JP1584053S - - Google Patents

Info

Publication number
JP1584053S
JP1584053S JPD2016-27755F JP2016027755F JP1584053S JP 1584053 S JP1584053 S JP 1584053S JP 2016027755 F JP2016027755 F JP 2016027755F JP 1584053 S JP1584053 S JP 1584053S
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JPD2016-27755F
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JPD2016-27755F priority Critical patent/JP1584053S/ja
Priority to US29/595,132 priority patent/USD834968S1/en
Application granted granted Critical
Publication of JP1584053S publication Critical patent/JP1584053S/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JPD2016-27755F 2016-12-21 2016-12-21 Active JP1584053S (enExample)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JPD2016-27755F JP1584053S (enExample) 2016-12-21 2016-12-21
US29/595,132 USD834968S1 (en) 2016-12-21 2017-02-24 Light wave distance measuring theodolite

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JPD2016-27755F JP1584053S (enExample) 2016-12-21 2016-12-21

Publications (1)

Publication Number Publication Date
JP1584053S true JP1584053S (enExample) 2017-08-21

Family

ID=59593651

Family Applications (1)

Application Number Title Priority Date Filing Date
JPD2016-27755F Active JP1584053S (enExample) 2016-12-21 2016-12-21

Country Status (2)

Country Link
US (1) USD834968S1 (enExample)
JP (1) JP1584053S (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD859185S1 (en) * 2018-01-22 2019-09-10 Topcon Corporation Surveying instrument
USD968240S1 (en) * 2018-06-29 2022-11-01 Mitsubishi Electric Corporation Mobile mapping device for vehicle
JP1691841S (enExample) * 2020-01-17 2021-08-02
USD1057170S1 (en) * 2022-02-17 2025-01-07 Topcon Corporation Eye testing apparatus and equipment
USD1064282S1 (en) * 2022-02-17 2025-02-25 Topcon Corporation Eye testing apparatus and equipment
USD1069123S1 (en) * 2022-02-17 2025-04-01 Topcon Corporation Eye testing apparatus and equipment
USD1088236S1 (en) * 2022-02-17 2025-08-12 Topcon Corporation Eye testing apparatus and equipment
USD1079950S1 (en) * 2023-01-19 2025-06-17 Topcon Corporation Eye testing apparatus
USD1087797S1 (en) * 2023-09-22 2025-08-12 Topcon Corporation Surveying instrument

Family Cites Families (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD375464S (en) * 1994-10-21 1996-11-12 Sokkia Co., Ltd. Electronic theodolite for distance measuring
USD367233S (en) * 1994-10-21 1996-02-20 Sokkia Co., Ltd. Electronic theodolite for distance measuring
USD389418S (en) * 1996-07-10 1998-01-20 Asahi Seimitsu Kabushiki Kaisha Electronic measurement device
USD409507S (en) * 1998-06-11 1999-05-11 Kabushiki Kaisha Topcon Electro-optical distance-measuring instrument
USD427087S (en) * 1999-03-19 2000-06-27 Asahi Seimitsu Kabushiki Kaisha Measurement surveying device
USD450254S1 (en) * 1999-12-06 2001-11-13 Kabushiki Kaisha Topcon Eyepiece section of an optical distance measuring instrument
USD447066S1 (en) * 2000-05-10 2001-08-28 Asahi Seimitsu Kabushiki Kaisha Measurement surveying device
USD494074S1 (en) * 2003-09-12 2004-08-10 Kabushiki Kaisha Topcon Optical measuring theodolite
JP2005249715A (ja) * 2004-03-08 2005-09-15 Topcon Corp 測量方法及び測量機
USD526588S1 (en) * 2004-09-10 2006-08-15 Trimble Ab Surveying device
USD526223S1 (en) * 2004-10-19 2006-08-08 Kabushiki Kaisha Topcon Laser measuring instrument
USD532325S1 (en) * 2005-02-09 2006-11-21 Sokkia Co., Ltd. Portion of electronic theodolite
USD531921S1 (en) * 2005-02-17 2006-11-14 Sokkia Co., Ltd. Portion of electronic theodolite
US20070064217A1 (en) * 2005-09-19 2007-03-22 Nen-Tsua Li Theodolite with a laser indicator
USD558075S1 (en) * 2006-04-21 2007-12-25 Kabushiki Kaisha Topcon Laser transit
USD576062S1 (en) * 2006-06-29 2008-09-02 Pentax Corporation Total station
JP2008014658A (ja) * 2006-07-03 2008-01-24 Pentax Industrial Instruments Co Ltd 測量機
USD605959S1 (en) * 2008-07-23 2009-12-15 Leica Geosystems Ag Land surveying total station measuring device
USD629314S1 (en) * 2009-04-23 2010-12-21 Nikon-Trimble Co., Ltd. Electronic tacheometer
USD635475S1 (en) * 2009-09-11 2011-04-05 Trimble Jena Gmbh Theodolite geodetic apparatus
USD684069S1 (en) * 2011-09-22 2013-06-11 Kabushiki Kaisha Topcon Light wave distance measuring theodolite
USD684068S1 (en) * 2011-09-22 2013-06-11 Kabushiki Kaisha Topcon Light wave distance measuring theodolite
USD723398S1 (en) * 2013-08-06 2015-03-03 Kabushiki Kaisha Topcon Light wave distance measuring theodolite
US11236997B2 (en) * 2014-10-24 2022-02-01 Nikon-Trimble Co., Ltd Surveying instrument and program
JP1540998S (enExample) * 2015-03-20 2015-12-28
JP1541083S (enExample) * 2015-04-03 2015-12-28
JP1541004S (enExample) * 2015-04-03 2015-12-28
JP1542103S (enExample) * 2015-04-24 2019-01-15
JP1542104S (enExample) * 2015-04-24 2019-01-15
JP1541025S (enExample) * 2015-06-10 2018-12-10
JP1541476S (enExample) * 2015-06-16 2018-12-25
JP1542482S (enExample) * 2015-06-23 2016-01-25
USD795720S1 (en) * 2016-01-18 2017-08-29 Topcon Corporation Surveying instrument
JP1553312S (enExample) * 2016-01-27 2016-07-04

Also Published As

Publication number Publication date
USD834968S1 (en) 2018-12-04

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