JP1578944S - - Google Patents
Info
- Publication number
- JP1578944S JP1578944S JPD2016-20567F JP2016020567F JP1578944S JP 1578944 S JP1578944 S JP 1578944S JP 2016020567 F JP2016020567 F JP 2016020567F JP 1578944 S JP1578944 S JP 1578944S
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPD2016-20567F JP1578944S (US07223432-20070529-C00017.png) | 2016-09-26 | 2016-09-26 | |
| US29/593,538 USD827459S1 (en) | 2016-09-26 | 2017-02-09 | Probe for remote coordinate measuring machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPD2016-20567F JP1578944S (US07223432-20070529-C00017.png) | 2016-09-26 | 2016-09-26 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JP1578944S true JP1578944S (US07223432-20070529-C00017.png) | 2017-06-12 |
Family
ID=59011610
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JPD2016-20567F Active JP1578944S (US07223432-20070529-C00017.png) | 2016-09-26 | 2016-09-26 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | USD827459S1 (US07223432-20070529-C00017.png) |
| JP (1) | JP1578944S (US07223432-20070529-C00017.png) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6631984B1 (ja) * | 2019-06-25 | 2020-01-15 | 株式会社浅沼技研 | 検査マスタ |
| JP1716912S (ja) | 2021-11-15 | 2022-06-08 | 電気的特性測定用プローブ |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4523450A (en) * | 1981-11-07 | 1985-06-18 | Carl-Zeiss-Stiftung, Heidenheim/Brenz | Method of calibrating probe pins on multicoordinate measurement machines |
| DE3417991A1 (de) * | 1984-05-15 | 1985-11-21 | Mauser-Werke Oberndorf Gmbh, 7238 Oberndorf | Tastkopf einer messmaschine |
| USD327854S (en) * | 1989-04-22 | 1992-07-14 | Renishaw Plc | Coordinate positioning probe head |
| DE4243284C2 (de) * | 1992-12-21 | 1996-09-12 | Zeiss Carl Jena Gmbh | Tastelement für Koordinatenmeßsysteme |
| US5446971A (en) * | 1993-01-14 | 1995-09-05 | Leitz Messtechnik Gmbh | Method for the dimensional measurement of workpieces |
| GB2336433B (en) * | 1998-04-14 | 2002-02-06 | Mitutoyo Corp | Touch signal probe |
| JP3352055B2 (ja) * | 1999-06-16 | 2002-12-03 | 株式会社ミツトヨ | タッチ信号プローブの着座機構 |
| US8122610B2 (en) * | 2008-03-28 | 2012-02-28 | Hexagon Metrology, Inc. | Systems and methods for improved coordination acquisition member comprising calibration information |
| USD666513S1 (en) * | 2010-10-21 | 2012-09-04 | Mitutoyo Corporation | Remote probe for a coordinate measuring machine |
| USD731904S1 (en) * | 2014-03-19 | 2015-06-16 | Hexagon Metrology Vision GmbH | Coordinate measuring machine |
| JP6321441B2 (ja) * | 2014-05-07 | 2018-05-09 | 株式会社ミツトヨ | 三次元測定システム、三次元測定方法、および、被測定体 |
| US9759540B2 (en) * | 2014-06-11 | 2017-09-12 | Hexagon Metrology, Inc. | Articulating CMM probe |
| JP6049786B2 (ja) * | 2015-03-05 | 2016-12-21 | 株式会社ミツトヨ | 測定プローブ |
| JP6049785B2 (ja) * | 2015-03-05 | 2016-12-21 | 株式会社ミツトヨ | 測定プローブ |
| JP6039718B2 (ja) * | 2015-03-05 | 2016-12-07 | 株式会社ミツトヨ | 測定プローブ |
-
2016
- 2016-09-26 JP JPD2016-20567F patent/JP1578944S/ja active Active
-
2017
- 2017-02-09 US US29/593,538 patent/USD827459S1/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| USD827459S1 (en) | 2018-09-04 |
