JP1755926S - 電気接触子 - Google Patents

電気接触子

Info

Publication number
JP1755926S
JP1755926S JP2023004352F JP2023004352F JP1755926S JP 1755926 S JP1755926 S JP 1755926S JP 2023004352 F JP2023004352 F JP 2023004352F JP 2023004352 F JP2023004352 F JP 2023004352F JP 1755926 S JP1755926 S JP 1755926S
Authority
JP
Japan
Prior art keywords
electrical contacts
article
semiconductor
inspecting
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2023004352F
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2023004352F priority Critical patent/JP1755926S/ja
Application granted granted Critical
Publication of JP1755926S publication Critical patent/JP1755926S/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Abstract

本物品は、半導体チップ等の半導体デバイスの電気特性を試験検査するための電気接触子であり、半導体デバイスの試験検査装置に組み込まれて使用される物品である。
JP2023004352F 2023-03-06 2023-03-06 電気接触子 Active JP1755926S (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2023004352F JP1755926S (ja) 2023-03-06 2023-03-06 電気接触子

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2023004352F JP1755926S (ja) 2023-03-06 2023-03-06 電気接触子

Publications (1)

Publication Number Publication Date
JP1755926S true JP1755926S (ja) 2023-10-23

Family

ID=88418404

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023004352F Active JP1755926S (ja) 2023-03-06 2023-03-06 電気接触子

Country Status (1)

Country Link
JP (1) JP1755926S (ja)

Similar Documents

Publication Publication Date Title
JP5687172B2 (ja) 半導体テスト治具およびそれを用いた耐圧測定方法
WO2015051175A3 (en) Application of electron-beam induced plasma probes to inspection, test, debug and surface modifications
TW200700740A (en) Method for using internal semiconductor junctions to aid in non-contact testing
TW200704931A (en) Probe card and testing device of micro structure
TW200702667A (en) Test probe and manufacturing method for test probe
WO2018162343A3 (en) A probe for testing an electrical property of a test sample
JP2018049989A (ja) 基板検査装置
TWD198372S (zh) 電氣特性測定用探針之部分
JP1755925S (ja) 電気接触子
JP1755926S (ja) 電気接触子
MA31786B1 (fr) Station d'essai permettant de tester un courant de fuite à travers le boîtier isolant de composants électroniques de puissance, et procédé correspondant
JP2017526920A (ja) 検査装置用コンタクトプローブ
TW200709316A (en) Substrate and testing method thereof
JP2016139646A5 (ja)
JP5546528B2 (ja) 半導体モジュールの絶縁欠陥検査装置および検査方法
KR20150019283A (ko) 신호특성이 강화된 프로브핀
CN206420918U (zh) 一种双级压缩测试针
JP1742840S (ja) 電気接触子
JP1743464S (ja) 電気接触子
JP1742820S (ja) 電気接触子
JP1742821S (ja) 電気接触子
SG10201901455XA (en) Contactor socket and ic test apparatus
JP1742819S (ja) 電気接触子
JP1743473S (ja) 電気接触子
FR3079032B1 (fr) Boîtier électrique et procédé pour tester l’étanchéité du boîtier électrique