JP1541083S - - Google Patents

Info

Publication number
JP1541083S
JP1541083S JPD2015-7626F JP2015007626F JP1541083S JP 1541083 S JP1541083 S JP 1541083S JP 2015007626 F JP2015007626 F JP 2015007626F JP 1541083 S JP1541083 S JP 1541083S
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JPD2015-7626F
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JPD2015-7626F priority Critical patent/JP1541083S/ja
Priority to US29/529,898 priority patent/USD766754S1/en
Application granted granted Critical
Publication of JP1541083S publication Critical patent/JP1541083S/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JPD2015-7626F 2015-04-03 2015-04-03 Active JP1541083S (es)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JPD2015-7626F JP1541083S (es) 2015-04-03 2015-04-03
US29/529,898 USD766754S1 (en) 2015-04-03 2015-06-11 Optical measuring theodolite using light wave

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JPD2015-7626F JP1541083S (es) 2015-04-03 2015-04-03

Publications (1)

Publication Number Publication Date
JP1541083S true JP1541083S (es) 2015-12-28

Family

ID=55131878

Family Applications (1)

Application Number Title Priority Date Filing Date
JPD2015-7626F Active JP1541083S (es) 2015-04-03 2015-04-03

Country Status (2)

Country Link
US (1) USD766754S1 (es)
JP (1) JP1541083S (es)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD834969S1 (en) * 2016-12-21 2018-12-04 Topcon Corporation Light wave distance measuring theodolite
USD834968S1 (en) * 2016-12-21 2018-12-04 Topcon Corporation Light wave distance measuring theodolite

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016115438A1 (en) 2015-01-16 2016-07-21 Industrial Scientific Corporation Modular gas monitoring system
CA171344S (en) * 2016-01-15 2017-02-27 Ind Scient Corp Monitoring device
USD980734S1 (en) 2016-01-15 2023-03-14 Industrial Scientific Corporation Gas monitoring device
USD843860S1 (en) * 2016-11-09 2019-03-26 Leica Geosystems Ag Surveying instrument
USD845794S1 (en) * 2016-11-09 2019-04-16 Leica Geosystems Ag Surveying instrument
USD844468S1 (en) * 2016-11-09 2019-04-02 Leica Geosystems Ag Case for surveying instrument

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6354010B1 (en) * 1998-04-23 2002-03-12 Asahi Kogaku Kogyo Kabushiki Kaisha Surveying instrument
USD409507S (en) * 1998-06-11 1999-05-11 Kabushiki Kaisha Topcon Electro-optical distance-measuring instrument
JP3930227B2 (ja) * 2000-06-14 2007-06-13 ペンタックス株式会社 磁気式エンコーダおよび磁気式エンコーダを搭載した測量機
USD494074S1 (en) * 2003-09-12 2004-08-10 Kabushiki Kaisha Topcon Optical measuring theodolite
JP2005249715A (ja) * 2004-03-08 2005-09-15 Topcon Corp 測量方法及び測量機
JP4424665B2 (ja) * 2004-07-30 2010-03-03 株式会社 ソキア・トプコン 測量機
USD526588S1 (en) * 2004-09-10 2006-08-15 Trimble Ab Surveying device
USD526223S1 (en) * 2004-10-19 2006-08-08 Kabushiki Kaisha Topcon Laser measuring instrument
USD531921S1 (en) * 2005-02-17 2006-11-14 Sokkia Co., Ltd. Portion of electronic theodolite
USD558075S1 (en) * 2006-04-21 2007-12-25 Kabushiki Kaisha Topcon Laser transit
USD576062S1 (en) * 2006-06-29 2008-09-02 Pentax Corporation Total station
USD605959S1 (en) * 2008-07-23 2009-12-15 Leica Geosystems Ag Land surveying total station measuring device
US8264672B1 (en) * 2009-06-12 2012-09-11 Sprint Communications Company L.P. Visually determining Fresnel zone boundaries in a device
USD684069S1 (en) * 2011-09-22 2013-06-11 Kabushiki Kaisha Topcon Light wave distance measuring theodolite
USD684068S1 (en) * 2011-09-22 2013-06-11 Kabushiki Kaisha Topcon Light wave distance measuring theodolite
USD723953S1 (en) * 2013-10-07 2015-03-10 Kabushiki Kaisha Topcon Measuring device for measuring in three-dimension

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD834969S1 (en) * 2016-12-21 2018-12-04 Topcon Corporation Light wave distance measuring theodolite
USD834968S1 (en) * 2016-12-21 2018-12-04 Topcon Corporation Light wave distance measuring theodolite

Also Published As

Publication number Publication date
USD766754S1 (en) 2016-09-20

Similar Documents

Publication Publication Date Title
JP1541083S (es)
BE2015C047I2 (es)
BE2015C044I2 (es)
BR0003928B1 (es)
BR0009994B1 (es)
BR0007468B1 (es)
BR0006866B1 (es)
BR0010150B1 (es)
BR0006634B1 (es)
BR0005085B1 (es)
BR0005041B1 (es)
BR0004687B1 (es)
BR0000763F1 (es)
BR0003751B1 (es)
BR0003746B1 (es)
BR0003686B1 (es)
BR0003401B1 (es)
BR0003208B1 (es)
CN303074417S (es)
BR0003189B1 (es)
BR0003166B1 (es)
BR0002874B1 (es)
BR0002802B1 (es)
BR0002694B1 (es)
BR0002435B1 (es)