ITUB20152113A1 - Device and procedure for detecting defects in pipe welds - Google Patents

Device and procedure for detecting defects in pipe welds

Info

Publication number
ITUB20152113A1
ITUB20152113A1 ITUB2015A002113A ITUB20152113A ITUB20152113A1 IT UB20152113 A1 ITUB20152113 A1 IT UB20152113A1 IT UB2015A002113 A ITUB2015A002113 A IT UB2015A002113A IT UB20152113 A ITUB20152113 A IT UB20152113A IT UB20152113 A1 ITUB20152113 A1 IT UB20152113A1
Authority
IT
Italy
Prior art keywords
procedure
detecting defects
pipe welds
welds
pipe
Prior art date
Application number
ITUB2015A002113A
Other languages
Italian (it)
Inventor
Nuzzo Daniele Di
Original Assignee
A B Esse S R L
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by A B Esse S R L filed Critical A B Esse S R L
Priority to ITUB2015A002113A priority Critical patent/ITUB20152113A1/en
Publication of ITUB20152113A1 publication Critical patent/ITUB20152113A1/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901Optical details; Scanning details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952Inspecting the exterior surface of cylindrical bodies or wires
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/50Using chromatic effects to achieve wavelength-dependent depth resolution

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
ITUB2015A002113A 2015-07-13 2015-07-13 Device and procedure for detecting defects in pipe welds ITUB20152113A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
ITUB2015A002113A ITUB20152113A1 (en) 2015-07-13 2015-07-13 Device and procedure for detecting defects in pipe welds

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ITUB2015A002113A ITUB20152113A1 (en) 2015-07-13 2015-07-13 Device and procedure for detecting defects in pipe welds

Publications (1)

Publication Number Publication Date
ITUB20152113A1 true ITUB20152113A1 (en) 2017-01-13

Family

ID=54347666

Family Applications (1)

Application Number Title Priority Date Filing Date
ITUB2015A002113A ITUB20152113A1 (en) 2015-07-13 2015-07-13 Device and procedure for detecting defects in pipe welds

Country Status (1)

Country Link
IT (1) ITUB20152113A1 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1398597A1 (en) * 2002-09-12 2004-03-17 Siemens Aktiengesellschaft Confocal distance sensor
DE102004053659B3 (en) * 2004-11-03 2006-04-13 My Optical Systems Gmbh Non-contact measurement of the temperature profile of a surface, along a line, uses a rotating and transparent polygon scanner to pass emitted and/or reflected light from the surface to a focusing lens
DE102005042733B3 (en) * 2005-09-05 2007-01-25 Universität Stuttgart Interferometric method e.g. for recording of separation and form and optical coherence tomography (OCT), involves having multi-wavelength source or tunable source and imaging on receiver by focusing systems

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1398597A1 (en) * 2002-09-12 2004-03-17 Siemens Aktiengesellschaft Confocal distance sensor
DE102004053659B3 (en) * 2004-11-03 2006-04-13 My Optical Systems Gmbh Non-contact measurement of the temperature profile of a surface, along a line, uses a rotating and transparent polygon scanner to pass emitted and/or reflected light from the surface to a focusing lens
DE102005042733B3 (en) * 2005-09-05 2007-01-25 Universität Stuttgart Interferometric method e.g. for recording of separation and form and optical coherence tomography (OCT), involves having multi-wavelength source or tunable source and imaging on receiver by focusing systems

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
KORNER K ET AL: "NEW APPROACHES IN DEPTH-SCANNING OPTICAL METROLOGY", OPTOMECHATRONIC MICRO/NANO DEVICES AND COMPONENTS III : 8 - 10 OCTOBER 2007, LAUSANNE, SWITZERLAND; [PROCEEDINGS OF SPIE , ISSN 0277-786X], SPIE, BELLINGHAM, WASH, vol. 5457, no. 1, 1 April 2004 (2004-04-01), pages 320 - 333, XP009084995, ISBN: 978-1-62841-730-2, DOI: 10.1117/12.554754 *

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