IT1194760B - Sistema assoluto a corrente continua per impianto di ispezione laser - Google Patents

Sistema assoluto a corrente continua per impianto di ispezione laser

Info

Publication number
IT1194760B
IT1194760B IT20150/81A IT2015081A IT1194760B IT 1194760 B IT1194760 B IT 1194760B IT 20150/81 A IT20150/81 A IT 20150/81A IT 2015081 A IT2015081 A IT 2015081A IT 1194760 B IT1194760 B IT 1194760B
Authority
IT
Italy
Prior art keywords
direct current
laser inspection
absolute direct
inspection system
current system
Prior art date
Application number
IT20150/81A
Other languages
English (en)
Other versions
IT8120150A0 (it
Inventor
Cole Harlan Baker
Original Assignee
Intec Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intec Corp filed Critical Intec Corp
Publication of IT8120150A0 publication Critical patent/IT8120150A0/it
Application granted granted Critical
Publication of IT1194760B publication Critical patent/IT1194760B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/93—Detection standards; Calibrating baseline adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
IT20150/81A 1980-03-07 1981-03-05 Sistema assoluto a corrente continua per impianto di ispezione laser IT1194760B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/128,286 US4297587A (en) 1980-03-07 1980-03-07 Absolute DC system for a laser inspection system

Publications (2)

Publication Number Publication Date
IT8120150A0 IT8120150A0 (it) 1981-03-05
IT1194760B true IT1194760B (it) 1988-09-28

Family

ID=22434570

Family Applications (1)

Application Number Title Priority Date Filing Date
IT20150/81A IT1194760B (it) 1980-03-07 1981-03-05 Sistema assoluto a corrente continua per impianto di ispezione laser

Country Status (7)

Country Link
US (1) US4297587A (it)
JP (1) JPS56140244A (it)
CA (1) CA1158333A (it)
DE (1) DE3108344A1 (it)
FR (1) FR2477712B1 (it)
IT (1) IT1194760B (it)
SE (1) SE8101446L (it)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4447150A (en) * 1981-02-27 1984-05-08 Bentley Laboratories Apparatus and method for measuring blood oxygen saturation
JPS5892935A (ja) * 1981-11-30 1983-06-02 Mitsubishi Electric Corp 表面欠陥検査装置
US4538915A (en) * 1981-12-23 1985-09-03 E. I. Du Pont De Nemours And Company Web inspection system having a product characteristic signal normalizing network
JPS6010174A (ja) * 1983-06-29 1985-01-19 Fuji Photo Film Co Ltd オ−トラジオグラフイ−による遺伝子のスクリ−ニング方法
EP0148288B1 (en) * 1983-12-22 1990-02-28 S.P.A. Leglertex Apparatus for detecting anomalies in corduroy preparation
US4701985A (en) * 1983-12-22 1987-10-27 Leglertex S.R.L. Apparatus for detecting anomalies in corduroy preparation
DE3418283A1 (de) * 1984-05-17 1985-12-12 Schott Glaswerke, 6500 Mainz Verfahren zum nachweis von fehlstellen in transparenten materialien
NL9100248A (nl) * 1991-02-13 1992-09-01 Philips & Du Pont Optical Inrichting voor het meten van de reflectie en/of transmissie van een voorwerp.
JPH06207910A (ja) * 1993-01-11 1994-07-26 Fuji Photo Film Co Ltd 表面検査装置
USH1616H (en) * 1994-05-31 1996-12-03 Minnesota Mining And Manufacturing Company Web inspection system having enhanced video signal preprocessing
US6526077B1 (en) * 2000-05-25 2003-02-25 Nelson Tabirian Line-scan laser beam profiler
US9747776B2 (en) 2012-06-08 2017-08-29 Neilsen-Kuljian, Inc. Electrical sensor with configurable settings and a display
US9664709B2 (en) 2012-06-08 2017-05-30 Neilsen-Kuljian, Inc. Electrical sensor with configurable settings
US9766273B2 (en) * 2012-08-21 2017-09-19 Neilsen-Kuljian, Inc. Self-powered current sensor with a linear adjustment
US9478402B2 (en) 2013-04-01 2016-10-25 Kla-Tencor Corporation Photomultiplier tube, image sensor, and an inspection system using a PMT or image sensor

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3690774A (en) * 1971-02-26 1972-09-12 Dow Chemical Co Continuous optical quality control monitor
US3866054A (en) * 1973-09-28 1975-02-11 Du Pont Defect size discriminator circuit for web inspection system
US3900265A (en) * 1974-03-08 1975-08-19 Intec Corp Laser scanner flaw detection system
US3958127A (en) * 1974-08-09 1976-05-18 E. I. Du Pont De Nemours And Company Optical-electrical web inspection system

Also Published As

Publication number Publication date
IT8120150A0 (it) 1981-03-05
FR2477712A1 (fr) 1981-09-11
DE3108344A1 (de) 1981-12-24
JPS56140244A (en) 1981-11-02
US4297587A (en) 1981-10-27
SE8101446L (sv) 1981-09-08
CA1158333A (en) 1983-12-06
FR2477712B1 (fr) 1985-07-05

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