USD447066S1 - Measurement surveying device - Google Patents

Measurement surveying device Download PDF

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Publication number
USD447066S1
USD447066S1 US29/131,305 US13130500F USD447066S US D447066 S1 USD447066 S1 US D447066S1 US 13130500 F US13130500 F US 13130500F US D447066 S USD447066 S US D447066S
Authority
US
United States
Prior art keywords
measurement surveying
surveying
measurement
elevational
ornamental
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/131,305
Inventor
Homu Takayama
Kenji Kaneko
Masayuki Ueno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pentax Corp
Pentax Precision Co Ltd
Original Assignee
Asahi Seimitsu KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP12-012257 priority Critical
Priority to JP2000012257 priority
Application filed by Asahi Seimitsu KK filed Critical Asahi Seimitsu KK
Assigned to ASAHI SEIMITSU KABUSHIKI KAISHA reassignment ASAHI SEIMITSU KABUSHIKI KAISHA ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: KANEKO, KENJI, TAKAYAMA, HOMU, UENO, MASAYUKI
Application granted granted Critical
Publication of USD447066S1 publication Critical patent/USD447066S1/en
Assigned to PENTAX CORPORATION reassignment PENTAX CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: PENTAX PRECISION CO., LTD. (FORMERLY KNOWN AS ASAHI SEIMITSU KABUSHIKI KAISHA)
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a front elevational view of the measurement surveying device;
FIG. 2 is a rear elevational view thereof;
FIG. 3 is a right side elevational view thereof;
FIG. 4 is a left side elevational view thereof;
FIG. 5 is a top plan view thereof;
FIG. 6 is a bottom plan view thereof;
FIG. 7 is a partially-enlarged view of the rear elevational view;
FIG. 8 is a partially-enlarged view of the right side elevational view;
FIG. 9 is a partially-enlarged view of the left side elevational view;
FIG. 10 is a partially-enlarged view of the top plan view;
FIG. 11 is a perspective view of the measurement surveying device; and,
FIG. 12 is another perspective view of the measurement surveying device.

Claims (1)

  1. The ornamental design for a measurement surveying device, as shown and described.
US29/131,305 2000-05-10 2000-10-19 Measurement surveying device Expired - Lifetime USD447066S1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP12-012257 2000-05-10
JP2000012257 2000-05-10

Publications (1)

Publication Number Publication Date
USD447066S1 true USD447066S1 (en) 2001-08-28

Family

ID=18540001

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/131,305 Expired - Lifetime USD447066S1 (en) 2000-05-10 2000-10-19 Measurement surveying device

Country Status (1)

Country Link
US (1) USD447066S1 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD795720S1 (en) * 2016-01-18 2017-08-29 Topcon Corporation Surveying instrument
USD795721S1 (en) * 2016-01-27 2017-08-29 Topcon Corporation Surveying instrument
USD834968S1 (en) * 2016-12-21 2018-12-04 Topcon Corporation Light wave distance measuring theodolite
USD834969S1 (en) * 2016-12-21 2018-12-04 Topcon Corporation Light wave distance measuring theodolite

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD795720S1 (en) * 2016-01-18 2017-08-29 Topcon Corporation Surveying instrument
USD795721S1 (en) * 2016-01-27 2017-08-29 Topcon Corporation Surveying instrument
USD834968S1 (en) * 2016-12-21 2018-12-04 Topcon Corporation Light wave distance measuring theodolite
USD834969S1 (en) * 2016-12-21 2018-12-04 Topcon Corporation Light wave distance measuring theodolite

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