JP1529609S - - Google Patents
Info
- Publication number
- JP1529609S JP1529609S JPD2014-27895F JP2014027895F JP1529609S JP 1529609 S JP1529609 S JP 1529609S JP 2014027895 F JP2014027895 F JP 2014027895F JP 1529609 S JP1529609 S JP 1529609S
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPD2014-27895F JP1529609S (en) | 2014-12-15 | 2014-12-15 | |
| TW104303169F TWD177829S (en) | 2014-12-15 | 2015-06-11 | A part of probe pin for ic socket |
| US29/530,266 USD769752S1 (en) | 2014-12-15 | 2015-06-15 | Probe pin |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPD2014-27895F JP1529609S (en) | 2014-12-15 | 2014-12-15 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JP1529609S true JP1529609S (en) | 2015-07-27 |
Family
ID=53764636
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JPD2014-27895F Active JP1529609S (en) | 2014-12-15 | 2014-12-15 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | USD769752S1 (en) |
| JP (1) | JP1529609S (en) |
| TW (1) | TWD177829S (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD942290S1 (en) * | 2019-07-12 | 2022-02-01 | Johnstech International Corporation | Tip for integrated circuit test pin |
| USD983681S1 (en) * | 2020-12-03 | 2023-04-18 | Mpi Corporation | Probe for testing device under test |
| TWD226028S (en) * | 2022-04-29 | 2023-06-21 | 南韓商普因特工程有限公司 | Semiconductor probe pin |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD507197S1 (en) * | 2004-11-22 | 2005-07-12 | Fu-Cheng Sun | Measure tape |
| WO2011036800A1 (en) * | 2009-09-28 | 2011-03-31 | 株式会社日本マイクロニクス | Contactor and electrical connection device |
| KR101058146B1 (en) * | 2009-11-11 | 2011-08-24 | 하이콘 주식회사 | Spring contacts and sockets with spring contacts |
| USD662895S1 (en) * | 2010-01-27 | 2012-07-03 | Kabushiki Kaisha Nihon Micronics | Electric contact |
| TWM390564U (en) * | 2010-03-18 | 2010-10-11 | Hon Hai Prec Ind Co Ltd | Electrical contact |
| JP4998838B2 (en) * | 2010-04-09 | 2012-08-15 | 山一電機株式会社 | Probe pin and IC socket having the same |
| JP5352525B2 (en) | 2010-04-28 | 2013-11-27 | 日本航空電子工業株式会社 | Probe pin contact, probe pin, and connection jig for electronic devices |
| USD665745S1 (en) * | 2010-09-28 | 2012-08-21 | Adamant Kogyo Co., Ltd. | Optical fiber connector |
| USD665744S1 (en) * | 2010-09-28 | 2012-08-21 | Adamant Kogyo Co., Ltd. | Optical fiber connector |
| JP5708430B2 (en) * | 2011-10-14 | 2015-04-30 | オムロン株式会社 | Contact |
| JP5699899B2 (en) * | 2011-10-14 | 2015-04-15 | オムロン株式会社 | Contact |
| USD749968S1 (en) * | 2014-01-24 | 2016-02-23 | Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. | Electrical test lead |
| USD750987S1 (en) * | 2014-01-24 | 2016-03-08 | Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. | Interactive test probe for battery tester |
-
2014
- 2014-12-15 JP JPD2014-27895F patent/JP1529609S/ja active Active
-
2015
- 2015-06-11 TW TW104303169F patent/TWD177829S/en unknown
- 2015-06-15 US US29/530,266 patent/USD769752S1/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| TWD177829S (en) | 2016-08-21 |
| USD769752S1 (en) | 2016-10-25 |