ITMI960355A0 - - Google Patents
Info
- Publication number
- ITMI960355A0 ITMI960355A0 ITMI960355A ITMI960355A ITMI960355A0 IT MI960355 A0 ITMI960355 A0 IT MI960355A0 IT MI960355 A ITMI960355 A IT MI960355A IT MI960355 A ITMI960355 A IT MI960355A IT MI960355 A0 ITMI960355 A0 IT MI960355A0
- Authority
- IT
- Italy
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2805—Bare printed circuit boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IT96MI000355A IT1282689B1 (it) | 1996-02-26 | 1996-02-26 | Dispositivo di conversione della griglia di punti di test di una macchina per il test elettrico di circuiti stampati non montati |
| US08/622,894 US5767692A (en) | 1996-02-26 | 1996-03-29 | Device for converting the test point grid of a machine for electrically testing unassembled printed circuit boards |
| DE69634506T DE69634506T2 (de) | 1996-02-26 | 1996-12-13 | Gerät zur Umsetzung eines Testrasters einer Vorrichtung zum elektrischen Prüfen von unbestückten gedruckten Schaltungen |
| EP96120048A EP0791833B1 (en) | 1996-02-26 | 1996-12-13 | Device for converting the test point grid of a machine for electrically testing unassembled printed circuit boards |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IT96MI000355A IT1282689B1 (it) | 1996-02-26 | 1996-02-26 | Dispositivo di conversione della griglia di punti di test di una macchina per il test elettrico di circuiti stampati non montati |
| US08/622,894 US5767692A (en) | 1996-02-26 | 1996-03-29 | Device for converting the test point grid of a machine for electrically testing unassembled printed circuit boards |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| ITMI960355A0 true ITMI960355A0 (US06373033-20020416-M00071.png) | 1996-02-26 |
| ITMI960355A1 ITMI960355A1 (it) | 1997-08-26 |
| IT1282689B1 IT1282689B1 (it) | 1998-03-31 |
Family
ID=26331357
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IT96MI000355A IT1282689B1 (it) | 1996-02-26 | 1996-02-26 | Dispositivo di conversione della griglia di punti di test di una macchina per il test elettrico di circuiti stampati non montati |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US5767692A (US06373033-20020416-M00071.png) |
| EP (1) | EP0791833B1 (US06373033-20020416-M00071.png) |
| IT (1) | IT1282689B1 (US06373033-20020416-M00071.png) |
Families Citing this family (36)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5892245A (en) * | 1996-11-11 | 1999-04-06 | Emulation Technology, Inc. | Ball grid array package emulator |
| US6194908B1 (en) * | 1997-06-26 | 2001-02-27 | Delaware Capital Formation, Inc. | Test fixture for testing backplanes or populated circuit boards |
| FR2772921B1 (fr) * | 1997-12-24 | 2000-01-28 | Sgs Thomson Microelectronics | Carte a pointes pour le test de composants semi-conducteurs |
| US6078186A (en) * | 1997-12-31 | 2000-06-20 | Micron Technology, Inc. | Force applying probe card and test system for semiconductor wafers |
| US6281692B1 (en) | 1998-10-05 | 2001-08-28 | International Business Machines Corporation | Interposer for maintaining temporary contact between a substrate and a test bed |
| US6414504B2 (en) * | 1999-05-20 | 2002-07-02 | Delaware Capital Formation, Inc. | Coaxial tilt pin fixture for testing high frequency circuit boards |
| EP2275175B1 (en) * | 2000-07-13 | 2016-08-24 | ReCor Medical, Inc. | Thermal treatment apparatus with ultrasonic energy application |
| EP2430996A3 (en) | 2000-07-13 | 2014-01-22 | ReCor Medical, Inc. | Energy-emitting catheter with balloon |
| US7059046B2 (en) * | 2002-06-24 | 2006-06-13 | Delaware Capital Formation, Inc. | Method for producing a captive wired test fixture and fixture therefor |
| US20040082859A1 (en) | 2002-07-01 | 2004-04-29 | Alan Schaer | Method and apparatus employing ultrasound energy to treat body sphincters |
| US6759861B2 (en) * | 2002-07-30 | 2004-07-06 | Intel Corporation | Thin film probe card contact drive system |
| CN1764419A (zh) * | 2003-02-20 | 2006-04-26 | 普罗里森姆股份有限公司 | 心脏消融装置 |
| US7100273B2 (en) * | 2003-03-03 | 2006-09-05 | Hewlett-Packard Development Company, L.P. | Interconnect validation instruments |
| US7662114B2 (en) * | 2004-03-02 | 2010-02-16 | Focus Surgery, Inc. | Ultrasound phased arrays |
| EP1755458B1 (en) * | 2004-05-06 | 2015-02-25 | Focus Surgery, Inc. | Apparatus for the selective treatment of tissue |
| DE102005030551B3 (de) * | 2005-06-22 | 2007-01-04 | JHS Technik Josef Schäfer | Vorrichtung zum Übertragen von elektrischen Signalen zwischen einem Tester und einem Prüfadapter |
| DE102005030550B3 (de) * | 2005-06-22 | 2006-10-26 | JHS Technik Josef Schäfer | Vorrichtung zum Prüfen von bestückten oder unbestückten Leiterplatten |
| US20070038096A1 (en) * | 2005-07-06 | 2007-02-15 | Ralf Seip | Method of optimizing an ultrasound transducer |
| US20070010805A1 (en) * | 2005-07-08 | 2007-01-11 | Fedewa Russell J | Method and apparatus for the treatment of tissue |
| WO2007136566A2 (en) | 2006-05-19 | 2007-11-29 | Prorhythm, Inc. | Ablation device with optimized input power profile and method of using the same |
| US20080039724A1 (en) * | 2006-08-10 | 2008-02-14 | Ralf Seip | Ultrasound transducer with improved imaging |
| US7559905B2 (en) * | 2006-09-21 | 2009-07-14 | Focus Surgery, Inc. | HIFU probe for treating tissue with in-line degassing of fluid |
| US7477066B2 (en) * | 2007-01-04 | 2009-01-13 | Unitech Printed Circuit Board Corp. | Universal grid composite circuit board testing tool |
| US8235902B2 (en) * | 2007-09-11 | 2012-08-07 | Focus Surgery, Inc. | System and method for tissue change monitoring during HIFU treatment |
| US8974445B2 (en) | 2009-01-09 | 2015-03-10 | Recor Medical, Inc. | Methods and apparatus for treatment of cardiac valve insufficiency |
| JP6796457B2 (ja) * | 2016-11-09 | 2020-12-09 | 株式会社日本マイクロニクス | 電気的接続装置、プローブ及び製造方法 |
| WO2018118075A1 (en) * | 2016-12-23 | 2018-06-28 | Intel Corporation | Fine pitch probe card methods and systems |
| US11268983B2 (en) | 2017-06-30 | 2022-03-08 | Intel Corporation | Chevron interconnect for very fine pitch probing |
| US10775414B2 (en) | 2017-09-29 | 2020-09-15 | Intel Corporation | Low-profile gimbal platform for high-resolution in situ co-planarity adjustment |
| US11061068B2 (en) | 2017-12-05 | 2021-07-13 | Intel Corporation | Multi-member test probe structure |
| US11204555B2 (en) | 2017-12-28 | 2021-12-21 | Intel Corporation | Method and apparatus to develop lithographically defined high aspect ratio interconnects |
| US11073538B2 (en) | 2018-01-03 | 2021-07-27 | Intel Corporation | Electrical testing apparatus with lateral movement of a probe support substrate |
| US10488438B2 (en) | 2018-01-05 | 2019-11-26 | Intel Corporation | High density and fine pitch interconnect structures in an electric test apparatus |
| US11543454B2 (en) | 2018-09-25 | 2023-01-03 | Intel Corporation | Double-beam test probe |
| US10935573B2 (en) | 2018-09-28 | 2021-03-02 | Intel Corporation | Slip-plane MEMS probe for high-density and fine pitch interconnects |
| CN114879019A (zh) * | 2022-07-12 | 2022-08-09 | 泉州艾奇科技有限公司 | 一种测试点规则分布的电路板的检测装置 |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4535536A (en) * | 1983-11-03 | 1985-08-20 | Augat Inc. | Method of assembling adaptor for automatic testing equipment |
| DE3340179C1 (de) * | 1983-11-07 | 1985-05-09 | MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH | Anordnung an einem Leiterplattenpruefgeraet zur Anpassung der Abstaende von Kontakten |
| DE3441578A1 (de) * | 1984-11-14 | 1986-05-22 | Riba-Prüftechnik GmbH, 7801 Schallstadt | Leiterplatten-pruefeinrichtung |
| DE3539720A1 (de) * | 1985-11-08 | 1987-05-14 | Martin Maelzer | Adapter fuer ein leiterplattenpruefgeraet |
| EP0222036B1 (de) * | 1985-11-12 | 1989-02-01 | MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH | Leiterplattenprüfgerät mit einem Kontaktpunktraster erhöhter Kontaktpunktdichte |
| US4977370A (en) * | 1988-12-06 | 1990-12-11 | Genrad, Inc. | Apparatus and method for circuit board testing |
| US5157325A (en) * | 1991-02-15 | 1992-10-20 | Compaq Computer Corporation | Compact, wireless apparatus for electrically testing printed circuit boards |
| IT1266653B1 (it) * | 1993-11-02 | 1997-01-09 | Circuit Line Spa | Macchina per eseguire il test elettrico simultaneo, sulle due facce di una piastra con circuiti stampati |
| US5450017A (en) * | 1993-12-03 | 1995-09-12 | Everett Charles Technologies, Inc. | Test fixture having translator for grid interface |
| US5493230A (en) * | 1994-02-25 | 1996-02-20 | Everett Charles Technologies, Inc. | Retention of test probes in translator fixtures |
-
1996
- 1996-02-26 IT IT96MI000355A patent/IT1282689B1/it active IP Right Grant
- 1996-03-29 US US08/622,894 patent/US5767692A/en not_active Expired - Fee Related
- 1996-12-13 EP EP96120048A patent/EP0791833B1/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| IT1282689B1 (it) | 1998-03-31 |
| EP0791833B1 (en) | 2005-03-23 |
| EP0791833A2 (en) | 1997-08-27 |
| US5767692A (en) | 1998-06-16 |
| EP0791833A3 (en) | 1998-03-18 |
| ITMI960355A1 (it) | 1997-08-26 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 0001 | Granted |