconductor laser elements 4 are used.
For B and BC, a spot-shaped main reflection image K2 is reflected on the light receiving member 5 based on the main reflected light K1, and a minute spot-shaped ghost image H2 is formed on the light receiving member 5 based on the ghost light H1.
It is reflected in. Therefore, it is possible to measure a plurality of measurement points in the light transmitting member 2 in a short time.

(Fourth Embodiment) FIG. 7 shows the basic concept of the fourth embodiment. The fourth embodiment has basically the same configuration as the first embodiment, and basically has the same operation and effect. In this example, a plurality of semiconductor laser elements 4 are provided on a fourth guide 14 provided on the base 1 so as to be located above the holding surface 3a. That is, a plurality of semiconductor laser elements 4 are arranged side by side along the length direction of the holding surface 3a.

According to this embodiment, for each of the light beams CA, CB, CC, and CD emitted from the plurality of semiconductor laser elements 4, a spot-like main reflection image is formed on the basis of the main reflection light K1, as described above. K2 is captured, and a ghost image H2 in the form of a minute spot is captured based on the ghost light H1. Therefore, a plurality of measurement points can be measured in a short time in the light transmitting member 2.

(Fifth Embodiment) FIG. 8 shows the basic concept of the fifth embodiment. The fifth embodiment has basically the same configuration as the first embodiment, and basically has the same operation and effect. A light receiving element 53 which is a CCD element as a light receiving member is provided. The laser light B emitted from the semiconductor laser element 4 is reflected by the light reflecting layer 23 of the light transmitting member 2 having a high reflectance, and becomes a main reflected light K1 having a high light intensity. In addition, a part of the laser light B is reflected on the surface 20a of the light transmitting layer 20 of the light transmitting member 2 having a low reflectance, and becomes ghost light H1 having a low light intensity.

Thus, in the light receiving element 53, a spot-shaped main reflection image K2 is picked up based on the main reflection light K1 having a high light intensity, and a minute spot-shaped reflection image is formed based on the ghost light H1 having a low light intensity. The ghost image H2 is captured. Distance ΔM between main reflection image K2 and ghost image H2
Are the main reflection image K2 and the ghost image H2 of the light receiving element 53.
, The interval ΔM is obtained by the detection circuit 55 based on the number of pixels.
6 is displayed.

(Sixth Embodiment) FIG. 9 shows the basic concept of the sixth embodiment. The sixth embodiment has basically the same configuration as the first embodiment, that is, it is the same as the case of FIG. 1 and has the same operation and effect. In this embodiment, the light transmitting member 2C
Is used for a display element such as an electrochromic display element, and the first light transmission layer 21 is a glass plate.
And a second light transmission layer 22 which is another glass plate, and a light reflection layer 23 such as an aluminum vapor-deposited film laminated on the back surface of the second light transmission layer 22. A gap 25, which is a minute gap, is formed between the first light transmitting layer 21 and the second light transmitting layer 22.

The reflectivity of the light reflecting layer 23 is determined by the first light transmitting layer 2.
The reflectance of the first surface 21a or the reflectance of the surface 22a of the second light transmitting layer 22 is considerably higher. Semiconductor laser device 4
Laser light B functioning as inspection light irradiated from the first light transmitting layer 21 is incident on the light transmitting member 2 from the first light transmitting layer 21 side at an incident angle α inclined with respect to the normal S of the light transmitting member 2. As a result, as shown in FIG. 9, the light reflected by the light reflecting layer 23 having a high reflectance in the light transmitting member 2C becomes a main reflected light K1 having a high light intensity. The light reflected on the surface 21a of the first light transmitting layer 21 having a low reflectance in the light transmitting member 2C becomes a ghost light H1 having a low light intensity. As a result, on the light receiving member 5, a spot-shaped main reflected image K2 appears based on the main reflected light K1, and a minute spot-shaped first ghost image H2 appears based on the ghost light H1.

By measuring the interval ΔN1 between the main reflection image K2 and the ghost image H2, the degree of double reflection on the light transmitting member 2C can be quantitatively measured. by the way,
First light transmitting layer 21 and second light transmitting layer 22 of light transmitting member 2C
Is low, the value of ΔN changes when the distance L between the base 1 and the light receiving member 5 changes.
Therefore, when grasping the parallelism between the first light transmitting layer 21 and the second light transmitting layer 22 of the light transmitting member 2C, the distance ΔN (1) between the main reflection image K2 and the ghost image H2 is measured. First
The measurement step is performed, and thereafter, the step of driving the drive source 6 to change the distance L between the base 1 and the light receiving member 5 is performed. Thereafter, the main reflection image K1 and the ghost image H2 are again formed. A second measuring step of measuring the interval ΔN (2) is performed. Then, the value of ΔN (1) in the first measurement process and the second
When the value of ΔN (2) in the measurement step is the same or a close value, it can be determined that the parallelism between the first light transmitting layer 21 and the first light transmitting layer 22 of the light transmitting member 2 is high.

When the value of ΔN (1) in the first measuring step is significantly different from the value of ΔN (2) in the second measuring step, the first light transmitting layer 21 of the light transmitting member 2C and the second light transmitting layer 21 It can be determined that the parallelism with the layer 22 is low. Therefore, the apparatus of this embodiment is also a parallelism measuring apparatus for measuring the parallelism. In addition, measuring the parallelism between the first light transmission layer 21 that is a glass plate and the second light transmission layer 22 that is a glass plate,
Since the uniformity of the thickness of the gap 25 between the first light transmission layer 21 and the second light transmission layer 22 is also measured, the apparatus of this embodiment is also a gap thickness measurement apparatus. In FIG. 9, the transparent conductive film and the coloring layer are omitted in the drawing.

(Seventh Embodiment) FIG. 10 shows the basic concept of the seventh embodiment. The seventh embodiment has basically the same configuration as the first embodiment, and basically has the same operation and effect. As shown in FIG. 10, a movable lens system 8 is provided between the base 1 and the light receiving member 5. Lens system 8
Indicates the magnifying lens 80 and arrows U1 and U
And a movable portion 81 including a cylinder mechanism or a motor mechanism that can be moved in two directions. Therefore, by moving the magnifying lens 80 of the lens system 8 in the direction of the arrow U1 and disposing the magnifying lens 80 in the laser light path of the main reflected light K1 and the ghost light H1, the magnitude of ΔM can be enlarged by the magnifying lens 80, and the measurement is easy. Can be achieved. When the thickness of the light transmission layer 20 is small, ΔM is small, and thus the device of the present example capable of increasing ΔM is advantageous. If not necessary, the magnifying lens 80 of the lens system 8 may be retracted in the direction of the arrow U2.

In addition, the present invention is not limited to the apparatus according to each of the above-described embodiments, but can be appropriately modified as necessary without departing from the scope of the invention. (Supplementary Note) The following technical idea can be understood from the above-described embodiment.

A light-transmitting member having a light-transmitting layer such as a glass plate is used, and inspection light such as laser light is incident on the light-transmitting member at an angle of incidence inclined with respect to the normal of the light-transmitting layer of the light-transmitting member. Operation, and the main reflection image and the sub reflection image based on the reflection of the detection light by the light transmission member are received by the light receiving member, and the light transmission member is multiplexed based on the distance between the main reflection image and the sub reflection image in the light receiving member. And an operation of measuring the degree of reflection.

A holding portion for holding a light transmitting member having a light transmitting layer such as a glass plate, and a laser beam at an incident angle inclined with respect to the normal of the light transmitting layer of the light transmitting member held by the holding portion. The inspection light source that causes inspection light to enter the light transmitting member and the reflection of the detection light by the light transmitting member so that the degree of multiple reflection of the light transmitting member can be determined based on the distance between the main reflection image and the sub reflection image. A parallelism measuring device or a gap thickness measuring device, comprising: a light-receiving member that receives a main reflection image and a sub-reflection image based on an image.

An apparatus according to claim 1, further comprising a distance varying means for varying a distance between the detection light source and the light receiving member.

[0035]

According to the apparatus of the present invention, inspection light such as laser light emitted from an inspection light source is incident at an angle of incidence that is inclined with respect to the normal to the light transmitting member. Then, the light receiving member receives a main reflection image formed by main reflection light having a high light intensity based on the reflection at the light transmission member and a sub-reflection image having a low light intensity based on the reflection at the light transmission member. Then, based on the interval between the main reflection image and the sub reflection image on the light receiving member, the degree of multiple reflection on the light transmitting member can be quantitatively obtained and determined. Therefore, it is advantageous for quality assurance against multiple reflection of the light transmitting member.

[Brief description of the drawings]

FIG. 1 is a configuration diagram of an apparatus according to a first embodiment.

FIG. 2 is a configuration diagram of an apparatus according to a first embodiment viewed from different directions.

FIG. 3 is a configuration diagram illustrating a reflection form of light on a light transmitting member.

FIG. 4 is a configuration diagram illustrating a spot-shaped main reflected image based on main reflected light and a minute spot-shaped ghost image based on ghost light.

FIG. 5 is a configuration diagram illustrating a form of light reflection by a light transmitting member having no light reflecting layer according to a second embodiment.

FIG. 6 is a configuration diagram of an apparatus according to a third embodiment.

FIG. 7 is a configuration diagram of an apparatus according to a fourth embodiment.

FIG. 8 is a configuration diagram of an apparatus according to a fifth embodiment.

FIG. 9 is a configuration diagram illustrating a form of light reflection by a light transmitting member according to a sixth embodiment.

FIG. 10 is a configuration diagram of an apparatus according to a seventh embodiment.

FIG. 11 is a configuration diagram showing a conventional mode.

[Explanation of symbols]

In the figure, 1 is a base, 2 is a light transmitting member, 20 is a light transmitting layer, 2
3 is a light reflection layer, 4 is a semiconductor laser device (inspection light source), 5
Denotes a light receiving member, B denotes a laser beam (inspection light), H1 denotes a ghost image, and K2 denotes a main reflection image.

Claims (1)

[Claims] A holding unit for holding a light transmitting member having a light transmitting layer; and an inspection light having an incident angle inclined with respect to a normal to a light transmitting layer of the light transmitting member held by the holding unit. Inspection light source to be incident on the light transmitting member, so that the degree of multiple reflection of the light transmitting member can be determined based on the distance between the main reflection image and the sub reflection image, the reflection of the detection light on the light transmission member A multiple reflection measuring device, comprising: a light-receiving member that receives a main reflection image and a sub-reflection image based on the reflection image.