JP1735290S - spring pin - Google Patents

spring pin

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Publication number
JP1735290S
JP1735290S JP2022016440F JP2022016440F JP1735290S JP 1735290 S JP1735290 S JP 1735290S JP 2022016440 F JP2022016440 F JP 2022016440F JP 2022016440 F JP2022016440 F JP 2022016440F JP 1735290 S JP1735290 S JP 1735290S
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Japan
Prior art keywords
spring pin
article
showing
state
reference figs
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Active
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JP2022016440F
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Japanese (ja)
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Abstract

本物品は、半導体デバイス(IC・電子部品)や基板などの性能検査に用いられるスプリングピンである。本物品は、使用状態を示す参考図2及び3に示すように、ハウジングに収容して使用することができる。また、使用状態を示す参考図5及び6に示すように、検査の際には、本物品の先端部を検査対象物に押し当てて使用される。This product is a spring pin used for performance inspection of semiconductor devices (IC/electronic parts) and substrates. The article can be used by being accommodated in a housing, as shown in reference FIGS. 2 and 3 showing the state of use. In addition, as shown in reference FIGS. 5 and 6 showing the state of use, the tip of the article is pressed against an object to be inspected during inspection.

JP2022016440F 2022-02-01 2022-08-01 spring pin Active JP1735290S (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US29/791,709 USD1015282S1 (en) 2022-02-01 2022-02-01 Spring pin tip

Publications (1)

Publication Number Publication Date
JP1735290S true JP1735290S (en) 2023-01-24

Family

ID=84978364

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2022025056F Active JP1745251S (en) 2022-02-01 2022-08-01 spring pin
JP2022016440F Active JP1735290S (en) 2022-02-01 2022-08-01 spring pin

Family Applications Before (1)

Application Number Title Priority Date Filing Date
JP2022025056F Active JP1745251S (en) 2022-02-01 2022-08-01 spring pin

Country Status (3)

Country Link
US (1) USD1015282S1 (en)
JP (2) JP1745251S (en)
TW (1) TWD226888S (en)

Family Cites Families (41)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6084421A (en) 1997-04-15 2000-07-04 Delaware Capital Formation, Inc. Test socket
US6507207B2 (en) * 2001-02-20 2003-01-14 Vinh T. Nguyen Contact probe pin for wafer probing apparatus
US7074049B2 (en) 2004-03-22 2006-07-11 Johnstech International Corporation Kelvin contact module for a microcircuit test system
US7298153B2 (en) 2005-05-25 2007-11-20 Interconnect Devices, Inc. Eccentric offset Kelvin probe
EP1889080A2 (en) 2005-06-10 2008-02-20 Delaware Capital Formation, Inc. Electrical contact probe with compliant internal interconnect
US20070018666A1 (en) * 2005-07-22 2007-01-25 Nasser Barabi Spring contact pin for an IC chip tester
US7116121B1 (en) * 2005-10-27 2006-10-03 Agilent Technologies, Inc. Probe assembly with controlled impedance spring pin or resistor tip spring pin contacts
WO2008083404A1 (en) 2007-01-02 2008-07-10 Johnstech International Corporation Microcircuit testing interface having kelvin and signal contacts within a single slot
USD580360S1 (en) * 2007-02-21 2008-11-11 Vitito Christopher J Keyed electrical connector
USD580866S1 (en) * 2007-02-21 2008-11-18 Vitito Christopher J Keyed electrical connector
USD596137S1 (en) * 2008-06-30 2009-07-14 Tyco Electronics Amp K.K. Electrical contact
USD605596S1 (en) * 2008-06-30 2009-12-08 Tyco Electronics Amp K.K. Electrical contact
US9046568B2 (en) * 2009-03-27 2015-06-02 Essai, Inc. Universal spring contact pin and IC test socket therefor
US8988090B2 (en) 2009-04-21 2015-03-24 Johnstech International Corporation Electrically conductive kelvin contacts for microcircuit tester
US10078101B2 (en) 2009-04-21 2018-09-18 Johnstech International Corporation Wafer level integrated circuit probe array and method of construction
US9329204B2 (en) 2009-04-21 2016-05-03 Johnstech International Corporation Electrically conductive Kelvin contacts for microcircuit tester
CN102483435B (en) 2009-04-21 2016-06-08 约翰国际有限公司 For conduction Kelvin's contact of microcircuit tester
WO2011036800A1 (en) 2009-09-28 2011-03-31 株式会社日本マイクロニクス Contactor and electrical connection device
USD665359S1 (en) * 2010-03-24 2012-08-14 Adamant Kogyo Co., Ltd. Ferrule for optical fiber connector
USD665745S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
USD665744S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
USD664927S1 (en) * 2011-01-28 2012-08-07 Adamant Kogyo Co., Ltd. Ferrule assembly
USD664928S1 (en) * 2011-01-28 2012-08-07 Adamant Kogyo Co., Ltd. Ferrule assembly
US9606143B1 (en) 2011-04-21 2017-03-28 Johnstech International Corporation Electrically conductive pins for load boards lacking Kelvin capability for microcircuit testing
US8957691B2 (en) 2011-10-21 2015-02-17 Taiwan Semiconductor Manufacturing Company, Ltd. Probe cards for probing integrated circuits
TWD151640S (en) * 2011-10-31 2013-02-01 日本麥克隆尼股份有限公司 Electric contact
CN103958567B (en) 2011-11-25 2016-10-12 巴斯夫欧洲公司 Alkoxylate polyalkylene polyamine
WO2013154738A1 (en) * 2012-04-13 2013-10-17 Delaware Capital Formation, Inc. Test probe assembly and related methods
WO2013157033A1 (en) 2012-04-17 2013-10-24 ユニテクノ株式会社 Kelvin contact probe and a kelvin inspection fixture provided with same
JP1529607S (en) * 2014-12-15 2015-07-27
JP1529612S (en) * 2014-12-19 2015-07-27
WO2016146499A1 (en) 2015-03-13 2016-09-22 Technoprobe S.P.A. Testing head with vertical probes having an improved sliding movement within respective guide holes and correct holding of the probes within the testing head under different operative conditions
US10197599B2 (en) 2015-12-16 2019-02-05 Infineon Technologies Ag Test pin configuration for test device for testing devices under test
USD847091S1 (en) * 2016-11-11 2019-04-30 Afl Ig Llc Housing for cable transition assembly
USD829296S1 (en) 2017-01-12 2018-09-25 Wes Cross Spring pin
US10473713B2 (en) 2017-10-26 2019-11-12 Xilinx, Inc. Interposer block with retractable spring pin top cover plate
JP1612015S (en) * 2018-01-24 2018-08-27
US20200119481A1 (en) * 2018-10-12 2020-04-16 David A. Struyk Inductance canceling spring pin contact
KR102228318B1 (en) * 2019-12-26 2021-03-16 주식회사 오킨스전자 Probe pin having outer spring
JP1678192S (en) * 2020-07-15 2021-02-01
US20230258688A1 (en) * 2022-02-07 2023-08-17 Johnstech International Corporation Spring probe assembly for a kelvin testing system

Also Published As

Publication number Publication date
USD1015282S1 (en) 2024-02-20
JP1745251S (en) 2023-06-01
TWD226888S (en) 2023-08-11

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