IT7819508A0 - SCANNING MICROSCOPY DEVICE FOR SELECTIVE VOLTAGE CONTRAST WITH DELAY LINE AND RELATIVE METHOD. - Google Patents

SCANNING MICROSCOPY DEVICE FOR SELECTIVE VOLTAGE CONTRAST WITH DELAY LINE AND RELATIVE METHOD.

Info

Publication number
IT7819508A0
IT7819508A0 IT7819508A IT1950878A IT7819508A0 IT 7819508 A0 IT7819508 A0 IT 7819508A0 IT 7819508 A IT7819508 A IT 7819508A IT 1950878 A IT1950878 A IT 1950878A IT 7819508 A0 IT7819508 A0 IT 7819508A0
Authority
IT
Italy
Prior art keywords
delay line
scanning microscopy
voltage contrast
relative method
selective voltage
Prior art date
Application number
IT7819508A
Other languages
Italian (it)
Other versions
IT1092854B (en
Inventor
Ramolini Angelo
Barocelli Alfredo
Antioci Claudio
Original Assignee
Honeywell Inf Systems
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell Inf Systems filed Critical Honeywell Inf Systems
Priority to IT19508/78A priority Critical patent/IT1092854B/en
Publication of IT7819508A0 publication Critical patent/IT7819508A0/en
Priority to JP547679A priority patent/JPS54120579A/en
Priority to DE19792901939 priority patent/DE2901939A1/en
Priority to NL7900456A priority patent/NL7900456A/en
Priority to GB7902301A priority patent/GB2014014B/en
Application granted granted Critical
Publication of IT1092854B publication Critical patent/IT1092854B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/266—Measurement of magnetic- or electric fields in the object; Lorentzmicroscopy
    • H01J37/268—Measurement of magnetic- or electric fields in the object; Lorentzmicroscopy with scanning beams

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
IT19508/78A 1978-01-23 1978-01-23 SCANNING MICROSCOPY DEVICE FOR SELECTIVE VOLTAGE CONTRAST WITH DELAY LINE AND RELATED METHOD IT1092854B (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
IT19508/78A IT1092854B (en) 1978-01-23 1978-01-23 SCANNING MICROSCOPY DEVICE FOR SELECTIVE VOLTAGE CONTRAST WITH DELAY LINE AND RELATED METHOD
JP547679A JPS54120579A (en) 1978-01-23 1979-01-19 Method of and device for obtaining electron microscope voltage contrast
DE19792901939 DE2901939A1 (en) 1978-01-23 1979-01-19 METHOD AND CIRCUIT ARRANGEMENT FOR VOLTAGE CONTRAST SCANNING OF A DUTY WITH AN ELECTRON MICROSCOPE
NL7900456A NL7900456A (en) 1978-01-23 1979-01-19 DEVICE FOR SENSING THE VOLTAGE CONTRAST OF A SAMPLE.
GB7902301A GB2014014B (en) 1978-01-23 1979-01-22 Voltage contrast in scanning electron microscopy

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT19508/78A IT1092854B (en) 1978-01-23 1978-01-23 SCANNING MICROSCOPY DEVICE FOR SELECTIVE VOLTAGE CONTRAST WITH DELAY LINE AND RELATED METHOD

Publications (2)

Publication Number Publication Date
IT7819508A0 true IT7819508A0 (en) 1978-01-23
IT1092854B IT1092854B (en) 1985-07-12

Family

ID=11158613

Family Applications (1)

Application Number Title Priority Date Filing Date
IT19508/78A IT1092854B (en) 1978-01-23 1978-01-23 SCANNING MICROSCOPY DEVICE FOR SELECTIVE VOLTAGE CONTRAST WITH DELAY LINE AND RELATED METHOD

Country Status (5)

Country Link
JP (1) JPS54120579A (en)
DE (1) DE2901939A1 (en)
GB (1) GB2014014B (en)
IT (1) IT1092854B (en)
NL (1) NL7900456A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3235700A1 (en) * 1982-09-27 1984-03-29 Siemens AG, 1000 Berlin und 8000 München METHOD AND DEVICE FOR RECORDING SIGNAL PROCESSES ON A CYCLICALLY OPERATED SAMPLE, DEPENDING ON A SPORADICALLY EVENT

Also Published As

Publication number Publication date
NL7900456A (en) 1979-07-25
IT1092854B (en) 1985-07-12
GB2014014A (en) 1979-08-15
GB2014014B (en) 1982-06-23
DE2901939A1 (en) 1979-07-26
JPS54120579A (en) 1979-09-19

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