IT202200010928A1 - Scheda di misura con controllo in temperatura perfezionato - Google Patents

Scheda di misura con controllo in temperatura perfezionato Download PDF

Info

Publication number
IT202200010928A1
IT202200010928A1 IT102022000010928A IT202200010928A IT202200010928A1 IT 202200010928 A1 IT202200010928 A1 IT 202200010928A1 IT 102022000010928 A IT102022000010928 A IT 102022000010928A IT 202200010928 A IT202200010928 A IT 202200010928A IT 202200010928 A1 IT202200010928 A1 IT 202200010928A1
Authority
IT
Italy
Prior art keywords
temperature control
improved temperature
measurement board
measurement
board
Prior art date
Application number
IT102022000010928A
Other languages
English (en)
Original Assignee
Technoprobe Spa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Technoprobe Spa filed Critical Technoprobe Spa
Priority to IT102022000010928A priority Critical patent/IT202200010928A1/it
Priority to TW112118291A priority patent/TW202411663A/zh
Priority to PCT/EP2023/063670 priority patent/WO2023227538A1/en
Publication of IT202200010928A1 publication Critical patent/IT202200010928A1/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
IT102022000010928A 2022-05-25 2022-05-25 Scheda di misura con controllo in temperatura perfezionato IT202200010928A1 (it)

Priority Applications (3)

Application Number Priority Date Filing Date Title
IT102022000010928A IT202200010928A1 (it) 2022-05-25 2022-05-25 Scheda di misura con controllo in temperatura perfezionato
TW112118291A TW202411663A (zh) 2022-05-25 2023-05-17 具有改善溫度控制的探針卡
PCT/EP2023/063670 WO2023227538A1 (en) 2022-05-25 2023-05-22 Probe card with improved temperature control

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT102022000010928A IT202200010928A1 (it) 2022-05-25 2022-05-25 Scheda di misura con controllo in temperatura perfezionato

Publications (1)

Publication Number Publication Date
IT202200010928A1 true IT202200010928A1 (it) 2023-11-25

Family

ID=83080823

Family Applications (1)

Application Number Title Priority Date Filing Date
IT102022000010928A IT202200010928A1 (it) 2022-05-25 2022-05-25 Scheda di misura con controllo in temperatura perfezionato

Country Status (3)

Country Link
IT (1) IT202200010928A1 (it)
TW (1) TW202411663A (it)
WO (1) WO2023227538A1 (it)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130069686A1 (en) * 2011-09-16 2013-03-21 Mpi Corporation Probing device and manufacturing method thereof
US20200057095A1 (en) * 2017-04-28 2020-02-20 Technoprobe S.P.A. Probe card for a testing apparatus of electronic devices

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130069686A1 (en) * 2011-09-16 2013-03-21 Mpi Corporation Probing device and manufacturing method thereof
US20200057095A1 (en) * 2017-04-28 2020-02-20 Technoprobe S.P.A. Probe card for a testing apparatus of electronic devices

Also Published As

Publication number Publication date
TW202411663A (zh) 2024-03-16
WO2023227538A1 (en) 2023-11-30

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