ITTO20050490A1 - METHOD FOR THE TESTING OF ANALOGUE-DIGITAL CONVERTERS - Google Patents

METHOD FOR THE TESTING OF ANALOGUE-DIGITAL CONVERTERS

Info

Publication number
ITTO20050490A1
ITTO20050490A1 ITTO20050490A ITTO20050490A1 IT TO20050490 A1 ITTO20050490 A1 IT TO20050490A1 IT TO20050490 A ITTO20050490 A IT TO20050490A IT TO20050490 A1 ITTO20050490 A1 IT TO20050490A1
Authority
IT
Italy
Prior art keywords
analogue
testing
digital converters
converters
digital
Prior art date
Application number
Other languages
Italian (it)
Inventor
Venuto Daniela De
Leonardo Reyneri
Original Assignee
Torino Politecnico
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Torino Politecnico filed Critical Torino Politecnico
Priority to ITTO20050490 priority Critical patent/ITTO20050490A1/en
Priority to PCT/EP2006/064092 priority patent/WO2007009912A1/en
Publication of ITTO20050490A1 publication Critical patent/ITTO20050490A1/en

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing
    • H03M1/1085—Measuring or testing using domain transforms, e.g. Fast Fourier Transform
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M3/00—Conversion of analogue values to or from differential modulation
    • H03M3/30—Delta-sigma modulation
    • H03M3/378—Testing
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/50—Analogue/digital converters with intermediate conversion to time interval
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M3/00—Conversion of analogue values to or from differential modulation
    • H03M3/30—Delta-sigma modulation
    • H03M3/458—Analogue/digital converters using delta-sigma modulation as an intermediate step

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Nonlinear Science (AREA)
  • Tests Of Electronic Circuits (AREA)
ITTO20050490 2005-07-15 2005-07-15 METHOD FOR THE TESTING OF ANALOGUE-DIGITAL CONVERTERS ITTO20050490A1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
ITTO20050490 ITTO20050490A1 (en) 2005-07-15 2005-07-15 METHOD FOR THE TESTING OF ANALOGUE-DIGITAL CONVERTERS
PCT/EP2006/064092 WO2007009912A1 (en) 2005-07-15 2006-07-11 Method for testing analog-to-digital converters

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ITTO20050490 ITTO20050490A1 (en) 2005-07-15 2005-07-15 METHOD FOR THE TESTING OF ANALOGUE-DIGITAL CONVERTERS

Publications (1)

Publication Number Publication Date
ITTO20050490A1 true ITTO20050490A1 (en) 2007-01-16

Family

ID=37488083

Family Applications (1)

Application Number Title Priority Date Filing Date
ITTO20050490 ITTO20050490A1 (en) 2005-07-15 2005-07-15 METHOD FOR THE TESTING OF ANALOGUE-DIGITAL CONVERTERS

Country Status (2)

Country Link
IT (1) ITTO20050490A1 (en)
WO (1) WO2007009912A1 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2323889A4 (en) 2008-09-05 2013-09-25 Thorley Ind Llc Collapsible stroller
US8106801B2 (en) 2009-02-12 2012-01-31 Qualcomm, Incorporated Methods and apparatus for built in self test of analog-to-digital convertors
CN101944152B (en) * 2010-09-29 2012-07-04 中国电子科技集团公司第十四研究所 Simulation method of switch control chip
CN110688821B (en) * 2019-09-27 2023-10-13 北京中电华大电子设计有限责任公司 Test excitation generator of complex algorithm and control method thereof

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6211803B1 (en) * 1998-11-12 2001-04-03 Logicvision, Inc. Test circuit and method for measuring switching point voltages and integral non-linearity (INL) of analog to digital converters
US6259389B1 (en) * 1998-11-20 2001-07-10 General Electric Company System for designing and testing a sigma-delta modulator using response surface techniques
US6492798B2 (en) * 2001-04-27 2002-12-10 Logicvision, Inc. Method and circuit for testing high frequency mixed signal circuits with low frequency signals

Also Published As

Publication number Publication date
WO2007009912A1 (en) 2007-01-25

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