IT8022715A0 - Apparecchiatura perfezionata perl'impiantamento o bombardamento di un bersaglio con ioni. - Google Patents
Apparecchiatura perfezionata perl'impiantamento o bombardamento di un bersaglio con ioni.Info
- Publication number
- IT8022715A0 IT8022715A0 IT8022715A IT2271580A IT8022715A0 IT 8022715 A0 IT8022715 A0 IT 8022715A0 IT 8022715 A IT8022715 A IT 8022715A IT 2271580 A IT2271580 A IT 2271580A IT 8022715 A0 IT8022715 A0 IT 8022715A0
- Authority
- IT
- Italy
- Prior art keywords
- bombarding
- implanting
- ions
- target
- improved equipment
- Prior art date
Links
- 150000002500 ions Chemical class 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67748—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber horizontal transfer of a single workpiece
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/48—Ion implantation
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/50—Substrate holders
- C23C14/505—Substrate holders for rotation of the substrates
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
- C23C14/541—Heating or cooling of the substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3171—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation for ion implantation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67069—Apparatus for fluid treatment for etching for drying etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67751—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber vertical transfer of a single workpiece
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Analytical Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/053,443 US4247781A (en) | 1979-06-29 | 1979-06-29 | Cooled target disc for high current ion implantation method and apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
IT8022715A0 true IT8022715A0 (it) | 1980-06-11 |
IT1148843B IT1148843B (it) | 1986-12-03 |
Family
ID=21984265
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IT22715/80A IT1148843B (it) | 1979-06-29 | 1980-06-11 | Apparecchiatura perfezionata per l'impiantamento o bombardamento di un bersaglio con ioni |
Country Status (5)
Country | Link |
---|---|
US (1) | US4247781A (it) |
EP (1) | EP0020873B1 (it) |
JP (1) | JPS566431A (it) |
DE (1) | DE3065114D1 (it) |
IT (1) | IT1148843B (it) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5953659B2 (ja) * | 1980-04-11 | 1984-12-26 | 株式会社日立製作所 | 真空室中回転体の往復動機構 |
JPS57186285A (en) * | 1981-05-11 | 1982-11-16 | Hitachi Ltd | Manufacture of magnetic bubble memory element |
JPS57186284A (en) * | 1981-05-11 | 1982-11-16 | Hitachi Ltd | Manufacture of magnetic bubble memory element |
JPS58153535A (ja) * | 1982-03-05 | 1983-09-12 | Hitachi Ltd | 試料回転装置 |
DE3411208C2 (de) * | 1984-03-27 | 1987-01-29 | Leybold-Heraeus GmbH, 5000 Köln | Haltevorrichtung für Substrate, insbesondere in Vakuum-Beschichtungsanlagen |
US4595481A (en) * | 1984-08-21 | 1986-06-17 | Komag, Inc. | Disk carrier |
US4724325A (en) * | 1986-04-23 | 1988-02-09 | Eaton Corporation | Adhesion cooling for an ion implantation system |
US4899059A (en) * | 1988-05-18 | 1990-02-06 | Varian Associates, Inc. | Disk scanning apparatus for batch ion implanters |
US6271529B1 (en) | 1997-12-01 | 2001-08-07 | Ebara Corporation | Ion implantation with charge neutralization |
CN101438373B (zh) * | 2006-05-05 | 2010-06-16 | 皇家飞利浦电子股份有限公司 | 用于x射线管的阳极板及其制造方法 |
AU2012328922A1 (en) * | 2011-10-24 | 2014-05-15 | Hybrid Turbine Group | Reaction turbine and hybrid impulse reaction turbine |
RU2669136C1 (ru) * | 2017-09-19 | 2018-10-08 | Научно-производственная Ассоциация "Технопарк авиационных технологий" (НПА "Технопарк АТ") | Способ ионно-имплантационной обработки лопаток компрессора из высоколегированных сталей и сплавов на никелевой основе |
CN111850501B (zh) * | 2020-07-20 | 2022-09-27 | 江苏集萃有机光电技术研究所有限公司 | 一种基片架结构及真空蒸镀装置 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL6700080A (it) * | 1966-01-03 | 1967-07-04 | ||
DE1951383C3 (de) * | 1969-10-11 | 1974-08-29 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Röntgenröhren-Drehanode mit einem Verbundkörper aus einem Schwermetallteil und wenigstens einem Graphitteil und Verfahren zu ihrer Herstellung |
NL7115946A (it) * | 1971-11-19 | 1973-05-22 | ||
DE2308509B2 (de) * | 1973-02-21 | 1976-09-09 | Kernforschungsanlage Jülich GmbH, 517OJülich | Rotationssymmetrische roentgenroehrendrehanode |
US4063103A (en) * | 1975-04-11 | 1977-12-13 | Tokyo Shibaura Electric Co., Ltd. | Electron beam exposure apparatus |
DK135257B (da) * | 1975-07-09 | 1977-03-21 | Danfysik As | Apparat til ion-implantation i emner, især skiver af halvledermateriale. |
US4011449A (en) * | 1975-11-05 | 1977-03-08 | Ibm Corporation | Apparatus for measuring the beam current of charged particle beam |
US3993018A (en) * | 1975-11-12 | 1976-11-23 | International Business Machines Corporation | Centrifugal support for workpieces |
US3983402A (en) * | 1975-12-22 | 1976-09-28 | International Business Machines Corporation | Ion implantation apparatus |
JPS5341184A (en) * | 1976-09-28 | 1978-04-14 | Nec Corp | Ion injection device |
CH607836A5 (it) * | 1976-12-27 | 1978-11-15 | Balzers Hochvakuum | |
US4118630A (en) * | 1977-05-05 | 1978-10-03 | International Business Machines Corporation | Ion implantation apparatus with a cooled structure controlling the surface potential of a target surface |
US4135097A (en) * | 1977-05-05 | 1979-01-16 | International Business Machines Corporation | Ion implantation apparatus for controlling the surface potential of a target surface |
-
1979
- 1979-06-29 US US06/053,443 patent/US4247781A/en not_active Expired - Lifetime
-
1980
- 1980-03-18 JP JP3349380A patent/JPS566431A/ja active Granted
- 1980-03-27 DE DE8080101627T patent/DE3065114D1/de not_active Expired
- 1980-03-27 EP EP80101627A patent/EP0020873B1/en not_active Expired
- 1980-06-11 IT IT22715/80A patent/IT1148843B/it active
Also Published As
Publication number | Publication date |
---|---|
DE3065114D1 (en) | 1983-11-10 |
IT1148843B (it) | 1986-12-03 |
EP0020873B1 (en) | 1983-10-05 |
JPS6127857B2 (it) | 1986-06-27 |
JPS566431A (en) | 1981-01-23 |
EP0020873A1 (en) | 1981-01-07 |
US4247781A (en) | 1981-01-27 |
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