IT1394193B1 - TEST DEVICE TO VERIFY THE ROBUSTNESS OF CIRCUITS OR ELECTRONIC DEVICES - Google Patents
TEST DEVICE TO VERIFY THE ROBUSTNESS OF CIRCUITS OR ELECTRONIC DEVICESInfo
- Publication number
- IT1394193B1 IT1394193B1 ITBS2009A000091A ITBS20090091A IT1394193B1 IT 1394193 B1 IT1394193 B1 IT 1394193B1 IT BS2009A000091 A ITBS2009A000091 A IT BS2009A000091A IT BS20090091 A ITBS20090091 A IT BS20090091A IT 1394193 B1 IT1394193 B1 IT 1394193B1
- Authority
- IT
- Italy
- Prior art keywords
- robustness
- verify
- circuits
- electronic devices
- test device
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
- G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Control Of El Displays (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
ITBS2009A000091A IT1394193B1 (en) | 2009-05-21 | 2009-05-21 | TEST DEVICE TO VERIFY THE ROBUSTNESS OF CIRCUITS OR ELECTRONIC DEVICES |
PCT/IB2010/052080 WO2010133999A1 (en) | 2009-05-21 | 2010-05-11 | Test device to test the robustness of electronic circuits or devices |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
ITBS2009A000091A IT1394193B1 (en) | 2009-05-21 | 2009-05-21 | TEST DEVICE TO VERIFY THE ROBUSTNESS OF CIRCUITS OR ELECTRONIC DEVICES |
Publications (2)
Publication Number | Publication Date |
---|---|
ITBS20090091A1 ITBS20090091A1 (en) | 2010-11-22 |
IT1394193B1 true IT1394193B1 (en) | 2012-06-01 |
Family
ID=41559253
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ITBS2009A000091A IT1394193B1 (en) | 2009-05-21 | 2009-05-21 | TEST DEVICE TO VERIFY THE ROBUSTNESS OF CIRCUITS OR ELECTRONIC DEVICES |
Country Status (2)
Country | Link |
---|---|
IT (1) | IT1394193B1 (en) |
WO (1) | WO2010133999A1 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106227201A (en) * | 2016-09-21 | 2016-12-14 | 江苏理工学院 | Intelligent Measurement platform and method of work thereof |
CN112464613B (en) * | 2019-09-09 | 2023-09-15 | 瑞昱半导体股份有限公司 | Digital circuit robustness verification method and system |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6549019B2 (en) * | 2000-12-11 | 2003-04-15 | Visteon Global Technologies, Inc. | Testing device for evaluating the immunity of an electronic device to electromagnetic noise |
US6807507B2 (en) * | 2001-11-27 | 2004-10-19 | Vasudevan Seshadhri Kumar | Electrical over stress (EOS) monitor |
JP3701954B2 (en) * | 2003-07-08 | 2005-10-05 | 松下電器産業株式会社 | Semiconductor integrated circuit, electrostatic withstand voltage test method and apparatus thereof |
US7863920B2 (en) * | 2007-09-12 | 2011-01-04 | Infineon Technologies Ag | Electrostatic discharge test system and electrostatic discharge test method |
-
2009
- 2009-05-21 IT ITBS2009A000091A patent/IT1394193B1/en active
-
2010
- 2010-05-11 WO PCT/IB2010/052080 patent/WO2010133999A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
ITBS20090091A1 (en) | 2010-11-22 |
WO2010133999A1 (en) | 2010-11-25 |
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