IT8323382A0 - Apparecchiatura di vaporizzazione ionica. - Google Patents

Apparecchiatura di vaporizzazione ionica.

Info

Publication number
IT8323382A0
IT8323382A0 IT8323382A IT2338283A IT8323382A0 IT 8323382 A0 IT8323382 A0 IT 8323382A0 IT 8323382 A IT8323382 A IT 8323382A IT 2338283 A IT2338283 A IT 2338283A IT 8323382 A0 IT8323382 A0 IT 8323382A0
Authority
IT
Italy
Prior art keywords
ionic
vaporization equipment
vaporization
equipment
ionic vaporization
Prior art date
Application number
IT8323382A
Other languages
English (en)
Other versions
IT1169862B (it
Inventor
Hideharu Kiyota
Mitsuaki Horiuchi
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Publication of IT8323382A0 publication Critical patent/IT8323382A0/it
Application granted granted Critical
Publication of IT1169862B publication Critical patent/IT1169862B/it

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • H01L21/283Deposition of conductive or insulating materials for electrodes conducting electric current
    • H01L21/285Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411Constructional aspects of the reactor
    • H01J37/3414Targets
    • H01J37/3423Shape
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3402Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
    • H01J37/3405Magnetron sputtering
    • H01J37/3408Planar magnetron sputtering

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physical Vapour Deposition (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Helmets And Other Head Coverings (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
IT8323382A 1982-10-22 1983-10-20 Apparecchiatura di vaporizzazione ionica IT1169862B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57184577A JPS5976875A (ja) 1982-10-22 1982-10-22 マグネトロン型スパッタ装置とそれに用いるターゲット

Publications (2)

Publication Number Publication Date
IT8323382A0 true IT8323382A0 (it) 1983-10-20
IT1169862B IT1169862B (it) 1987-06-03

Family

ID=16155636

Family Applications (1)

Application Number Title Priority Date Filing Date
IT8323382A IT1169862B (it) 1982-10-22 1983-10-20 Apparecchiatura di vaporizzazione ionica

Country Status (10)

Country Link
US (1) US4547279A (it)
JP (1) JPS5976875A (it)
KR (1) KR840006557A (it)
DE (1) DE3338377A1 (it)
FR (1) FR2535109A1 (it)
GB (1) GB2129021B (it)
HK (1) HK488A (it)
IT (1) IT1169862B (it)
MY (1) MY8700801A (it)
SG (1) SG87987G (it)

Families Citing this family (50)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2476384B1 (fr) * 1980-02-18 1985-11-29 Teco Sa Perfectionnements a un disjoncteur de securite a enclenchement manuel et a organes de deverrouillage magnetiques et thermiques
NL185372C (nl) * 1980-02-18 1990-03-16 Teco Societe Anonyme Meerpolige elektrische veiligheidsschakelaar.
US4515675A (en) * 1983-07-06 1985-05-07 Leybold-Heraeus Gmbh Magnetron cathode for cathodic evaportion apparatus
NL8402012A (nl) * 1983-07-19 1985-02-18 Varian Associates Magnetron spetter deklaag opbrengbron voor zowel magnetische als niet-magnetische trefplaatmaterialen.
DE3442206A1 (de) * 1983-12-05 1985-07-11 Leybold-Heraeus GmbH, 5000 Köln Magnetronkatode zum zerstaeuben ferromagnetischer targets
US4486287A (en) * 1984-02-06 1984-12-04 Fournier Paul R Cross-field diode sputtering target assembly
US4606806A (en) * 1984-05-17 1986-08-19 Varian Associates, Inc. Magnetron sputter device having planar and curved targets
DE163445T1 (de) * 1984-05-17 1986-05-22 Varian Associates, Inc., Palo Alto, Calif. Magnetron-zerstaeubungs-vorrichtung mit ebenen und konkaven auftreffplatten.
US4627904A (en) * 1984-05-17 1986-12-09 Varian Associates, Inc. Magnetron sputter device having separate confining magnetic fields to separate targets and magnetically enhanced R.F. bias
US4569746A (en) * 1984-05-17 1986-02-11 Varian Associates, Inc. Magnetron sputter device using the same pole piece for coupling separate confining magnetic fields to separate targets subject to separate discharges
US4661228A (en) * 1984-05-17 1987-04-28 Varian Associates, Inc. Apparatus and method for manufacturing planarized aluminum films
US4610774A (en) * 1984-11-14 1986-09-09 Hitachi, Ltd. Target for sputtering
JPS61183467A (ja) * 1985-02-08 1986-08-16 Hitachi Ltd スパッタリング方法及びその装置
US4855033A (en) * 1986-04-04 1989-08-08 Materials Research Corporation Cathode and target design for a sputter coating apparatus
CA1308060C (en) * 1986-04-04 1992-09-29 Tokyo Electron Limited Cathode and target design for a sputter coating apparatus
US4834860A (en) * 1987-07-01 1989-05-30 The Boc Group, Inc. Magnetron sputtering targets
GB2209769A (en) * 1987-09-16 1989-05-24 Ion Tech Ltd Sputter coating
JPH0246854U (it) * 1988-09-19 1990-03-30
DE3919147C2 (de) * 1989-06-12 1998-01-15 Leybold Ag Verfahren zum Beschichten eines Kunststoffsubstrats mit Aluminium
US5403663A (en) * 1989-06-12 1995-04-04 Leybold Aktiengesellschaft Process for coating a polycarbonate substrate with an aluminum-silicon alloy
JP3047917B2 (ja) * 1989-10-20 2000-06-05 東京エレクトロン株式会社 スパッタ用ターゲット及びスパッタ方法
JPH0733576B2 (ja) * 1989-11-29 1995-04-12 株式会社日立製作所 スパツタ装置、及びターゲツト交換装置、並びにその交換方法
JPH03191058A (ja) * 1989-12-19 1991-08-21 Toshiba Corp スパッタリング装置
US5080772A (en) * 1990-08-24 1992-01-14 Materials Research Corporation Method of improving ion flux distribution uniformity on a substrate
JPH04114210U (ja) * 1991-03-26 1992-10-07 日立化成工業株式会社 平面アンテナのハウジング構造
US5334302A (en) * 1991-11-15 1994-08-02 Tokyo Electron Limited Magnetron sputtering apparatus and sputtering gun for use in the same
DE9217937U1 (it) * 1992-01-29 1993-04-01 Leybold Ag, 6450 Hanau, De
US6605198B1 (en) * 1993-07-22 2003-08-12 Sputtered Films, Inc. Apparatus for, and method of, depositing a film on a substrate
EP0661728B1 (en) * 1993-12-28 1997-06-11 Shin-Etsu Chemical Co., Ltd. Dipole ring magnet for use in magnetron sputtering or magnetron etching
EP0704878A1 (en) * 1994-09-27 1996-04-03 Applied Materials, Inc. Uniform film thickness deposition of sputtered materials
US5697827A (en) * 1996-01-11 1997-12-16 Rabinowitz; Mario Emissive flat panel display with improved regenerative cathode
GB9606920D0 (en) * 1996-04-02 1996-06-05 Applied Vision Ltd Magnet array for magnetrons
US5863399A (en) * 1996-04-13 1999-01-26 Singulus Technologies Gmbh Device for cathode sputtering
DE19614595A1 (de) * 1996-04-13 1997-10-16 Singulus Technologies Gmbh Vorrichtung zur Kathodenzerstäubung
DE19614598A1 (de) * 1996-04-13 1997-10-16 Singulus Technologies Gmbh Vorrichtung zur Kathodenzerstäubung
US6042706A (en) * 1997-01-14 2000-03-28 Applied Materials, Inc. Ionized PVD source to produce uniform low-particle deposition
US5985115A (en) 1997-04-11 1999-11-16 Novellus Systems, Inc. Internally cooled target assembly for magnetron sputtering
KR19990023327A (ko) * 1997-08-05 1999-03-25 토마스 엠. 알바레즈 제 1 및 제 2 재료를 기판상에 증착하는 장치 및 방법
TW460599B (en) * 1998-01-14 2001-10-21 Toshiba Corp Method for forming fine wiring pattern
US6217716B1 (en) 1998-05-06 2001-04-17 Novellus Systems, Inc. Apparatus and method for improving target erosion in hollow cathode magnetron sputter source
JP2000098582A (ja) * 1998-09-17 2000-04-07 Ulvac Seimaku Kk 位相シフトフォトマスクブランクス、位相シフトフォトマスク及びそれらの製造方法、並びに該ブランクスの製造装置
US6783638B2 (en) 2001-09-07 2004-08-31 Sputtered Films, Inc. Flat magnetron
US6846396B2 (en) * 2002-08-08 2005-01-25 Applied Materials, Inc. Active magnetic shielding
US20080083611A1 (en) * 2006-10-06 2008-04-10 Tegal Corporation High-adhesive backside metallization
US8808513B2 (en) * 2008-03-25 2014-08-19 Oem Group, Inc Stress adjustment in reactive sputtering
US20090246385A1 (en) * 2008-03-25 2009-10-01 Tegal Corporation Control of crystal orientation and stress in sputter deposited thin films
WO2010129180A2 (en) * 2009-04-28 2010-11-11 Ferrotec (Usa) Corporation Lift-off deposition system featuring a density optimized hula substrate holder in a conical dep0sition chamber
US8482375B2 (en) * 2009-05-24 2013-07-09 Oem Group, Inc. Sputter deposition of cermet resistor films with low temperature coefficient of resistance
JP6244103B2 (ja) 2012-05-04 2017-12-06 ヴァイアヴィ・ソリューションズ・インコーポレイテッドViavi Solutions Inc. 反応性スパッタ堆積のための方法および反応性スパッタ堆積システム
JP5343162B1 (ja) * 2012-10-26 2013-11-13 エピクルー株式会社 エピタキシャル成長装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4046659A (en) * 1974-05-10 1977-09-06 Airco, Inc. Method for coating a substrate
US4060470A (en) * 1974-12-06 1977-11-29 Clarke Peter J Sputtering apparatus and method
US4100055A (en) * 1977-06-10 1978-07-11 Varian Associates, Inc. Target profile for sputtering apparatus
US4169031A (en) * 1978-01-13 1979-09-25 Polyohm, Inc. Magnetron sputter cathode assembly
US4219397A (en) * 1978-11-24 1980-08-26 Clarke Peter J Magnetron sputter apparatus
HU179482B (en) * 1979-02-19 1982-10-28 Mikroelektronikai Valalat Penning pulverizel source
GB2058143B (en) * 1979-07-31 1983-11-02 Nordiko Ltd Sputtering electrodes
US4457825A (en) * 1980-05-16 1984-07-03 Varian Associates, Inc. Sputter target for use in a sputter coating source
US4461688A (en) * 1980-06-23 1984-07-24 Vac-Tec Systems, Inc. Magnetically enhanced sputtering device having a plurality of magnetic field sources including improved plasma trapping device and method
US4401539A (en) * 1981-01-30 1983-08-30 Hitachi, Ltd. Sputtering cathode structure for sputtering apparatuses, method of controlling magnetic flux generated by said sputtering cathode structure, and method of forming films by use of said sputtering cathode structure
US4422896A (en) * 1982-01-26 1983-12-27 Materials Research Corporation Magnetically enhanced plasma process and apparatus
US4414086A (en) * 1982-11-05 1983-11-08 Varian Associates, Inc. Magnetic targets for use in sputter coating apparatus
US4428816A (en) * 1983-05-25 1984-01-31 Materials Research Corporation Focusing magnetron sputtering apparatus

Also Published As

Publication number Publication date
US4547279A (en) 1985-10-15
KR840006557A (ko) 1984-11-30
IT1169862B (it) 1987-06-03
GB8328208D0 (en) 1983-11-23
MY8700801A (en) 1987-12-31
GB2129021B (en) 1986-09-10
HK488A (en) 1988-01-15
JPH021909B2 (it) 1990-01-16
SG87987G (en) 1988-06-03
GB2129021A (en) 1984-05-10
FR2535109A1 (fr) 1984-04-27
JPS5976875A (ja) 1984-05-02
DE3338377A1 (de) 1984-04-26

Similar Documents

Publication Publication Date Title
IT8323382A0 (it) Apparecchiatura di vaporizzazione ionica.
DE3382282D1 (de) Kabelpritschen-schutzsystem.
NO158972C (no) Styrespakanordning.
DK246683D0 (da) Herbicider
DE3382627T2 (de) Elektrisches anschlussystem.
NO163646C (no) Broenn-tetningsenhet.
NO833127L (no) Kabler.
DE3381593D1 (de) Zerstaeubungsvorrichtung.
NO823113L (no) Luftbaaren prosjektilutstyr.
NO830098L (no) Anodeanordning.
KR840006142A (ko) 레이저 가공장치
NO821529L (no) Anordning ved jordbruksredskaper.
FI832759A (fi) Foerfarande foer datuminstaellning i en elektroniskt styrd frankeringsmaskin.
NL189986C (nl) Antenne-inrichting.
FI834671A (fi) Vektorer foer kloning i streptomyces- bakterier.
FI65675B (fi) Elektrodsystem foer voltametriska maetningar
IT8320969A0 (it) Apparecchiatura di rivestimento.
IT1172389B (it) 2,2,2-trialogeno-1-(trialogenometil)etiliden-bis-benzen-tioli
IT8322252A0 (it) Apparecchiatura nucleante.
FI824088L (fi) Nedloppskonstruktion foer kylare i roterugn.
NO157221C (no) Fremgangsmaate for elektroplettering.
DZ563A1 (fr) Formulation fongicides.
IT8223235V0 (it) Apparecchio per stiratura.
IT8305201A0 (it) Procedimento di mercerizzazione.
ATE31363T1 (de) Zielscheibeneinrichtung.

Legal Events

Date Code Title Description
TA Fee payment date (situation as of event date), data collected since 19931001

Effective date: 19951026