IT1394193B1 - TEST DEVICE TO VERIFY THE ROBUSTNESS OF CIRCUITS OR ELECTRONIC DEVICES - Google Patents

TEST DEVICE TO VERIFY THE ROBUSTNESS OF CIRCUITS OR ELECTRONIC DEVICES

Info

Publication number
IT1394193B1
IT1394193B1 ITBS2009A000091A ITBS20090091A IT1394193B1 IT 1394193 B1 IT1394193 B1 IT 1394193B1 IT BS2009A000091 A ITBS2009A000091 A IT BS2009A000091A IT BS20090091 A ITBS20090091 A IT BS20090091A IT 1394193 B1 IT1394193 B1 IT 1394193B1
Authority
IT
Italy
Prior art keywords
robustness
verify
circuits
electronic devices
test device
Prior art date
Application number
ITBS2009A000091A
Other languages
Italian (it)
Inventor
Luigi Salvi
Original Assignee
Euro Instr S R L
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Euro Instr S R L filed Critical Euro Instr S R L
Priority to ITBS2009A000091A priority Critical patent/IT1394193B1/en
Priority to PCT/IB2010/052080 priority patent/WO2010133999A1/en
Publication of ITBS20090091A1 publication Critical patent/ITBS20090091A1/en
Application granted granted Critical
Publication of IT1394193B1 publication Critical patent/IT1394193B1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Control Of El Displays (AREA)
  • Tests Of Electronic Circuits (AREA)
ITBS2009A000091A 2009-05-21 2009-05-21 TEST DEVICE TO VERIFY THE ROBUSTNESS OF CIRCUITS OR ELECTRONIC DEVICES IT1394193B1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
ITBS2009A000091A IT1394193B1 (en) 2009-05-21 2009-05-21 TEST DEVICE TO VERIFY THE ROBUSTNESS OF CIRCUITS OR ELECTRONIC DEVICES
PCT/IB2010/052080 WO2010133999A1 (en) 2009-05-21 2010-05-11 Test device to test the robustness of electronic circuits or devices

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ITBS2009A000091A IT1394193B1 (en) 2009-05-21 2009-05-21 TEST DEVICE TO VERIFY THE ROBUSTNESS OF CIRCUITS OR ELECTRONIC DEVICES

Publications (2)

Publication Number Publication Date
ITBS20090091A1 ITBS20090091A1 (en) 2010-11-22
IT1394193B1 true IT1394193B1 (en) 2012-06-01

Family

ID=41559253

Family Applications (1)

Application Number Title Priority Date Filing Date
ITBS2009A000091A IT1394193B1 (en) 2009-05-21 2009-05-21 TEST DEVICE TO VERIFY THE ROBUSTNESS OF CIRCUITS OR ELECTRONIC DEVICES

Country Status (2)

Country Link
IT (1) IT1394193B1 (en)
WO (1) WO2010133999A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106227201A (en) * 2016-09-21 2016-12-14 江苏理工学院 Intelligent detection platform and working method thereof
CN112464613B (en) * 2019-09-09 2023-09-15 瑞昱半导体股份有限公司 Digital circuit robustness verification method and system

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6549019B2 (en) * 2000-12-11 2003-04-15 Visteon Global Technologies, Inc. Testing device for evaluating the immunity of an electronic device to electromagnetic noise
US6807507B2 (en) * 2001-11-27 2004-10-19 Vasudevan Seshadhri Kumar Electrical over stress (EOS) monitor
JP3701954B2 (en) * 2003-07-08 2005-10-05 松下電器産業株式会社 Semiconductor integrated circuit, electrostatic withstand voltage test method and apparatus thereof
US7863920B2 (en) * 2007-09-12 2011-01-04 Infineon Technologies Ag Electrostatic discharge test system and electrostatic discharge test method

Also Published As

Publication number Publication date
ITBS20090091A1 (en) 2010-11-22
WO2010133999A1 (en) 2010-11-25

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