IT1402921B1 - Circuito di pilotaggio di una porta d'accesso al test - Google Patents
Circuito di pilotaggio di una porta d'accesso al testInfo
- Publication number
- IT1402921B1 IT1402921B1 ITMI2010A002265A ITMI20102265A IT1402921B1 IT 1402921 B1 IT1402921 B1 IT 1402921B1 IT MI2010A002265 A ITMI2010A002265 A IT MI2010A002265A IT MI20102265 A ITMI20102265 A IT MI20102265A IT 1402921 B1 IT1402921 B1 IT 1402921B1
- Authority
- IT
- Italy
- Prior art keywords
- test
- access door
- pilot circuit
- pilot
- circuit
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318555—Control logic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318572—Input/Output interfaces
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
- G11C29/30—Accessing single arrays
- G11C29/32—Serial access; Scan testing
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/48—Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access [DMA] or using auxiliary access paths
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Semiconductor Integrated Circuits (AREA)
- Tests Of Electronic Circuits (AREA)
- Electrophonic Musical Instruments (AREA)
- Elevator Door Apparatuses (AREA)
- Pinball Game Machines (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
ITMI2010A002265A IT1402921B1 (it) | 2010-12-10 | 2010-12-10 | Circuito di pilotaggio di una porta d'accesso al test |
US13/240,163 US8892387B2 (en) | 2010-12-10 | 2011-09-22 | Driving circuit of a test access port |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
ITMI2010A002265A IT1402921B1 (it) | 2010-12-10 | 2010-12-10 | Circuito di pilotaggio di una porta d'accesso al test |
Publications (2)
Publication Number | Publication Date |
---|---|
ITMI20102265A1 ITMI20102265A1 (it) | 2012-06-11 |
IT1402921B1 true IT1402921B1 (it) | 2013-09-27 |
Family
ID=43736921
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ITMI2010A002265A IT1402921B1 (it) | 2010-12-10 | 2010-12-10 | Circuito di pilotaggio di una porta d'accesso al test |
Country Status (2)
Country | Link |
---|---|
US (1) | US8892387B2 (it) |
IT (1) | IT1402921B1 (it) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7155646B2 (en) * | 1999-02-10 | 2006-12-26 | Texas Instruments Incorporated | Tap and test controller with separate enable inputs |
US7284170B2 (en) * | 2004-01-05 | 2007-10-16 | Texas Instruments Incorporated | JTAG circuit transferring data between devices on TMS terminals |
KR20150064452A (ko) * | 2013-12-03 | 2015-06-11 | 에스케이하이닉스 주식회사 | 내장형 셀프 테스트 회로 및 이를 포함한 반도체 장치 |
US10267850B2 (en) * | 2014-12-22 | 2019-04-23 | Intel Corporation | Reconfigurable test access port with finite state machine control |
US10969455B2 (en) * | 2018-10-16 | 2021-04-06 | Rohde & Schwarz Gmbh & Co. Kg | Test system and method for testing a device under test having several communication lanes |
EP3961229B1 (en) * | 2020-08-25 | 2024-02-28 | STMicroelectronics S.r.l. | Electronic device and corresponding self-test method |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4860290A (en) * | 1987-06-02 | 1989-08-22 | Texas Instruments Incorporated | Logic circuit having individually testable logic modules |
US4862072A (en) * | 1988-09-08 | 1989-08-29 | General Electric Company | Distributed access serial port test arrangement for integrated circuits |
US5737342A (en) * | 1996-05-31 | 1998-04-07 | Quantum Corporation | Method for in-chip testing of digital circuits of a synchronously sampled data detection channel |
JP2001195899A (ja) * | 2000-01-06 | 2001-07-19 | Mitsubishi Electric Corp | 半導体記憶装置 |
JP2003100100A (ja) * | 2001-07-19 | 2003-04-04 | Mitsubishi Electric Corp | 半導体集積回路装置 |
TW200708750A (en) * | 2005-07-22 | 2007-03-01 | Koninkl Philips Electronics Nv | Testable integrated circuit, system in package and test instruction set |
CN102165328A (zh) * | 2008-09-26 | 2011-08-24 | Nxp股份有限公司 | 用于测试部分地组装的多管芯器件的方法、集成电路管芯和多管芯器件 |
-
2010
- 2010-12-10 IT ITMI2010A002265A patent/IT1402921B1/it active
-
2011
- 2011-09-22 US US13/240,163 patent/US8892387B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
ITMI20102265A1 (it) | 2012-06-11 |
US8892387B2 (en) | 2014-11-18 |
US20120150477A1 (en) | 2012-06-14 |
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