IT981196B - PERFECTED SYSTEM FOR TESTING CIRCUITS, IN PARTICULAR NON-LINEAR CIRCUITS - Google Patents

PERFECTED SYSTEM FOR TESTING CIRCUITS, IN PARTICULAR NON-LINEAR CIRCUITS

Info

Publication number
IT981196B
IT981196B IT2130673A IT2130673A IT981196B IT 981196 B IT981196 B IT 981196B IT 2130673 A IT2130673 A IT 2130673A IT 2130673 A IT2130673 A IT 2130673A IT 981196 B IT981196 B IT 981196B
Authority
IT
Italy
Prior art keywords
circuits
particular non
linear
testing
perfected system
Prior art date
Application number
IT2130673A
Other languages
Italian (it)
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Application granted granted Critical
Publication of IT981196B publication Critical patent/IT981196B/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318385—Random or pseudo-random test pattern

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
IT2130673A 1972-03-17 1973-03-08 PERFECTED SYSTEM FOR TESTING CIRCUITS, IN PARTICULAR NON-LINEAR CIRCUITS IT981196B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US23548572A 1972-03-17 1972-03-17

Publications (1)

Publication Number Publication Date
IT981196B true IT981196B (en) 1974-10-10

Family

ID=22885702

Family Applications (1)

Application Number Title Priority Date Filing Date
IT2130673A IT981196B (en) 1972-03-17 1973-03-08 PERFECTED SYSTEM FOR TESTING CIRCUITS, IN PARTICULAR NON-LINEAR CIRCUITS

Country Status (5)

Country Link
CA (1) CA1000361A (en)
DE (1) DE2312731A1 (en)
FR (1) FR2176684B1 (en)
GB (1) GB1403805A (en)
IT (1) IT981196B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5475624A (en) * 1992-04-30 1995-12-12 Schlumberger Technologies, Inc. Test generation by environment emulation

Also Published As

Publication number Publication date
GB1403805A (en) 1975-08-28
FR2176684B1 (en) 1979-10-05
FR2176684A1 (en) 1973-11-02
CA1000361A (en) 1976-11-23
DE2312731A1 (en) 1973-09-20

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